Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-201327 | Discussion on AP 85.25 ACLR metric change |
discussion revised to R5-202842 |
Qualcomm Finland RFFE Oy | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-201468 | MBR impact on testability | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-201476 | MU and TT for MOP spherical coverage for Intra-band contiguous CA | discussion | NTT DOCOMO INC. | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-201603 | On the QoQZ validation procedure for enhanced IFF |
discussion revised to R5-202704 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-201605 | RRM FR2 MU: Representative test case 7.7.1.1 |
discussion revised to R5-202843 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-201818 | Review on test point analysis | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-201819 | On RRM inter-frequency tests in narrow NR bands | CR | ROHDE & SCHWARZ | 38.533 16.3.0 CR#632 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] |
| R5-201839 | On RRM inter-frequency tests in narrow NR bands | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-201840 | Discussion on testing of 4Rx vs 2Rx in FR1 |
discussion revised to R5-202811 |
Huawei, CAICT, OPPO, Samsung, Bureau Veritas, Sporton, Ericsson, Anritsu, AT&T, Keysight, CMCC, Dish, Telecom Italia, Orange, Rohde&Schwarz | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-201852 | On ACLR test metric for FR2 related to AP 85.25 |
discussion revised to R5-202844 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-201869 | Discussion on test point analysis for spurious emission UE co-existence per EN-DC configuration | discussion | Huawei,Hisilicon |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |||
| R5-201919 | Discussion on how to update TS 38.522 |
discussion revised to R5-202919 |
China Mobile, Bureau Veritas, Huawei, Hisilicon, TTA, Sporton | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202082 | Discussion on size of Quiet Zone above 30cm | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202115 | On Beam Peak Searches for different test configurations |
discussion revised to R5-202939 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202116 | On Beam Peak Searches for Intra-Band Contiguous CA |
discussion revised to R5-202920 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202117 | On UBF for Intra-Band Carrier Aggregation | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202124 | On PC1 MUs |
discussion revised to R5-202845 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202126 | On the order of test steps for output power dynamics test cases | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202127 | On NR FR2 Demodulation MUs |
discussion revised to R5-202846 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202163 | Discussion about power configuration for spurious emission for inter-band EN-DC | discussion | Guangdong OPPO Mobile Telecom. | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-202312 | DL Absolute Level Uncertainty for FR2 RRM |
discussion revised to R5-202847 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202313 | FR2 receiver spurious emission uncertainties | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202314 | FR2 RRM timing measurement uncertainty |
discussion revised to R5-202921 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202315 | FR2 SNR Uncertainty |
discussion revised to R5-202922 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202316 | Noise impact for FR2 TRx test cases |
discussion revised to R5-202848 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202317 | On FR2 ACLR MUs |
discussion revised to R5-202849 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202318 | On FR2 OBW MU | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202319 | On FR2 TRx testability and MU for PC1 device |
discussion revised to R5-202850 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202320 | On frequency flatness uncertainty for FR2 RRM and Performance tests |
discussion revised to R5-202851 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202321 | On the FR2 ACLR Testability | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202374 | Discussion on requirements for power class 2 UE in EN-DC MOP test case | discussion | Ericsson | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202375 | Discussion on Testpoint analysis and testing of lower order fallback in NR Rx CA test cases | discussion | Ericsson, WE Certification, DISH | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202379 | Discussion on clarification of disabling of Tx diversity in FR2 testing |
discussion revised to R5-202923 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-202382 | Discussion on FR2 EIRP Tx OFF power MU for test cases usage |
discussion revised to R5-202872 |
Samsung R&D Institute UK | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202392 | Discussion on Beam Correspondence measurement procedure | discussion | Samsung R&D Institute UK | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202397 | Discussion on SCell activation and deactivation delay | discussion | Samsung R&D Institute UK | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202398 | Discussion on UE PSCell addition and release delay | discussion | Samsung R&D Institute UK |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |||
| R5-202417 | On txDirectCurrentLocation |
discussion revised to R5-202924 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202434 | Discussion on per port testing for FR1 UL MIMO devices | discussion | QUALCOMM JAPAN LLC. | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202452 | DUT alignment for form factors other than smartphones | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202454 | On the MU for ALCR | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202455 | Discussion on the power level for transmit modulation quality test cases |
discussion revised to R5-202852 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-202457 | Discussion on testability of ACS and IBB for CA | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202458 | On the MU of FR2 OBW | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202459 | On the SNR for FR2 TRx test cases | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202460 | On FR2 OBW MU | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202461 | On FR2 ACLR MU | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
| R5-202462 | On FR2 Spurious coexistence MU | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
| R5-202463 | On FR2 EVM MU | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
| R5-202464 | On FR2 Minimum Output power MU | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
| R5-202704 | On the QoQZ validation procedure for enhanced IFF |
discussion revision of R5-201603 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202811 | Discussion on testing of 4Rx vs 2Rx in FR1 |
discussion revision of R5-201840 |
Huawei, CAICT, OPPO, Samsung, Bureau Veritas, Sporton, Ericsson, Anritsu, AT&T, Keysight, CMCC, Dish, Telecom Italia, Orange, Rohde&Schwarz | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-202842 | Discussion on AP 85.25 ACLR metric change |
discussion revision of R5-201327 |
Qualcomm Finland RFFE Oy | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202843 | RRM FR2 MU: Representative test case 7.7.1.1 |
discussion revision of R5-201605 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202844 | On ACLR test metric for FR2 related to AP 85.25 |
discussion revision of R5-201852 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-202845 | On PC1 MUs |
discussion revision of R5-202124 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202846 | On NR FR2 Demodulation MUs |
discussion revision of R5-202127 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202847 | DL Absolute Level Uncertainty for FR2 RRM |
discussion revision of R5-202312 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202848 | Noise impact for FR2 TRx test cases |
discussion revision of R5-202316 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202849 | On FR2 ACLR MUs |
discussion revision of R5-202317 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202850 | On FR2 TRx testability and MU for PC1 device |
discussion revision of R5-202319 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202851 | On frequency flatness uncertainty for FR2 RRM and Performance tests |
discussion revision of R5-202320 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202852 | Discussion on the power level for transmit modulation quality test cases |
discussion revision of R5-202455 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202872 | Discussion on FR2 EIRP Tx OFF power MU for test cases usage |
discussion revision of R5-202382 |
Samsung R&D Institute UK | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202919 | Discussion on how to update TS 38.522 |
discussion revision of R5-201919 |
China Mobile, Bureau Veritas, Huawei, Hisilicon, TTA, Sporton, Ericsson, CAICT, Qualcomm, R&S | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202920 | On Beam Peak Searches for Intra-Band Contiguous CA |
discussion revision of R5-202116 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202921 | FR2 RRM timing measurement uncertainty |
discussion revision of R5-202314 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202922 | FR2 SNR Uncertainty |
discussion revision of R5-202315 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202923 | Discussion on clarification of disabling of Tx diversity in FR2 testing |
discussion revision of R5-202379 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-202924 | On txDirectCurrentLocation |
discussion revision of R5-202417 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-202939 | On Beam Peak Searches for different test configurations |
discussion revision of R5-202115 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-38102 AI: 5.3.2.17 |
noted | [WTS] [JSN] |
71 documents (0.35980486869812 seconds)