3GPP tdocs

Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc	Title	Type / Revs	Source	Spec / CR	S/WID	Release	Meeting	Status	Links

R5-153000	Agenda - opening session	agenda	WG Chairman				R5-68 AI: 1	available	[WTS] [JSN]
R5-153001	Agenda - mid week session	agenda	WG Chairman				R5-68 AI: 4.5	available	[WTS] [JSN]
R5-153002	Agenda - closing session	agenda	WG Chairman				R5-68 AI: 7.1	available	[WTS] [JSN]
R5-153003	RAN5#68 Session Programme	agenda	WG Chairman				R5-68 AI: 2.1	available	[WTS] [JSN]
R5-153004	RAN5 Leadership Team	other	WG Chairman				R5-68 AI: 2.1	available	[WTS] [JSN]
R5-153005	Previous RAN5#67 WG Minutes	report	ETSI Secretariat				R5-68 AI: 2.1	available	[WTS] [JSN]
R5-153006	Previous RAN5#67 WG Action Points	report	ETSI Secretariat				R5-68 AI: 2.1	available	[WTS] [JSN]
R5-153007	Latest RAN Plenary notes	report	WG Chairman				R5-68 AI: 2.1	reserved	[WTS] [JSN]
R5-153008	Latest RAN Plenary draft Report	report	WG Chairman				R5-68 AI: 2.1	available	[WTS] [JSN]
R5-153009	Post Plenary Active Work Item update	other	ETSI Secretariat				R5-68 AI: 2.1	available	[WTS] [JSN]
R5-153010	TF160 TTCN current status report	report	MCC TF160				R5-68 AI: 2.1	available	[WTS] [JSN]
R5-153011	RAN5 SR to RP#68	report	WG Chairman				R5-68 AI: 2.2	available	[WTS] [JSN]
R5-153012	TF160 SR to RP#68	report	WG Chairman				R5-68 AI: 2.2	available	[WTS] [JSN]
R5-153013	RAN Chair Report to SP#68	report	WG Chairman				R5-68 AI: 2.2	available	[WTS] [JSN]
R5-153014	GCF CAG Rel-8 & Rel-9 LTE TCL	other	WG Chairman				R5-68 AI: 2.2	reserved	[WTS] [JSN]
R5-153015	GCF LTE WIASR (Rel-8 & Rel-9)	other	WG Chairman				R5-68 AI: 2.2	available	[WTS] [JSN]
R5-153016	GCF UTRA & IMS TC prio	other	WG Chairman				R5-68 AI: 2.2	withdrawn	[WTS] [JSN]
R5-153017	Update of GCF UTRA and IMS priority list after CAG#43	other	Ericsson				R5-68 AI: 2.2	available	[WTS] [JSN]
R5-153018	RAN5 PRDs	other	WG Chairman				R5-68 AI: 4.3	reserved	[WTS] [JSN]
R5-153019	RAN5#68 LS Template	other	WG Chairman				R5-68 AI: 4.3	available	[WTS] [JSN]
R5-153020	Meeting schedule for 2015/16	agenda	WG Chairman				R5-68 AI: 4.4	available	[WTS] [JSN]
R5-153021	iWD/PRD Updates	other	WG Chairman				R5-68 AI: 7.2	reserved	[WTS] [JSN]
R5-153022	WP UE OTA (Ant) - Laptop mounted eqpt Free Space test	Work Plan	ZTE				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153023	SR UE OTA (Ant) - Laptop mounted eqpt Free Space test	WI status report	ZTE				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153024	WP UE Conformance Test Aspects - LTE UE TRP and TRS and UTRA Hand Phantom	Work Plan	ZTE				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153025	SR UE Conformance Test Aspects - LTE UE TRP and TRS and UTRA Hand Phantom	WI status report	ZTE				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153026	WP UE Conformance Test Aspects - Further Rel-12 Configurations for LTE Advanced Carrier Aggregation with 3DL	Work Plan	Huawei				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153027	SR UE Conformance Test Aspects - Further Rel-12 Configurations for LTE Advanced Carrier Aggregation with 3DL	WI status report	Huawei				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153028	WP UE Conformance Test Aspects – WLAN/3GPP Radio Interworking	Work Plan	Intel				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153029	SR UE Conformance Test Aspects – WLAN/3GPP Radio Interworking	WI status report	Intel				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153030	WP UE Conformance Test Aspects - Further DL MIMO Enhancement for LTE-Advanced	Work Plan	ZTE				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153031	SR UE Conformance Test Aspects - Further DL MIMO Enhancement for LTE-Advanced	WI status report	ZTE				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153032	WP UE Conformance Test Aspects – LTE Device-to-Device Proximity Services	Work Plan	Qualcomm				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153033	SR UE Conformance Test Aspects – LTE Device-to-Device Proximity Services	WI status report	Qualcomm				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153034	WP UE Conformance Test Aspects - L-band for Supplemental Downlink in E-UTRA and UTRA (Band number 32 for LTE and XXXII for UTRAN)	Work Plan	Ericsson				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153035	SR UE Conformance Test Aspects - L-band for Supplemental Downlink in E-UTRA and UTRA (Band number 32 for LTE and XXXII for UTRAN)	WI status report	Ericsson				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153036	WP UE Conformance Test Aspects - Low cost & enhanced coverage MTC UE for LTE	Work Plan	Ericsson				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153037	SR UE Conformance Test Aspects - Low cost & enhanced coverage MTC UE for LTE	WI status report	Ericsson				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153038	WP UE Conformance Test Aspects - Further Rel-12 configurations for LTE Advanced Carrier Aggregation with 2UL	Work Plan	Ericsson				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153039	SR UE Conformance Test Aspects - Further Rel-12 configurations for LTE Advanced Carrier Aggregation with 2UL	WI status report	Ericsson				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153040	WP UE Conformance Test Aspects - Codec for Enhanced Voice Services (EVS)	Work Plan	Ericsson				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153041	SR UE Conformance Test Aspects - Codec for Enhanced Voice Services (EVS)	WI status report	Ericsson				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153042	WP UE Conformance Test Aspects - Smart Congestion Mitigation in E-UTRAN	Work Plan	NTT DOCOMO				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153043	SR UE Conformance Test Aspects - Smart Congestion Mitigation in E-UTRAN	WI status report	NTT DOCOMO				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153044	WP UE Conformance Test Aspects - Performance Requirements of Interference Cancellation and Suppression Receiver for SU-MIMO for E-UTRA	Work Plan	Huawei				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153045	SR UE Conformance Test Aspects - Performance Requirements of Interference Cancellation and Suppression Receiver for SU-MIMO for E-UTRA	WI status report	Huawei				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153046	WP UE Conformance Test Aspects - DCH Enhancements for UMTS	Work Plan	Qualcomm				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153047	SR UE Conformance Test Aspects - DCH Enhancements for UMTS	WI status report	Qualcomm				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153048	WP UE Conformance Test Aspects - E-UTRA Small cell enhancements - Physical layer aspects	Work Plan	Huawei				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153049	SR UE Conformance Test Aspects - E-UTRA Small cell enhancements - Physical layer aspects	WI status report	Huawei				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153050	WP UE Conformance Test Aspects - Core Requirements for Uplink 64QAM for E-UTRA	Work Plan	CMCC				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153051	SR UE Conformance Test Aspects - Core Requirements for Uplink 64QAM for E-UTRA	WI status report	CMCC				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153052	WP UE Conformance Test Aspects - Dual connectivity for LTE	Work Plan	Ericsson				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153053	SR UE Conformance Test Aspects - Dual connectivity for LTE	WI status report	Ericsson				R5-68 AI: 7.3	available	[WTS] [JSN]
R5-153054	Updated TF 160 Report (TF Manager)	report	MCC TF160				R5-68 AI: 7.5	available	[WTS] [JSN]
R5-153055	RAN5 CRs for email agreement	other	ETSI Secretariat				R5-68 AI: 7.5	reserved	[WTS] [JSN]
R5-153056	Draft minutes of RAN5#68	report	ETSI Secretariat				R5-68 AI: 7.5	reserved	[WTS] [JSN]
R5-153057	Summary of RAN5 agreed CRs	other	ETSI Secretariat				R5-68 AI: 7.6	reserved	[WTS] [JSN]
R5-153058	WG SR to Plenary to become RP-15xxxx	report	WG Chairman				R5-68 AI: 7.6	reserved	[WTS] [JSN]
R5-153059	Updated meeting schedule for 2015/16	other	WG Chairman				R5-68 AI: 7.7	reserved	[WTS] [JSN]
R5-153060	Review deadlines for next quarter	other	WG Chairman				R5-68 AI: 7.7	reserved	[WTS] [JSN]
R5-153061	Look forward to the next RAN5 meeting	other	WG Chairman				R5-68 AI: 7.7	available	[WTS] [JSN]
R5-153062	Introduction of LTE eDL_MIMO applicability for TCs	CR	ZTE Corporation	36.521-2 12.6.0 CR#271 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153063	Correction to RC.2 TDD Nr. HARQ Proc.	CR	ZTE Corporation	36.521-1 12.6.0 CR#1985 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153064	Introduction of TC 8.16.38 3DL TDD CA activation and deactivation of known SCell in non-DRX	CR	ZTE Corporation	36.521-3 12.6.0 CR#1179 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153065	Introduction of TC 9.2.41.1 3 DL TDD Absolute RSRQ for E-UTRAN in Carrier Aggregation	CR	ZTE Corporation	36.521-3 12.6.0 CR#1180 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153066	Introduction of TC 9.2.41.2 3 DL TDD Relative RSRQ for E-UTRAN in Carrier Aggregation	CR	ZTE Corporation	36.521-3 12.6.0 CR#1181 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153067	Introduction of 3 DL TDD Absolute/Relative RSRQ for E-UTRAN in Carrier Aggregation	CR	ZTE Corporation	36.521-3 12.6.0 CR#1182 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153068	Introduction of TC 9.6.1.3.1 TDD FDD CA CQI Reporting – PUCCH 1-0 for FDD PCell (2DL CA)	CR	ZTE Corporation	36.521-1 12.6.0 CR#1986 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153069	Introduction of TC 9.6.1.3.2 TDD FDD CA CQI Reporting – PUCCH 1-0 for FDD PCell (3DL CA)	CR	ZTE Corporation	36.521-1 12.6.0 CR#1987 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153070	Introduction of TC 9.6.1.4.1 TDD FDD CA CQI Reporting – PUCCH 1-0 for TDD PCell (2DL CA)	CR	ZTE Corporation	36.521-1 12.6.0 CR#1988 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153071	Introduction of TC 9.6.1.4.2 TDD FDD CA CQI Reporting – PUCCH 1-0 for TDD PCell (3DL CA)	CR	ZTE Corporation	36.521-1 12.6.0 CR#1989 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153072	CA RF: Update of connection diagrams for 3CCs (RF) testing for more than 3CCs	CR	ROHDE & SCHWARZ	36.508 12.6.0 CR#611 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.1	available	[WTS] [JSN]
R5-153073	Updates to RAN5 PRD12	other	MCC TF160				R5-68 AI: 4.3	available	[WTS] [JSN]
R5-153074	Routine maintenance for TS 36.523-3	CR	MCC TF160	36.523-3 12.2.0 CR#2783 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.5.1	available	[WTS] [JSN]
R5-153075	Routine maintenance for TS 34.123-3	CR	MCC TF160	34.123-3 12.0.0 CR#3372 catF	TEI6_Test	Rel-12	R5-68 AI: 6.6.4.3	available	[WTS] [JSN]
R5-153076	Further status update on LTE (non-IMS) TCs regression test with IMS-enabled UEs	discussion	MCC TF160				R5-68 AI: 6.4.6	available	[WTS] [JSN]
R5-153077	3GPP / WLAN Radio Interworking: Status update of Test Model investigations	discussion	MCC TF160				R5-68 AI: 6.3.2.9	available	[WTS] [JSN]
R5-153078	Extension of SCM test case 13.5.1	CR	MCC TF160	36.523-1 12.6.0 CR#3030 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.1	available	[WTS] [JSN]
R5-153079	Correction to SCM test case 13.5.2	CR	MCC TF160	36.523-1 12.6.0 CR#3031 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.1	available	[WTS] [JSN]
R5-153080	Correction of PICS references in test applicabilities	CR	MCC TF160	36.523-1 12.6.0 CR#3032 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.2	withdrawn	[WTS] [JSN]
R5-153081	Correction of PICS references in test applicabilities	CR	MCC TF160	34.229-2 12.5.0 CR#147 catF	TEI11_Test	Rel-12	R5-68 AI: 6.6.6.2	withdrawn	[WTS] [JSN]
R5-153082	Updates to rSRVCC test case 13.4.3.40	CR	MCC TF160, Intel, Anite	36.523-1 12.6.0 CR#3033 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.8	available	[WTS] [JSN]
R5-153083	Updates to generic test procedure C.43	CR	MCC TF160, Intel	34.229-1 12.6.0 CR#705 catF	TEI11_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153084	Correction to generic test procedure C.24	CR	MCC TF160	34.229-1 12.6.0 CR#706 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153085	Text proposal for TS 37.544 v0.4.0 Subclause 7.1.1	pCR	Sporton International Inc., Sony Mobile Communications	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153086	Text proposal for TS 37.544 v0.4.0 Subclause 7.1.2	pCR	Sporton International Inc., Sony Mobile Communications	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153087	Text proposal for TS 37.544 v0.4.0 Subclause 7.2.1	pCR	Sporton International Inc., Sony Mobile Communications	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153088	Text proposal for TS 37.544 v0.4.0 Subclause 7.2.2	pCR	Sporton International Inc., Sony Mobile Communications	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153089	Text proposal for TS 37.544 v0.4.0 Subclause 7.2.3	pCR	Sporton International Inc., Sony Mobile Communications	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153090	Text proposal for TS 37.544 v0.4.0 Subclause 7.2.4	pCR	Sporton International Inc., Sony Mobile Communications	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153091	Text proposal for TS 37.544 v0.4.0 Annex I	pCR	Sporton International Inc., Sony Mobile Communications	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153092	Text proposal for TS 37.544 v0.4.0 Annex J	pCR	Sporton International Inc., Sony Mobile Communications	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153093	Correction to TS 37.544 v0.4.0 Annex K	pCR	Sporton International Inc., Sony Mobile Communications	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153094	Addition of cell configuration mapping for RRM test cases 8.16.17 and 8.16.18	CR	Bureau Veritas ADT	36.521-3 12.6.0 CR#1183 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153095	Correction of cell configuration mapping for RRM cases	CR	Bureau Veritas ADT	36.521-3 12.6.0 CR#1184 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153096	Correction of RMC used in UE Timing Advance Adjustment Accuracy Test for SCell in sTAG	CR	Bureau Veritas ADT	36.521-3 12.6.0 CR#1185 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153097	Correction of descriptions for test cases 8.16.18	CR	Bureau Veritas ADT	36.521-3 12.6.0 CR#1186 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153098	Update editor’s note for RRM test case 8.16.17 and 8.16.18	CR	Bureau Veritas ADT	36.521-3 12.6.0 CR#1187 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153099	Addition of RMCs for UL 64QAM in Table A.2.1.3-1	CR	Bureau Veritas ADT	36.521-1 12.6.0 CR#1990 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153100	Corrections to EVM and Carrier leakage CA test cases	CR	Bureau Veritas ADT	36.521-1 12.6.0 CR#1991 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-153101	Update of EVM minimum requirements	CR	Bureau Veritas ADT	36.521-1 12.6.0 CR#1992 catF	TEI9_Test	Rel-12	R5-68 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-153102	Introduction of TC 8.8.1.4 Successful Acceptance/Rejection of Direct Communication announcements	CR	TechMahindra Ltd	36.523-1 12.6.0 CR#3034 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.3	available	[WTS] [JSN]
R5-153103	Addition of TC 8.8.2.4 D2D test case for successful acceptance/rejection of Direct Discovery announcements	CR	TechMahindra Ltd	36.523-1 12.6.0 CR#3035 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.3	available	[WTS] [JSN]
R5-153104	Addition of new test case TC 6.4.5 - WLAN Offload / Cell Selection / UTRA RRC_Idle to/from WLAN Failure (WLAN identifier does not match)	CR	TechMahindra Ltd	34.123-1 12.0.0 CR#3758 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	available	[WTS] [JSN]
R5-153105	Addition of new test case TC 8.2.10.1 - WLAN Offload / Offload Success / UTRA RRC_Connected to/from WLAN (RSRPmeas, BackhaulRateUlWLAN)	CR	TechMahindra Ltd	34.123-1 12.0.0 CR#3759 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	available	[WTS] [JSN]
R5-153106	Add applicability for new WLAN test case 6.4.5 and 8.2.10.1	CR	TechMahindra Ltd	34.123-2 12.0.0 CR#741 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.3	available	[WTS] [JSN]
R5-153107	Add applicability for new D2D test case 8.8.1.4 and 8.8.2.4	CR	TechMahindra Ltd	36.523-2 12.6.0 CR#756 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.4	available	[WTS] [JSN]
R5-153108	Corrections to UTC Model and Time Model	CR	Spirent Communications	37.571-5 12.2.0 CR#118 catF	TEI12_Test	Rel-12	R5-68 AI: 5.5.11	available	[WTS] [JSN]
R5-153109	Update to Galileo Assistance Data IEs	CR	Spirent Communications	37.571-5 12.2.0 CR#119 catF	TEI12_Test	Rel-12	R5-68 AI: 5.5.11	available	[WTS] [JSN]
R5-153110	Correction to GANSS Multi-frequency Measurement Requested IE	CR	Spirent Communications	37.571-2 12.2.0 CR#59 catF	TEI7_Test	Rel-12	R5-68 AI: 6.6.7.1	available	[WTS] [JSN]
R5-153111	Corrections to MEASUREMENT CONTROL messages	CR	Spirent Communications	37.571-2 12.2.0 CR#60 catF	TEI7_Test	Rel-12	R5-68 AI: 6.6.7.1	available	[WTS] [JSN]
R5-153112	Corrections to UTC Model	CR	Spirent Communications	37.571-5 12.2.0 CR#120 catF	TEI12_Test	Rel-12	R5-68 AI: 6.6.7.4	available	[WTS] [JSN]
R5-153113	Update to Galileo Assistance Data IEs	CR	Spirent Communications	37.571-5 12.2.0 CR#121 catF	TEI12_Test	Rel-12	R5-68 AI: 6.6.7.4	available	[WTS] [JSN]
R5-153114	Prevent unnecessary IMS signalling over GERAN for non-IMS related test cases	CR	MCC TF160	36.508 12.6.0 CR#612 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.1	available	[WTS] [JSN]
R5-153115	Updates to EMM test case 9.1.5.1	CR	MCC TF160	36.523-1 12.6.0 CR#3036 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.4	withdrawn	[WTS] [JSN]
R5-153116	Introduction of eDL MIMO enhancement TC 9.3.7.1_G	CR	HEPTA 7291	36.521-1 12.6.0 CR#1993 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-68 AI: 5.3.4.1	available	[WTS] [JSN]
R5-153117	Introduction of eDL MIMO enhancement TC 9.3.7.2_G	CR	HEPTA 7291	36.521-1 12.6.0 CR#1994 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-68 AI: 5.3.4.1	available	[WTS] [JSN]
R5-153118	Introduction of eDL MIMO enhancement TC 9.4.1.4.1_G	CR	HEPTA 7291	36.521-1 12.6.0 CR#1995 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-68 AI: 5.3.4.1	available	[WTS] [JSN]
R5-153119	Introduction of eDL MIMO enhancement TC 9.4.1.4.2_G	CR	HEPTA 7291	36.521-1 12.6.0 CR#1996 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-68 AI: 5.3.4.1	available	[WTS] [JSN]
R5-153120	Text proposal to TS 37.544 v0.4.0 for TC 6.1.2	pCR	HEPTA 7291	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153121	Text proposal to TS 37.544 v0.4.0 for TC 6.1.7	pCR	HEPTA 7291	37.544 0.4.0	LTE_eDL_MIMO_enh-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153122	Text proposal to TS 37.544 v0.4.0 for TC 6.1.8	pCR	HEPTA 7291	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153123	Text proosal to TS 37.544 v0.4.0 for TC 6.1.9	pCR	HEPTA 7291	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153124	Text proposal to TS 37.544 v0.4.0 for TC 6.1.10	pCR	HEPTA 7291	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153125	Text proposal to TS 37.544 v0.4.0 for TC 6.2.1	pCR	HEPTA 7291	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153126	Text proposal to TS 37.544 v0.4.0 for TC 6.2.2	pCR	HEPTA 7291	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153127	Text proposal to TS 37.544 v0.4.0 for TC 6.2.3	pCR	HEPTA 7291	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153128	Text proposal to TS 37.544 v.0.4.0 for TC 6.2.4	pCR	HEPTA 7291	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153129	TS 37.544: User Equipment (UE) and Mobile Station (MS) Over The Air (OTA) performance v0.5.0	pCR	HEPTA 7291	37.544 0.5.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 7.5	available	[WTS] [JSN]
R5-153130	Update of eDL MIMO enhancement TC 9.4.2.3.3_G	CR	SGS Wireless	36.521-1 12.6.0 CR#1997 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-68 AI: 5.3.4.1	available	[WTS] [JSN]
R5-153131	Update of eDL MIMO enhancement TC 9.4.2.3.4_G	CR	SGS Wireless	36.521-1 12.6.0 CR#1998 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-68 AI: 5.3.4.1	available	[WTS] [JSN]
R5-153132	Introduction of SUMIMO for LTE Type C performance TC 8.2.2.3.1B	CR	SGS Wireless	36.521-1 12.6.0 CR#1999 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	available	[WTS] [JSN]
R5-153133	New TC: E-UTRAN TDD - UE Timing Advance Adjustment Accuracy Test for Scell in sTAG for 20 MHz +20 MHz bandwidth	CR	SGS Wireless, Bureau Veritas ADT	36.521-3 12.6.0 CR#1188 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153134	New TC: E-UTRAN TDD - UE Timing Advance Adjustment Accuracy Test for Scell in sTAG for 20 MHz +10 MHz bandwidth	CR	SGS Wireless, Bureau Veritas ADT	36.521-3 12.6.0 CR#1189 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153135	New TC: E-UTRAN TDD activation and deactivation of known SCell in non-DRX for 20MHz +20MHz bandwidth	CR	SGS Wireless, Bureau Veritas ADT	36.521-3 12.6.0 CR#1190 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153136	New TC: 9.7.1.2 TDD CQI reporting definition under AWGN conditions for UE category 0	CR	SGS Wireless	36.521-1 12.6.0 CR#2000 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153137	Correction to LTE FDD-TDD Inter-mode test case 8.3.1.13a	CR	Spreadtrum Communications	36.523-1 12.6.0 CR#3037 catF	TEI9_Test	Rel-12	R5-68 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-153138	Correction to EUTRA measurement test case 8.3.1.13	CR	Spreadtrum Communications	36.523-1 12.6.0 CR#3038 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-153139	Correction to EUTRA idle mode test case 6.1.2.17	CR	Spreadtrum Communications	36.523-1 12.6.0 CR#3039 catF	TEI9_Test	Rel-12	R5-68 AI: 6.4.3.1	available	[WTS] [JSN]
R5-153140	Correction of PICS references in test applicabilities	CR	MCC TF160	36.523-2 12.6.0 CR#757 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.2	available	[WTS] [JSN]
R5-153141	Routine maintenance for TS 34.123-3 TDD	CR	MCC TF160, CATT	34.123-3 12.0.0 CR#3373 catF	TEI7_Test	Rel-12	R5-68 AI: 6.6.1.4	available	[WTS] [JSN]
R5-153142	Low-cost MTC: Introduction of Test Model	CR	MCC TF160	36.523-3 12.2.0 CR#2784 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.5	available	[WTS] [JSN]
R5-153143	FDD-TDD CA: Introduction of Test Model	CR	MCC TF160	36.523-3 12.2.0 CR#2785 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 6.3.1.4	available	[WTS] [JSN]
R5-153144	Test Cases with branches depending on UE capabilities/configuration	LS in	GCF CAG				R5-68 AI: 3	available	[WTS] [JSN]
R5-153145	Outstanding audio scenarios	LS in	GCF PAG				R5-68 AI: 3	available	[WTS] [JSN]
R5-153146	LIAISON STATEMENT TO GCS PROPONENTS* OF IMT-ADVANCED RELATED TO the revision OF RECOMMENDATIONS FOR Generic unwanteD EMISSION CHARACTERISTICS	LS in	ITU-R WP5D				R5-68 AI: 3	available	[WTS] [JSN]
R5-153147	LS on Out-of-band blocking for 2UL CA	LS in	TSG WG RAN4				R5-68 AI: 3	available	[WTS] [JSN]
R5-153148	Reply LS on LTE Rel-12 UE feature list	LS in	TSG RAN				R5-68 AI: 3	available	[WTS] [JSN]
R5-153149	Correct the IMS APN format	CR	Ericsson, Qualcomm	36.508 12.6.0 CR#613 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.1	available	[WTS] [JSN]
R5-153150	Missing RSTD information for multiple test cases	CR	PCTEST Engineering Lab	37.571-5 12.2.0 CR#122 catF	TEI12_Test	Rel-12	R5-68 AI: 6.6.7.4	available	[WTS] [JSN]
R5-153151	Missing BDS reference in the A-GNSS Minimum Performance Testing	CR	PCTEST Engineering Lab	37.571-5 12.2.0 CR#123 catF	TEI12_Test	Rel-12	R5-68 AI: 6.6.7.4	available	[WTS] [JSN]
R5-153152	Incorrect ICS information in Table 4-7	CR	PCTEST Engineering Lab	37.571-3 12.3.0 CR#36 catF	TEI12_Test	Rel-12	R5-68 AI: 6.6.7.2	available	[WTS] [JSN]
R5-153153	Missing " earlyFixReport-r12 " in Table 7.2.2.2.3.3-13	CR	PCTEST Engineering Lab	37.571-2 12.2.0 CR#61 catF	TEI12_Test	Rel-12	R5-68 AI: 6.6.7.1	available	[WTS] [JSN]
R5-153154	VOID TC 8.1.2.27 RRC Connection Establishment using the default configuration#23 for HSDSCH/ E-DCH signalling bearers	CR	QUALCOMM Incorporated	34.123-1 9.9.0 CR#3760 catF	TEI9_Test	Rel-9	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153155	VOID Applicability of TC 8.1.2.27	CR	QUALCOMM Incorporated	34.123-2 9.9.0 CR#742 catF	TEI9_Test	Rel-9	R5-68 AI: 6.6.4.2	available	[WTS] [JSN]
R5-153156	New TC: E-UTRAN TDD - UE Transmit Timing Accuracy Tests for SCell in sTAG for 20MHz + 20MHz bandwidth	CR	Bureau Veritas ADT	36.521-3 12.6.0 CR#1191 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153157	New TC: E-UTRAN TDD - UE Transmit Timing Accuracy Tests for SCell in sTAG for 20MHz + 10MHz bandwidth	CR	Bureau Veritas ADT	36.521-3 12.6.0 CR#1192 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153158	Addition of applicability for newly introduced 20MHz+20MHz and 20MHz+10MHz cases (Rel-12)	CR	Bureau Veritas ADT	36.521-2 12.6.0 CR#272 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153159	New CA band combination CA_1A-5A-7A - Updates of 7.3.3 Delta RIB and 7.3A Refsens Test Configuration	CR	LG Uplus	36.521-1 12.6.0 CR#2001 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3	available	[WTS] [JSN]
R5-153160	Correction of minimum requirements and test procedures for 8.2.2.1.1_A.1	CR	Bureau Veritas ADT	36.521-1 12.6.0 CR#2002 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153161	Corrections to 8.2.2.3.1_A.1	CR	Bureau Veritas ADT	36.521-1 12.6.0 CR#2003 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153162	Test applicability for TC 9.7.1.2	CR	SGS Wireless	36.521-2 12.6.0 CR#273 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.3	available	[WTS] [JSN]
R5-153163	Addition of operating bands for CA_39A-41C and CA_39C-41A	CR	Bureau Veritas ADT	36.521-1 12.6.0 CR#2004 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153164	New TC: E-UTRAN TDD - UE Transmit Timing Accuracy Tests for SCell for 20MHz + 10MHz bandwidth	CR	Bureau Veritas ADT	36.521-3 12.6.0 CR#1193 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153165	Addition of applicability for newly introduced TC8.16.18A (Rel-10)	CR	Bureau Veritas ADT	36.521-2 12.6.0 CR#274 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153166	Addition of applicability for newly introduced TC7.1.4A (Rel-11)	CR	Bureau Veritas ADT	36.521-2 12.6.0 CR#275 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153167	Cell configuration mapping for newly introduced 20+20MHz and 20+10MHz cases	CR	Bureau Veritas ADT	36.521-3 12.6.0 CR#1194 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153168	Introduction of RMCs for UL 64QAM in A.2.2	CR	Bureau Veritas ADT	36.521-1 12.6.0 CR#2005 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153169	Corrections to MTC test applicabilities	CR	Bureau Veritas ADT	36.521-2 12.6.0 CR#276 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.3	available	[WTS] [JSN]
R5-153170	Introduction of RC.16 TDD and RC.16 FDD in Table A.4-1	CR	Bureau Veritas ADT	36.521-1 12.6.0 CR#2006 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153171	Update of 6.2.3_2 MPR for Multi-Cluster PUSCH	CR	Bureau Veritas ADT	36.521-1 12.6.0 CR#2007 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-153172	Correction to applicability of TD-LTE to UTRA TDD connected mode measurements	CR	QUALCOMM UK Ltd	36.521-3 12.6.0 CR#1195 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153173	Correction to applicability of EUTRA TDD to UTRA TDD connected mode measurements	CR	QUALCOMM UK Ltd	36.521-2 12.6.0 CR#277 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153174	Correction to cell mapping of eICIC Chapter 9 test cases	CR	QUALCOMM UK Ltd	36.521-3 12.6.0 CR#1196 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153175	Update Test Tolerance analyses for TS 36.521-3 Test case 4.3.1.1	CR	ANRITSU LTD	36.903 12.6.0 CR#205 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-153176	Addition of missing titles to section 8 RRM test cases	CR	QUALCOMM UK Ltd	36.521-3 12.6.0 CR#1197 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153177	Update Test Tolerances and Test requirements for Test case 4.3.1.1	CR	ANRITSU LTD	36.521-3 12.6.0 CR#1198 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-153178	Update Test Tolerance analyses for Test case 4.3.4.1	CR	ANRITSU LTD	36.903 12.6.0 CR#206 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-153179	Update Test Tolerances and Test requirements for Test case 4.3.4.1	CR	ANRITSU LTD	36.521-3 12.6.0 CR#1199 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-153180	Update Test Tolerance analyses for TS 36.521-3 Test cases 5.1.3+5.1.4+5.1.7+5.1.8	CR	ANRITSU LTD	36.903 12.6.0 CR#207 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-153181	Update Test Tolerances and Test requirements for Test cases 5.1.3+5.1.4+5.1.7+5.1.8	CR	ANRITSU LTD	36.521-3 12.6.0 CR#1200 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-153182	Introduction of 3DL CA Event triggered reporting Test cases 8.16.27 and 8.16.28	CR	ANRITSU LTD	36.521-3 12.6.0 CR#1201 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153183	Introduction of 3DL CA RSRP accuracy Test cases 9.1.37 and 9.1.38	CR	ANRITSU LTD	36.521-3 12.6.0 CR#1202 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153184	3DL CA RRM Test Tolerance analysis strategy	discussion	ANRITSU LTD		LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.	available	[WTS] [JSN]
R5-153185	Align Test Procedure and Test requirements for 7.5A.5 ACS 3DL CA	CR	ANRITSU LTD	36.521-1 12.6.0 CR#2008 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153186	Revise Power Control Relative power tolerance for 2 UL CA test case 6.3.5A.2.1	CR	ANRITSU LTD	36.521-1 12.6.0 CR#2009 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153187	Align Test requirements for 7.4A.5 Max Input 3DL CA	CR	ANRITSU LTD	36.521-1 12.6.0 CR#2010 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153188	Introduction of new RRC default message - SidelinkUEInformation	CR	TechMahindra Ltd	36.508 12.6.0 CR#614 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.1	available	[WTS] [JSN]
R5-153189	Correction to Rel-8 Absolute Priority cell reselection testcase 6.1.2.12	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3761 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153190	Correction to Re-8 ETWS testcase 8.1.1.19	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3762 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153191	Correction to Rel-10 NIMTC testcase 11.1.3.4	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3763 catF	TEI10_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153192	Correction to Rel-7 NISPC testcases	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3764 catF	TEI7_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153193	Correction to Rel-10 NIMTC testcases 9.4.5.5 and 12.4.3.2a	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3765 catF	TEI10_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153194	Correction to Rel-8 SS testcase 15.4.3	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3766 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153195	Correction to Rel-8 SS testcase 15.8.1	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3767 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153196	Correction to Rel-8 SS testcase 15.8.4	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3768 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153197	Correction to Rel-8 SS testcase 15.8.5	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3769 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153198	Correction to Rel-8 SS testcase 15.8.6	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3770 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153199	Correction to Rel-8 SS testcase 15.9.1	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3771 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153200	Correction to Rel-8 SS testcase 15.9.3 & 15.9.4	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3772 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153201	IMS over WLAN	discussion	Ericsson				R5-68 AI: 4.2	available	[WTS] [JSN]
R5-153202	Correction to 200 OK in C.28	CR	ROHDE & SCHWARZ, Qualcomm, China Mobile	34.229-1 12.6.0 CR#707 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153203	Correction to TC 8.2.4.24.1 - CA / RRC connection reconfiguration / SCell Addition and Release / Success /RRC Processing Delay/Intra-Band Contiguous CA	CR	QUALCOMM Incorporated	36.523-1 10.4.0 CR#3040 catF	TEI10_Test	Rel-10	R5-68 AI: 6.4.3.3.2	available	[WTS] [JSN]
R5-153204	Introduction of New Test Cases 8.2.4.24.2 and 8.2.4.24.3	CR	QUALCOMM Incorporated	36.523-1 10.4.0 CR#3041 catF	TEI10_Test	Rel-10	R5-68 AI: 6.4.3.3.2	available	[WTS] [JSN]
R5-153205	Add Applicability for New TC 8.2.4.24.2 and 8.2.4.24.3	CR	QUALCOMM Incorporated	36.523-2 10.3.0 CR#758 catF	TEI10_Test	Rel-10	R5-68 AI: 6.4.4	available	[WTS] [JSN]
R5-153206	Introduction of new test case 8.2.2.90 - Radio Bearer Reconfiguration in CELL_DCH: Successful Reconfiguration of DCH Enhancement in Full Mode	CR	QUALCOMM Incorporated	34.123-1 12.0.0 CR#3773 catF	UTRA_DCHenh-UEConTest	Rel-12	R5-68 AI: 6.3.9.2	available	[WTS] [JSN]
R5-153207	Introduction of new test case 8.2.2.91 - Radio Bearer Reconfiguration for transition to CELL_DCH with SRBs mapped on DCH: Successful Activation and Deactivation of DCH Enhancement in Basic Mode	CR	QUALCOMM Incorporated	34.123-1 12.0.0 CR#3774 catF	UTRA_DCHenh-UEConTest	Rel-12	R5-68 AI: 6.3.9.2	available	[WTS] [JSN]
R5-153208	Introduction of new test case 8.2.2.92 - Radio Bearer Reconfiguration for transition to CELL_DCH with SRBs mapped on DCH: Successful Activation and Deactivation of DCH Enhancement in Full Mode	CR	QUALCOMM Incorporated	34.123-1 12.0.0 CR#3775 catF	UTRA_DCHenh-UEConTest	Rel-12	R5-68 AI: 6.3.9.2	available	[WTS] [JSN]
R5-153209	Add Applicability for New DCH Enhancement Test Case 8.2.2.90, 8.2.2.91 and 8.2.2.92	CR	QUALCOMM CDMA Technologies	34.123-2 12.0.0 CR#743 catF	UTRA_DCHenh-UEConTest	Rel-12	R5-68 AI: 6.3.9.3	available	[WTS] [JSN]
R5-153210	Update to Device to Device Proximity Services Test Environment	CR	QUALCOMM Incorporated, Ericsson	36.508 12.6.0 CR#615 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.1	available	[WTS] [JSN]
R5-153211	Correction to Device to Device Proximity Services Test Loop	CR	QUALCOMM Incorporated, Ericsson	36.509 12.0.0 CR#142 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.2	available	[WTS] [JSN]
R5-153212	Correction to D2D test case 19.2.1 for Successful Announce Request Procedure/Direct discovery	CR	QUALCOMM Incorporated	36.523-1 12.6.0 CR#3042 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.3	available	[WTS] [JSN]
R5-153213	Update to FDD PDSCH Open Loop Spatial Multiplexing 2x2 for CA (3DL CA)	CR	LG Electronics Inc., NTT DOCOMO	36.521-1 12.6.0 CR#2011 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153214	Update to FDD PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 for CA (3DL CA)	CR	LG Electronics Inc.	36.521-1 12.6.0 CR#2012 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153215	Update to TDD PDSCH Open Loop Spatial Multiplexing 2x2 for CA (3DL CA)	CR	LG Electronics Inc.	36.521-1 12.6.0 CR#2013 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153216	Update to TDD PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 for CA (3DL CA)	CR	LG Electronics Inc.	36.521-1 12.6.0 CR#2014 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153217	Introduction of 3DL Pcell in FDD RSRQ for E-UTRAN in Carrier Aggregation	CR	LG Electronics Inc., NTT DOCOMO	36.521-3 12.6.0 CR#1203 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153218	Addition of a new D2D test case for Successful Reception and Transmission/ProSe Direct Discovery	CR	LG Electronics Inc.	36.523-1 12.6.0 CR#3043 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.3	available	[WTS] [JSN]
R5-153219	Addition of a new D2D test case for RRC Reconfiguration/Direct Discovery	CR	LG Electronics Inc.	36.523-1 12.6.0 CR#3044 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.3	available	[WTS] [JSN]
R5-153220	Addition of applicability for new TC “Successful Reception and Transmission/Direct Discovery ”	CR	LG Electronics Inc.	36.523-2 12.6.0 CR#759 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.4	available	[WTS] [JSN]
R5-153221	Addition of applicability for new TC “RRC Reconfiguration/Direct Discovery”	CR	LG Electronics Inc.	36.523-2 12.6.0 CR#760 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.4	available	[WTS] [JSN]
R5-153222	Discussion paper on updating legacy protocol test cases for Category 0 UE	other	Ericsson		LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.6	available	[WTS] [JSN]
R5-153223	Add minimum loopback buffer size requirement for Category 0 UE	CR	Ericsson	36.509 12.0.0 CR#143 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.2	available	[WTS] [JSN]
R5-153224	New E-UTRA MAC test case 7.1.3.3a for DL MAC PDU header handling for Category 0 UE	CR	Ericsson	36.523-1 12.6.0 CR#3045 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	available	[WTS] [JSN]
R5-153225	New E-UTRA MAC test case 7.1.4.3a for logical channel prioritization handling for Category 0 UE	CR	Ericsson	36.523-1 12.6.0 CR#3046 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	available	[WTS] [JSN]
R5-153226	Correction of E-UTRA MAC test case 7.1.4.13 for Category 0 UE	CR	Ericsson	36.523-1 12.6.0 CR#3047 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	available	[WTS] [JSN]
R5-153227	New E-UTRA MAC test case 7.1.2.24a TTI bundling without resource allocation restriction for Category 0 UE	CR	Ericsson	36.523-1 12.6.0 CR#3048 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	available	[WTS] [JSN]
R5-153228	Correction of E-UTRA RLC test case 7.2.3.1 for Category 0 UE	CR	Ericsson	36.523-1 12.6.0 CR#3049 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	available	[WTS] [JSN]
R5-153229	Correction of E-UTRA RLC test case 7.2.3.5 for Category 0 UE	CR	Ericsson	36.523-1 12.6.0 CR#3050 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	available	[WTS] [JSN]
R5-153230	Correction of E-UTRA RLC test case 7.2.3.9 for Category 0 UE	CR	Ericsson	36.523-1 12.6.0 CR#3051 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	available	[WTS] [JSN]
R5-153231	Correction of DRB generic test procedure in clause 12.1.1 for Category 0 UE	CR	Ericsson	36.523-1 12.6.0 CR#3052 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	available	[WTS] [JSN]
R5-153232	Add applicability of new and update applicability of existing protocol test cases for Category 0 UE	CR	Ericsson	36.523-2 12.6.0 CR#761 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.4	available	[WTS] [JSN]
R5-153233	IMS Testing on fixed access terminals	discussion	Telecom Italia, AT&T, Bell Canada, Deutsche Telekom, Ericsson, NEC, NTT, Orange, Qualcomm, Telefonica, Telekom Austria, ZTE				R5-68 AI: 4.2	available	[WTS] [JSN]
R5-153234	Editorial correction to E-UTRA MAC test case 7.1.3.3	CR	Ericsson LM	36.523-1 12.6.0 CR#3053 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.2.1	available	[WTS] [JSN]
R5-153235	Update of applicability for CA 2UL protocol test cases	CR	Ericsson	36.523-2 12.6.0 CR#762 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 6.3.6.3	available	[WTS] [JSN]
R5-153236	Addition of additional capabilities for Enhanced performance requirements type C for LTE	CR	SGS Wireless, Huawei	36.521-2 12.6.0 CR#278 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.3	available	[WTS] [JSN]
R5-153237	Un-subscriptions before de-registrations	CR	ROHDE & SCHWARZ, Anite	34.229-1 12.6.0 CR#708 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153238	Subscription to conf event: in-dialog or out-of-dialog?	CR	ROHDE & SCHWARZ	34.229-1 12.6.0 CR#709 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153239	CA RF: Clarification of PUCCH Format for ACK/NACK feedback	CR	Rohde & Schwarz	36.521-1 12.6.0 CR#2015 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153240	UE Cat 0: Connection diagrams for RF/RRM testing	CR	Rohde & Schwarz	36.508 12.6.0 CR#616 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.1	available	[WTS] [JSN]
R5-153241	UE Cat 0 RF: Addition to Annex I	CR	Rohde & Schwarz	36.521-1 12.6.0 CR#2016 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153242	eICIC RRM: Corrections to cell mapping Table E-1	CR	Rohde & Schwarz	36.508 12.6.0 CR#617 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.1	available	[WTS] [JSN]
R5-153243	CA RF: Minor corrections	CR	Rohde & Schwarz	36.521-1 12.6.0 CR#2017 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-153244	eDL-MIMO RF: Minor corrections	CR	Rohde & Schwarz	36.521-1 12.6.0 CR#2018 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153245	CA RF: Correction to applicability of SDR test	CR	Rohde & Schwarz	36.521-1 12.6.0 CR#2019 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153246	RF: Applicability of CSI requirements to UE Category 1 (for 36.521-1)	CR	Rohde & Schwarz	36.521-1 12.6.0 CR#2020 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153247	eICIC and feICIC RF: Corrections to PDSCH RMCs used for PDCCH performance	CR	Rohde & Schwarz	36.521-1 12.6.0 CR#2021 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153248	RF: Applicability of CSI requirements to UE Category 1 (for 36.521-2)	CR	Rohde & Schwarz	36.521-2 12.6.0 CR#279 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153249	CA RRM: Clarification of PHICH configuration	CR	Rohde & Schwarz	36.521-3 12.6.0 CR#1204 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153250	RRM: Minor correction to TC 8.7.2	CR	Rohde & Schwarz	36.521-3 12.6.0 CR#1205 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153251	Uncertainties and Test tolerances for TS 36.521-3 Test case 8.20.2B	CR	Rohde & Schwarz	36.521-3 12.6.0 CR#1206 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-153252	Add Test Tolerance analysis for TS 36.521-3 Test case 8.20.2B	CR	Rohde & Schwarz	36.903 12.6.0 CR#208 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-153253	CA LBS: Clarification of PHICH configuration	CR	Rohde & Schwarz	37.571-1 12.3.0 CR#140 catF	TEI10_Test	Rel-12	R5-68 AI: 5.5.9	available	[WTS] [JSN]
R5-153254	Extending the registration expiration interval	CR	ROHDE & SCHWARZ	34.229-1 12.6.0 CR#710 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153255	Correction to Route header in MO INVITE	CR	ROHDE & SCHWARZ	34.229-1 12.6.0 CR#711 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153256	Editorial corrections to C.20	CR	ROHDE & SCHWARZ	34.229-1 12.6.0 CR#712 catD	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153257	Routine maintenance for TS 34.229-3	CR	MCC TF160	34.229-3 11.0.0 CR#318 catF	TEI8_Test	Rel-11	R5-68 AI: 6.6.6.3	available	[WTS] [JSN]
R5-153258	Corrections to TCs 15.27 and 15.28	CR	ROHDE & SCHWARZ	34.229-1 12.6.0 CR#713 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153259	Further corrections for SDP o-lines	CR	MCC TF160	34.229-1 12.6.0 CR#714 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153260	Content-Type and Content-Length for 200 OK for other requests than REGISTER or SUBSCRIBE in case of SDP body	CR	MCC TF160	34.229-1 12.6.0 CR#715 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153261	Multiple tag-values in icsi-ref feature parameter	CR	ROHDE & SCHWARZ, Qualcomm	34.229-1 12.6.0 CR#716 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153262	Correction of test case 15.21b	CR	MCC TF160	34.229-1 12.6.0 CR#717 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153263	Correction to eMBMS test case 17.4.5	CR	Anite Telecoms Ltd., Samsung	36.523-1 12.6.0 CR#3054 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.11	available	[WTS] [JSN]
R5-153264	Editorial corrections	CR	MCC TF160	34.229-1 12.6.0 CR#718 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153265	Usage of GRUU in 34.229-1	discussion	MCC TF160				R5-68 AI: 6.6.6.5	available	[WTS] [JSN]
R5-153266	Clarifications to handle GRUU in SIP signalling	CR	MCC TF160	34.229-1 12.6.0 CR#719 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153267	Text proposal for TS 37.544 v0.4.0 Subclause 7.1.7	pCR	Intel Corporation (UK) Ltd	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153268	Text proposal for TS 37.544 v0.4.0 Subclause 7.1.8	pCR	Intel Corporation (UK) Ltd	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153269	Text proposal for TS 37.544 v0.4.0 Subclause 7.1.9	pCR	Intel Corporation (UK) Ltd	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153270	Text proposal for TS 37.544 v0.4.0 Subclause 7.1.10	pCR	Intel Corporation (UK) Ltd	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153271	Updates to TS 37.544 v0.4.0 Subclause 7.1.3 & 7.1.4	pCR	Intel Corporation (UK) Ltd	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-68 AI: 5.3.2.1	available	[WTS] [JSN]
R5-153272	Update TC 8.3.1.1d Inter-frequency absolute priority based reselection in CELL_FACH (Lower Priority)	CR	QUALCOMM Incorporated, MCC TF160	34.123-1 11.7.0 CR#3776 catF	TEI11_Test	Rel-11	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153273	Update TC 8.3.1.1e Inter-frequency absolute priority based reselection in CELL_FACH (Higher Priority)	CR	QUALCOMM Incorporated, MCC TF160	34.123-1 11.7.0 CR#3777 catF	TEI11_Test	Rel-11	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153274	Update of TC 8.3.1.1f - Inter-frequency reselection to a no priority layer when NW and UE supports absolute priority in CELL_FACH	CR	QUALCOMM Incorporated, MCC TF160	34.123-1 11.7.0 CR#3778 catF	TEI11_Test	Rel-11	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153275	Correction to Applicability for FE-FACH Test Cases 8.3.1.1d, 8.3.1.1e and 8.3.1.1f	CR	QUALCOMM Incorporated, MCC TF160, Ericsson	34.123-2 11.7.0 CR#744 catF	TEI11_Test	Rel-11	R5-68 AI: 6.6.4.2	available	[WTS] [JSN]
R5-153276	Void 1x SRVCC test case 8.4.7.1	CR	Qualcomm Incorporated, Rohde & Schwarz, KDDI	36.523-1 12.6.0 CR#3055 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.3.4	available	[WTS] [JSN]
R5-153277	Void applicability of 1x SRVCC test case 8.4.7.1	CR	Qualcomm Incorporated, Rohde & Schwarz, KDDI	36.523-2 12.6.0 CR#763 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.4	available	[WTS] [JSN]
R5-153278	Void eICIC test case 8.3.1.20	CR	Qualcomm Incorporated	36.523-1 12.6.0 CR#3056 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-153279	Void applicability of eICIC test case 8.3.1.20	CR	Qualcomm Incorporated	36.523-2 12.6.0 CR#764 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.4	available	[WTS] [JSN]
R5-153280	Correction to Measurement reporting test case 8.3.1.4	CR	Qualcomm Incorporated, Anritsu Ltd.	36.523-1 12.6.0 CR#3057 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-153281	Correction to Cell selection test case 6.1.2.3	CR	Qualcomm Incorporated, Anritsu Ltd.	36.523-1 12.6.0 CR#3058 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.1	available	[WTS] [JSN]
R5-153282	TS 36.523-1 enhanced Minimization of Drive Test (eMDT) Specific Procedures test cases issue	discussion	Qualcomm Incorporated			Rel-12	R5-68 AI: 6.4.6	available	[WTS] [JSN]
R5-153283	Testing of Loopback mode A and B activated test cases with IMS enabled UE	discussion	Anritsu Ltd, Qualcomm Incorporated			Rel-12	R5-68 AI: 6.4.6	available	[WTS] [JSN]
R5-153284	Update to Loopback activation procedure for IMS enabled UE	CR	Anritsu Ltd., Qualcomm Incorporated	36.508 12.6.0 CR#618 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.1	available	[WTS] [JSN]
R5-153285	Update to Loopback data procedure with IMS signalling	CR	Anritsu Ltd., Qualcomm Incorporated	36.509 12.0.0 CR#144 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.2	available	[WTS] [JSN]
R5-153286	Update of test case 9.1.5.1	CR	Intel Corporation (UK) Ltd	36.523-1 12.6.0 CR#3059 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.5	available	[WTS] [JSN]
R5-153287	Update of RLC test case 7.2.2.5.2	CR	Intel Corporation (UK) Ltd	36.523-1 12.6.0 CR#3060 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.2.2	available	[WTS] [JSN]
R5-153288	Update of RLC test case 7.2.2.5.1	CR	Intel Corporation (UK) Ltd	36.523-1 12.6.0 CR#3061 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.2.2	withdrawn	[WTS] [JSN]
R5-153289	Updates of minimum requirements of reference sensitivity for 3DL CA	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2022 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153290	Updates of Reference sensitivity for 3DL CA	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2023 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153291	Addition of annex F for Reference sensitivity for 3DL CA	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2024 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153292	Addition of new TC of 3DL FDD RSRP for E-UTRAN in Carrier Aggregation	CR	NTT DOCOMO INC., LG Electronics	36.521-3 12.6.0 CR#1207 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153293	Addition of new TC of 3 DL FDD RSRQ for E-UTRAN in Carrier Aggregation	CR	NTT DOCOMO INC., Tejet	36.521-3 12.6.0 CR#1208 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153294	Addition of applicabilities for 3DL CA test cases	CR	NTT DOCOMO INC., BlackBerry., Huawei	36.521-2 12.6.0 CR#280 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.3	available	[WTS] [JSN]
R5-153295	Addition of applicabilities for 3DL CA RRM test cases	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2025 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.3	withdrawn	[WTS] [JSN]
R5-153296	Addition of applicabilities for 3DL CA RRM test cases	CR	NTT DOCOMO INC.	36.521-2 12.6.0 CR#281 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.3	available	[WTS] [JSN]
R5-153297	Addition of new TC of Transmit off power for inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2026 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153298	Addition of new TC of ON/OFF time mask for inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2027 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153299	Addition of new TC of Occupied bandwidth for inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2028 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153300	Addition of new TC of Frequency error for inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2029 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153301	Addition of new TC of Spectrum emission mask for inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2030 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153302	Addition of new TC of Transmitter Spurious emissions for inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2031 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153303	Discussion for spurious emission band UE co-existence for 2UL inter-band CA	discussion	NTT DOCOMO INC.			Rel-12	R5-68 AI: 5.3.8.7	available	[WTS] [JSN]
R5-153304	Addition of new TC of Spurious emission band UE co-existence for inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2032 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153305	Addition of new TC of Reference sensitivity level for 2UL inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2033 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153306	Addition of annex F for 2UL CA test cases	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2034 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153307	Addition of test applicabilities of some test cases for 2UL CA	CR	NTT DOCOMO INC.	36.521-2 12.6.0 CR#282 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.3	available	[WTS] [JSN]
R5-153308	Updates of minimum requirements of Spurious emission band UE co-existence	CR	NTT DOCOMO INC.	36.521-1 12.6.0 CR#2035 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-153309	Updates of minimum requirement of Rx spurious eimissions	CR	NTT DOCOMO INC.	34.121-1 12.0.0 CR#1607 catF	TEI_Test	Rel-12	R5-68 AI: 5.5.2	available	[WTS] [JSN]
R5-153310	Correction of L2G PSHO applicability for TS 36.521-3 spec	CR	NTT DOCOMO INC.	36.521-3 12.6.0 CR#1209 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153311	Correction of L2G PSHO applicability for TS 36.521-2 spec	CR	NTT DOCOMO INC.	36.521-2 12.6.0 CR#283 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153312	Update of EMM Test Case 9.2.1.2.1b	CR	Intel Corporation (UK) Ltd	36.523-1 12.6.0 CR#3062 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.4	available	[WTS] [JSN]
R5-153313	Update of test cases 6.1.1.6 and 6.1.1.6a	CR	Intel Corporation (UK) Ltd	36.101 12.8.0 CR#3108 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.1	available	[WTS] [JSN]
R5-153314	Update of eMDT test case 8.6.4.9	CR	Intel Corporation (UK) Ltd	36.523-1 12.6.0 CR#3063 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-153315	Update of ANR test case 8.7.1	CR	Intel Corporation (UK) Ltd, Anritsu	36.523-1 12.6.0 CR#3064 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.6	available	[WTS] [JSN]
R5-153316	CA RF: Update of intraband contiguous blocking requirements	CR	ROHDE & SCHWARZ	36.521-1 12.6.0 CR#2036 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153317	CA RF: Addition of missing requirements for CA_4A-12A	CR	ROHDE & SCHWARZ	36.521-1 12.6.0 CR#2037 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-153318	RF: Clarifications for TC 6.6.3.2	CR	ROHDE & SCHWARZ	36.521-1 12.6.0 CR#2038 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-153319	CA RF: Update of test points for CA_12B	CR	ROHDE & SCHWARZ	36.521-1 12.6.0 CR#2039 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153320	CA RF: Cleanup of minimum requirements for Refsense test cases	CR	ROHDE & SCHWARZ	36.521-1 12.6.0 CR#2040 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153321	CA RF: Correction of test procedure for TC 7.4A.5	CR	ROHDE & SCHWARZ	36.521-1 12.6.0 CR#2041 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153322	RF: Correction to TC 6.6.3.3A	CR	ROHDE & SCHWARZ	36.521-1 12.6.0 CR#2042 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-153323	CA RF: Clean Up of UL resource allocation for interband 2DL CA	CR	ROHDE & SCHWARZ	36.521-1 12.6.0 CR#2043 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-153324	Addition of new state and procedure to be used in WLAN interworking test cases	CR	Motorola Mobility	34.108 12.0.0 CR#984 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.1	available	[WTS] [JSN]
R5-153325	Addition of new UTRAN-WLAN interworking test case 6.4.2	CR	Motorola Mobility	34.123-1 12.0.0 CR#3779 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	available	[WTS] [JSN]
R5-153326	Addition of new UTRAN-WLAN interworking test case 6.4.3	CR	Motorola Mobility	34.123-1 12.0.0 CR#3780 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	available	[WTS] [JSN]
R5-153327	Addition of new UTRAN-WLAN interworking test case 8.2.10.3	CR	Motorola Mobility	34.123-1 12.0.0 CR#3781 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	available	[WTS] [JSN]
R5-153328	Addition of new UTRAN-WLAN interworking test case 8.2.10.4	CR	Motorola Mobility	34.123-1 12.0.0 CR#3782 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	available	[WTS] [JSN]
R5-153329	Update of generic procedures for WLAN ofload	CR	Motorola Mobility	34.123-1 12.0.0 CR#3783 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	available	[WTS] [JSN]
R5-153330	Correction to WLAN Offload procedures	CR	Motorola Mobility	36.508 12.6.0 CR#619 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.5	available	[WTS] [JSN]
R5-153331	Addition of applicability of new UTRAN-WLAN interworking test cases	CR	Motorola Mobility	34.123-2 12.0.0 CR#745 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.3	available	[WTS] [JSN]
R5-153332	Addition of new EUTRAN-WLAN interworking test case 6.5.5	CR	Motorola Mobility	36.523-1 12.6.0 CR#3065 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.6	available	[WTS] [JSN]
R5-153333	Corrections to test cases 13.1.9 and 13.1.10	CR	CATT	34.229-1 12.6.0 CR#720 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	withdrawn	[WTS] [JSN]
R5-153334	Addition of new EUTRAN-WLAN interworking test case 6.5.6	CR	Motorola Mobility	36.523-1 12.6.0 CR#3066 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.6	available	[WTS] [JSN]
R5-153335	Change BDS Applicability for LCR TDD	CR	CATT, TDIA	37.571-3 12.3.0 CR#37 catF	LCS_BDS-UEConTest	Rel-12	R5-68 AI: 6.6.7.2	available	[WTS] [JSN]
R5-153336	Addition of applicability of new EUTRAN-WLAN interworking test cases	CR	Motorola Mobility	36.523-2 12.6.0 CR#765 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.7	available	[WTS] [JSN]
R5-153337	New WID proposal: UE Conformance Test Aspects - Further Enhancements to LTE TDD for DL-UL Interference Management and Traffic Adaptation	WID new revised to R5-153695	CATT			Rel-12	R5-68 AI: 4.1	revised	[WTS] [JSN]
R5-153338	introduction to the test case 6.2.4A.2:Additional Maximum Power Reduction (A-MPR) for CA (inter-band DL CA and UL CA)	CR	China Unicom	36.521-1 12.6.0 CR#2044 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153339	Restoration of condition C21es	CR	Spirent Communications, Samsung	37.571-3 12.3.0 CR#38 catF	TEI9_Test	Rel-12	R5-68 AI: 6.6.7.2	available	[WTS] [JSN]
R5-153340	Introduction to test case 6.2.4A.3: Additional Maximum Power Reduction (A-MPR) for CA (intra-band non-contiguous DL CA and UL CA)	CR	China Unicom	36.521-1 12.6.0 CR#2045 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153341	Correction to EUTRA eMDT test case 8.6.11.1	CR	Anritsu Ltd, Qualcomm Incorporated	36.523-1 12.6.0 CR#3067 catF		Rel-12	R5-68 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-153342	Introduction to test case 6.2.5A.2: Configured UE transmitted Output Power for CA (inter-band DL CA and UL CA)	CR	China Unicom	36.521-1 12.6.0 CR#2046 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153343	Introduction to test case 6.2.5A.3: Configured UE transmitted Output Power for CA (intra-band non-contiguous DL CA and UL CA)	CR	China Unicom	36.521-1 12.6.0 CR#2047 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153344	Correction to applicability for test case 9.6.1.2_A.2.	CR	CGC Inc.	36.521-2 12.6.0 CR#284 catF		Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153345	Correction to title of table A 3.2-3 and A 3.2-4 in annex A.3.2	CR	CGC Inc.	36.521-1 12.6.0 CR#2048 catF		Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153346	Correction to applicability contain for 36.521-1	CR	CGC Inc.	36.521-2 12.6.0 CR#285 catF		Rel-12	R5-68 AI: 5.4.1.3	withdrawn	[WTS] [JSN]
R5-153347	Correction to content of comments item A.4.2.1.1-1/1	CR	CGC Inc.	36.523-2 12.6.0 CR#766 catF		Rel-12	R5-68 AI: 6.4.4	available	[WTS] [JSN]
R5-153348	Update to TC 7.6.1A.5 In-band blocking for CA (3DL CA without UL CA)	CR	MICROSOFT EUROPE SARL	36.521-1 12.6.0 CR#2049 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153349	Update to TC 7.6.2A.5 Out-of-band blocking for CA (3DL CA without UL CA)	CR	MICROSOFT EUROPE SARL	36.521-1 12.6.0 CR#2050 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153350	Update to TC 7.6.3A.5 Narrow band blocking for CA (3DL CA without UL CA)	CR	MICROSOFT EUROPE SARL	36.521-1 12.6.0 CR#2051 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153351	Update to TC 7.7A.5 Spurious response for CA (3DL CA without UL CA)	CR	MICROSOFT EUROPE SARL	36.521-1 12.6.0 CR#2052 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153352	CA RRM: Additions to cell mapping Table E-1	CR	ROHDE & SCHWARZ	36.508 12.6.0 CR#620 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.1	available	[WTS] [JSN]
R5-153353	RSeq in 183 Session Progress	CR	ROHDE & SCHWARZ	34.229-1 12.6.0 CR#721 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153354	Correction to EMM Test Case 9.1.5.1	CR	MCC TF160, Rohde & Schwarz	36.523-1 12.6.0 CR#3068 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.4	available	[WTS] [JSN]
R5-153355	Correction to IMS Emergency Call Test Case 19.3.1	CR	MCC TF160, Rohde & Schwarz	34.229-1 12.6.0 CR#722 catF	TEI9_Test	Rel-12	R5-68 AI: 6.6.6.1	withdrawn	[WTS] [JSN]
R5-153356	Update of 4.4.2 Simulated cells for CA RRM test cases	CR	Anritsu	36.508 12.6.0 CR#621 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.1	available	[WTS] [JSN]
R5-153357	Correction to RLM tests for eICIC	CR	Anritsu	36.521-3 12.6.0 CR#1210 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153358	Correction to initial conditions in event triggered reporting tests	CR	Anritsu	36.521-3 12.6.0 CR#1211 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153359	Correction to RSRP and RSRQ test cases	CR	Anritsu	36.521-3 12.6.0 CR#1212 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153360	Clarification of neighbor cell frequency for intra-band non-contiguous CA	CR	Anritsu	36.521-3 12.6.0 CR#1213 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153361	Update of Annex E for 3DL CA RRM	CR	Anritsu	36.521-3 12.6.0 CR#1214 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153362	Clean up for Tx test cases	CR	Anritsu	36.521-1 12.6.0 CR#2053 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-153363	Correction to lower tolerances for CA_NS_05 in A-MPR	CR	Anritsu	36.521-1 12.6.0 CR#2054 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-153364	Correction to DL parameters in CA Rx tests	CR	Anritsu	36.521-1 12.6.0 CR#2055 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-153365	Correction to 7.6.1A.4 In-band blocking for non-contiguous CA	CR	Anritsu	36.521-1 12.6.0 CR#2056 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-153366	Correction to test procedure in 7.8.1A.4 Wideband intermodulation for non-contiguous CA	CR	Anritsu	36.521-1 12.6.0 CR#2057 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-153367	Removable of PCFICH_RA in 8.4 and 8.5	CR	Anritsu	36.521-1 12.6.0 CR#2058 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153368	Correction to the title in 2DL CA performance test cases	CR	Anritsu	36.521-1 12.6.0 CR#2059 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153369	Correction to FDD soft buffer test for CA	CR	Anritsu	36.521-1 12.6.0 CR#2060 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153370	Correction to message exceptions in performance test(User-Specific RS) for eDL-MIMO	CR	Anritsu	36.521-1 12.6.0 CR#2061 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153371	Correction to CQI reporting under AWGN for eDL-MIMO	CR	Anritsu	36.521-1 12.6.0 CR#2062 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153372	Correction to CQI reporting under fading(PUSCH3-1) for eDL-MIMO	CR	Anritsu	36.521-1 12.6.0 CR#2063 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153373	Correction to CQI reporting under fading(PUCCH1-1) for eDL-MIMO	CR	Anritsu	36.521-1 12.6.0 CR#2064 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153374	Correction to PMI reporting test for eDL-MIMO	CR	Anritsu	36.521-1 12.6.0 CR#2065 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153375	Correction to RI reporting test for eDL-MIMO	CR	Anritsu	36.521-1 12.6.0 CR#2066 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153376	Correction to TM9 interference model test cases	CR	Anritsu	36.521-1 12.6.0 CR#2067 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153377	Correction to CQI reporting test for TM9	CR	Anritsu	36.521-1 12.6.0 CR#2068 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153378	Correction to feICIC CQI reporting test procedure in 9.2.1.5_E.1	CR	Anritsu	36.521-1 12.6.0 CR#2069 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153379	Option tags in Supported and Require header	discussion	MCC TF160, Rohde & Schwarz				R5-68 AI: 6.6.6.5	available	[WTS] [JSN]
R5-153380	Corrections to option tags in Supported and Require header	CR	MCC TF160, Rohde & Schwarz	34.229-1 12.6.0 CR#723 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153381	Correction to Cell reselection test case 6.1.2.6	CR	Anritsu Ltd	36.523-1 12.6.0 CR#3069 catF		Rel-12	R5-68 AI: 6.4.3.1	available	[WTS] [JSN]
R5-153382	Correction to TC 8.2.4.24.1 - CA / RRC connection reconfiguration / SCell Addition / Success /RRC Processing Delay/Intra-Band Contiguous CA.	CR	Anritsu Ltd, Qualcomm Incorporated ,Anite, Rohde & Schwarz	36.523-1 12.6.0 CR#3070 catF		Rel-12	R5-68 AI: 6.4.3.3.2	available	[WTS] [JSN]
R5-153383	Correction to GCF WI-151 EUTRA FDD-TDD Testcase 8.3.1.13a	CR	Anritsu Ltd., Qualcomm Incorporated	36.523-1 12.6.0 CR#3071 catF		Rel-12	R5-68 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-153384	Correction to eMDT test case 8.6.2.11	CR	Anritsu Ltd, Qualcomm Incorporated	36.523-1 12.6.0 CR#3072 catF		Rel-12	R5-68 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-153385	Correction to GCF WI-159 Pre-registration at 1xRTT testcase 13.1.18	CR	Anritsu Ltd., Qualcomm Incorporated	36.523-1 12.6.0 CR#3073 catF		Rel-12	R5-68 AI: 6.4.3.8	available	[WTS] [JSN]
R5-153386	Correction to applicability of feICIC demod test cases	CR	QUALCOMM UK Ltd	36.521-1 12.6.0 CR#2070 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.2	available	[WTS] [JSN]
R5-153387	Correction to applicability of feICIC RRM test cases.	CR	QUALCOMM UK Ltd	36.521-3 12.6.0 CR#1215 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153388	Correction to applicability of feICIC test cases.	CR	QUALCOMM UK Ltd	36.521-2 12.6.0 CR#286 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153389	Update of test case 8.4.2.7.x	CR	Intel Corporation (UK) Ltd	36.523-1 12.6.0 CR#3074 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.4	available	[WTS] [JSN]
R5-153390	Update of test case 8.6.7.1	CR	Intel Corporation (UK) Ltd	36.523-1 12.6.0 CR#3075 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-153391	Addition of Test Case - WLAN Offload / Cell Selection / EUTRA RRC_Idle to/from WLAN (Qqualmeas, ChannelUtilizationWLAN) - 3GPP/WLAN Work Plan	CR	Intel Corporation (UK) Ltd	36.523-1 12.6.0 CR#3076 catF	IWLAN_Mob_UEConTest	Rel-12	R5-68 AI: 6.3.2.6	reserved	[WTS] [JSN]
R5-153392	Addition of Test Case - WLAN Offload / Cell Selection / EUTRA RRC_Idle to/from WLAN (Qqualmeas, ChannelUtilizationWLAN) - 3GPP/WLAN Work Plan	CR	Intel Corporation (UK) Ltd	36.523-1 12.6.0 CR#3077 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.6	available	[WTS] [JSN]
R5-153393	Addition of Test Case - WLAN Offload / Cell Selection / UTRA RRC_Idle to/from WLAN (Qrxlevmeas, BeaconRSSI) - 3GPP/WLAN Work Plan	CR	Intel Corporation (UK) Ltd	34.123-1 12.0.0 CR#3784 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	available	[WTS] [JSN]
R5-153394	Applicability of Test Case - WLAN Offload / Cell Selection / EUTRA RRC_Idle to/from WLAN (Qqualmeas, ChannelUtilizationWLAN) - 3GPP/WLAN Work Plan	CR	Intel Corporation (UK) Ltd	36.508 12.6.0 CR#622 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.5	available	[WTS] [JSN]
R5-153395	Applicability of Test Case - WLAN Offload / Cell Selection / UTRA RRC_Idle to/from WLAN (Qrxlevmeas, BeaconRSSI) - 3GPP/WLAN Work Plan	CR	Intel Corporation (UK) Ltd	34.108 12.0.0 CR#985 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.1	available	[WTS] [JSN]
R5-153396	Correction to eMBMS test cases 17.4.3 and 17.4.3a	CR	Anite Telecoms Ltd., Samsung	36.523-1 12.6.0 CR#3078 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.11	available	[WTS] [JSN]
R5-153397	Correction to Multilayer Procedures test case 13.4.2.4	CR	Anite Telecoms Ltd.	36.523-1 12.6.0 CR#3079 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.8	available	[WTS] [JSN]
R5-153398	Correction to Multilayer Procedures test case 13.4.2.5	CR	Anite Telecoms Ltd.	36.523-1 12.6.0 CR#3080 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.8	available	[WTS] [JSN]
R5-153399	Correction to EMM test case 9.2.1.1.30	CR	Anite Telecoms Ltd.	36.523-1 12.6.0 CR#3081 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.4	available	[WTS] [JSN]
R5-153400	Correction to Test Case 12.2.1.5d	CR	Intel Corporation (UK) Ltd	34.123-1 11.7.0 CR#3785 catF		Rel-11	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153401	Correction to Test Case 10.8.8	CR	Intel Corporation (UK) Ltd, Anite Telecoms Ltd	36.523-1 12.6.0 CR#3082 catF		Rel-12	R5-68 AI: 6.4.3.4	available	[WTS] [JSN]
R5-153402	Correction to eMDT test case 8.6.3.4	CR	Anite Telecoms Ltd., Samsung	36.523-1 12.6.0 CR#3083 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-153403	Correction to Test Case 9.2.3.1.8a	CR	Intel Corporation (UK) Ltd, Anite Telecoms Ltd.	36.523-1 12.6.0 CR#3084 catF		Rel-12	R5-68 AI: 6.4.3.4	available	[WTS] [JSN]
R5-153404	Correction to MDT test case 8.6.4.4	CR	Anite Telecoms Ltd., Qualcomm Incorporated	36.523-1 12.6.0 CR#3085 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-153405	Correction to eMDT test case 8.6.5.1a	CR	Anite Telecoms Ltd., Samsung	36.523-1 12.6.0 CR#3086 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-153406	Correction to CA test cases 8.3.1.18.1, 8.3.1.18.2 and 8.3.1.18.3	CR	Anite Telecoms Ltd., Qualcomm Incorporated, Huawei	36.523-1 12.6.0 CR#3087 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-153407	Update of Latency check test case 8.2.1.5	CR	Qualcomm Incorporated, Anritsu Ltd.	36.523-1 12.6.0 CR#3088 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.3.2	available	[WTS] [JSN]
R5-153408	Correction to Table 4.4.2-1A to change root sequence index for Cell 30	CR	Anite Telecoms Ltd.	36.508 12.6.0 CR#623 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.1	available	[WTS] [JSN]
R5-153409	Latency check requirements for test case 8.2.1.5 from TS 36.523-1	discussion	Qualcomm Incorporated				R5-68 AI: 6.4.6	reserved	[WTS] [JSN]
R5-153410	Correction to the default message contents of CM SERVICE REQUEST message	CR	Anite Telecoms Ltd.	34.108 12.0.0 CR#986 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.2.1	available	[WTS] [JSN]
R5-153411	Correction to Supplementary Services test case 15.7.27	CR	Anite Telecoms Ltd.	34.123-1 12.0.0 CR#3786 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153412	New CA band combinations CA_41A-42C - Updates of 5.4.2A Channel bandwidth	CR	KDDI Corporation	36.521-1 12.6.0 CR#2071 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153413	Addition and modification of 2DL CA Frequencies and CA Channel Bandwidth combination	CR	KDDI Corporation	36.508 12.6.0 CR#624 catF		Rel-12	R5-68 AI: 6.3.1.1	available	[WTS] [JSN]
R5-153414	New CA band combinations (CA_1A-41C, CA_26A_41C, CA_41A_42C) - Updates of 6.2.5.3 Delta TIB	CR	KDDI Corporation	36.521-1 12.6.0 CR#2072 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153415	Update the default configuration of channel bandwidth for Band 42 for signalling testing	CR	KDDI Corporation	36.508 12.6.0 CR#625 catF		Rel-12	R5-68 AI: 6.4.1	available	[WTS] [JSN]
R5-153416	Correction to information of feature group indicators	CR	KTL	36.521-2 12.6.0 CR#287 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153417	Correction to information of feature group indicators	CR	KTL	36.523-2 12.6.0 CR#767 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.4	available	[WTS] [JSN]
R5-153418	New CA band combinations (CA_1A-41C, CA_26A_41C, CA_41A_42C) - Updates of 7.3.3 Delta RIB	CR	KDDI Corporation	36.521-1 12.6.0 CR#2073 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153419	New CA band combinations (CA_1A-41C, CA_26A-41C, CA_41A-42C) - Updates of 7.3A Refsens	CR	KDDI Corporation	36.521-1 12.6.0 CR#2074 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153420	New CA band combinations CA_41A-42C - Updates of Table A.4.6.3-3	CR	KDDI Corporation	36.521-2 12.6.0 CR#288 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.3	available	[WTS] [JSN]
R5-153421	Addition of new SCM test case 13.5.4	CR	NTT DOCOMO INC.	36.523-1 12.6.0 CR#3089 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.1	reserved	[WTS] [JSN]
R5-153422	Addition of new band combination 1A-42A, 3A-42A and 19A-42A	CR	NTT DOCOMO INC.	36.508 12.6.0 CR#626 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 6.3.1.1	available	[WTS] [JSN]
R5-153423	Updates of ?TIB,c values to TC 6.2.5	CR	Huawei	36.521-1 12.6.0 CR#2075 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153424	Updates to 8.2.2.1.1_A.2 TDD PDSCH Single Antenna Port Performance for CA (3DL CA)	CR	Huawei	36.521-1 12.6.0 CR#2076 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153425	Updates to 8.7.1.1.A_2 FDD Sustained data rate performance for CA (3DL CA)	CR	Huawei	36.521-1 12.6.0 CR#2077 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153426	Updates to 8.7.2.1.A_1 TDD Sustained data rate performance for CA (2DL CA)	CR	Huawei	36.521-1 12.6.0 CR#2078 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153427	Updates to 8.7.2.1.A_2 TDD Sustained data rate performance for CA (3DL CA)	CR	Huawei	36.521-1 12.6.0 CR#2079 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153428	Addition of 8.7.5.1.1 TDD FDD CA Sustained data rate performance for FDD PCell (2DL CA)	CR	Huawei	36.521-1 12.6.0 CR#2080 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153429	Addition of 8.7.5.1.2 TDD FDD CA Sustained data rate performance for FDD PCell (3DL CA)	CR	Huawei	36.521-1 12.6.0 CR#2081 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153430	Addition of 8.7.5.2.1 TDD FDD CA Sustained data rate performance for TDD PCell (2DL CA)	CR	Huawei	36.521-1 12.6.0 CR#2082 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153431	Addition of 8.7.5.2.2 TDD FDD CA Sustained data rate performance for TDD PCell (3DL CA)	CR	Huawei	36.521-1 12.6.0 CR#2083 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153432	Cell mapping for newly added TDD-FDD 2DL CA RRM test cases	CR	Huawei	36.521-3 12.6.0 CR#1216 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	withdrawn	[WTS] [JSN]
R5-153433	Updates to RRM TCs 8.16.23, 8.16.24, 8.16.25 and 8.16.26	CR	Huawei	36.521-3 12.6.0 CR#1217 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153434	Addition of new TC 8.16.31 E-UTRAN TDD-FDD 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX and with PCell in FDD	CR	Huawei	36.521-3 12.6.0 CR#1218 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153435	Addition of new TC 8.16.32 E-UTRAN TDD-FDD 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX and with PCell in TDD	CR	Huawei	36.521-3 12.6.0 CR#1219 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153436	Addition of new TC 8.16.33 E-UTRAN FDD 3DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX	CR	Huawei	36.521-3 12.6.0 CR#1220 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153437	Addition of new TC 8.16.34 E-UTRAN TDD 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX	CR	Huawei	36.521-3 12.6.0 CR#1221 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153438	Applicability for new TDD-FDD CA protocol test cases	CR	Huawei	36.523-2 12.6.0 CR#768 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 6.3.1.3	available	[WTS] [JSN]
R5-153439	Updates to 7.1.7.1 and 7.1.7.2 about DL-SCH and UL-SCH TBS selection	CR	Huawei	36.523-1 12.6.0 CR#3090 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.2.1	available	[WTS] [JSN]
R5-153440	Updates to 8.2.2.3 and Deletion of 8.2.4.24	CR	Huawei	36.523-1 12.6.0 CR#3091 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.2	available	[WTS] [JSN]
R5-153441	Correction to test case 8.6.7.1	CR	Huawei	36.523-1 12.6.0 CR#3092 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-153442	Addition of SCE-L1 clause numbering principle in Annex I	CR	Huawei	36.521-1 12.6.0 CR#2084 catF	LTE_SC_enh_L1-UEConTest	Rel-12	R5-68 AI: 5.3.11.2	available	[WTS] [JSN]
R5-153443	Addition of new TC 7.1.7.1.7 SCE-L1 / DL-SCH transport block size selection / DCI format 1 / RA type 0	CR	Huawei	36.523-1 12.6.0 CR#3093 catF	LTE_SC_enh_L1-UEConTest	Rel-12	R5-68 AI: 6.3.10.2	available	[WTS] [JSN]
R5-153444	Add Test Tolerance analysis for TCs 7.1.3+7.1.3_1+7.1.4+7.1.4_1 36.903 CR	CR	Huawei, Anritsu	36.903 12.6.0 CR#209 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-153445	Uncerts and Test Tols for TCs 7.1.3+7.1.4 36.521-3 CR	CR	Huawei, Anritsu	36.523-1 12.6.0 CR#3094 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-153446	Cell mapping for new RRM TCs 7.1.3_1+7.1.4_1	CR	Huawei, Anritsu	36.523-1 12.6.0 CR#3095 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153447	Applicability for new RRM TCs 7.1.3_1+7.1.4_1	CR	Huawei, Anritsu	36.523-1 12.6.0 CR#3096 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153448	Addition of new RRM TCs 7.1.3_1+7.1.4_1	CR	Huawei, Anritsu	36.523-1 12.6.0 CR#3097 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153449	Addition of CA capability and applicability changes to TDD SDR CA tests	CR	QUALCOMM UK Ltd	36.521-1 12.6.0 CR#2085 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153450	Updates to TDD FDD CA test cases for PDSCH Single Antenna Port Performance	CR	QUALCOMM UK Ltd	36.521-1 12.6.0 CR#2086 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153451	Correction to test point selection table for all chap8/9 FDD and TDD 2DLCA cases	CR	QUALCOMM UK Ltd	36.521-1 12.6.0 CR#2087 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153452	Correction to Supplementary Services test case 15.9.3	CR	Anite Telecoms Ltd.	34.123-1 12.0.0 CR#3787 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153453	Update of TC list for Rel-12 RSRP accuracy requirements – before RAN5#68	other	China Mobile Com. Corporation				R5-68 AI: 5.4.1.11	available	[WTS] [JSN]
R5-153454	EVM for Intra-band contiguous UL CA for non-equal Channel BWs	CR	QUALCOMM UK Ltd	36.521-1 12.6.0 CR#2088 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153455	Merge of TDD sustained data rate CA test cases	CR	CMCC	36.521-1 12.6.0 CR#2089 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153456	Discussion on test point selection rules for chap8/9 CA Demod test cases	discussion	QUALCOMM UK Ltd		TEI10_Test	Rel-12	R5-68 AI: 5.4.1.11	available	[WTS] [JSN]
R5-153457	Correction to Testpoint Selection in Chapter 7 NC CA Testcases	CR	Intel Deutschland GmbH	36.521-1 12.6.0 CR#2090 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-153458	Test case list for 20MHz+10MHz and 20MHz+20MHz CA RRM tests - Before RAN5#68	other	CMCC				R5-68 AI: 5.4.1.11	available	[WTS] [JSN]
R5-153459	Correction to test case 12.4.1.4f applicability	CR	Anite Telecoms Ltd.	34.123-2 12.0.0 CR#746 catF	TEI10_Test	Rel-12	R5-68 AI: 6.6.4.2	available	[WTS] [JSN]
R5-153460	Correction of 1A-3A-5A CA REFSENS DL Allocation	CR	Intel Deutschland GmbH	36.521-1 12.6.0 CR#2091 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153461	New TC: 8.20.2A for RRM	CR	CMCC	36.521-3 12.6.0 CR#1222 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153462	Addition of several definitions to chapter 3	CR	Intel Deutschland GmbH	36.521-1 12.6.0 CR#2092 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153463	Correction to IMS authentication test case 9.1	CR	Anite Telecoms Ltd.	34.229-1 12.6.0 CR#724 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153464	Update of minimum requirements for relative RSRP Accuracy TC 9.1.6.2 and 9.1.7.2	CR	CMCC	36.521-3 12.6.0 CR#1223 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153465	Addition of Multiple Inter-band CA Configurations to 7.3A.4	CR	Intel Deutschland GmbH	36.521-1 12.6.0 CR#2093 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153466	Correction to Annex C.39 Generic test procedure for setting up MTSI MO speech call for rSRVCC	CR	Anite Telecoms Ltd., Samsung	34.229-1 12.6.0 CR#725 catF	TEI11_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153467	New TCs: FDD Rel-12 CA RSRP relative accuracy tests	CR	CMCC	36.521-3 12.6.0 CR#1224 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153468	Addition of CA_2C to Chapter 4	CR	Intel Deutschland GmbH	36.508 12.6.0 CR#627 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.1	available	[WTS] [JSN]
R5-153469	New TCs: TDD Rel-12 CA RSRP relative accuracy tests	CR	CMCC	36.521-3 12.6.0 CR#1225 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153470	Addition of 3DL CA default XB-YA configuration to REFSENS test configuration table	CR	Intel Deutschland GmbH	36.521-1 12.6.0 CR#2094 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153471	Update of test applicabilites for Rel-10 CA RSRP relative accuracy tests	CR	CMCC	36.521-3 12.6.0 CR#1226 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153472	Correction to Emergency Service over IMS test case 19.3.1	CR	Anite Telecoms Ltd.	34.229-1 12.6.0 CR#726 catF	TEI9_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153473	Update of test applicabilites for Rel-11 CA RSRP relative accuracy tests	CR	China Mobile Com. Corporation	36.521-3 12.6.0 CR#1227 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153474	Applicability Update of Intra-Band DL-only CA testcases in Chapter 7	CR	Intel Deutschland GmbH	36.521-1 12.6.0 CR#2095 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153475	Update of Annex E for RRM 9.1.6.2_1 and 9.1.7.2_1	CR	CMCC	36.521-3 12.6.0 CR#1228 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153476	Implementation of 36.521-1 Chapter 8.1 and 9.1 test selection rules in Table 4.1-1 testcases	CR	Intel Deutschland GmbH	36.521-2 12.6.0 CR#289 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.3	available	[WTS] [JSN]
R5-153477	521-2 change applicability for Rel-10 CA RSRP relative accuracy tests	CR	CMCC	36.521-2 12.6.0 CR#290 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153478	Proposal for missing Selection Criteria in table 4.1	CR	Intel Deutschland GmbH	36.521-2 12.6.0 CR#291 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.3	available	[WTS] [JSN]
R5-153479	521-2 change applicability for Rel-11 CA RSRP relative accuracy tests	CR	CMCC	36.521-2 12.6.0 CR#292 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153480	Introduction of 2DL CA test skipping if 3DL CA is tested in 36.521-1 Chapter 7	CR	Intel Deutschland GmbH	36.521-2 12.6.0 CR#293 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.3	available	[WTS] [JSN]
R5-153481	521-2 Addition of test applicabilities for Rel-12 CA RSRP relative accuracy tests	CR	CMCC	36.521-2 12.6.0 CR#294 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153482	New TCs: 9.1.40 and 9.1.40_1 TDD RSRP Accuracy for 3DL CA	CR	CMCC	36.521-3 12.6.0 CR#1229 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153483	New TCs: 9.2.39 TDD RSRQ Accuracy for 3DL CA	CR	CMCC	36.521-3 12.6.0 CR#1230 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153484	Update of Annex E for RRM 3DL CA RSRP Accuracy tests	CR	CMCC	36.521-3 12.6.0 CR#1231 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153485	Update of Annex E for RRM 3DL CA RSRQ Accuracy test	CR	CMCC	36.521-3 12.6.0 CR#1232 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153486	Update of Reference sensitivity for CA_39A-41C and CA_39C-41A	CR	CMCC	36.521-1 12.6.0 CR#2096 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153487	Clarifications and corrections to IMS test case 20.1	CR	Ericsson, Qualcomm Incorporated, Rohde & Schwarz	34.229-1 12.6.0 CR#727 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153488	New generic procedure 4.5A.21 Generic Test Procedure for IMS MO Customized Alerting Tones and speech establishment in E-UTRA	CR	Ericsson	36.508 12.6.0 CR#628 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.1	available	[WTS] [JSN]
R5-153489	Updates to TC 13.4.3.31	CR	Ericsson	36.523-1 12.6.0 CR#3098 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.8	available	[WTS] [JSN]
R5-153490	Updates to TC 13.4.3.33	CR	Ericsson	36.523-1 12.6.0 CR#3099 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.8	available	[WTS] [JSN]
R5-153491	Updates to TC 13.4.3.35	CR	Ericsson	36.523-1 12.6.0 CR#3100 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.8	available	[WTS] [JSN]
R5-153492	Addition of test case 7.4E - Maximum input level for UE category 0	CR	CATR	36.521-1 12.6.0 CR#2097 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153493	Addition of test case 7.5E - Adjacent Channel Selectivity (ACS) for UE category 0	CR	CATR	36.521-1 12.6.0 CR#2098 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153494	Addition of test case 7.6.1E - In-band blocking for UE category 0	CR	CATR	36.521-1 12.6.0 CR#2099 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153495	Addition of test case 7.6.2E - Out-of-band blocking for UE category 0	CR	CATR	36.521-1 12.6.0 CR#2100 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153496	Addition of test case 7.6.3E - Narrow band blocking for UE category 0	CR	CATR	36.521-1 12.6.0 CR#2101 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153497	Addition of test case 7.7E - Spurious response for UE category 0	CR	CATR	36.521-1 12.6.0 CR#2102 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153498	Addition of test case 7.8.1E - Wide band Intermodulation for UE category 0	CR	CATR	36.521-1 12.6.0 CR#2103 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153499	Addition of test case 7.9E - Spurious emissions for UE category 0	CR	CATR	36.521-1 12.6.0 CR#2104 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153500	Addition of UE category 0 test cases	CR	CATR	36.521-2 12.6.0 CR#295 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.3	available	[WTS] [JSN]
R5-153501	Aligning 36.521-2 and 36.523-2 Supported CA Configurations Tables	CR	Intel Deutschland GmbH	36.523-2 12.6.0 CR#769 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 6.3.1.3	available	[WTS] [JSN]
R5-153502	Addition of new TC CA 3CC DL / Simultaneous Activation/Deactivation of SCells / Activation/Deactivation MAC control element reception / Inter-band CA	CR	Anritsu Ltd, Huawei	36.523-1 12.6.0 CR#3101 catB		Rel-12	R5-68 AI: 6.3.1.2	available	[WTS] [JSN]
R5-153503	Correction to applicability content in Table 4.1-1, 4.1-1a. for 36.521-1	CR	CGC Inc.	36.521-2 12.6.0 CR#296 catF		Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153504	Addition of demod test case under static condition with DCH enhanced	CR	QUALCOMM UK Ltd	34.121-1 12.0.0 CR#1608 catF	UTRA_DCHenh-UEConTest	Rel-12	R5-68 AI: 5.3.10.3	available	[WTS] [JSN]
R5-153505	Update of FDD PDSCH Single Antenna Port Performance for CA (3DL CA)	CR	Huawei, LGE, Anritsu	36.521-1 12.6.0 CR#2105 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153506	TDD FDD CA PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 for TDD PCell (2DL CA)	CR	Huawei	36.521-1 12.6.0 CR#2106 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153507	TDD FDD CA PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 for TDD PCell (3DL CA)	CR	Huawei	36.521-1 12.6.0 CR#2107 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153508	Addition of simplified CA testing method (Annex C.3.5) into 36.521-1	CR	Huawei	36.521-1 12.6.0 CR#2108 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153509	Introduction of Test Case 7.4A.6 Maximum input level for CA (inter-band DL CA and UL CA)	CR	Huawei	36.521-1 12.6.0 CR#2109 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153510	Introduction of Test Case 7.5A.6 Adjacent Channel Selectivity (ACS) for CA (inter-band DL CA and UL CA)	CR	Huawei	36.521-1 12.6.0 CR#2110 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153511	Correction of MTC UE test case applicability	CR	Huawei	36.521-2 12.6.0 CR#297 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.3	available	[WTS] [JSN]
R5-153512	Introduce connection diagram for multi-cell Enhanced requirements Type C tests	CR	Huawei	36.508 12.6.0 CR#629 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.1	available	[WTS] [JSN]
R5-153513	Addition of Reference measurement channel and overview reference for multi-cell test in Annex	CR	Huawei	36.521-1 12.6.0 CR#2111 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	available	[WTS] [JSN]
R5-153514	Introduction of FDD TM3 test case for LTE Type C performance requirements (8.2.1.3.1B)	CR	Huawei	36.521-1 12.6.0 CR#2112 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	available	[WTS] [JSN]
R5-153515	Introduction of FDD TM3 multi-cell test case with TM1 interference for LTE Type C performance requirements (8.2.1.3.1C)	CR	Huawei	36.521-1 12.6.0 CR#2113 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	available	[WTS] [JSN]
R5-153516	Introduction of TDD TM3 multi-cell test case with TM1 interference for LTE Type C performance requirements (8.2.2.3.1C)	CR	Huawei	36.521-1 12.6.0 CR#2114 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	available	[WTS] [JSN]
R5-153517	Introduction of FDD TM4 test case for LTE Type C performance requirements (8.2.1.4.2A)	CR	Huawei	36.521-1 12.6.0 CR#2115 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	available	[WTS] [JSN]
R5-153518	Introduction of TDD TM4 test case for LTE Type C performance requirements (8.2.2.4.2A)	CR	Huawei	36.521-1 12.6.0 CR#2116 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	available	[WTS] [JSN]
R5-153519	Introduction of TDD TM8 test case for LTE Type C performance requirements (8.3.2.2.2)	CR	Huawei	36.521-1 12.6.0 CR#2117 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	available	[WTS] [JSN]
R5-153520	Introduction of FDD TM9 test case for LTE Type C performance requirements (8.3.1.2.2)	CR	Huawei	36.521-1 12.6.0 CR#2118 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	available	[WTS] [JSN]
R5-153521	Addition of Enhanced performance requirements Type C definition	CR	Huawei	36.521-1 12.6.0 CR#2119 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	available	[WTS] [JSN]
R5-153522	Addition of applicability of SU-MIMO conformance tests	CR	Huawei	36.521-2 12.6.0 CR#298 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.3	available	[WTS] [JSN]
R5-153523	Correction to Inter-RAT Cell reselection test case 6.2.3.1a	CR	Anritsu Ltd.	36.523-1 12.6.0 CR#3102 catF		Rel-12	R5-68 AI: 6.4.3.1	available	[WTS] [JSN]
R5-153524	Correction to description of applicablility of testcase 8.3	CR	Anritsu Ltd	34.229-2 12.5.0 CR#148 catD		Rel-12	R5-68 AI: 6.6.6.2	available	[WTS] [JSN]
R5-153525	Correction to WI-103 IMS Testcase 15.8	CR	Anritsu Ltd	34.229-1 12.6.0 CR#728 catF		Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153526	Addition of new D2D test case for Successful EPC-LEVEL ProSe Discovery	CR	Anritsu Ltd	36.523-1 12.6.0 CR#3103 catB		Rel-12	R5-68 AI: 6.3.3.3	available	[WTS] [JSN]
R5-153527	Correction to PhysicalConfigDedicated-DEFAULT	CR	Anritsu Ltd	36.508 12.6.0 CR#630 catF		Rel-12	R5-68 AI: 6.4.1	available	[WTS] [JSN]
R5-153528	Update of FGI definitions in TS 36.521-2	CR	Ericsson	36.521-2 12.6.0 CR#299 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153529	Update of FGI definitions in TS 36.523-2	CR	Ericsson	36.523-2 12.6.0 CR#770 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.4	available	[WTS] [JSN]
R5-153530	Clarifications for A.6.2	CR	MCC TF160	34.229-1 12.6.0 CR#729 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153531	Update Test Tolerance analyses for TS 36.521-3 Test case 5.2.7	CR	Ericsson LM	36.903 12.6.0 CR#210 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-153532	Update Uncertainties for Test case 5.2.7	CR	Ericsson LM	36.521-3 12.6.0 CR#1233 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-153533	Correction to TTI bundling PICS	CR	Spreadtrum Communications	36.523-2 12.6.0 CR#771 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.4	available	[WTS] [JSN]
R5-153534	Add new generic procedure for MT speech / EVS	CR	Ericsson	34.229-1 12.6.0 CR#730 catF	EVS_codec-UEConTest	Rel-12	R5-68 AI: 6.3.7.1	available	[WTS] [JSN]
R5-153535	Add new test case for MT speech / EVS	CR	Ericsson	34.229-1 12.6.0 CR#731 catF	EVS_codec-UEConTest	Rel-12	R5-68 AI: 6.3.7.1	available	[WTS] [JSN]
R5-153536	Correct annex C.44	CR	Ericsson	34.229-1 12.6.0 CR#732 catF	EVS_codec-UEConTest	Rel-12	R5-68 AI: 6.3.7.1	available	[WTS] [JSN]
R5-153537	Update test case 12.23	CR	Ericsson	34.229-1 12.6.0 CR#733 catF	EVS_codec-UEConTest	Rel-12	R5-68 AI: 6.3.7.1	available	[WTS] [JSN]
R5-153538	Add applicability for new MT EVS test case	CR	Ericsson	34.229-2 12.5.0 CR#149 catF	EVS_codec-UEConTest	Rel-12	R5-68 AI: 6.3.7.2	available	[WTS] [JSN]
R5-153539	Add generic procedure for IMS MT speech for EVS	CR	Ericsson	36.508 12.6.0 CR#631 catF	EVS_codec-UEConTest	Rel-12	R5-68 AI: 6.3.7.4	available	[WTS] [JSN]
R5-153540	Correction to Annexes C.19 and C.37	CR	Ericsson	34.229-1 12.6.0 CR#734 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153541	Updates to applicability of rSRVCC test cases	CR	Ericsson	36.523-2 12.6.0 CR#772 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.4	available	[WTS] [JSN]
R5-153542	Clarification of ICS for F-DPCH support with HS	CR	Ericsson	34.123-2 12.0.0 CR#747 catF	TEI12_Test	Rel-12	R5-68 AI: 6.6.4.2	available	[WTS] [JSN]
R5-153543	Update Test Tolerance analyses for TS 36.521-3 Test cases 5.2.8 and 5.2.9	CR	Ericsson LM	36.903 12.6.0 CR#211 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-153544	Update Uncertainties for Test cases 5.2.8 and 5.2.9	CR	Ericsson LM	36.521-3 12.6.0 CR#1234 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-153545	Correction to APN IE value provided in ACTIVATE DEFAULT EPS BEARER CONTEXT REQUEST	CR	ROHDE & SCHWARZ, Qualcomm Incorporated, Sony Mobile Communications Inc.	36.508 12.6.0 CR#632 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.1	available	[WTS] [JSN]
R5-153546	Update Test Tolerance analyses for TS 36.521-3 Test case 5.2.10	CR	Ericsson LM	36.903 12.6.0 CR#212 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-153547	Update Uncertainties for Test case 5.2.10	CR	Ericsson LM	36.521-3 12.6.0 CR#1235 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-153548	Correction to IMS test case 20.1	CR	ROHDE & SCHWARZ, Qualcomm Incorporated	34.229-1 12.6.0 CR#735 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153549	Correction to LTE-A eICIC test case 8.3.1.21	CR	ROHDE & SCHWARZ, Qualcomm Incorporated, Anritsu Ltd.	36.523-1 12.6.0 CR#3104 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-153550	Correction to eMDT test case 8.6.10.1	CR	ROHDE & SCHWARZ, Qualcomm Incorporated	36.523-1 12.6.0 CR#3105 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-153551	Correction to IMS Emergency Call test case 11.2.12	CR	ROHDE & SCHWARZ, Qualcomm Incorporated	36.523-1 12.6.0 CR#3106 catF	TEI9_Test	Rel-12	R5-68 AI: 6.4.3.6	available	[WTS] [JSN]
R5-153552	List of remaining TT analysis above 3GHz	other	Ericsson LM				R5-68 AI: 5.4.1.11	available	[WTS] [JSN]
R5-153553	Correction to 8.16.17 and 8.16.18 activation and deactivation of known Scell	CR	Anritsu	36.521-3 12.6.0 CR#1236 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153554	Correction to applicability conditions C154F and C154T	CR	ROHDE & SCHWARZ, Qualcomm Incorporated, Anritsu Ltd.	36.523-2 12.6.0 CR#773 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.4	available	[WTS] [JSN]
R5-153555	Correction to GCF WI-222 Test Cases 8.5.4.2 and 8.5.4.3	CR	ROHDE & SCHWARZ	36.523-1 12.6.0 CR#3107 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.3.1	available	[WTS] [JSN]
R5-153556	Correction to video and smsip feature tags	CR	ROHDE & SCHWARZ	34.229-1 12.6.0 CR#736 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153557	Rewording of PICS for video feature tag	CR	ROHDE & SCHWARZ	34.229-1 12.6.0 CR#737 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	withdrawn	[WTS] [JSN]
R5-153558	Correction to WI-082 Test Cases 9.2.2.1.1, 9.2.2.1.6, 9.2.2.1.7, 9.2.2.1.8, 9.2.2.1.9	CR	ROHDE & SCHWARZ	36.523-1 12.6.0 CR#3108 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.4	available	[WTS] [JSN]
R5-153559	Correction to Initial conditions of NITZ Test Cases 9.4.10, 12.2.1.13, 12.2.1.14 and 12.2.1.15	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3788 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153560	Correction to Test Case Selection Expressions of test cases 9.2.1.1.30, 9.2.1.2.4a and 9.2.3.2.4a	CR	ROHDE & SCHWARZ	36.523-2 12.6.0 CR#774 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.4	available	[WTS] [JSN]
R5-153561	Additions to test case 6.2.3E - Maximum Power Reduction (MPR) for UE category 0	CR	Ericsson	36.521-1 12.6.0 CR#2120 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153562	Introduction of new 3DL CA Test cases 8.16.29	CR	Ericsson LM	36.521-3 12.6.0 CR#1237 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153563	Update test case 8.4.8.1	CR	Ericsson	36.523-1 12.6.0 CR#3109 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.6	available	[WTS] [JSN]
R5-153564	Introduction of new 3DL CA Test cases 8.16.30	CR	Ericsson LM	36.521-3 12.6.0 CR#1238 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153565	Correction to LTE-UTRA FE-FACH test case 6.2.4.7	CR	ROHDE & SCHWARZ, Qualcomm Incorporated, Anite Ltd.	36.523-1 12.6.0 CR#3110 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.1	available	[WTS] [JSN]
R5-153566	Introduction of test environment information for new 3DL intra-band Carrier Aggregation combinations to 36.508	CR	7 LAYERS AG	36.508 12.6.0 CR#633 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.1	available	[WTS] [JSN]
R5-153567	Addition of default parameters for DF_PROSE on Test UICC	CR	ROHDE & SCHWARZ	36.508 12.6.0 CR#634 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.1	reserved	[WTS] [JSN]
R5-153568	Update of test case 8.6.4.5	CR	Intel Corporation (UK) Ltd	36.523-1 12.6.0 CR#3111 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-153569	Data Analytics Task Force Status Report	other	Spirent Communications				R5-68 AI: 4.5.5	available	[WTS] [JSN]
R5-153570	Addition of D2D ProSe test case 19.1.3	CR	ROHDE & SCHWARZ	36.523-1 12.6.0 CR#3112 catB	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	available	[WTS] [JSN]
R5-153571	Addition of D2D ProSe test case 19.1.4	CR	ROHDE & SCHWARZ	36.523-1 12.6.0 CR#3113 catB	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.3	available	[WTS] [JSN]
R5-153572	Addition of D2D ProSe test case 19.1.5	CR	ROHDE & SCHWARZ	36.523-1 12.6.0 CR#3114 catB	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.3	available	[WTS] [JSN]
R5-153573	Addition of D2D ProSe test case 19.1.11	CR	ROHDE & SCHWARZ	36.523-1 12.6.0 CR#3115 catB	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.3	reserved	[WTS] [JSN]
R5-153574	Update of eICIC Test case 8.1.3	CR	Ericsson LM	37.571-1 12.3.0 CR#141 catF	TEI10_Test	Rel-12	R5-68 AI: 5.5.9	available	[WTS] [JSN]
R5-153575	Initial Data Analytics Proposals for RF and RRM Test Time Analysis	other	Spirent Communications				R5-68 AI: 4.5.5	reserved	[WTS] [JSN]
R5-153576	Update of eICIC Test case 8.1.4	CR	Ericsson LM	37.571-1 12.3.0 CR#142 catF	TEI10_Test	Rel-12	R5-68 AI: 5.5.9	available	[WTS] [JSN]
R5-153577	Adding applicability statements for ECID eICIC test cases 8.1.3 and 8.1.4	CR	Ericsson LM	37.571-3 12.3.0 CR#39 catF	TEI10_Test	Rel-12	R5-68 AI: 5.5.	available	[WTS] [JSN]
R5-153578	Correction to LTE IRAT testcase 6.3.3	CR	ROHDE & SCHWARZ	36.523-1 12.6.0 CR#3116 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.1	available	[WTS] [JSN]
R5-153579	Correction to UTRAN NITZ Test Cases 9.4.10, 12.2.1.13, 12.2.1.14 and 12.2.1.15	CR	MCC TF160, Rohde & Schwarz	34.123-1 12.0.0 CR#3789 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153580	Correction of applicability condition TC 9.6.1.1_A.1 non-contiguous part	CR	Samsung	36.521-2 12.6.0 CR#300 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153581	Adding applicability for TC 8.2.1.7_A.1	CR	Samsung	36.521-2 12.6.0 CR#301 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153582	Update of various introductory sections in 34.123-1	CR	Samsung, MCC TF 160	34.123-1 12.0.0 CR#3790 catF	TEI_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153583	Update of TC 8.1.2.1 RRC connection establishment / Ks=1.25 / Success to reflect its original intention	CR	Samsung	36.523-1 12.6.0 CR#3117 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.3.1	available	[WTS] [JSN]
R5-153584	Update of TC 9.2.2.1.3 for dynamic change of GERAN Release	CR	Samsung, MCC TF 160	36.523-1 12.6.0 CR#3118 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.4	available	[WTS] [JSN]
R5-153585	Adding ICS for dynamic change of GERAN Release	CR	Samsung, MCC TF 160	36.523-2 12.6.0 CR#775 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.5.1	available	[WTS] [JSN]
R5-153586	Reduction of the value of the T3402 used in TC 9.2.1.1.22	CR	Samsung	36.523-1 12.6.0 CR#3119 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.4	available	[WTS] [JSN]
R5-153587	Indicating a limited number of releases for TC applicability	CR	Samsung, MCC TF 160	36.523-2 12.6.0 CR#776 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.5.1	available	[WTS] [JSN]
R5-153588	Explicit ICS/IXIT branching the TC execution	discussion	Samsung				R5-68 AI: 6.2	available	[WTS] [JSN]
R5-153589	Update of 36.523-2 for explicit ICS/IXIT branching the TC execution	CR	Samsung	36.523-2 12.6.0 CR#777 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.5.1	available	[WTS] [JSN]
R5-153590	Proposal for moving the SSAC TCs from 34.229 into 36.523	discussion	Samsung, MCC TF 160				R5-68 AI: 6.2	available	[WTS] [JSN]
R5-153591	Moving the MTSI SSAC access probability TCs from 34.229 into 36.523	CR	Samsung, MCC TF 160	36.523-1 12.6.0 CR#3120 catF	TEI9_Test	Rel-12	R5-68 AI: 6.4.3.4	available	[WTS] [JSN]
R5-153592	Adding applicability for MTSI SSAC access probability TCs	CR	Samsung, MCC TF 160	36.523-2 12.6.0 CR#778 catF	TEI9_Test	Rel-12	R5-68 AI: 6.4.5.1	available	[WTS] [JSN]
R5-153593	Adding note for Moving the MTSI SSAC access probability	CR	Samsung, MCC TF 160	34.229-1 12.6.0 CR#738 catF	TEI9_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153594	Removing Applicability for the MTSI SSAC access probability TCs	CR	Samsung, MCC TF 160	34.229-2 12.5.0 CR#150 catF	TEI9_Test	Rel-12	R5-68 AI: 6.6.6.2	available	[WTS] [JSN]
R5-153595	Adding new TC 13.5.3 MTSI MO SMS / SCM / 0% access probability skip for MTSI MO SMS over IP	CR	Samsung	36.523-1 12.6.0 CR#3121 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.1	available	[WTS] [JSN]
R5-153596	Adding applicability for new TC 13.5.3 SCM	CR	Samsung	36.523-2 12.6.0 CR#779 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.2	available	[WTS] [JSN]
R5-153597	Adding new generic procedure for MO SMS over IP	CR	Samsung	36.508 12.6.0 CR#635 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.4	reserved	[WTS] [JSN]
R5-153598	[PTCO] Summary of proposals with Risk Analysis for RAN5#68	discussion	Samsung				R5-68 AI: 4.5.5	available	[WTS] [JSN]
R5-153599	[PTCO] Reject-Failure: Proposal for removal of TCs 9.2.1.1.25 and 9.2.1.1.30 extremely rare scenario	discussion	Samsung				R5-68 AI: 4.5.5	available	[WTS] [JSN]
R5-153600	[PTCO] Implicit Testing: Removal of TC 9.2.1.1.21 update of 9.2.1.1.22	CR	Samsung	36.523-1 12.6.0 CR#3122 catF	TEI8_Test	Rel-12	R5-68 AI: 4.5.5	available	[WTS] [JSN]
R5-153601	[PTCO] Implicit Testing: Removal of TC 9.1.2.1 and update of 9.1.2.3 due to removal of 9.1.2.1 and 8.1.3.1	CR	Samsung	36.523-1 12.6.0 CR#3123 catF	TEI8_Test	Rel-12	R5-68 AI: 4.5.5	available	[WTS] [JSN]
R5-153602	[PTCO] Implicit testing: Update of 11.2.1 due to removal of 8.1.2.11	CR	Samsung	36.523-1 12.6.0 CR#3124 catF	TEI9_Test	Rel-12	R5-68 AI: 4.5.5	available	[WTS] [JSN]
R5-153603	[PTCO] Implicit testing: Update of 11.2.2 due to removal of 8.1.2.12	CR	Samsung	36.523-1 12.6.0 CR#3125 catF	TEI9_Test	Rel-12	R5-68 AI: 4.5.5	available	[WTS] [JSN]
R5-153604	[PTCO] Implicit testing: Update of 9.3.2.1 due to removal of 8.1.1.1	CR	Samsung	36.523-1 12.6.0 CR#3126 catF	TEI8_Test	Rel-12	R5-68 AI: 4.5.5	available	[WTS] [JSN]
R5-153605	[PTCO] Implicit testing: Removal of 8.1.2.11, 8.1.2.12, 8.1.3.1 and 8.1.1.1	CR	Samsung	36.523-1 12.6.0 CR#3127 catF	TEI8_Test	Rel-12	R5-68 AI: 4.5.5	available	[WTS] [JSN]
R5-153606	[PTCO] Implicit Testing: Removing TCs from the applicability table	CR	Samsung	36.523-2 12.6.0 CR#780 catF	TEI8_Test	Rel-12	R5-68 AI: 4.5.5	available	[WTS] [JSN]
R5-153607	Update of feICIC Test cases 8.1.5 and 8.1.6	CR	Ericsson LM	37.571-1 12.3.0 CR#143 catF	TEI11_Test	Rel-12	R5-68 AI: 5.5.9	available	[WTS] [JSN]
R5-153608	Adding operating band XXXII to clause 8 of 34.121-1	CR	Ericsson LM	34.121-1 12.0.0 CR#1609 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-68 AI: 5.3.6.2	available	[WTS] [JSN]
R5-153609	Adding a new Annex “Conditions for RRM requirements applicability for operating bands”	CR	Ericsson LM	34.121-1 12.0.0 CR#1610 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-68 AI: 5.3.6.2	available	[WTS] [JSN]
R5-153610	Usage of “a=sendrecv” following deletion of “a=inactive”	CR	ROHDE & SCHWARZ	34.229-1 12.6.0 CR#739 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153611	Correction to Rel-9 DC-HSUPA MAC testcase 7.1.9.2	CR	ROHDE & SCHWARZ	34.123-1 12.0.0 CR#3791 catF	TEI9_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153612	Updates to test case 7.8.1A.5 Wideband intermodulation for CA (3DL CA without UL CA)	CR	Ericsson	36.521-1 12.6.0 CR#2121 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153613	Introduction of Receiver Spurious emissions test case for Carrier Aggregation in DL-only bands	CR	Ericsson	36.521-1 12.6.0 CR#2122 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-68 AI: 5.3.6.5	available	[WTS] [JSN]
R5-153614	Applicability for Receiver Spurious emissions test case for Carrier aggregation in DL-only bands	CR	Ericsson	36.521-2 12.6.0 CR#302 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-68 AI: 5.3.6.6	available	[WTS] [JSN]
R5-153615	Introduction of Receiver Spurious emissions test case for DB-DC-HSDPA in DL-only bands	CR	Ericsson	34.121-1 12.0.0 CR#1611 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-68 AI: 5.3.6.2	available	[WTS] [JSN]
R5-153616	Applicability for Receiver Spurious emissions test case for DB-DC-HSDPA in DL-only bands	CR	Ericsson	34.121-2 12.0.0 CR#162 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-68 AI: 5.3.6.3	available	[WTS] [JSN]
R5-153617	Additions to test case 6.2.2E - UE Maximum Output Power for UE category 0	CR	Ericsson	36.521-1 12.6.0 CR#2123 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153618	Changes to test case 7.3E - Reference sensitivity level for UE category 0	CR	Ericsson	36.521-1 12.6.0 CR#2124 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153619	RMC definitions for UE category 0	CR	Ericsson	36.521-1 12.6.0 CR#2125 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153620	TR 36.905, structure and content	other	Ericsson		TEI10_Test	Rel-12	R5-68 AI: 5.3.1.2	available	[WTS] [JSN]
R5-153621	Text proposal to TR 36.905 v0.0.1	other	Ericsson		TEI10_Test	Rel-12	R5-68 AI: 5.3.1.2	available	[WTS] [JSN]
R5-153622	TR 36.905 after RAN5#68	other	Ericsson		TEI10_Test	Rel-12	R5-68 AI: 5.3.1.2	available	[WTS] [JSN]
R5-153623	Status on proposals for RF/RRM test optimisation after RAN5#68	other	Ericsson		TEI_Test	Rel-12	R5-68 AI: 5.3.1.2	available	[WTS] [JSN]
R5-153624	New CA 2UL Tx test case 6.6.2.3A.2 Adjacent Channel Leakage power Ratio for CA (inter-band DL CA and UL CA)	CR	Ericsson	36.521-1 12.6.0 CR#2126 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153625	Editorial update of Blocking Characteristics test cases	CR	Ericsson	34.121-1 12.0.0 CR#1612 catF	TEI9_Test	Rel-12	R5-68 AI: 5.5.2	available	[WTS] [JSN]
R5-153626	Addition of applicability for new D2D test case on Successful Announce Request Procedure/Direct discovery	CR	Anritsu Ltd	36.523-2 12.6.0 CR#781 catB		Rel-12	R5-68 AI: 6.3.3.4	available	[WTS] [JSN]
R5-153627	Introduction of Default E-UTRA channel bandwidth combinations for CA Signalling testing with three component carriers	CR	7 LAYERS AG	36.508 12.6.0 CR#636 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.1	available	[WTS] [JSN]
R5-153628	Testing of D2D Work Item	discussion	BlackBerry UK Limited, Anritsu			Rel-12	R5-68 AI: 6.3.3.6	available	[WTS] [JSN]
R5-153629	Test Tolerances for test case 6.3.4A.1.3 General ON/OFF time mask for CA (intra-band contiguous DL CA and UL CA)	CR	BlackBerry UK Limited, Anritsu	36.521-1 12.6.0 CR#2127 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153630	Test Tolerances for test case 6.3.4A.1.1 General ON/OFF time mask for CA (intra-band contiguous DL CA and UL CA)	CR	BlackBerry UK Limited, Anritsu	36.521-1 12.6.0 CR#2128 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-153631	Corrections to test case 6.6.1A.1 Occupied bandwidth for CA (intra-band contiguous DL CA and UL CA)	CR	BlackBerry UK Limited, Anritsu	36.521-1 12.6.0 CR#2129 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-153632	Editorial correction for chapter 6.5 title - 3GPP/WLAN Work Plan	CR	Intel Corporation (UK) Ltd	36.523-1 12.6.0 CR#3128 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.6	available	[WTS] [JSN]
R5-153633	Test Tolerances for test case 6.6.1A.3 Occupied bandwidth for CA (intra-band non-contiguous DL CA and UL CA)	CR	BlackBerry UK Limited, Intel, Anritsu	36.521-1 12.6.0 CR#2130 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153634	Test Tolerances for test case 6.6.2.1A.3 Spectrum emission mask for CA (intra-band non-contiguous DL CA and UL CA)	CR	BlackBerry UK Limited, Intel	36.521-1 12.6.0 CR#2131 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	available	[WTS] [JSN]
R5-153635	Completion to Test cases 9.6.1.1_A.2 and 9.6.1.2_A.2: FDD/TDD CQI Reporting under AWGN conditions – PUCCH 1-0 (3DL CA)	CR	BlackBerry UK Limited, Qualcomm, Anritsu	36.521-1 12.6.0 CR#2132 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153636	Work Item codes for visibility of features impacted	discussion	BlackBerry UK Limited, AT&T, Anite, Ericsson				R5-68 AI: 4.2	available	[WTS] [JSN]
R5-153637	New PRD on Guidance to Work Item Codes	other	BlackBerry UK Limited				R5-68 AI: 4.3	available	[WTS] [JSN]
R5-153638	TS 36.523-1 Status before RAN5#68	other	Rapporteur (BlackBerry)				R5-68 AI: 6.4.6	available	[WTS] [JSN]
R5-153639	TS 36.523-1 Status after RAN5#68	other	Rapporteur (BlackBerry)				R5-68 AI: 6.4.6	available	[WTS] [JSN]
R5-153640	Correction to LTE IRAT testcase 6.3.4	CR	ROHDE & SCHWARZ	36.523-1 12.6.0 CR#3129 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.1	available	[WTS] [JSN]
R5-153641	Handling of unsolicited messages for Optional AT commands	discussion	ROHDE & SCHWARZ				R5-68 AI: 6.4.6	available	[WTS] [JSN]
R5-153642	Introduction of test environment and test frequency information for several new 3DL inter-band Carrier Aggregation with three different band combinations to 36.508	CR	7 LAYERS AG	36.508 12.6.0 CR#637 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.1	available	[WTS] [JSN]
R5-153643	Introduction of test environment and test frequency information for several new 3DL inter-band Carrier Aggregation combinations with two different bands to 36.508.	CR	7 LAYERS AG	36.508 12.6.0 CR#638 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.1	available	[WTS] [JSN]
R5-153644	36.521-1_ Several corrections in CA test 8.2.1.1.1_A.2	CR	Keysight Technologies UK Ltd	36.521-1 12.6.0 CR#2133 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	reserved	[WTS] [JSN]
R5-153645	36.521-1_CA power imbalance test updates	CR	Keysight Technologies UK Ltd	36.521-1 12.6.0 CR#2134 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153646	36.521-1_Reference corrections in test 6.6.3.2	CR	Keysight Technologies UK Ltd	36.521-1 12.6.0 CR#2135 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-153647	36.521-1_Test requirements correction in test 6.3.5.2	CR	Keysight Technologies UK Ltd	36.521-1 12.6.0 CR#2136 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-153648	Corrections to BDS Clock Model and Navigation Model for SIG tests	CR	CATR	37.571-5 12.2.0 CR#124 catF	TEI12_Test	Rel-12	R5-68 AI: 6.6.7.4	available	[WTS] [JSN]
R5-153649	Definition of additional E-UTRAN inter-band Cells for 3DL inter-band Carrier Aggregation combinations.	CR	7 LAYERS AG	36.508 12.6.0 CR#639 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.1	available	[WTS] [JSN]
R5-153650	36.521-1_Updates for band combination 1A-3A	CR	Keysight Technologies UK Ltd	36.521-1 12.6.0 CR#2137 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	reserved	[WTS] [JSN]
R5-153651	36.521-1_Updates for band combination 1A-3A-20A	CR	Keysight Technologies UK Ltd	36.521-1 12.6.0 CR#2138 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	reserved	[WTS] [JSN]
R5-153652	36.521-1_Updates for band combination 1A-7A-20A	CR	Keysight Technologies UK Ltd	36.521-1 12.6.0 CR#2139 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	reserved	[WTS] [JSN]
R5-153653	36.521-1_Updates for band combination 2A-2A-13A	CR	Keysight Technologies UK Ltd	36.521-1 12.6.0 CR#2140 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	reserved	[WTS] [JSN]
R5-153654	36.521-1_Updates for band combination 2A-12B	CR	Keysight Technologies UK Ltd	36.521-1 12.6.0 CR#2141 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	reserved	[WTS] [JSN]
R5-153655	Corrections to BDS Clock Model and Navigation Model for SIG tests	CR	CATR	37.571-5 12.2.0 CR#125 catF	TEI12_Test	Rel-12	R5-68 AI: 5.5.11	withdrawn	[WTS] [JSN]
R5-153656	36.521-1_Updates for band combination 12B	CR	Keysight Technologies UK Ltd	36.521-1 12.6.0 CR#2142 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	reserved	[WTS] [JSN]
R5-153657	36.521-2_Addition of band combinations 2A-2A-13A and 2A-12A-12A	CR	Keysight Technologies UK Ltd	36.521-2 12.6.0 CR#303 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.3	reserved	[WTS] [JSN]
R5-153658	36.521-2_Addition of band combinations 12A-12A	CR	Keysight Technologies UK Ltd	36.521-2 12.6.0 CR#304 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.3	reserved	[WTS] [JSN]
R5-153659	36.521-1_ Several corrections in CA test 8.2.1.1.1_A.2	CR	Keysight Technologies UK Ltd	36.521-1 12.6.0 CR#2143 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	available	[WTS] [JSN]
R5-153660	Correction to Test Case 12.3.2.8	CR	Intel Corporation (UK) Ltd	34.123-1 11.7.0 CR#3792 catF		Rel-11	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153661	Update of Galileo OS SIS ICD reference	CR	CATR	37.571-1 12.3.0 CR#144 catF	TEI12_Test	Rel-12	R5-68 AI: 5.5.9	available	[WTS] [JSN]
R5-153662	Correction to Test Case 12.4.1.4	CR	Intel Corporation (UK) Ltd	34.123-1 11.7.0 CR#3793 catF		Rel-11	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153663	Correction to Test Case 10.5.1b	CR	Intel Corporation (UK) Ltd	36.523-1 12.6.0 CR#3130 catF		Rel-12	R5-68 AI: 6.4.3.4	available	[WTS] [JSN]
R5-153664	Update of Galileo OS SIS ICD reference	CR	CATR	37.571-5 12.2.0 CR#126 catF		Rel-12	R5-68 AI: 5.5.11	available	[WTS] [JSN]
R5-153665	Additions to test case 6.2.4E – Additional Maximum Power Reduction (A-MPR) for UE category 0	CR	Ericsson	36.521-1 12.6.0 CR#2144 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	available	[WTS] [JSN]
R5-153666	Update A10 condition for REGISTER message	CR	Qualcomm Japan Inc	34.229-1 12.6.0 CR#740 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	reserved	[WTS] [JSN]
R5-153667	Correction to LTE-A eICIC test case 8.3.1.28	CR	Rohde & Schwarz, Anritsu Ltd., Qualcomm Incorporated, MCC-TF160	36.523-1 12.6.0 CR#3131 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-153668	Correction to eMBMS test case 17.3.2	CR	ROHDE & SCHWARZ	36.523-1 12.6.0 CR#3132 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.11	available	[WTS] [JSN]
R5-153669	Correction to IMS Emergency Call test case 11.2.7	CR	Rohde & Schwarz, Qualcomm Incorporated, Samsung	36.523-1 12.6.0 CR#3133 catF	TEI9_Test	Rel-12	R5-68 AI: 6.4.3.11	reserved	[WTS] [JSN]
R5-153670	Data Throughput	LS in	GCF PAG				R5-68 AI: 3	available	[WTS] [JSN]
R5-153671	Resubmission: CA RF: Clarification of PHICH configuration	CR	ETSI	36.521-1 12.6.0 CR#2145 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-153672	Resubmission: Corrections to rSRVCC test cases 13.4.3.x	CR	ETSI	36.523-1 12.6.0 CR#3134 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.11	available	[WTS] [JSN]
R5-153673	Addition of new UTRAN-WLAN interworking test case 8.2.10.6	CR	Tejet	34.123-1 12.0.0 CR#3794 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	available	[WTS] [JSN]
R5-153674	Addition of new UTRAN-WLAN interworking test case 8.2.10.7	CR	Tejet	34.123-1 12.0.0 CR#3795 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	available	[WTS] [JSN]
R5-153675	Addition of new UTRAN-WLAN interworking test case 8.2.10.8	CR	Tejet	34.123-1 12.0.0 CR#3796 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	available	[WTS] [JSN]
R5-153676	Addition applicability for new EUTRAN-WLAN interworking test case	CR	Tejet	34.123-2 12.0.0 CR#748 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.3	available	[WTS] [JSN]
R5-153677	Add new EVS test case 12.25 MO MTSI speech call / EVS / AMR-WB	CR	Tejet	34.229-1 12.6.0 CR#741 catF	EVS_codec-UEConTest	Rel-12	R5-68 AI: 6.3.7.2	available	[WTS] [JSN]
R5-153678	Add applicability for new MT EVS test case 12.25	CR	Tejet	34.229-2 12.5.0 CR#151 catF	EVS_codec-UEConTest	Rel-12	R5-68 AI: 6.3.7.3	available	[WTS] [JSN]
R5-153679	Corrections to BDS Clock Model and Navigation Model for Perf tests	CR	CATR	37.571-5 12.2.0 CR#127 catF	TEI12_Test	Rel-12	R5-68 AI: 5.5.11	available	[WTS] [JSN]
R5-153680	Rewording of PICS for video feature tag	CR	ROHDE & SCHWARZ	34.229-2 12.5.0 CR#152 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.2	available	[WTS] [JSN]
R5-153681	Corrections to test cases 13.1.9 and 13.1.10	CR	CATT	36.523-1 12.6.0 CR#3135 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.11	available	[WTS] [JSN]
R5-153682	Correction to IMS Emergency Call test case 19.1.3	CR	Anritsu Ltd	34.229-1 12.6.0 CR#742 catF		Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153683	UE Category Corrections to test case 8.2.1.4.2_A.1 from 36.521-1	CR	7Layers	36.521-1 12.6.0 CR#2146 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-153684	Applicability corrections for test case 8.2.1.4.2_A.1	CR	7Layers	36.521-2 12.6.0 CR#305 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.3	available	[WTS] [JSN]
R5-153685	Proposed Split of XCAP test case 15.14a for Outgoing and Incoming Communication Barring while roaming services	discussion	Anite Telecoms Ltd, Qualcomm Incorporated				R5-68 AI: 6.6.6.5	available	[WTS] [JSN]
R5-153686	Update applicability of test case 8.2.4.17.2 (AP#67.03)	CR	Motorola Mobility	36.523-2 12.6.0 CR#782 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.4	available	[WTS] [JSN]
R5-153687	Uncerts and Test Tols for TCs 7.1.3+7.1.4 36.521-3 CR	CR	Huawei, Anritsu	36.521-3 12.6.0 CR#1239 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-153688	Cell mapping for new RRM TCs 7.1.3_1+7.1.4_1	CR	Huawei, Anritsu	36.521-3 12.6.0 CR#1240 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153689	Applicability for new RRM TCs 7.1.3_1+7.1.4_1	CR	Huawei, Anritsu	36.521-2 12.6.0 CR#306 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153690	Addition of new RRM TCs 7.1.3_1+7.1.4_1	CR	Huawei, Anritsu	36.521-3 12.6.0 CR#1241 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153691	Correction to MDT Inter-RAT Logged Handover Failure test case 8.6.7.1	CR	Anite Telecoms Ltd, Qualcomm Incorporat	36.523-1 12.6.0 CR#3136 catF		Rel-12	R5-68 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-153692	Correction to relative measurement test cases of feICIC RRM test cases.	CR	Qualcomm Inc	36.521-3 12.6.0 CR#1242 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	available	[WTS] [JSN]
R5-153693	New Work Item proposal: UE Conformance Test Aspects - UE Power Consumptions Optimizations (UEPCOP)	WID new	Ericsson				R5-68 AI: 4.1	available	[WTS] [JSN]
R5-153694	LS to 3GPP RAN4/RAN5 Regarding CTIA MIMO OTA Test Plan Development	LS in	CTIA				R5-68 AI: 3	available	[WTS] [JSN]
R5-153695	New WID proposal: UE Conformance Test Aspects - Further Enhancements to LTE TDD for DL-UL Interference Management and Traffic Adaptation	WID new revision of R5-153337	CATT				R5-68 AI: 7.5	agreed	[WTS] [JSN]
R5-153696	New Work Item proposal: UE Conformance Test Aspects - UE Power Consumptions Optimizations (UEPCOP)	WID new	Ericsson				R5-68 AI: 7.5	agreed	[WTS] [JSN]
R5-153697	Correction to Rel-10 NIMTC testcase 11.1.3.4	CR	ROHDE & SCHWARZ	34.123-1 12.1.0 CR#37631 catF	TEI10_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153698	Correction to Rel-10 NIMTC testcases 9.4.5.5 and 12.4.3.2a	CR	ROHDE & SCHWARZ, Intel	34.123-1 12.1.0 CR#37651 catF	TEI10_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153699	Correction to Rel-8 SS testcase 15.4.3	CR	ROHDE & SCHWARZ	34.123-1 12.1.0 CR#37661 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153700	Correction to Rel-8 SS testcase 15.8.1	CR	ROHDE & SCHWARZ	34.123-1 12.1.0 CR#37671 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153701	Correction to Rel-8 SS testcase 15.8.4	CR	ROHDE & SCHWARZ	34.123-1 12.1.0 CR#37681 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153702	Correction to Rel-8 SS testcase 15.8.5	CR	ROHDE & SCHWARZ	34.123-1 12.1.0 CR#37691 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153703	Correction to Rel-8 SS testcase 15.8.6	CR	ROHDE & SCHWARZ	34.123-1 12.1.0 CR#37701 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153704	Correction to Rel-8 SS testcase 15.9.3 & 15.9.4	CR	ROHDE & SCHWARZ	34.123-1 12.1.0 CR#37721 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153705	Correction to Initial conditions of NITZ Test Cases 9.4.10, 12.2.1.13, 12.2.1.14 and 12.2.1.15	CR	ROHDE & SCHWARZ	34.123-1 12.1.0 CR#37881 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153706	Correction to Rel-9 DC-HSUPA MAC testcase 7.1.9.2	CR	ROHDE & SCHWARZ	34.123-1 12.1.0 CR#37911 catF	TEI9_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153707	Update TC 8.3.1.1d Inter-frequency absolute priority based reselection in CELL_FACH (Lower Priority)	CR	QUALCOMM Incorporated, MCC TF160	34.123-1 12.1.0 CR#37761 catF	TEI11_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153708	Update TC 8.3.1.1e Inter-frequency absolute priority based reselection in CELL_FACH (Higher Priority)	CR	QUALCOMM Incorporated, MCC TF160	34.123-1 12.1.0 CR#37771 catF	TEI11_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153709	Update of TC 8.3.1.1f - Inter-frequency reselection to a no priority layer when NW and UE supports absolute priority in CELL_FACH	CR	QUALCOMM Incorporated, MCC TF160	34.123-1 12.1.0 CR#37781 catF	TEI11_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153710	Clarification of ICS for F-DPCH support with HS	CR	Ericsson	34.123-2 12.1.0 CR#7471 catF	TEI12_Test	Rel-12	R5-68 AI: 6.6.4.2	agreed	[WTS] [JSN]
R5-153711	Introduction of new test case 8.2.2.90 - Radio Bearer Reconfiguration in CELL_DCH: Successful Reconfiguration of DCH Enhancement in Full Mode	CR	QUALCOMM Incorporated	34.123-1 11.7.0 CR#37731 catF	UTRA_DCHenh-UEConTest	Rel-11	R5-68 AI: 6.3.9.2	agreed	[WTS] [JSN]
R5-153712	Introduction of new test case 8.2.2.91 - Radio Bearer Reconfiguration for transition to CELL_DCH with SRBs mapped on DCH: Successful Activation and Deactivation of DCH Enhancement in Basic Mode	CR	QUALCOMM Incorporated	34.123-1 12.1.0 CR#37741 catF	UTRA_DCHenh-UEConTest	Rel-12	R5-68 AI: 6.3.9.2	agreed	[WTS] [JSN]
R5-153713	Introduction of new test case 8.2.2.92 - Radio Bearer Reconfiguration for transition to CELL_DCH with SRBs mapped on DCH: Successful Activation and Deactivation of DCH Enhancement in Full Mode	CR	QUALCOMM Incorporated	34.123-1 12.1.0 CR#37751 catF	UTRA_DCHenh-UEConTest	Rel-12	R5-68 AI: 6.3.9.2	agreed	[WTS] [JSN]
R5-153714	Compliance to GSMA PRDs	discussion	Ericsson, Anite				R5-68 AI: 6.6.6.5	noted	[WTS] [JSN]
R5-153715	Update the default configuration of channel bandwidth for Band 42 for signalling testing	CR	KDDI Corporation, CMCC	36.508 12.7.0 CR#6251 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.1	agreed	[WTS] [JSN]
R5-153716	New generic procedure 4.5A.21 Generic Test Procedure for IMS MO Customized Alerting Tones and speech establishment in E-UTRA	CR	Ericsson	36.508 12.7.0 CR#6281 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.1	agreed	[WTS] [JSN]
R5-153717	Correction to PhysicalConfigDedicated-DEFAULT	CR	Anritsu Ltd	36.508 12.7.0 CR#6301 catF		Rel-12	R5-68 AI: 6.4.1	agreed	[WTS] [JSN]
R5-153718	Correction to Cell selection test case 6.1.2.3	CR	Qualcomm Incorporated, Anritsu Ltd.	36.523-1 12.7.0 CR#30581 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.1	available	[WTS] [JSN]
R5-153719	Updates to 7.1.7.1 and 7.1.7.2 about DL-SCH and UL-SCH TBS selection	CR	Huawei	36.523-1 12.7.0 CR#30901 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.2.1	agreed	[WTS] [JSN]
R5-153720	Update of RLC test case 7.2.2.5.2	CR	Intel Corporation, MCC TF160, Anritsu Ltd.	36.523-1 12.7.0 CR#30601 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.2.2	agreed	[WTS] [JSN]
R5-153721	Update of TC 8.1.2.1 RRC connection establishment / Ks=1.25 / Success to reflect its original intention	CR	Samsung	36.523-1 12.7.0 CR#31171 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.3.1	agreed	[WTS] [JSN]
R5-153722	Updates to 8.2.2.3 and Deletion of 8.2.4.24	CR	Huawei, Qualcomm Incorporated, Anritsu, Anite, Rohde & Schwarz	36.523-1 12.7.0 CR#30911 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.2	agreed	[WTS] [JSN]
R5-153723	New Work Item proposal: UE Conformance Test Aspects – Multimedia Telephony Services for IMS (MTSI) over WLAN	WID new	Ericsson				R5-68 AI: 7.5	agreed	[WTS] [JSN]
R5-153724	Editorial correction to DL-SCH SCH transport block size selection test cases 7.1.7.1.3 and 7.1.7.1.4	CR	Ericsson	36.523-1 12.7.0 CR#3137 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	available	[WTS] [JSN]
R5-153725	Update of test case 8.4.2.7.x	CR	Intel Corporation (UK) Ltd	36.523-1 12.7.0 CR#30741 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.4	agreed	[WTS] [JSN]
R5-153726	Correction to EUTRA eMDT test case 8.6.11.1	CR	Anritsu Ltd, Qualcomm Incorporated	36.523-1 12.7.0 CR#30671 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.3.5	agreed	[WTS] [JSN]
R5-153727	Correction to eMDT test case 8.6.2.11	CR	Anritsu Ltd, Qualcomm Incorporated	36.523-1 12.7.0 CR#30721 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.3.5	agreed	[WTS] [JSN]
R5-153728	Correction to eMDT test case 8.6.3.4	CR	Anite Telecoms Ltd., Samsung	36.523-1 12.7.0 CR#30831 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.3.5	agreed	[WTS] [JSN]
R5-153729	Correction to MDT test case 8.6.4.4	CR	Anite Telecoms Ltd., Qualcomm Incorporated	36.523-1 12.7.0 CR#30851 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.5	agreed	[WTS] [JSN]
R5-153730	Correction to test case 8.6.7.1	CR	Huawei, Intel, Rohde & Schwarz	36.523-1 12.7.0 CR#30921 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.5	agreed	[WTS] [JSN]
R5-153731	Update of ANR test case 8.7.1	CR	Intel Corporation (UK) Ltd, Anritsu	36.523-1 12.7.0 CR#30641 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.6	agreed	[WTS] [JSN]
R5-153732	Update of test case 9.1.5.1	CR	Intel Corporation (UK) Ltd	36.523-1 12.7.0 CR#30591 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.4	revised	[WTS] [JSN]
R5-153733	Update of TC 9.2.2.1.3 for dynamic change of GERAN Release	CR	Samsung, MCC TF 160	36.523-1 12.7.0 CR#31181 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.4	agreed	[WTS] [JSN]
R5-153734	Reduction of the value of the T3402 used in TC 9.2.1.1.22	CR	Samsung	36.523-1 12.7.0 CR#31191 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.4	agreed	[WTS] [JSN]
R5-153735	Reply LS on Interoperability consequences for not testing presence of IM CN SS flag	LS in	TSG WG CT1				R5-68 AI: 6.2	noted	[WTS] [JSN]
R5-153736	Moving the MTSI SSAC access probability TCs from 34.229 into 36.523	CR	Samsung, MCC TF 160	36.523-1 12.7.0 CR#31201 catF	TEI9_Test	Rel-12	R5-68 AI: 6.4.3.4	agreed	[WTS] [JSN]
R5-153737	Correction to Test Case 10.5.1b	CR	Intel Corporation (UK) Ltd, Anite	36.523-1 12.7.0 CR#31301 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.4	agreed	[WTS] [JSN]
R5-153738	Correction to IMS Emergency Call test case 11.2.12	CR	ROHDE & SCHWARZ, Qualcomm Incorporated	36.523-1 12.7.0 CR#31061 catF	TEI9_Test	Rel-12	R5-68 AI: 6.4.3.6	agreed	[WTS] [JSN]
R5-153739	Correction to Multilayer Procedures test case 13.4.2.4	CR	Anite Telecoms Ltd.	36.523-1 12.7.0 CR#30791 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.8	agreed	[WTS] [JSN]
R5-153740	Correction to eMBMS test case 17.4.5	CR	Anite Telecoms Ltd., Samsung	36.523-1 12.7.0 CR#30541 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.11	agreed	[WTS] [JSN]
R5-153741	Correction to eMBMS test cases 17.4.3 and 17.4.3a	CR	Anite Telecoms Ltd., Samsung	36.523-1 12.7.0 CR#30781 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.11	agreed	[WTS] [JSN]
R5-153742	Void applicability of 1x SRVCC test case 8.4.7.1	CR	Qualcomm Incorporated, Rohde & Schwarz, KDDI	36.523-2 12.7.0 CR#7631 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.4	agreed	[WTS] [JSN]
R5-153743	Adding ICS for dynamic change of GERAN Release	CR	Samsung, MCC TF 160	36.523-2 12.7.0 CR#7751 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.4	agreed	[WTS] [JSN]
R5-153744	Indicating a limited number of releases for TC applicability	CR	Samsung, MCC TF 160	36.523-2 12.7.0 CR#7761 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.4	agreed	[WTS] [JSN]
R5-153745	Adding applicability for MTSI SSAC access probability TCs	CR	Samsung, MCC TF 160	36.523-2 12.7.0 CR#7781 catF	TEI9_Test	Rel-12	R5-68 AI: 6.4.4	agreed	[WTS] [JSN]
R5-153746	Routine maintenance for TS 36.523-3	CR	MCC TF160	36.523-3 12.3.0 CR#27831 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.5.1	agreed	[WTS] [JSN]
R5-153747	Correction to test case 6.2.2.2	CR	MCC TF160	36.523-1 12.7.0 CR#3138 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.1	available	[WTS] [JSN]
R5-153748	Correction to test cases 13.4.2.5, 13.4.2.6, 13.4.2.7, 13.4.2.8	CR	MCC TF160	36.523-1 12.7.0 CR#3139 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.8	available	[WTS] [JSN]
R5-153749	Addition and modification of 2DL CA Frequencies and CA Channel Bandwidth combination	CR	KDDI Corporation, NTT DOCOMO INC.	36.508 12.7.0 CR#6241 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 6.3.1.1	agreed	[WTS] [JSN]
R5-153750	Introduction of test environment information for new 3DL intra-band Carrier Aggregation combinations to 36.508	CR	7 LAYERS AG	36.508 12.7.0 CR#6331 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 6.3.1.1	withdrawn	[WTS] [JSN]
R5-153751	Introduction of test environment information for intra-band Carrier Aggregation combinations CA_2C	CR	7 LAYERS AG	36.508 12.7.0 CR#640 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 6.3.1.1	agreed	[WTS] [JSN]
R5-153752	Introduction of Default E-UTRA channel bandwidth combinations for CA Signalling testing with three component carriers	CR	7 LAYERS AG	36.508 12.7.0 CR#6361 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 6.3.1.1	agreed	[WTS] [JSN]
R5-153753	Introduction of test environment and test frequency information for several new 3DL inter-band Carrier Aggregation combinations with two different bands to 36.508.	CR	7 LAYERS AG	36.508 12.7.0 CR#6381 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 6.3.1.1	agreed	[WTS] [JSN]
R5-153754	Updates to generic test procedure C.43	CR	MCC TF160, Intel	34.229-1 12.7.0 CR#7051 catF	TEI11_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153755	Correction to generic test procedure C.24	CR	MCC TF160	34.229-1 12.7.0 CR#7061 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153756	Un-subscriptions before de-registrations	CR	ROHDE & SCHWARZ, Anite	34.229-1 12.7.0 CR#7081 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153757	Adding new TC 13.5.6 MTSI MO SMS / SCM / 0% access probability skip for MTSI MO SMS over IP	CR	Samsung	36.523-1 12.7.0 CR#3140 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.1	agreed	[WTS] [JSN]
R5-153758	Editorial corrections to C.20	CR	ROHDE & SCHWARZ	34.229-1 12.7.0 CR#7121 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153759	Further corrections for SDP o-lines	CR	MCC TF160	34.229-1 12.7.0 CR#7141 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153760	Clarifications to handle GRUU in SIP signalling	CR	MCC TF160	34.229-1 12.7.0 CR#7191 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153761	RSeq in 183 Session Progress	CR	ROHDE & SCHWARZ, Qualcomm	34.229-1 12.7.0 CR#7211 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153762	Corrections to option tags in Supported and Require header	CR	MCC TF160, Rohde & Schwarz	34.229-1 12.7.0 CR#7231 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153763	Clarifications and corrections to IMS test case 20.1	CR	Ericsson, Qualcomm Incorporated, Rohde & Schwarz	34.229-1 12.7.0 CR#7271 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153764	Clarifications for A.6.2	CR	MCC TF160	34.229-1 12.7.0 CR#7291 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153765	Correction to Annexes C.19 and C.37	CR	Ericsson	34.229-1 12.7.0 CR#7341 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153766	Correction to video and smsip feature tags	CR	ROHDE & SCHWARZ, Qualcomm	34.229-1 12.7.0 CR#7361 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153767	Correction to description of applicablility of testcase 8.3	CR	Anritsu Ltd	34.229-2 12.6.0 CR#1481 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.2	agreed	[WTS] [JSN]
R5-153768	Addition of new test case TC 6.4.5 - WLAN Offload / Cell Selection / UTRA RRC_Idle to/from WLAN Failure (WLAN identifier does not match)	CR	TechMahindra Ltd	34.123-1 12.1.0 CR#37581 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	agreed	[WTS] [JSN]
R5-153769	Addition of new test case TC 8.2.10.1 - WLAN Offload / Offload Success / UTRA RRC_Connected to/from WLAN (RSRPmeas, BackhaulRateUlWLAN)	CR	TechMahindra Ltd	34.123-1 12.1.0 CR#37591 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	agreed	[WTS] [JSN]
R5-153770	Adding applicability for new SCM TC 13.5.6 and renumbering of existing SCM	CR	Samsung	36.523-2 12.7.0 CR#783 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.2	agreed	[WTS] [JSN]
R5-153771	Addition applicability for new EUTRAN-WLAN interworking test case	CR	Tejet	34.123-2 12.1.0 CR#7481 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.3	withdrawn	[WTS] [JSN]
R5-153772	Addition of new UTRAN-WLAN interworking test case 6.4.2	CR	Motorola Mobility	34.123-1 12.1.0 CR#37791 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	agreed	[WTS] [JSN]
R5-153773	Addition of new UTRAN-WLAN interworking test case 6.4.3	CR	Motorola Mobility	34.123-1 12.1.0 CR#37801 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	agreed	[WTS] [JSN]
R5-153774	Addition of applicability of new UTRAN-WLAN interworking test cases	CR	Motorola Mobility, Tech Mahindra, Tejet	34.123-2 12.1.0 CR#7451 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.3	available	[WTS] [JSN]
R5-153775	Correction to WLAN Offload procedures	CR	Motorola Mobility	36.508 12.7.0 CR#6191 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.5	withdrawn	[WTS] [JSN]
R5-153776	Addition of new EUTRAN-WLAN interworking test case 6.5.5	CR	Motorola Mobility	36.523-1 12.7.0 CR#30651 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.6	agreed	[WTS] [JSN]
R5-153777	Addition of new EUTRAN-WLAN interworking test case 6.5.6	CR	Motorola Mobility	36.523-1 12.7.0 CR#30661 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.6	agreed	[WTS] [JSN]
R5-153778	[PTCO] Implicit Testing: Removal of TC 9.1.2.1 and update of 9.1.2.3	CR	Samsung	36.523-1 12.7.0 CR#3141 catF	TEI8_Test	Rel-12	R5-68 AI: 4.5.5	revised	[WTS] [JSN]
R5-153779	[PTCO] Implicit Testing: Update of 8.2.1.1 due to removal of TC 8.1.3.1	CR	Samsung	36.523-1 12.7.0 CR#3142 catF	TEI8_Test	Rel-12	R5-68 AI: 4.5.5	agreed	[WTS] [JSN]
R5-153780	Moving SSAC TCs from TS 34.229 into TS 36.523	LS out LS To: GCF CAG	TSG WG RAN5				R5-68 AI: 6.7	approved	[WTS] [JSN]
R5-153781	Testing of D2D Work Item	discussion	BlackBerry UK Limited, Anritsu, TF160				R5-68 AI: 6.3.3.6	noted	[WTS] [JSN]
R5-153782	Update to Device to Device Proximity Services Test Environment	CR	QUALCOMM Incorporated, Ericsson	36.508 12.7.0 CR#6151 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.1	revised	[WTS] [JSN]
R5-153783	[PTCO] Implicit Testing: Removal of TC 9.2.1.1.21 update of 9.2.1.1.22	CR	Samsung	36.523-1 12.7.0 CR#31221 catF	TEI8_Test	Rel-12	R5-68 AI: 4.5.5	agreed	[WTS] [JSN]
R5-153784	[PTCO] Implicit Testing: Removal of TC 9.1.2.1 and update of 9.1.2.3	CR	Samsung	36.523-1 12.7.0 CR#31411 catF	TEI8_Test	Rel-12	R5-68 AI: 7.1.3	agreed	[WTS] [JSN]
R5-153785	[PTCO] Implicit testing: Update of 11.2.2 due to removal of 8.1.2.12	CR	Samsung	36.523-1 12.7.0 CR#31251 catF	TEI9_Test	Rel-12	R5-68 AI: 4.5.5	agreed	[WTS] [JSN]
R5-153786	[PTCO] Implicit testing: Update of 9.3.2.1 due to removal of 8.1.1.1	CR	Samsung	36.523-1 12.7.0 CR#31261 catF	TEI8_Test	Rel-12	R5-68 AI: 4.5.5	agreed	[WTS] [JSN]
R5-153787	[PTCO] Implicit testing: Removal of 8.1.2.11, 8.1.2.12, 8.1.3.1 and 8.1.1.1	CR	Samsung	36.523-1 12.7.0 CR#31271 catF	TEI8_Test	Rel-12	R5-68 AI: 4.5.5	agreed	[WTS] [JSN]
R5-153788	[PTCO] Summary of proposals with Risk Analysis for RAN5#68	discussion	Samsung				R5-68 AI: 4.5.5	noted	[WTS] [JSN]
R5-153789	New PRD on Guidance to Work Item Codes	other	BlackBerry UK Limited				R5-68 AI: 4.5.6	revised	[WTS] [JSN]
R5-153790	New PICS for dialog usage upon subscription to conference event package	CR	ROHDE & SCHWARZ	34.229-2 12.6.0 CR#153 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.2	available	[WTS] [JSN]
R5-153791	Corrections to BDS Clock Model and Navigation Model for SIG tests	CR	CATR	37.571-5 12.3.0 CR#1241 catF	TEI12_Test	Rel-12	R5-68 AI: 6.6.7.4	agreed	[WTS] [JSN]
R5-153792	Addition of TC 8.8.2.4 D2D test case for successful acceptance/rejection of Direct Discovery announcements	CR	TechMahindra Ltd	36.523-1 12.7.0 CR#30351 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.3	agreed	[WTS] [JSN]
R5-153793	Addition of a new D2D test case for Successful Reception and Transmission/ProSe Direct Discovery	CR	LG Electronics Inc.	36.523-1 12.7.0 CR#30431 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.3	agreed	[WTS] [JSN]
R5-153794	Addition of a new D2D test case for RRC Reconfiguration/Direct Discovery	CR	LG Electronics Inc.	36.523-1 12.7.0 CR#30441 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.3	agreed	[WTS] [JSN]
R5-153795	Addition of new D2D test case for Successful EPC-LEVEL ProSe Discovery	CR	Anritsu Ltd	36.523-1 12.7.0 CR#31031 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.3	agreed	[WTS] [JSN]
R5-153796	New WI proposal: UE Conformance Test Aspects – Network-Assisted Interference Cancellation and Suppression for LTE	WID new	Mediatek				R5-68 AI: 7.5	agreed	[WTS] [JSN]
R5-153797	LS on Status of Non-IMS E-UTRA Test Cases Regression on IMS Enabled Devices	LS out LS To: GCF CAG, PTCRB PVG	TSG WG RAN5				R5-68 AI: 7.5	approved	[WTS] [JSN]
R5-153798	Add new generic procedure for MT speech / EVS	CR	Ericsson	34.229-1 12.7.0 CR#7301 catF	EVS_codec-UEConTest	Rel-12	R5-68 AI: 6.3.7.1	agreed	[WTS] [JSN]
R5-153799	Correct annex C.44	CR	Ericsson	34.229-1 12.7.0 CR#7321 catF	EVS_codec-UEConTest	Rel-12	R5-68 AI: 6.3.7.1	revised	[WTS] [JSN]
R5-153800	Correction to applicability of feICIC demod test cases	CR	QUALCOMM UK Ltd	36.521-1 12.7.0 CR#20701 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.2	agreed	[WTS] [JSN]
R5-153801	Correction to test procedure in 7.8.1A.4 Wideband intermodulation for non-contiguous CA	CR	Anritsu	36.521-1 12.7.0 CR#20571 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.2.2	agreed	[WTS] [JSN]
R5-153802	Correction to Testpoint Selection in Chapter 7 NC CA Testcases	CR	Intel Deutschland GmbH	36.521-1 12.7.0 CR#20901 catF	TEI11_Test	Rel-13	R5-68 AI: 5.4.1.2.2	agreed	[WTS] [JSN]
R5-153803	Correction to title of table A 3.2-3 and A 3.2-4 in annex A.3.2	CR	CGC Inc.	36.521-1 12.7.0 CR#20481 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153804	Correction to message exceptions in performance test(User-Specific RS) for eDL-MIMO	CR	Anritsu	36.521-1 12.7.0 CR#20611 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153805	Correction to PMI reporting test for eDL-MIMO	CR	Anritsu	36.521-1 12.7.0 CR#20651 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153806	Correction to TM9 interference model test cases	CR	Anritsu	36.521-1 12.7.0 CR#20671 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153807	Updates to 8.7.2.1.A_1 TDD Sustained data rate performance for CA (2DL CA)	CR	Huawei	36.521-1 12.7.0 CR#20781 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153808	Merge of TDD sustained data rate CA test cases	CR	CMCC	36.521-1 12.7.0 CR#20891 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	withdrawn	[WTS] [JSN]
R5-153809	Addition of CA capability and applicability changes to TDD SDR CA tests	CR	QUALCOMM UK Ltd	36.521-1 12.7.0 CR#20851 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	withdrawn	[WTS] [JSN]
R5-153810	Correction to test point selection table for all chap8/9 FDD and TDD 2DLCA cases	CR	QUALCOMM UK Ltd	36.521-1 12.7.0 CR#20871 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153811	List of remaining TT analysis above 3GHz	other	Ericsson LM				R5-68 AI: 5.4.1.11	agreed	[WTS] [JSN]
R5-153812	New TC: E-UTRAN TDD activation and deactivation of known SCell in non-DRX for 20MHz +20MHz bandwidth	CR	SGS Wireless, Bureau Veritas ADT	36.521-3 12.7.0 CR#11901 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153813	Correction of L2G PSHO applicability for TS 36.521-2 spec	CR	NTT DOCOMO INC.	36.521-2 12.7.0 CR#2831 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.3	agreed	[WTS] [JSN]
R5-153814	New TCs: FDD Rel-12 CA RSRP relative accuracy tests	CR	CMCC	36.521-3 12.7.0 CR#12241 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153815	New TCs: TDD Rel-12 CA RSRP relative accuracy tests	CR	CMCC	36.521-3 12.7.0 CR#12251 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153816	Addition of new RRM TCs 7.1.3_1+7.1.4_1	CR	Huawei	36.521-3 12.7.0 CR#12411 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153817	3DL CA RRM Test Tolerance analysis strategy	discussion	ANRITSU LTD		LTE_CA_Rel12_3DL-UEConTest		R5-68 AI: 5.3.3.	noted	[WTS] [JSN]
R5-153818	Correction of descriptions for test cases 8.16.18	CR	Bureau Veritas ADT	36.521-3 12.7.0 CR#11861 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153819	Update editor’s note for RRM test case 8.16.17 and 8.16.18	CR	Bureau Veritas ADT	36.521-3 12.7.0 CR#11871 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153820	Addition of CA_2C to Chapter 4	CR	Intel Deutschland GmbH	36.508 12.7.0 CR#6271 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.1	agreed	[WTS] [JSN]
R5-153821	Update to FDD PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 for CA (3DL CA)	CR	LG Electronics Inc.	36.521-1 12.7.0 CR#20121 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153822	Addition of annex F for Reference sensitivity for 3DL CA	CR	NTT DOCOMO INC.	36.521-1 12.7.0 CR#20241 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153823	CA RF: Update of test points for CA_12B	CR	ROHDE & SCHWARZ	36.521-1 12.7.0 CR#20391 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153824	New CA band combinations (CA_1A-41C, CA_26A_41C, CA_41A_42C) - Updates of 6.2.5.3 Delta TIB	CR	KDDI Corporation	36.521-1 12.7.0 CR#20721 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	withdrawn	[WTS] [JSN]
R5-153825	New CA band combinations (CA_1A-41C, CA_26A_41C, CA_41A_42C) - Updates of 7.3.3 Delta RIB	CR	KDDI Corporation	36.521-1 12.7.0 CR#20731 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	withdrawn	[WTS] [JSN]
R5-153826	New CA band combinations (CA_1A-41C, CA_26A-41C, CA_41A-42C) - Updates of 7.3A Refsens	CR	KDDI Corporation	36.521-1 12.7.0 CR#20741 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	withdrawn	[WTS] [JSN]
R5-153827	Addition of 3DL CA default XB-YA configuration to REFSENS test configuration table	CR	Intel Deutschland GmbH	36.521-1 12.7.0 CR#20941 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153828	Addition of applicabilities for 3DL CA test cases	CR	NTT DOCOMO INC., BlackBerry., Huawei	36.521-2 12.7.0 CR#2801 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.3	agreed	[WTS] [JSN]
R5-153829	Introduction of 3DL CA Event triggered reporting Test cases 8.16.27 and 8.16.28	CR	ANRITSU LTD	36.521-3 12.7.0 CR#12011 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-153830	Introduction of 3DL CA RSRP accuracy Test cases 9.1.37 and 9.1.38	CR	ANRITSU LTD	36.521-3 12.7.0 CR#12021 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-153831	Introduction of 3DL Pcell in FDD RSRQ for E-UTRAN in Carrier Aggregation	CR	LG Electronics Inc., NTT DOCOMO	36.521-3 12.7.0 CR#12031 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-153832	Addition of new TC of 3DL FDD RSRP for E-UTRAN in Carrier Aggregation	CR	NTT DOCOMO INC., LG Electronics	36.521-3 12.7.0 CR#12071 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-153833	Addition of new TC of 3 DL FDD RSRQ for E-UTRAN in Carrier Aggregation	CR	NTT DOCOMO INC., Tejet	36.521-3 12.7.0 CR#12081 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-153834	Updates to RRM TCs 8.16.23, 8.16.24, 8.16.25 and 8.16.26	CR	Huawei	36.521-3 12.7.0 CR#12171 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-153835	Introduce connection diagram for multi-cell Enhanced requirements Type C tests	CR	Huawei	36.508 12.7.0 CR#6291 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.1	agreed	[WTS] [JSN]
R5-153836	Introduction of SUMIMO for LTE Type C performance TC 8.2.2.3.1B	CR	SGS Wireless	36.521-1 12.7.0 CR#19991 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	agreed	[WTS] [JSN]
R5-153837	Addition of Reference measurement channel and overview reference for multi-cell test in Annex	CR	Huawei	36.521-1 12.7.0 CR#21111 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	agreed	[WTS] [JSN]
R5-153838	Introduction of FDD TM3 test case for LTE Type C performance requirements (8.2.1.3.1B)	CR	Huawei	36.521-1 12.7.0 CR#21121 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	agreed	[WTS] [JSN]
R5-153839	Introduction of FDD TM3 multi-cell test case with TM1 interference for LTE Type C performance requirements (8.2.1.3.1C)	CR	Huawei	36.521-1 12.7.0 CR#21131 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	agreed	[WTS] [JSN]
R5-153840	Introduction of TDD TM3 multi-cell test case with TM1 interference for LTE Type C performance requirements (8.2.2.3.1C)	CR	Huawei	36.521-1 12.7.0 CR#21141 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	agreed	[WTS] [JSN]
R5-153841	Introduction of FDD TM4 test case for LTE Type C performance requirements (8.2.1.4.2A)	CR	Huawei	36.521-1 12.7.0 CR#21151 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	agreed	[WTS] [JSN]
R5-153842	Introduction of TDD TM4 test case for LTE Type C performance requirements (8.2.2.4.2A)	CR	Huawei	36.521-1 12.7.0 CR#21161 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	agreed	[WTS] [JSN]
R5-153843	Introduction of TDD TM8 test case for LTE Type C performance requirements (8.3.2.2.2)	CR	Huawei	36.521-1 12.7.0 CR#21171 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	agreed	[WTS] [JSN]
R5-153844	Introduction of FDD TM9 test case for LTE Type C performance requirements (8.3.1.2.2)	CR	Huawei	36.521-1 12.7.0 CR#21181 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	agreed	[WTS] [JSN]
R5-153845	Addition of Enhanced performance requirements Type C definition	CR	Huawei	36.521-1 12.7.0 CR#21191 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.2	agreed	[WTS] [JSN]
R5-153846	Addition of applicability of SU-MIMO conformance tests	CR	Huawei	36.521-2 12.7.0 CR#2981 catF	LTE_SUMIMO_RX-UEConTest	Rel-12	R5-68 AI: 5.3.9.3	agreed	[WTS] [JSN]
R5-153847	Addition of Multiple Inter-band CA Configurations to 7.3A.4	CR	Intel Deutschland GmbH	36.521-1 12.7.0 CR#2147 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	revised	[WTS] [JSN]
R5-153848	Update of eDL MIMO enhancement TC 9.4.2.3.3_G	CR	SGS Wireless	36.521-1 12.7.0 CR#19971 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-68 AI: 5.3.4.1	agreed	[WTS] [JSN]
R5-153849	Update of eDL MIMO enhancement TC 9.4.2.3.4_G	CR	SGS Wireless	36.521-1 12.7.0 CR#19981 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-68 AI: 5.3.4.1	agreed	[WTS] [JSN]
R5-153850	UE Cat 0: Connection diagrams for RF/RRM testing	CR	Rohde & Schwarz	36.508 12.7.0 CR#6161 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.1	agreed	[WTS] [JSN]
R5-153851	New TC: 9.7.1.2 TDD CQI reporting definition under AWGN conditions for UE category 0	CR	SGS Wireless	36.521-1 12.7.0 CR#20001 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-153852	RMC definitions for UE category 0	CR	Ericsson	36.521-1 12.7.0 CR#21251 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-153853	Additions to test case 6.2.2E - UE Maximum Output Power for UE category 0	CR	Ericsson	36.521-1 12.7.0 CR#21231 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-153854	Changes to test case 7.3E - Reference sensitivity level for UE category 0	CR	Ericsson	36.521-1 12.7.0 CR#21241 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-153855	Addition of new TC of Transmit off power for inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.7.0 CR#20261 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	agreed	[WTS] [JSN]
R5-153856	Addition of annex F for 2UL CA test cases	CR	NTT DOCOMO INC.	36.521-1 12.7.0 CR#20341 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	agreed	[WTS] [JSN]
R5-153857	introduction to the test case 6.2.4A.2:Additional Maximum Power Reduction (A-MPR) for CA (inter-band DL CA and UL CA)	CR	China Unicom	36.521-1 12.7.0 CR#20441 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	withdrawn	[WTS] [JSN]
R5-153858	Introduction to test case 6.2.4A.3: Additional Maximum Power Reduction (A-MPR) for CA (intra-band non-contiguous DL CA and UL CA)	CR	China Unicom	36.521-1 12.7.0 CR#20451 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	agreed	[WTS] [JSN]
R5-153859	EVM for Intra-band contiguous UL CA for non-equal Channel BWs	CR	QUALCOMM UK Ltd	36.521-1 12.7.0 CR#20881 catF	TEI10_Test	Rel-12	R5-68 AI: 5.3.8.2	agreed	[WTS] [JSN]
R5-153860	Addition of test applicabilities of some test cases for 2UL CA	CR	NTT DOCOMO INC.	36.521-2 12.7.0 CR#2821 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.3	agreed	[WTS] [JSN]
R5-153861	Proposal for missing Selection Criteria in table 4.1	CR	Intel Deutschland GmbH	36.521-2 12.7.0 CR#2911 catF	LC_MTC_LTE-UEConTest, LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.3	agreed	[WTS] [JSN]
R5-153862	Addition of SCE-L1 clause numbering principle in Annex I	CR	Huawei	36.521-1 12.7.0 CR#20841 catF	LTE_SC_enh_L1-UEConTest	Rel-12	R5-68 AI: 5.3.11.2	agreed	[WTS] [JSN]
R5-153863	Update of feICIC Test cases 8.1.5 and 8.1.6	CR	Ericsson LM	37.571-1 12.4.0 CR#1431 catF	TEI11_Test	Rel-12	R5-68 AI: 5.5.9	agreed	[WTS] [JSN]
R5-153864	Update of eICIC Test case 8.1.3	CR	Ericsson LM	37.571-1 12.4.0 CR#1411 catF	TEI10_Test	Rel-12	R5-68 AI: 5.5.9	agreed	[WTS] [JSN]
R5-153865	Update of eICIC Test case 8.1.4	CR	Ericsson LM	37.571-1 12.4.0 CR#1421 catF	TEI10_Test	Rel-12	R5-68 AI: 5.5.9	agreed	[WTS] [JSN]
R5-153866	Corrections to BDS Clock Model and Navigation Model for Perf tests	CR	CATR	37.571-5 12.3.0 CR#1271 catF	TEI12_Test	Rel-12	R5-68 AI: 5.5.11	agreed	[WTS] [JSN]
R5-153867	Adding missing subclauses in Annex A.2	CR	Bureau Veritas, Rohde & Schwarz	36.521-1 12.7.0 CR#2150 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153868	Align Test Procedure and Test requirements for 7.5A.5 ACS 3DL CA	CR	ANRITSU LTD	36.521-1 12.7.0 CR#20081 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153869	Align Test requirements for 7.4A.5 Max Input 3DL CA	CR	ANRITSU LTD	36.521-1 12.7.0 CR#20101 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153870	Completion to Test cases 9.6.1.1_A.2 and 9.6.1.2_A.2: FDD/TDD CQI Reporting under AWGN conditions – PUCCH 1-0 (3DL CA)	CR	BlackBerry UK Limited, Qualcomm, Anritsu	36.521-1 12.7.0 CR#21321 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153871	New TCs: 9.1.40 and 9.1.40_1 TDD RSRP Accuracy for 3DL CA	CR	CMCC	36.521-3 12.7.0 CR#12291 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-153872	New TCs: 9.2.39 TDD RSRQ Accuracy for 3DL CA	CR	CMCC	36.521-3 12.7.0 CR#12301 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-153873	Updates of minimum requirements of Spurious emission band UE co-existence	CR	NTT DOCOMO INC.	36.521-1 12.7.0 CR#20351 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.2.1	agreed	[WTS] [JSN]
R5-153874	New CA band combination CA_1A-5A-7A - Updates of 7.3.3 Delta RIB and 7.3A Refsens Test Configuration	CR	LG Uplus	36.521-1 12.7.0 CR#20011 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3	agreed	[WTS] [JSN]
R5-153875	CA RF: Update of connection diagrams for 3CCs (RF) testing for more than 3CCs	CR	ROHDE & SCHWARZ	36.508 12.7.0 CR#6111 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.1	agreed	[WTS] [JSN]
R5-153876	Update of 4.4.2 Simulated cells for CA RRM test cases	CR	Anritsu	36.508 12.7.0 CR#6211 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.1	agreed	[WTS] [JSN]
R5-153877	Updates of minimum requirements of reference sensitivity for 3DL CA	CR	NTT DOCOMO INC.	36.521-1 12.7.0 CR#20221 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	revised	[WTS] [JSN]
R5-153878	Updates of Reference sensitivity for 3DL CA	CR	NTT DOCOMO INC.	36.521-1 12.7.0 CR#20231 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	revised	[WTS] [JSN]
R5-153879	CA RF: Update of intraband contiguous blocking requirements	CR	ROHDE & SCHWARZ	36.521-1 12.7.0 CR#20361 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153880	Update of Reference sensitivity for CA_39A-41C and CA_39C-41A	CR	CMCC	36.521-1 12.7.0 CR#20961 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153881	Updates to test case 7.8.1A.5 Wideband intermodulation for CA (3DL CA without UL CA)	CR	Ericsson	36.521-1 12.7.0 CR#21211 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153882	New CA band combinations (CA_1A-41C, CA_26A_41C) - Updates of 7.3.3 Delta RIB	CR	KDDI	36.521-1 12.7.0 CR#2148 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153883	New CA band combinations (CA_1A-41C, CA_26A-41C) - Updates of 7.3A Refsens	CR	KDDI	36.521-1 12.7.0 CR#2149 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	revised	[WTS] [JSN]
R5-153884	Addition of Multiple Inter-band CA Configurations to 7.3A.4	CR	Intel Deutschland GmbH	36.521-1 12.7.0 CR#21471 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153885	Update to FDD PDSCH Open Loop Spatial Multiplexing 2x2 for CA (3DL CA)	CR	LG Electronics Inc., NTT DOCOMO	36.521-1 12.7.0 CR#20111 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153886	Update to TDD PDSCH Open Loop Spatial Multiplexing 2x2 for CA (3DL CA)	CR	LG Electronics Inc.	36.521-1 12.7.0 CR#20131 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153887	Update to TDD PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 for CA (3DL CA)	CR	LG Electronics Inc.	36.521-1 12.7.0 CR#20141 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153888	Updates to 8.2.2.1.1_A.2 TDD PDSCH Single Antenna Port Performance for CA (3DL CA)	CR	Huawei	36.521-1 12.7.0 CR#20761 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153889	Updates to 8.7.1.1.A_2 FDD Sustained data rate performance for CA (3DL CA)	CR	Huawei	36.521-1 12.7.0 CR#20771 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153890	Updates to 8.7.2.1.A_2 TDD Sustained data rate performance for CA (3DL CA)	CR	Huawei	36.521-1 12.7.0 CR#20791 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153891	Updates to TDD FDD CA test cases for PDSCH Single Antenna Port Performance	CR	QUALCOMM UK Ltd	36.521-1 12.7.0 CR#20861 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153892	Update of FDD PDSCH Single Antenna Port Performance for CA (3DL CA)	CR	Huawei, LGE, Anritsu	36.521-1 12.7.0 CR#21051 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153893	TDD FDD CA PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 for TDD PCell (2DL CA)	CR	Huawei	36.521-1 12.7.0 CR#21061 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153894	TDD FDD CA PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 for TDD PCell (3DL CA)	CR	Huawei	36.521-1 12.7.0 CR#21071 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153895	New CA band combinations (CA_1A-41C, CA_26A-41C) - Updates of 7.3A Refsens	CR	KDDI	36.521-1 12.7.0 CR#21491 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153896	Addition of applicabilities for 3DL CA RRM test cases	CR	NTT DOCOMO INC.	36.521-2 12.7.0 CR#2811 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.3	agreed	[WTS] [JSN]
R5-153897	Implementation of 36.521-1 Chapter 8.1 and 9.1 test selection rules in Table 4.1-1 testcases	CR	Intel Deutschland GmbH	36.521-2 12.7.0 CR#2891 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.3	agreed	[WTS] [JSN]
R5-153898	Addition of new TC 8.16.31 E-UTRAN TDD-FDD 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX and with PCell in FDD	CR	Huawei	36.521-3 12.7.0 CR#12181 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-153899	Addition of new TC 8.16.32 E-UTRAN TDD-FDD 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX and with PCell in TDD	CR	Huawei	36.521-3 12.7.0 CR#12191 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-153900	Addition of new TC 8.16.33 E-UTRAN FDD 3DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX	CR	Huawei	36.521-3 12.7.0 CR#12201 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-153901	Addition of new TC 8.16.34 E-UTRAN TDD 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX	CR	Huawei	36.521-3 12.7.0 CR#12211 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-153902	Introduction of eDL MIMO enhancement TC 9.3.7.1_G	CR	HEPTA 7291	36.521-1 12.7.0 CR#19931 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-68 AI: 5.3.4.1	agreed	[WTS] [JSN]
R5-153903	Introduction of eDL MIMO enhancement TC 9.3.7.2_G	CR	HEPTA 7291	36.521-1 12.7.0 CR#19941 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-68 AI: 5.3.4.1	agreed	[WTS] [JSN]
R5-153904	Introduction of eDL MIMO enhancement TC 9.4.1.4.1_G	CR	HEPTA 7291	36.521-1 12.7.0 CR#19951 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-68 AI: 5.3.4.1	agreed	[WTS] [JSN]
R5-153905	Introduction of eDL MIMO enhancement TC 9.4.1.4.2_G	CR	HEPTA 7291	36.521-1 12.7.0 CR#19961 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-68 AI: 5.3.4.1	agreed	[WTS] [JSN]
R5-153906	UE Cat 0 RF: Addition to Annex I	CR	Rohde & Schwarz, Ericsson	36.521-1 12.7.0 CR#20161 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-153907	Addition of test case 7.4E - Maximum input level for UE category 0	CR	CATR	36.521-1 12.7.0 CR#20971 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-153908	Additions to test case 6.2.3E - Maximum Power Reduction (MPR) for UE category 0	CR	Ericsson	36.521-1 12.7.0 CR#21201 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-153909	Additions to test case 6.2.4E – Additional Maximum Power Reduction (A-MPR) for UE category 0	CR	Ericsson	36.521-1 12.7.0 CR#21441 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-153910	Corrections to MTC test applicabilities	CR	Bureau Veritas ADT	36.521-2 12.7.0 CR#2761 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.3	agreed	[WTS] [JSN]
R5-153911	Correction of MTC UE test case applicability	CR	Huawei	36.521-2 12.7.0 CR#2971 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.3	agreed	[WTS] [JSN]
R5-153912	Addition of new TC of ON/OFF time mask for inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.7.0 CR#20271 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	agreed	[WTS] [JSN]
R5-153913	Addition of new TC of Occupied bandwidth for inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.7.0 CR#20281 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	agreed	[WTS] [JSN]
R5-153914	Addition of new TC of Spectrum emission mask for inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.7.0 CR#20301 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	agreed	[WTS] [JSN]
R5-153915	Addition of new TC of Transmitter Spurious emissions for inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.7.0 CR#20311 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	agreed	[WTS] [JSN]
R5-153916	Addition of new TC of Spurious emission band UE co-existence for inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.7.0 CR#20321 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	agreed	[WTS] [JSN]
R5-153917	Introduction to test case 6.2.5A.2: Configured UE transmitted Output Power for CA (inter-band DL CA and UL CA)	CR	China Unicom	36.521-1 12.7.0 CR#20461 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	agreed	[WTS] [JSN]
R5-153918	Introduction to test case 6.2.5A.3: Configured UE transmitted Output Power for CA (intra-band non-contiguous DL CA and UL CA)	CR	China Unicom	36.521-1 12.7.0 CR#20471 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.3.8.2	agreed	[WTS] [JSN]
R5-153919	eICIC RRM: Corrections to cell mapping Table E-1	CR	Rohde & Schwarz	36.508 12.7.0 CR#6171 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.1	agreed	[WTS] [JSN]
R5-153920	Update of 6.2.3_2 MPR for Multi-Cluster PUSCH	CR	Bureau Veritas ADT	36.521-1 12.7.0 CR#20071 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.1	agreed	[WTS] [JSN]
R5-153921	Correction to lower tolerances for CA_NS_05 in A-MPR	CR	Anritsu	36.521-1 12.7.0 CR#20541 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.1	agreed	[WTS] [JSN]
R5-153922	Corrections to test case 6.6.1A.1 Occupied bandwidth for CA (intra-band contiguous DL CA and UL CA)	CR	BlackBerry UK Limited, Anritsu	36.521-1 12.7.0 CR#21291 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.1	agreed	[WTS] [JSN]
R5-153923	CA RF: Clean Up of UL resource allocation for interband 2DL CA	CR	ROHDE & SCHWARZ	36.521-1 12.7.0 CR#20431 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.2	agreed	[WTS] [JSN]
R5-153924	Correction of minimum requirements and test procedures for 8.2.2.1.1_A.1	CR	Bureau Veritas ADT	36.521-1 12.7.0 CR#20021 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153925	Corrections to 8.2.2.3.1_A.1	CR	Bureau Veritas ADT	36.521-1 12.7.0 CR#20031 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153926	Correction to the title in 2DL CA performance test cases	CR	Anritsu	36.521-1 12.7.0 CR#20591 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153927	Correction to FDD soft buffer test for CA	CR	Anritsu	36.521-1 12.7.0 CR#20601 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153928	36.521-1_CA power imbalance test updates	CR	Keysight Technologies UK Ltd	36.521-1 12.7.0 CR#21341 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153929	Addition of applicability for newly introduced 20MHz+20MHz and 20MHz+10MHz cases (Rel-12)	CR	Bureau Veritas ADT	36.521-2 12.7.0 CR#2721 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.3	agreed	[WTS] [JSN]
R5-153930	New TC: E-UTRAN TDD - UE Timing Advance Adjustment Accuracy Test for Scell in sTAG for 20 MHz +20 MHz bandwidth	CR	SGS Wireless, Bureau Veritas ADT	36.521-3 12.7.0 CR#11881 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153931	New TC: E-UTRAN TDD - UE Timing Advance Adjustment Accuracy Test for Scell in sTAG for 20 MHz +10 MHz bandwidth	CR	SGS Wireless, Bureau Veritas ADT	36.521-3 12.7.0 CR#11891 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153932	Addition of applicability for newly introduced TC8.16.18A (Rel-10)	CR	Bureau Veritas ADT	36.521-2 12.7.0 CR#2741 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.3	agreed	[WTS] [JSN]
R5-153933	Addition of applicability for newly introduced TC7.1.4A (Rel-11)	CR	Bureau Veritas ADT	36.521-2 12.7.0 CR#2751 catF	TEI11_Test	Rel-12	R5-68 AI: 5.4.1.3	agreed	[WTS] [JSN]
R5-153934	Correction to applicability of TD-LTE to UTRA TDD connected mode measurements	CR	QUALCOMM UK Ltd	36.521-3 12.7.0 CR#11951 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153935	Correction to applicability of EUTRA TDD to UTRA TDD connected mode measurements	CR	QUALCOMM UK Ltd	36.521-2 12.7.0 CR#2771 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.3	agreed	[WTS] [JSN]
R5-153936	New TC: E-UTRAN TDD - UE Transmit Timing Accuracy Tests for SCell in sTAG for 20MHz + 20MHz bandwidth	CR	Bureau Veritas ADT	36.521-3 12.7.0 CR#11911 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153937	New TC: E-UTRAN TDD - UE Transmit Timing Accuracy Tests for SCell in sTAG for 20MHz + 10MHz bandwidth	CR	Bureau Veritas ADT	36.521-3 12.7.0 CR#11921 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153938	Correction to cell mapping of eICIC Chapter 9 test cases	CR	QUALCOMM UK Ltd	36.521-3 12.7.0 CR#11961 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153939	Clarification of neighbor cell frequency for intra-band non-contiguous CA	CR	Anritsu	36.521-3 12.7.0 CR#12131 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153940	Update of minimum requirements for relative RSRP Accuracy TC 9.1.6.2 and 9.1.7.2	CR	CMCC	36.521-3 12.7.0 CR#12231 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.4	agreed	[WTS] [JSN]
R5-153941	Adding applicability statements for ECID eICIC test cases 8.1.3 and 8.1.4	CR	Ericsson LM	37.571-3 12.4.0 CR#391 catF	TEI10_Test	Rel-12	R5-68 AI: 5.5.	agreed	[WTS] [JSN]
R5-153942	Introduction of new 3DL CA Test cases 8.16.29	CR	Ericsson LM	36.521-3 12.7.0 CR#12371 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153943	Introduction of new 3DL CA Test cases 8.16.30	CR	Ericsson LM	36.521-3 12.7.0 CR#12381 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	available	[WTS] [JSN]
R5-153944	Updates of minimum requirements of reference sensitivity for 3DL CA	CR	NTT DOCOMO INC.	36.521-1 12.7.0 CR#20222 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153945	Updates of Reference sensitivity for 3DL CA	CR	NTT DOCOMO INC.	36.521-1 12.7.0 CR#20232 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-153946	Adding applicability for TC 8.2.1.7_A.1	CR	Samsung	36.521-2 12.7.0 CR#3011 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.3	agreed	[WTS] [JSN]
R5-153947	UE Category Corrections to test case 8.2.1.4.2_A.1 from 36.521-1	CR	7Layers	36.521-1 12.7.0 CR#21461 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153948	Applicability corrections for test case 8.2.1.4.2_A.1	CR	7Layers	36.521-2 12.7.0 CR#3051 catF	TEI10_Test	Rel-12	R5-68 AI: 5.4.1.3	agreed	[WTS] [JSN]
R5-153949	Correction to RC.2 TDD Nr. HARQ Proc.	CR	ZTE Corporation	36.521-1 12.7.0 CR#19851 catF	TEI12_Test	Rel-12	R5-68 AI: 5.4.1.2.3	agreed	[WTS] [JSN]
R5-153950	Add new EVS test case 12.25 MO MTSI speech call / EVS / AMR-WB	CR	Tejet	34.229-1 12.7.0 CR#7411 catF	EVS_codec-UEConTest	Rel-12	R5-68 AI: 6.3.7.1	agreed	[WTS] [JSN]
R5-153951	Add applicability for new MT EVS test case 12.25	CR	Tejet	34.229-2 12.6.0 CR#1511 catF	EVS_codec-UEConTest	Rel-12	R5-68 AI: 6.3.7.3	agreed	[WTS] [JSN]
R5-153952	Split of XCAP test case 15.14a for communication barring while roaming	CR	Anite Telecoms Ltd, Qualcomm Incorporation	34.229-1 12.7.0 CR#743 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	revised	[WTS] [JSN]
R5-153953	Test case applicability changes due to Split of XCAP test case 15.14a	CR	Anite Telecoms Ltd, Qualcomm Incorporation	34.229-2 12.6.0 CR#154 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.2	revised	[WTS] [JSN]
R5-153954	New E-UTRA MAC test case 7.1.3.3a for DL MAC PDU header handling for Category 0 UE	CR	Ericsson	36.523-1 12.7.0 CR#30451 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	agreed	[WTS] [JSN]
R5-153955	New E-UTRA MAC test case 7.1.4.3a for logical channel prioritization handling for Category 0 UE	CR	Ericsson	36.523-1 12.7.0 CR#30461 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	agreed	[WTS] [JSN]
R5-153956	Correction of E-UTRA MAC test case 7.1.4.13 for Category 0 UE	CR	Ericsson	36.523-1 12.7.0 CR#30471 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	agreed	[WTS] [JSN]
R5-153957	Correction of E-UTRA RLC test case 7.2.3.9 for Category 0 UE	CR	Ericsson	36.523-1 12.7.0 CR#30511 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	agreed	[WTS] [JSN]
R5-153958	Correction of DRB generic test procedure in clause 12.1.1 for Category 0 UE	CR	Ericsson	36.523-1 12.7.0 CR#30521 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.5.3	agreed	[WTS] [JSN]
R5-153959	Extension of SCM test case 13.5.1	CR	MCC TF160	36.523-1 12.7.0 CR#30301 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.1	agreed	[WTS] [JSN]
R5-153960	Correction to SCM test case 13.5.2	CR	MCC TF160	36.523-1 12.7.0 CR#30311 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.1	agreed	[WTS] [JSN]
R5-153961	Adding new TC 13.5.3 MTSI MO SMS / SCM / 0% access probability skip for MTSI MO SMS over IP	CR	Samsung	36.523-1 12.7.0 CR#31211 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.1	withdrawn	[WTS] [JSN]
R5-153962	Correction of PICS references in test applicabilities	CR	MCC TF160	36.523-2 12.7.0 CR#7571 catF	SCM_LTE-UEConTest	Rel-12	R5-68 AI: 6.3.8.2	agreed	[WTS] [JSN]
R5-153963	Addition of applicability of new D2D test cases	CR	Qualcomm Incorporated, tech Mahindra, LG, Rohde&Schwarz, Anritsu Ltd	36.523-2 12.7.0 CR#784 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.4	available	[WTS] [JSN]
R5-153964	LS on Test Case Optimisation Risk Analysis	LS out LS To: GCF CAG	TSG WG RAN5				R5-68 AI: 7.5	available	[WTS] [JSN]
R5-153965	New Work Item proposal: UE Conformance Test Aspects - Multimedia Telephony Services for IMS (MTSI) over fixed access	WID new	Telecom Italia				R5-68 AI: 7.5	agreed	[WTS] [JSN]
R5-153966	Correction to Supplementary Services test case 15.9.3	CR	Anite Telecoms Ltd.	34.123-1 12.1.0 CR#37871 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153967	Correction to Supplementary Services test case 15.7.27	CR	Anite Telecoms Ltd.	34.123-1 12.1.0 CR#37861 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153968	Correction to UTRAN NITZ Test Cases 9.4.10, 12.2.1.13, 12.2.1.14 and 12.2.1.15	CR	MCC TF160, Rohde & Schwarz	34.123-1 12.1.0 CR#37891 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.4.1	agreed	[WTS] [JSN]
R5-153969	Testing of Loopback mode A and B activated test cases with IMS enabled UE	discussion	Anritsu Ltd, Qualcomm Incorporated				R5-68 AI: 6.4.6	noted	[WTS] [JSN]
R5-153970	Update to Loopback data procedure with IMS signalling	CR	Anritsu Ltd., Qualcomm Incorporated, Samsung, MCC TF160	36.509 12.1.0 CR#1441 catF	TEI12_Test	Rel-12	R5-68 AI: 6.4.2	available	[WTS] [JSN]
R5-153971	Update to Loopback activation procedure for IMS enabled UE	CR	Anritsu Ltd., Qualcomm Incorporated	36.508 12.7.0 CR#6181 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.1	available	[WTS] [JSN]
R5-153972	Correction to TC 8.2.4.24.1 - CA / RRC connection reconfiguration / SCell Addition / Success /RRC Processing Delay/Intra-Band Contiguous CA.	CR	Anritsu Ltd, Qualcomm Incorporated ,Anite, Rohde & Schwarz	36.523-1 12.7.0 CR#30701 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.3.3.2	withdrawn	[WTS] [JSN]
R5-153973	Update of Latency check test case 8.2.1.5	CR	Qualcomm Incorporated, Anritsu Ltd., MCC TF160	36.523-1 12.7.0 CR#30881 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.3.2	agreed	[WTS] [JSN]
R5-153974	Deletion of TC 8.2.4.24	CR	Huawei	36.523-2 12.7.0 CR#785 catF	TEI10_Test	Rel-12	R5-68 AI: 7.1.2	available	[WTS] [JSN]
R5-153975	Correction to EMM Test Case 9.1.5.1	CR	MCC TF160, Rohde & Schwarz	36.523-1 12.7.0 CR#30681 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.4	available	[WTS] [JSN]
R5-153976	Update of test case 9.1.5.1	CR	Intel Corporation (UK) Ltd	36.523-1 12.7.0 CR#30592 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.4	agreed	[WTS] [JSN]
R5-153977	Correction to Test Case 9.2.3.1.8a	CR	Intel Corporation (UK) Ltd, Anite Telecoms Ltd.	36.523-1 12.7.0 CR#30841 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.4	agreed	[WTS] [JSN]
R5-153978	Updates to rSRVCC test case 13.4.3.40	CR	MCC TF160, Intel, Anite	36.523-1 12.7.0 CR#30331 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.8	agreed	[WTS] [JSN]
R5-153979	Correction to Multilayer Procedures test case 13.4.2.5	CR	Anite Telecoms Ltd.	36.523-1 12.7.0 CR#30801 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.3.8	agreed	[WTS] [JSN]
R5-153980	Resubmission: Corrections to rSRVCC test cases 13.4.3.x	CR	ETSI MCC, Anite	36.523-1 12.7.0 CR#31341 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.11	agreed	[WTS] [JSN]
R5-153981	Correction to TTI bundling PICS	CR	Spreadtrum Communications	36.523-2 12.7.0 CR#7711 catF	TEI8_Test	Rel-12	R5-68 AI: 6.4.4	agreed	[WTS] [JSN]
R5-153982	Addition of new TC 7.1.7.1.7 SCE-L1 / DL-SCH transport block size selection / DCI format 1 / RA type 0	CR	Huawei	36.523-1 12.7.0 CR#30931 catF	LTE_SC_enh_L1-UEConTest	Rel-12	R5-68 AI: 6.3.10.2	agreed	[WTS] [JSN]
R5-153983	Correction to the default message contents of CM SERVICE REQUEST message	CR	Anite Telecoms Ltd.	34.108 12.1.0 CR#9861 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.2.1	agreed	[WTS] [JSN]
R5-153984	[PTCO] Reject-Failure: Proposal for removal of TCs 9.2.1.1.25 and 9.3.1.16 extremely rare scenario	discussion	Samsung				R5-68 AI: 4.5.5	noted	[WTS] [JSN]
R5-153985	Update applicabiity of test case 8.2.4.17.2 (AP#67.03)	CR	Motorola Mobility	36.523-2 12.7.0 CR#7821 catF	TEI10_Test	Rel-12	R5-68 AI: 6.4.4	agreed	[WTS] [JSN]
R5-153986	Subscription to conf event: in-dialog or out-of-dialog?	CR	ROHDE & SCHWARZ	34.229-1 12.7.0 CR#7091 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153987	Multiple tag-values in icsi-ref feature parameter	CR	ROHDE & SCHWARZ, Qualcomm	34.229-1 12.7.0 CR#7161 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153988	Correction to IMS Emergency Call test case 19.1.3	CR	Anritsu Ltd	34.229-1 12.7.0 CR#7421 catF	TEI9_Test	Rel-12	R5-68 AI: 6.6.6.1	agreed	[WTS] [JSN]
R5-153989	Addition of Test Case - WLAN Offload / Cell Selection / UTRA RRC_Idle to/from WLAN (Qrxlevmeas, BeaconRSSI) - 3GPP/WLAN Work Plan	CR	Intel Corporation (UK) Ltd	34.123-1 12.1.0 CR#37841 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	agreed	[WTS] [JSN]
R5-153990	Addition of Test Case - WLAN Offload / Cell Selection / EUTRA RRC_Idle to/from WLAN (Qqualmeas, ChannelUtilizationWLAN) - 3GPP/WLAN Work Plan	CR	Intel Corporation (UK) Ltd	36.523-1 12.7.0 CR#30771 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.6	agreed	[WTS] [JSN]
R5-153991	Correction to Test Case 12.2.1.5d	CR	Intel Corporation (UK) Ltd	34.123-1 12.1.0 CR#37851 catF	TEI11_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153992	Correction to Test Case 12.4.1.4	CR	Intel Corporation (UK) Ltd	34.123-1 12.1.0 CR#37931 catF	TEI_Test	Rel-12	R5-68 AI: 6.6.4.1	withdrawn	[WTS] [JSN]
R5-153993	Correction to Test Case 12.3.2.8	CR	Intel Corporation (UK) Ltd	34.123-1 12.1.0 CR#37921 catF	TEI_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153994	Correction to Test Case 12.4.1.4c	CR	Intel Corporation (UK) Ltd	34.123-1 12.1.0 CR#3797 catF	TEI_Test	Rel-12	R5-68 AI: 6.6.4.1	available	[WTS] [JSN]
R5-153995	Split of XCAP test case 15.14a for communication barring while roaming	CR	Anite Telecoms Ltd, Qualcomm Incorporation	34.229-1 12.7.0 CR#7431 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.1	available	[WTS] [JSN]
R5-153996	Test case applicability changes due to Split of XCAP test case 15.14a	CR	Anite Telecoms Ltd, Qualcomm Incorporation	34.229-2 12.6.0 CR#1541 catF	TEI8_Test	Rel-12	R5-68 AI: 6.6.6.2	available	[WTS] [JSN]
R5-153997	Correction to LTE-UTRA FE-FACH test case 6.2.4.7	CR	ROHDE & SCHWARZ, Qualcomm Incorporated, Anite Ltd.	36.523-1 12.7.0 CR#31101 catF	TEI11_Test	Rel-12	R5-68 AI: 6.4.3.1	available	[WTS] [JSN]
R5-153998	Update to Device to Device Proximity Services Test Environment	CR	QUALCOMM Incorporated, Ericsson	36.508 12.7.0 CR#6152 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-68 AI: 6.3.3.1	agreed	[WTS] [JSN]
R5-153999	Correct annex C.44	CR	Ericsson	34.229-1 12.7.0 CR#7322 catF	EVS_codec-UEConTest	Rel-12	R5-68 AI: 6.3.7.1	agreed	[WTS] [JSN]
R5-154000	Introduction of TC 8.16.38 3DL TDD CA activation and deactivation of known SCell in non-DRX	CR	ZTE Corporation	36.521-3 12.7.0 CR#11791 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-154001	Introduction of 3 DL TDD Absolute/Relative RSRQ for E-UTRAN in Carrier Aggregation	CR	ZTE Corporation	36.521-3 12.7.0 CR#11821 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.4	agreed	[WTS] [JSN]
R5-154002	Introduction of TC 9.6.1.3.1 TDD FDD CA CQI Reporting – PUCCH 1-0 for FDD PCell (2DL CA)	CR	ZTE Corporation	36.521-1 12.7.0 CR#19861 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-154003	Introduction of TC 9.6.1.3.2 TDD FDD CA CQI Reporting – PUCCH 1-0 for FDD PCell (3DL CA)	CR	ZTE Corporation	36.521-1 12.7.0 CR#19871 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-154004	Introduction of TC 9.6.1.4.1 TDD FDD CA CQI Reporting – PUCCH 1-0 for TDD PCell (2DL CA)	CR	ZTE Corporation	36.521-1 12.7.0 CR#19881 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-154005	Introduction of TC 9.6.1.4.2 TDD FDD CA CQI Reporting – PUCCH 1-0 for TDD PCell (3DL CA)	CR	ZTE Corporation	36.521-1 12.7.0 CR#19891 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-154006	Addition of test case 7.5E - Adjacent Channel Selectivity (ACS) for UE category 0	CR	CATR	36.521-1 12.7.0 CR#20981 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-154007	Addition of test case 7.6.1E - In-band blocking for UE category 0	CR	CATR	36.521-1 12.7.0 CR#20991 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-154008	Addition of test case 7.6.2E - Out-of-band blocking for UE category 0	CR	CATR	36.521-1 12.7.0 CR#21001 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-154009	Addition of test case 7.6.3E - Narrow band blocking for UE category 0	CR	CATR	36.521-1 12.7.0 CR#21011 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-154010	Addition of test case 7.7E - Spurious response for UE category 0	CR	CATR	36.521-1 12.7.0 CR#21021 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-154011	Addition of test case 7.8.1E - Wide band Intermodulation for UE category 0	CR	CATR	36.521-1 12.7.0 CR#21031 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-154012	Addition of test case 7.9E - Spurious emissions for UE category 0	CR	CATR	36.521-1 12.7.0 CR#21041 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.2	agreed	[WTS] [JSN]
R5-154013	Addition of UE category 0 test cases	CR	CATR	36.521-2 12.7.0 CR#2951 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-68 AI: 5.3.7.3	agreed	[WTS] [JSN]
R5-154014	36.521-1_Test requirements correction in test 6.3.5.2	CR	Keysight Technologies UK Ltd	36.521-1 12.7.0 CR#21361 catF	TEI8_Test	Rel-12	R5-68 AI: 5.4.1.2.1	agreed	[WTS] [JSN]
R5-154015	Addition of 8.7.5.1.1 TDD FDD CA Sustained data rate performance for FDD PCell (2DL CA)	CR	Huawei	36.521-1 12.7.0 CR#20801 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-154016	Addition of 8.7.5.1.2 TDD FDD CA Sustained data rate performance for FDD PCell (3DL CA)	CR	Huawei	36.521-1 12.7.0 CR#20811 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-154017	Addition of 8.7.5.2.1 TDD FDD CA Sustained data rate performance for TDD PCell (2DL CA)	CR	Huawei	36.521-1 12.7.0 CR#20821 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-154018	Addition of 8.7.5.2.2 TDD FDD CA Sustained data rate performance for TDD PCell (3DL CA)	CR	Huawei	36.521-1 12.7.0 CR#20831 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-154019	Update to TC 7.6.1A.5 In-band blocking for CA (3DL CA without UL CA)	CR	MICROSOFT EUROPE SARL	36.521-1 12.7.0 CR#20491 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-154020	Update of TC list for Rel-12 RSRP accuracy requirements – after RAN5#68	other	CMCC				R5-68 AI: 5.4.1.11	noted	[WTS] [JSN]
R5-154021	Test case list for 20MHz+10MHz and 20MHz+20MHz CA RRM tests - After RAN5#68	other	CMCC				R5-68 AI: 5.4.1.11	noted	[WTS] [JSN]
R5-154022	Update to TC 7.6.2A.5 Out-of-band blocking for CA (3DL CA without UL CA)	CR	MICROSOFT EUROPE SARL	36.521-1 12.7.0 CR#20501 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-154023	Update to TC 7.6.3A.5 Narrow band blocking for CA (3DL CA without UL CA)	CR	MICROSOFT EUROPE SARL	36.521-1 12.7.0 CR#20511 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-154024	Update to TC 7.7A.5 Spurious response for CA (3DL CA without UL CA)	CR	MICROSOFT EUROPE SARL	36.521-1 12.7.0 CR#20521 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-68 AI: 5.3.3.2	agreed	[WTS] [JSN]
R5-154050	Correction to xSRVCC test cases 13.4.3.2, 13.4.3.14, 13.4.3.16 and 13.4.3.18	CR	Rohde & Schwarz, Qualcomm Incorporated	36.523-1 12.7.0 CR#3143 catF	TEI8_Test	Rel-12	R5-68 AI: 7.1.2	available	[WTS] [JSN]
R5-154051	Applicability of Test Case - WLAN Offload / Cell Selection / EUTRA RRC_Idle to/from WLAN (Qqualmeas, ChannelUtilizationWLAN) - 3GPP/WLAN Work Plan	CR	Intel Corporation (UK) Ltd	36.523-2 12.7.0 CR#786 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.7	agreed	[WTS] [JSN]
R5-154052	LS on features with an FGI bit dependency from an earlier release	LS out LS To: TSG WG RAN2	TSG WG RAN5				R5-68 AI: 7.5	approved	[WTS] [JSN]
R5-154053	Update of 36.523-2 for explicit ICS/IXIT branching the TC execution	CR	Samsung	36.523-2 12.7.0 CR#7771 catF	TEI8_Test	Rel-12	R5-68 AI: 7.1.2	available	[WTS] [JSN]
R5-154054	Response LS on Test Cases with branches depending on UE capabilities/configuration	LS out LS To: GCF CAG	TSG WG RAN5				R5-68 AI: 7.5	available	[WTS] [JSN]
R5-154055	Addition of new UTRAN-WLAN interworking test case 8.2.10.6	CR	Tejet	34.123-1 12.1.0 CR#3798 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-68 AI: 6.3.2.2	available	[WTS] [JSN]
R5-154056	Status on proposals for RF/RRM test optimisation after RAN5#68	other	Ericsson				R5-68 AI: 7.1.6	noted	[WTS] [JSN]
R5-154057	New PRD on Guidance to Work Item Codes	other	BlackBerry UK Limited				R5-68 AI: 4.5.6	approved	[WTS] [JSN]

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