[{"name":"R5-201327","title":"Discussion on AP 85.25 ACLR metric change","source":"Qualcomm Finland RFFE Oy","contact":"Hemish Parikh","contact-id":61982,"tdoctype":"discussion","for":"Discussion","abstract":"The purpose of this paper is to share Qualcomm data on AP#85.25. This discussion paper provides Qualcomm\u2019s internal ACLR measurement test data comparing Peak EIRP based ACLR and TRP based ACLR results.\n\nObservation 1: The Peak EIRP ACLR can be \u201cliberal\u201d compared to TRP ACLR by 1dB to 2dB.\nObservation 2: Compared to the ACLR TRP (relative) limit of 17dB, both Peak EIRP based and TRP based ACLR pass by significant margin. \nObservation 3: In general Qualcomm view is that ACLR test optimization can be achieved by using Peak EIRP as a test metric. \nProposal 1: Use \u201cACLR test metric change MU element = [2dB]\u201d as a systematic error in [Total MU]. This can be refined further based on any other inputs.\nProposal 2: Adopt Peak EIRP as a test metric for FR2 ACLR testing to determine pass\/fail as follows: If [Peak EIRP ACLR + Total MU) < ACLR TRP limit] then conclude FR2 ACLR test pass or else conclude fail.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":13270,"status":"revised","reservation_date":"2020-04-24 23:50:01","uploaded":"2020-05-08 22:51:17","revisionof":"","revisedto":"R5-202842","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201327.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]