Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-205571 Discussion on restructuring of TR 38.905 to better reflect the TS 38.521-x structure. discussion

revised to R5-206842

 Ericsson 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-205622 On the influence of the XPD for Enhanced-IFF discussion ROHDE & SCHWARZ R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-205623 On the DL AWGN absolute power or wanted DL signal absolute power discussion ROHDE & SCHWARZ R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-205624 On the QoQZ for enhanced IFF discussion ROHDE & SCHWARZ R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-205660 Discussion paper on specific test frequencies for RRM testing discussion

revised to R5-206789

 Ericsson 5GS_NR_LTE-UEConTest Rel-15 R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-205702 On Fading Impact on CREST and Demod Testability Analysis discussion ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-205713 AP#87e.23 Test coverage for large devices discussion Apple (UK) Limited R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-205865 Noise impact for FR2 CA test case where MPR applies discussion

revised to R5-206611

 Anritsu 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-205921 Discussion on FR2 Demod and CSI MTSU and TT discussion

revised to R5-206612

 Qualcomm Austria RFFE GmbH 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-205971 Discussion on Test Tolerance for RRM test 6.1.1.1 discussion

revised to R5-206607

 Huawei, HiSilicon 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-205990 Discussion on test points in Receiver test cases for EN-DC configurations with exception requirements discussion

revised to R5-206841

 Ericsson, DISH, Orange 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-205991 Discussion on FR2 ON-OFF time mask discussion

revised to R5-206785

 Ericsson 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-206068 On Larger Quiet Zone Sizes discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206069 On 20cm Quiet Zone discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206072 QoQZ and EIRP/EIS MU results for ETC testing discussion

revised to R5-206819

 Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-206075 On DFF QoQZ MU discussion

revised to R5-206608

 Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-206130 Discussion on size of Quiet Zone above 30cm discussion ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206150 On PC3 Beam Correspondence Measurement Uncertainty discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 withdrawn [WTS] [JSN]
R5-206153 On Testability Aspects for FR2 Demodulation Testing discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.17

 withdrawn [WTS] [JSN]
R5-206154 On DFF MU Tables in 38.903 discussion

revised to R5-206613

 Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-206166 On Measurement Distance uncertainty and phase curvature uncertainty for DFF discussion Anritsu 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206167 DFF Quality of Quiet Zone for DFF and IFF-DFF FR2 RRM test setup discussion Anritsu 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206168 On the achievable SNR for FR2 demod and perf test cases discussion

revised to R5-206614

 Anritsu 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-206172 On XPD MU for DFF discussion Anritsu 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206173 On FR2 Blocker Test with Offset Antenna discussion

revised to R5-206615

 Anritsu 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-206174 On n259 MU and testability limit discussion

revised to R5-206786

 Anritsu R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-206175 On FR2 OBW MU discussion Anritsu 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206176 On FR2b Spurious emission MU discussion

revised to R5-206616

 Anritsu 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-206180 On AoA change in FR2 RRM test discussion Anritsu 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 withdrawn [WTS] [JSN]
R5-206182 On Spurious measurement uncertainties discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 withdrawn [WTS] [JSN]
R5-206183 On Occupied Bandwidth measurement uncertainties discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 withdrawn [WTS] [JSN]
R5-206184 On the MU of FR2 OBW discussion

revised to R5-206617

 ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-206185 PC1 Assumptions for CDF Curve for MOP EIRP Spherical Coverage discussion

revised to R5-206618

 Qualcomm Japan LLC 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-206186 PC1 Assumptions for CDF Curve for MOP EIRP Spherical Coverage discussion Qualcomm Japan LLC 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.17

 withdrawn [WTS] [JSN]
R5-206192 Discussion on the MU for band n259 discussion

revised to R5-206787

 ROHDE & SCHWARZ R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-206240 Proposing update to Rel-16 EN-DC PC2 MOP test cases based on TEI-16 maintenance in RAN4 discussion

revised to R5-206840

 Huawei, HiSilicon TEI16_Test Rel-16 R5-89-e

AI: 5.3.2.17

 revised [WTS] [JSN]
R5-206607 Discussion on Test Tolerance for RRM test 6.1.1.1 discussion

revision of R5-205971

 Huawei, HiSilicon 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206608 On DFF QoQZ MU discussion

revision of R5-206075

 Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206611 Noise impact for FR2 CA test case where MPR applies discussion

revision of R5-205865

 Anritsu 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206612 Discussion on FR2 Demod and CSI MTSU and TT discussion

revision of R5-205921

 Qualcomm Austria RFFE GmbH 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206613 On DFF MU Tables in 38.903 discussion

revision of R5-206154

 Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206614 On the achievable SNR for FR2 demod and perf test cases discussion

revision of R5-206168

 Anritsu 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206615 On FR2 Blocker Test with Offset Antenna discussion

revision of R5-206173

 Anritsu 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206616 On FR2b Spurious emission MU discussion

revision of R5-206176

 Anritsu 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206617 On the MU of FR2 OBW discussion

revision of R5-206184

 ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206618 PC1 Assumptions for CDF Curve for MOP EIRP Spherical Coverage discussion

revision of R5-206185

 Qualcomm Japan LLC 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206785 Discussion on FR2 ON-OFF time mask discussion

revision of R5-205991

 Ericsson 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206786 On n259 MU and testability limit discussion

revision of R5-206174

 Anritsu R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206787 Discussion on the MU for band n259 discussion

revision of R5-206192

 ROHDE & SCHWARZ R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206789 Discussion paper on specific test frequencies for RRM testing discussion

revision of R5-205660

 Ericsson 5GS_NR_LTE-UEConTest Rel-15 R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206819 QoQZ and EIRP/EIS MU results for ETC testing discussion

revision of R5-206072

 Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206840 Proposing update to Rel-16 EN-DC PC2 MOP test cases based on TEI-16 maintenance in RAN4 discussion

revision of R5-206240

 Huawei, HiSilicon TEI16_Test Rel-16 R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206841 Discussion on test points in Receiver test cases for EN-DC configurations with exception requirements discussion

revision of R5-205990

 Ericsson, DISH, Orange 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]
R5-206842 Discussion on restructuring of TR 38.905 to better reflect the TS 38.521-x structure. discussion

revision of R5-205571

 Ericsson 5GS_NR_LTE-UEConTest R5-89-e

AI: 5.3.2.17

 noted [WTS] [JSN]

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