[{"name":"R5-202319","title":"On FR2 TRx testability and MU for PC1 device","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"Common assumptions of  PC1 device are provided in [1]. Also, some views on PC1 MU are provided in [2]. This paper provides our view on measurement uncertainties for PC1UE devices and also addresses one testability issue for PC1 devices.\nRAN5 is asked to endorse following proposals.\nProposal 1 :  Re-study Amplifier Uncertainties, Mismatch and RF power measurement equipment uncertainty for SEM and General Spurious\nProposal 2 : Other than MOP(TRP, EIPR), MOP Spherical Coverage, OFF Power, Peak EIS, EIS Spherical coverage, SEM, general spurious, further study all MU elements.\nProposal 3: Re-study \u201cImpact of noise\u201d for all the test cases for PC1 DevicesProposal 4 : Study the MU when non-full sphere measurement for TRP and spherical coverage and count additional MU element due to it by either following way :\nA)\tCount it in measurement grid MU\nB)\tIndependent MU element for impact of non-full sphere measurement for TRP and spherical coverage","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23190,"status":"revised","reservation_date":"2020-05-08 12:41:59","uploaded":"2020-05-08 18:02:11","revisionof":"","revisedto":"R5-202850","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202319.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]