3GPP tdocs

Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc	Title	Type / Revs	Source	Spec / CR	S/WID	Release	Meeting	Status	Links

R5-151000	Agenda - opening session	agenda	WG Chairman				R5-67 AI: 1	noted	[WTS] [JSN]
R5-151001	Agenda - mid week session	agenda	WG Chairman				R5-67 AI: 4.5	noted	[WTS] [JSN]
R5-151002	Agenda - closing session	agenda	WG Chairman				R5-67 AI: 7.1	noted	[WTS] [JSN]
R5-151003	RAN5#67 Session Programme	agenda	WG Chairman				R5-67 AI: 2.1	noted	[WTS] [JSN]
R5-151004	RAN5 Leadership Team	other	WG Chairman				R5-67 AI: 2.1	noted	[WTS] [JSN]
R5-151005	Previous RAN5#66 WG Minutes	report	ETSI Secretariat				R5-67 AI: 2.1	approved	[WTS] [JSN]
R5-151006	Previous RAN5#66 WG Action Points	report	ETSI Secretariat				R5-67 AI: 2.1	noted	[WTS] [JSN]
R5-151007	Latest RAN Plenary notes	report	WG Chairman				R5-67 AI: 2.1	withdrawn	[WTS] [JSN]
R5-151008	Latest RAN Plenary draft Report	report	WG Chairman				R5-67 AI: 2.1	noted	[WTS] [JSN]
R5-151009	Post Plenary Active Work Item update	other	ETSI Secretariat				R5-67 AI: 7.1	noted	[WTS] [JSN]
R5-151010	TF160 TTCN current status report	report	MCC TF160				R5-67 AI: 2.1	noted	[WTS] [JSN]
R5-151011	RAN5 SR to RP#67	report	WG Chairman				R5-67 AI: 2.2	noted	[WTS] [JSN]
R5-151012	TF160 SR to RP#67	report	WG Chairman				R5-67 AI: 2.2	noted	[WTS] [JSN]
R5-151013	RAN Chair Report to SP#67	report	WG Chairman				R5-67 AI: 2.2	noted	[WTS] [JSN]
R5-151014	GCF CAG Rel-8 & Rel-9 LTE TCL	other	WG Chairman				R5-67 AI: 2.2	withdrawn	[WTS] [JSN]
R5-151015	GCF LTE WIASR (Rel-8 & Rel-9)	other	WG Chairman				R5-67 AI: 2.2	noted	[WTS] [JSN]
R5-151016	GCF UTRA & IMS TC prio	other	WG Chairman				R5-67 AI: 2.2	withdrawn	[WTS] [JSN]
R5-151017	Update of GCF UTRA and IMS priority list after CAG#41	other	Ericsson				R5-67 AI: 2.2	noted	[WTS] [JSN]
R5-151018	RAN5 PRDs	other	WG Chairman				R5-67 AI: 4.3	withdrawn	[WTS] [JSN]
R5-151019	RAN5#67 LS Template	other	WG Chairman				R5-67 AI: 4.3	noted	[WTS] [JSN]
R5-151020	Meeting schedule for 2015/16	agenda	WG Chairman				R5-67 AI: 4.4	noted	[WTS] [JSN]
R5-151021	iWD/PRD Updates	other	WG Chairman				R5-67 AI: 7.2	agreed	[WTS] [JSN]
R5-151022	wp UE OTA (Ant) - Laptop mounted eqpt Free Space test	Work Plan	ZTE Corporation				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151023	SR UE OTA (Ant) - Laptop mounted eqpt Free Space test	WI status report	ZTE Corporation				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151024	wp UE Conformance Test Aspects - LTE UE TRP and TRS and UTRA Hand Phantom	Work Plan	ZTE Corporation				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151025	SR UE Conformance Test Aspects - LTE UE TRP and TRS and UTRA Hand Phantom	WI status report	ZTE Corporation				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151026	wp UE Conformance Test Aspects - BeiDou Navigation Satellite System (BDS) Positioning Support for LTE and UMTS	Work Plan	CATT				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151027	SR UE Conformance Test Aspects - BeiDou Navigation Satellite System (BDS) Positioning Support for LTE and UMTS	WI status report	CATT				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151028	wp UE Conformance Test Aspects - Further Rel-12 Configurations for LTE Advanced Carrier Aggregation with 3DL	Work Plan	MICROSOFT EUROPE SARL				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151029	SR UE Conformance Test Aspects - Further Rel-12 Configurations for LTE Advanced Carrier Aggregation with 3DL	WI status report	MICROSOFT EUROPE SARL				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151030	wp UE Conformance Test Aspects - LTE Coverage Enhancements	Work Plan	China Telecommunications				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151031	SR UE Conformance Test Aspects - LTE Coverage Enhancements	WI status report	China Telecommunications				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151032	wp UE Conformance Test Aspects – WLAN/3GPP Radio Interworking	Work Plan revised to R5-152118	Intel Corporation (UK) Ltd				R5-67 AI: 7.3	revised	[WTS] [JSN]
R5-151033	SR UE Conformance Test Aspects – WLAN/3GPP Radio Interworking	WI status report	Intel Corporation (UK) Ltd				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151034	wp UE Conformance Test Aspects - Further DL MIMO Enhancement for LTE-Advanced	Work Plan	ZTE Corporation				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151035	SR UE Conformance Test Aspects - Further DL MIMO Enhancement for LTE-Advanced	WI status report	ZTE Corporation				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151036	wp UE Conformance Test Aspects – LTE Device-to-Device Proximity Services	Work Plan	QUALCOMM CDMA Technologies				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151037	SR UE Conformance Test Aspects – LTE Device-to-Device Proximity Services	WI status report	QUALCOMM CDMA Technologies				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151038	wp UE Conformance Test Aspects - L-band for Supplemental Downlink in E-UTRA and UTRA	Work Plan	Ericsson				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151039	SR UE Conformance Test Aspects - L-band for Supplemental Downlink in E-UTRA and UTRA	WI status report	Ericsson				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151040	wp UE Conformance Test Aspects - Low cost & enhanced coverage MTC UE for LTE	Work Plan revised to R5-152119	Ericsson				R5-67 AI: 7.3	revised	[WTS] [JSN]
R5-151041	SR UE Conformance Test Aspects - Low cost & enhanced coverage MTC UE for LTE	WI status report revised to R5-152120	Ericsson				R5-67 AI: 7.3	revised	[WTS] [JSN]
R5-151042	wp UE Conformance Test Aspects - Further Rel-12 configurations for LTE Advanced Carrier Aggregation with 2UL	Work Plan	Ericsson				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151043	SR UE Conformance Test Aspects - Further Rel-12 configurations for LTE Advanced Carrier Aggregation with 2UL	WI status report	Ericsson				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151044	wp UE Conformance Test Aspects - Codec for Enhanced Voice Services (EVS)	Work Plan	Ericsson				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151045	SR UE Conformance Test Aspects - Codec for Enhanced Voice Services (EVS)	WI status report	Ericsson				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151046	wp UE Conformance Test Aspects - Smart Congestion Mitigation in E-UTRAN	Work Plan	NTT DOCOMO INC.				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151047	SR UE Conformance Test Aspects - Smart Congestion Mitigation in E-UTRAN	WI status report revised to R5-152122	NTT DOCOMO INC.				R5-67 AI: 7.3	revised	[WTS] [JSN]
R5-151048	wp UE Conformance Test Aspects - Performance Requirements of Interference Cancellation and Suppression Receiver for SU-MIMO for E-UTRA	Work Plan	HuaWei Technologies Co., Ltd				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151049	SR UE Conformance Test Aspects - Performance Requirements of Interference Cancellation and Suppression Receiver for SU-MIMO for E-UTRA	WI status report	HuaWei Technologies Co., Ltd				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151050	wp UE Conformance Test Aspects - DCH Enhancements for UMTS	Work Plan	QUALCOMM CDMA Technologies				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151051	SR UE Conformance Test Aspects - DCH Enhancements for UMTS	WI status report	QUALCOMM CDMA Technologies				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-151052	Updated TF 160 Report	report	ETSI				R5-67 AI: 7.5	noted	[WTS] [JSN]
R5-151053	RAN5 CRs for email agreement	report	ETSI				R5-67 AI: 7.5	noted	[WTS] [JSN]
R5-151054	Draft minutes of RAN5#67	report	ETSI				R5-67 AI: 7.5	noted	[WTS] [JSN]
R5-151055	Summary of RAN5 agreed CRs	report	ETSI				R5-67 AI: 7.6	noted	[WTS] [JSN]
R5-151056	WG SR to Plenary to become RP-15xxxx	report	SPRINT Corporation				R5-67 AI: 7.6	withdrawn	[WTS] [JSN]
R5-151057	Updated meeting schedule for 2015/16	agenda	SPRINT Corporation				R5-67 AI: 7.7	withdrawn	[WTS] [JSN]
R5-151058	Review deadlines for next quarter	agenda	SPRINT Corporation				R5-67 AI: 7.7	noted	[WTS] [JSN]
R5-151059	Look forward to the next RAN5 meeting	other	SPRINT Corporation				R5-67 AI: 7.7	noted	[WTS] [JSN]
R5-151060	Response LS on Content Type Used in XCAP HTTP Request and Response	LS in	TSG WG CT1				R5-67 AI: 3	noted	[WTS] [JSN]
R5-151061	Test Case limitations on support for Non-IMS E-UTRA Test Cases	LS in	GCF CAG				R5-67 AI: 3	noted	[WTS] [JSN]
R5-151062	Test Case Optimisation – conditional Execution of RAN5 test cases classified as “Inter-RAT all”	LS in	GCF CAG				R5-67 AI: 3	noted	[WTS] [JSN]
R5-151063	Reply LS on Test Case Optimisation – removal of GERAN test cases	LS in	TSG WG GERAN3				R5-67 AI: 3	noted	[WTS] [JSN]
R5-151064	CTIA Test Plan for Wireless Device Over-the-Air Performance	LS in	CTIA				R5-67 AI: 3	noted	[WTS] [JSN]
R5-151065	LS on impact of optional preconfigured parameters for D2D out of Network coverage mode	LS in	TSG WG RAN4				R5-67 AI: 3	noted	[WTS] [JSN]
R5-151066	LS on D2D off network operations	LS in	TSG RAN				R5-67 AI: 5.1	noted	[WTS] [JSN]
R5-151067	Removal of Extreme Conditions from TC 6.6.2.1A test environment	CR	Samsung R&D Institute UK	36.521-1 12.5.1 CR#1841 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151068	Add TDD to A-GNSS testing	CR	Spirent Communications	37.571-1 12.2.0 CR#127 catF	TEI12_Test	Rel-12	R5-67 AI: 5.5.9	available	[WTS] [JSN]
R5-151069	Add TDD to A-GNSS Assistance Data	CR	Spirent Communications	37.571-5 12.1.0 CR#113 catF	TEI12_Test	Rel-12	R5-67 AI: 5.5.11	available	[WTS] [JSN]
R5-151070	Delete "FFS" from ECID test conditions	CR	Spirent Communications	37.571-1 12.2.0 CR#128 catF	TEI12_Test	Rel-12	R5-67 AI: 5.5.9	available	[WTS] [JSN]
R5-151071	Addition of LPP Release Applicability	CR	Spirent Communications	37.571-3 12.2.0 CR#30 catF	TEI12_Test	Rel-12	R5-67 AI: 5.5.	available	[WTS] [JSN]
R5-151072	Change Galileo Release Applicability	CR	Spirent Communications	37.571-3 12.2.0 CR#31 catF	TEI12_Test	Rel-12	R5-67 AI: 5.5.	available	[WTS] [JSN]
R5-151073	Missing NS Value for Band 30 Reference Sensitivity Testing and Missing Message Content Exceptions	CR	Spirent Communications, AT&T	36.521-1 12.5.0 CR#1842 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-151074	Addition of LPP Release Applicability	CR	Spirent Communications	37.571-3 12.2.0 CR#32 catF	TEI12_Test	Rel-12	R5-67 AI: 6.6.7.2	available	[WTS] [JSN]
R5-151075	Change Galileo Release Applicability	CR	Spirent Communications	37.571-3 12.2.0 CR#33 catF	TEI12_Test	Rel-12	R5-67 AI: 6.6.7.2	available	[WTS] [JSN]
R5-151076	Addition of "early fix" to A-GNSS tests	CR	Spirent Communications	37.571-2 12.1.0 CR#52 catF	TEI12_Test	Rel-12	R5-67 AI: 6.6.7.1	available	[WTS] [JSN]
R5-151077	Correction of prs-ConfigurationIndex for TDD	CR	Spirent Communications	37.571-2 12.1.0 CR#53 catF	TEI12_Test	Rel-12	R5-67 AI: 6.6.7.1	available	[WTS] [JSN]
R5-151078	Update Test Tolerance Analyses for TS 37.571-1 Test Cases 9.1.3 and 9.1.4	CR	Spirent Communications	36.903 12.5.0 CR#178 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151079	Update Test Tolerance Analyses for TS 37.571-1 Test Cases 9.2.4 and 9.2.5	CR	Spirent Communications	36.903 12.5.0 CR#179 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151080	Update Test Tolerance Analyses for TS 37.571-1 Test Cases 10.3 and 10.4	CR	Spirent Communications	36.903 12.5.0 CR#180 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151081	Update Test Tolerance Analyses for TS 37.571-1 Test Cases 10.3A and 10.4A	CR	Spirent Communications	36.903 12.5.0 CR#181 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151082	Add Test Tolerance Analysis for TS 37.571-1 Test Case 10.2D	CR	Spirent Communications	36.903 12.5.0 CR#182 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151083	Uncertainties and Test Tolerances for RSTD test case 10.2D	CR	Spirent Communications	37.571-1 12.2.0 CR#129 catF	TEI10_Test	Rel-12	R5-67 AI: 5.5.9	available	[WTS] [JSN]
R5-151084	Add Test Tolerance Analysis for TS 37.571-1 Test Case 10.4D	CR	Spirent Communications	36.903 12.5.0 CR#183 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151085	Uncertainties and Test Tolerances for RSTD test case 10.4D	CR	Spirent Communications	37.571-1 12.2.0 CR#130 catF	TEI10_Test	Rel-12	R5-67 AI: 5.5.9	available	[WTS] [JSN]
R5-151086	RSTD accuracy changes for Rel-12	CR	Spirent Communications	37.571-1 12.2.0 CR#131 catF	TEI12_Test	Rel-12	R5-67 AI: 5.5.9	available	[WTS] [JSN]
R5-151087	RSTD accuracy changes for Rel-12	CR	Spirent Communications	37.571-3 12.2.0 CR#34 catF	TEI12_Test	Rel-12	R5-67 AI: 5.5.	available	[WTS] [JSN]
R5-151088	Formatting error in Parameter Sensitivity Coarse Tables	CR	PCTEST Engineering Lab	37.571-1 12.2.0 CR#132 catF	TEI10_Test	Rel-12	R5-67 AI: 5.5.9	available	[WTS] [JSN]
R5-151089	Incorrect Expected RSTD value in Table 9.2.5.4.1-1	CR	PCTEST Engineering Lab	37.571-1 12.2.0 CR#133 catF	TEI10_Test	Rel-12	R5-67 AI: 5.5.9	available	[WTS] [JSN]
R5-151090	Missing applicability of test case executions in Table 4-3 for E-UTRA pc_eTDD tests	CR	PCTEST Engineering Lab	37.571-3 12.2.0 CR#35 catF	TEI9_Test	Rel-12	R5-67 AI: 5.5.	available	[WTS] [JSN]
R5-151091	Missing RSTD new tests for 10.2D and 10.4D	CR	PCTEST Engineering Lab	37.571-5 12.1.0 CR#114 catF	TEI9_Test	Rel-12	R5-67 AI: 5.5.11	available	[WTS] [JSN]
R5-151092	Correction to Absolute Priority Cell reselection testcases 8.3.1.52, 8.3.1.53, 8.3.1.54	CR	QUALCOMM Incorporated, MCC TF 160	34.123-1 11.6.0 CR#3737 catF	TEI8_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151093	Addition of 3 new test cases for Rel. 11 FE-FACH	other	QUALCOMM Incorporated				R5-67 AI: 6.6.5	noted	[WTS] [JSN]
R5-151094	Proposal of Bands/CA-Configurations Selection Concept for 36.521-2 Testcase Applicability	other	Intel				R5-67 AI: 5.3.4.	noted	[WTS] [JSN]
R5-151095	Introduction of Band Selection Concept and new 3DL CA Combinations to 36.521-2	CR	Intel	36.521-2 12.5.0 CR#243 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.3	available	[WTS] [JSN]
R5-151096	Correction to RRC test case 8.1.2.1	CR	TechMahindra Ltd	36.523-1 12.5.0 CR#2917 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.3.1	available	[WTS] [JSN]
R5-151097	Editorial correction in RRC test case 8.1.2.3	CR	TechMahindra Ltd	36.523-1 12.5.0 CR#2918 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.3.1	available	[WTS] [JSN]
R5-151098	Correction to NAS test case 10.4.1	CR	TechMahindra Ltd	36.523-1 12.5.0 CR#2919 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.5	available	[WTS] [JSN]
R5-151099	Updates to PRD12	other	MCC TF160				R5-67 AI: 4.3	withdrawn	[WTS] [JSN]
R5-151100	Routine maintenance for TS 36.523-3	CR	MCC TF160	36.523-3 12.1.0 CR#2626 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.5.1	available	[WTS] [JSN]
R5-151101	Routine maintenance for TS 34.123-3	CR	MCC TF160	34.123-3 11.6.0 CR#3328 catF	TEI12_Test	Rel-12	R5-67 AI: 6.6.4.3	available	[WTS] [JSN]
R5-151102	Routine maintenance for TS 34.229-3	CR	MCC TF160	34.229-3 10.6.0 CR#284 catF	TEI8_Test	Rel-10	R5-67 AI: 6.6.6.3	available	[WTS] [JSN]
R5-151103	Band 32 - Guidance on LTE test execution	CR	MCC TF160	36.523-3 12.1.0 CR#2627 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 6.3.6.5	available	[WTS] [JSN]
R5-151104	APN IE requirements for IMS emergency PDN	CR	MCC TF160	36.508 12.5.0 CR#587 catF	TEI9_Test	Rel-12	R5-67 AI: 6.4.1	available	[WTS] [JSN]
R5-151105	Upgrade of TC 8.5.4.1 to Rel-12 ASN.1 baseline	CR	MCC TF160	36.523-1 12.5.0 CR#2920 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.3.1	available	[WTS] [JSN]
R5-151106	Upgrade of TC 8.1.5.7 to Rel-12 ASN.1 baseline	CR	MCC TF160	34.123-1 11.6.0 CR#3738 catF	TEI_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151107	Updates for GBA testing - Part1	CR	MCC TF160	34.229-1 12.5.0 CR#657 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151108	Updates for GBA testing - Part2	CR	MCC TF160	34.229-2 12.4.0 CR#139 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.2	available	[WTS] [JSN]
R5-151109	IMS settings for LTE Positioning test cases	CR	MCC TF160	37.571-2 12.1.0 CR#54 catF	TEI9_Test	Rel-12	R5-67 AI: 6.6.7.1	available	[WTS] [JSN]
R5-151110	Correction to test case 6.2.2.8	CR	MCC TF160	36.523-1 12.5.0 CR#2921 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.1	available	[WTS] [JSN]
R5-151111	Status update on LTE (non-IMS) TCs regression test with IMS-enabled UEs	other revised to R5-151734	MCC TF160				R5-67 AI: 6.4.6	revised	[WTS] [JSN]
R5-151112	Add GBA related abbreviations	CR	Ericsson	34.229-1 12.5.0 CR#658 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151113	CA RF: Connection diagrams for 3DL CA (RF) testing	CR	ROHDE & SCHWARZ	36.508 12.5.0 CR#588 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.1	available	[WTS] [JSN]
R5-151114	RF: Missing power class information	CR	ROHDE & SCHWARZ	36.521-1 12.5.0 CR#1843 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151115	CA RF: PCC/SCC mapping onto physical CC-s definition cleanup	CR	ROHDE & SCHWARZ	36.521-1 12.5.0 CR#1844 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151116	CA RF: Clarification of PHICH configuration	CR	ROHDE & SCHWARZ	36.521-1 12.5.0 CR#1845 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151117	RF: Corrections to CSI RMCs references	CR	Rohde & Schwarz	36.521-1 12.5.0 CR#1846 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151118	CA RF: Cleanup of FDD 2DL CA tests	CR	Rohde & Schwarz	36.521-1 12.5.0 CR#1847 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151119	CA RF: Corrections to power imbalance test	CR	Rohde & Schwarz	36.521-1 12.5.0 CR#1848 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151120	CA RF: Corrections to sustained data rate test	CR	Rohde & Schwarz	36.521-1 12.5.0 CR#1849 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151121	ePDCCH RF: Corrections to sustained data rate test	CR	Rohde & Schwarz	36.521-1 12.5.0 CR#1850 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151122	feICIC RF: Updates to TC 9.2.1.6_E.1	CR	Rohde & Schwarz	36.521-1 12.5.0 CR#1851 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151123	feICIC RF: Corrections to CSI TCs	CR	Rohde & Schwarz	36.521-1 12.5.0 CR#1852 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151124	RRM: Consideration of unsent measurement reports in recently added test cases	CR	Rohde & Schwarz	36.521-3 12.5.0 CR#1105 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151125	RRM: Corrections to message configuration of TCs 4.5.1.1 and 4.5.2.1	CR	Rohde & Schwarz	36.521-3 12.5.0 CR#1106 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151126	RRM: Corrections to message configuration of TCs 9.3.2 and 9.4.2	CR	Rohde & Schwarz	36.521-3 12.5.0 CR#1107 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151127	RRM: Corrections to test procedures of TCs 9.3.x and 9.4.x	CR	Rohde & Schwarz	36.521-3 12.5.0 CR#1108 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151128	CA RRM: Corrections to TC 9.1.24.2	CR	Rohde & Schwarz	36.521-3 12.5.0 CR#1109 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151129	CA RRM: Corrections to cell configuration mapping table	CR	Rohde & Schwarz	36.521-3 12.5.0 CR#1110 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151130	CA: Corrections to CA capability tables	CR	Rohde & Schwarz	36.523-2 12.5.0 CR#715 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151131	Band 32 - Guidance on UTRAN test execution	CR	MCC TF160	34.123-3 11.6.0 CR#3329 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 6.3.6.3	available	[WTS] [JSN]
R5-151132	Add Test Tolerance analysis for TS 36.521-3 Test cases 9.9.1.1 and 9.9.2.1	CR	Rohde & Schwarz	36.903 12.5.0 CR#184 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151133	Uncertainties and Test tolerances for Test cases 9.9.1.1 and 9.9.2.1	CR	Rohde & Schwarz	36.521-3 12.5.0 CR#1111 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151134	Add Test Tolerance analysis for TS 36.521-3 Test cases 9.9.1.2 and 9.9.2.2	CR	Rohde & Schwarz	36.903 12.5.0 CR#185 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151135	Uncertainties and Test tolerances for Test cases 9.9.1.2 and 9.9.2.2	CR	Rohde & Schwarz	36.521-3 12.5.0 CR#1112 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151136	Update of EMM test case 9.2.1.1.28	CR	Ericsson	36.523-1 12.5.0 CR#2922 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151137	Update of EMM test case 9.2.1.1.28a	CR	Ericsson	36.523-1 12.5.0 CR#2923 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151138	Correction to CSG test case 6.3.1.3	CR	Anite, Qualcomm	34.123-1 11.6.0 CR#3739 catF	TEI9_Test	Rel-11	R5-67 AI: 6.3.11.2	available	[WTS] [JSN]
R5-151139	Update to the applicatbility of Intra/inter-frequencySI acquisition Home eNB test cases	CR revised to R5-151239	Anite, Intel	36.523-2 12.5.0 CR#716 catF	TEI9_Test	Rel-12	R5-67 AI: 6.4.4	revised	[WTS] [JSN]
R5-151140	Correction to EUTRA Idle Mode test case 6.1.1.8 and 6.1.1.9	CR	Anite, MCC TF160	36.523-1 12.5.0 CR#2924 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.1	available	[WTS] [JSN]
R5-151141	Correction to Annex Procedure C.25	CR	Anite	34.229-1 12.5.0 CR#659 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151142	Update to IRAT PLMN selection test case 6.2.1.4	CR	Anite, Ericsson	36.523-1 12.5.0 CR#2925 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.1	available	[WTS] [JSN]
R5-151143	Correction to Multi-layer test case 13.1.3	CR	Anite, Ericsson	36.523-1 12.5.0 CR#2926 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.8	available	[WTS] [JSN]
R5-151144	Correction to eMBMS test case 17.4.7	CR	Anite	36.523-1 12.5.0 CR#2927 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.3.11	available	[WTS] [JSN]
R5-151145	Correction to eMBMS test case 17.2.4	CR	Anite, LG	36.523-1 12.5.0 CR#2928 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.11	available	[WTS] [JSN]
R5-151146	Correction to EMM test case 9.2.3.3.1 and 9.2.3.3.4	CR	Anite	36.523-1 12.5.0 CR#2929 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151147	Correction to Applicability for eMDT test cases 8.6.9.3	CR	Anite	36.523-2 12.5.0 CR#717 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151148	Update to EUTRAN measurement test case 8.3.1.12a	CR	Anite	36.523-1 12.5.0 CR#2930 catF	TEI9_Test	Rel-12	R5-67 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-151149	Corrections to rSRVCC test cases	CR	Anite	36.523-1 12.5.0 CR#2931 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.3.8	available	[WTS] [JSN]
R5-151150	Update execution guidelines for MFBI test case 6.1.2.20	CR	Anite	36.523-3 12.1.0 CR#2628 catF	TEI9_Test	Rel-12	R5-67 AI: 6.4.5.1	available	[WTS] [JSN]
R5-151151	Correction to the requirements of test case 6.6.2.1A	CR	KTL	36.521-1 12.5.0 CR#1853 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151152	Addition of Rx paramter for test case 7.6.2A.1 and 7.6.2A.2	CR	KTL	36.521-1 12.5.0 CR#1854 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-151153	Correction to applicability conditions for test case 8.7.2.1 and 8.7.2.1_1	CR	KTL, TTA	36.521-2 12.5.0 CR#244 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.3	withdrawn	[WTS] [JSN]
R5-151154	Correction of idle mode test case 6.1.1.2a	CR revised to R5-151357	KTL	36.523-1 12.5.0 CR#2932 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.1	revised	[WTS] [JSN]
R5-151155	Correction of test cases 8.6.7.2 and 8.6.7.3	CR	KTL	36.523-1 12.5.0 CR#2933 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.3.3.5	withdrawn	[WTS] [JSN]
R5-151156	Correction of applicability conditions for RRM test case 5.3.5 and 5.3.6	CR	KTL	36.521-2 12.5.0 CR#245 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151157	Corrections to BDS Clock Model and Navigation Model for SIG tests	CR	CATR	37.571-5 12.1.0 CR#115 catF	LCS_BDS-UEConTest	Rel-12	R5-67 AI: 6.3.1.6	available	[WTS] [JSN]
R5-151158	Corrections to BDS Clock Model and Navigation Model for Perf tests	CR	CATR	37.571-5 12.1.0 CR#116 catF	LCS_BDS-UEConTest	Rel-12	R5-67 AI: 5.3.3.5	available	[WTS] [JSN]
R5-151159	Corrections to the Ionospheric Model of BDS	CR	CATR	37.571-5 12.1.0 CR#117 catF	LCS_BDS-UEConTest	Rel-12	R5-67 AI: 5.3.3.5	available	[WTS] [JSN]
R5-151160	LPP responseTime update and correction	CR	Spirent Communications	37.571-1 12.2.0 CR#134 catF	TEI12_Test	Rel-12	R5-67 AI: 5.5.9	available	[WTS] [JSN]
R5-151161	LPP updates and corrections	CR	Spirent Communications	37.571-2 12.1.0 CR#55 catF	TEI12_Test	Rel-12	R5-67 AI: 6.6.7.1	available	[WTS] [JSN]
R5-151162	Correction of the TPR of Absolute GNSS signal level for Dynamic Range	CR	CATR	37.571-1 12.2.0 CR#135 catF	TEI8_Test	Rel-12	R5-67 AI: 5.5.9	available	[WTS] [JSN]
R5-151163	Update of default GNSS Assistance Data Elements	CR	CATR	37.571-2 12.1.0 CR#56 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.7.1	available	[WTS] [JSN]
R5-151164	CA RF: Correction to condition description	CR	Rohde & Schwarz, Sony Mobile	36.521-2 12.5.0 CR#246 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151165	CA RF: Correction to conditition description	CR	ROHDE & SCHWARZ	36.521-2 12.5.0 CR#247 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.3	reserved	[WTS] [JSN]
R5-151166	Update of test case 15.14a	CR	Ericsson	34.229-1 12.5.0 CR#660 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151167	Addition of Device to Device Proximity Services Test Environment	CR	QUALCOMM Incorporated	36.508 12.5.0 CR#589 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-67 AI: 6.3.5.1	available	[WTS] [JSN]
R5-151168	Addition of Device to Device Proximity Services Test Loop	CR	QUALCOMM Incorporated, Ericsson	36.509 10.3.0 CR#141 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-67 AI: 6.3.5.2	revised	[WTS] [JSN]
R5-151169	Correction to C113dT in the applicability of test conditions	CR	KTL	36.523-2 12.5.0 CR#718 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151170	Editorial correction in the applicability of test conditions	CR	KTL	36.523-2 12.5.0 CR#719 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151171	Addition of frequency E-UTRA band 32	CR	Ericsson	36.521-2 12.5.0 CR#248 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 5.3.7.6	available	[WTS] [JSN]
R5-151172	Addition of frequency UTRA band 32	CR	Ericsson	34.121-2 11.5.0 CR#161 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 5.3.7.3	available	[WTS] [JSN]
R5-151173	Update of default SIB1 for Low Cost MTC testing	CR	Ericsson	36.508 12.5.0 CR#590 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.7.1	available	[WTS] [JSN]
R5-151174	New idle mode test case 6.1.2.2b for Low Cost MTC	CR	Ericsson, TechMahindra	36.523-1 12.5.0 CR#2934 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.7.2	available	[WTS] [JSN]
R5-151175	New MAC test case 7.1.1.1a for Low Cost MTC	CR	Ericsson, TechMahindra	36.523-1 12.5.0 CR#2935 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.7.2	available	[WTS] [JSN]
R5-151176	Applicability of New Low Cost MTC protocol test cases	CR	Ericsson, TechMahindra	36.523-2 12.5.0 CR#720 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.7.3	available	[WTS] [JSN]
R5-151177	LS on NS_15 requirements for B26	LS in	TSG WG RAN4				R5-67 AI: 3	noted	[WTS] [JSN]
R5-151178	LS to RAN WG5 on requirements for the Antenna Test Function (ATF)	LS in	TSG WG RAN4				R5-67 AI: 5.2	noted	[WTS] [JSN]
R5-151179	LS on clarification of Tx EVM from RAN4 to RAN5	LS in	TSG WG RAN4				R5-67 AI: 5.2	noted	[WTS] [JSN]
R5-151180	(GP-150344) Correction to GERAN-LTE cell reselection test cases 6.2.3.23 and 6.2.3.24	CR	Qualcomm	36.523-1 12.5.0 CR#2936 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.11	reserved	[WTS] [JSN]
R5-151181	CA RF: Corrections to the applicability clause	CR	ROHDE & SCHWARZ	36.521-1 12.5.0 CR#1855 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151182	Addition of Chapter 7 3DL CA Test Configuration Tables	CR	Intel	36.521-1 12.5.0 CR#1856 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151183	Update generic procedure C.21	CR	Ericsson, Microsoft	34.229-1 12.5.0 CR#661 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151184	Addition of new D2D test case for Successful Announce Request Procedure/Direct discovery	CR	QUALCOMM CDMA Technologies	36.523-1 12.5.0 CR#2937 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-67 AI: 6.3.5.3	available	[WTS] [JSN]
R5-151185	Addition of new D2D test case 19.2.1 - Successful Announce Request Procedure/Direct Discovery	CR	QUALCOMM CDMA Technologies	36.523-2 12.5.0 CR#721 catF	LTE_D2D_Prox-UEConTest	Rel-12	R5-67 AI: 6.3.5.4	available	[WTS] [JSN]
R5-151186	Test Tolerances for 8.3.1+8.3.2+8.14.1+8.14.2 inter-frequency event triggered reporting under fading propagation conditions	CR	ZTE	36.521-3 12.5.0 CR#1113 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151187	Update Test Tolerance Analysis for TS 36.521-3 TC 8.3.1+8.3.2+8.14.1+8.14.2	CR	ZTE	36.521-3 12.5.0 CR#1114 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.2	withdrawn	[WTS] [JSN]
R5-151188	Test Tolerances for 8.4.1+8.4.2+8.15.1+8.15.2 inter-frequency event triggered reporting under fading propagation conditions	CR	ZTE	36.521-3 12.5.0 CR#1115 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151189	Update Test Tolerance Analysis for TS 36.521-3 TC 8.4.1+8.4.2+8.15.1+8.15.2	CR	ZTE	36.521-3 12.5.0 CR#1116 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.2	withdrawn	[WTS] [JSN]
R5-151190	Test Tolerances for 9.2.4A.1 Absolute Accuracy RSRQ	CR	ZTE	36.521-3 12.5.0 CR#1117 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151191	Update Test Tolerance Analysis for TS 36.521-3 TC 9.2.4A.1	CR	ZTE	36.521-3 12.5.0 CR#1118 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.2	withdrawn	[WTS] [JSN]
R5-151192	Test Tolerances for 9.2.4A.2 Relative Accuracy RSRQ	CR	ZTE	36.521-3 12.5.0 CR#1119 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151193	Update Test Tolerance Analysis for TS 36.521-3 TC 9.2.4A.2	CR	ZTE	36.521-3 12.5.0 CR#1120 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.2	withdrawn	[WTS] [JSN]
R5-151194	Uncertainties to Annex F for above 3GHz RRM test cases	CR	ZTE	36.521-3 12.5.0 CR#1121 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151195	Corrections to CSI Reference Measurement Channel	CR	ZTE	36.521-1 12.5.0 CR#1857 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151196	Corrections to Reference Measurement Channel	CR	ZTE	36.521-1 12.5.0 CR#1858 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151197	Corrections to CPICH Ec/No to CPICH Ec/Io in EUTRA FDD to UTRA FDD HO	CR	ZTE	36.521-3 12.5.0 CR#1122 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151198	Corrections to RRM test cases for Core Alignment	CR	ZTE	36.521-3 12.5.0 CR#1123 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151199	Introduction of Accuracy Requirements for RSRQ on all OFDM Symbols	CR	ZTE	36.521-3 12.5.0 CR#1124 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151200	Corrections to RSRP minimum requirements	CR	ZTE	36.521-3 12.5.0 CR#1125 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151201	Introduction of TC 6.3.5A.1.2 Power Control Absolute Power Tolerance for CA	CR	Tejet, ZTE	36.521-1 12.5.0 CR#1859 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151202	Introduction of TC 6.3.5A.1.3 Power Control Absolute Power Tolerance for CA	CR	Tejet, ZTE	36.521-1 12.5.0 CR#1860 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151203	Introduction of TC 6.3.5A.2.3 Power Control Relative Power Tolerance for CA	CR	Tejet, ZTE	36.521-1 12.5.0 CR#1861 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151204	Introduction of TC 6.3.5A.2.2 Power Control Relative Power Tolerance for CA	CR	ZTE	36.521-1 12.5.0 CR#1862 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151205	Introduction of TC 6.7A.2 Transmit intermodulation for CA	CR	ZTE	36.521-1 12.5.0 CR#1863 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151206	Introduction of TC 6.7A.3 Transmit intermodulation for CA	CR	ZTE	36.521-1 12.5.0 CR#1864 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151207	Addition of multiple Inter-band 3DL CA combinations 2A_4A_29A to Channel BW	CR	ZTE, SRTC, Intertek	36.521-1 12.5.0 CR#1865 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151208	Addition of multiple Inter-band 3DL CA combinations 4A_29A_30A to Channel BW	CR	ZTE	36.521-1 12.5.0 CR#1866 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151209	Addition of 3DL CA 2A_4A_29A to Inter-band CA operating bands	CR	ZTE, SRTC, Intertek	36.521-1 12.5.0 CR#1867 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151210	Addition of 3DL CA 4A_29A_30A to Inter-band CA operating bands	CR	ZTE, SRTC, Intertek	36.521-1 12.5.0 CR#1868 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151211	Addition of Inter-band CA combination 29A_30A to Channel BW	CR	ZTE, SRTC, Intertek	36.521-1 12.5.0 CR#1869 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151212	Addition of CA 29A_30A to Inter-band CA operating bands	CR	ZTE	36.521-1 12.5.0 CR#1870 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151213	Updating Annex A relevant for the introduced of eDL MIMO enhancement Tests	CR	ZTE	36.521-1 12.5.0 CR#1871 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-67 AI: 5.3.5.1	available	[WTS] [JSN]
R5-151214	Updating Annex B Beam steering approach for eDL MIMO enhancement Tests	CR	ZTE	36.521-1 12.5.0 CR#1872 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-67 AI: 5.3.5.1	available	[WTS] [JSN]
R5-151215	Updating Annex I relevant for the introduced of eDL MIMO enhancement Tests	CR	ZTE	36.521-1 12.5.0 CR#1873 catF	LTE_eDL_MIMO_enh-UEConTest	Rel-12	R5-67 AI: 5.3.5.1	available	[WTS] [JSN]
R5-151216	Text proposal to TS 37.544 v0.3.0 for 3.1 Definitions	pCR	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151217	Text proposal to TS 37.544 v0.3.0 for 4.3.1 DUT Positioning on Head Phantom	pCR	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151218	Text proposal to TS 37.544 v0.3.0 for Annex A.2.1 Head Phantom	pCR	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151219	Text proposal to TS 37.544 v0.3.0 for 4.3.3 DUT Positioning for Speech Mode	pCR	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151220	Text proposal to TS 37.544 v0.3.0 for Annex A.2.2 Hand Phantom	pCR	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151221	Text proposal to TS 37.544 v0.3.0 for 4.3.4 DUT Positioning for Browsing Mode	pCR	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151222	Text proposal to TS 37.544 v0.3.0 for 4.3.5 DUT Positioning for devices with embedded modules	pCR	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151223	Text proposal to TS 37.544 v0.3.0 for Annex F Suggested recipes of liquid to be used inside SAM phantom	pCR	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151224	Text proposal to TS 37.544 v0.3.0 for Annex C Measurement Test Report	pCR	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151225	Text proposal to TS 37.544 v0.3.0 for Annex D Maximum Uncertainty of Test System	pCR revised to R5-151908	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	revised	[WTS] [JSN]
R5-151226	Text proposal to TS 37.544 v0.3.0 for Annex D Test Tolerances	pCR revised to R5-151909	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	revised	[WTS] [JSN]
R5-151227	Text proposal to TS 37.544 v0.3.0 for Annex E General Estimation of Measurement Uncertainty	pCR	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151228	Text proposal to TS 37.544 v0.3.0 for Annex G for Anechoic Chamber Specs and Validation Method	pCR	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	withdrawn	[WTS] [JSN]
R5-151229	Text proposal to TS 37.544 v0.3.0 for Annex H for Reverberation Chamber Specs and Validation Method	pCR	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151230	TS 37.544: User Equipment (UE) and Mobile Station (MS) Over The Air (OTA) performance v0.4.0	pCR	ZTE	37.544 0.4.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 7.5	noted	[WTS] [JSN]
R5-151231	CoMP TCs applicability update section 8	CR	Samsung, Rohde & Schwarz	36.521-1 12.5.0 CR#1874 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151232	CoMP TCs applicability update section 9	CR	Samsung, Rohde & Schwarz	36.521-1 12.5.0 CR#1875 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151233	CoMP TCs applicability update	CR	Samsung, Rohde & Schwarz	36.523-2 12.5.0 CR#722 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151234	Update generic procedure C.25	CR	Ericsson	34.229-1 12.5.0 CR#662 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151235	Update generic procedure C.39	CR	Ericsson	34.229-1 12.5.0 CR#663 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151236	Update generic procedure C.40	CR	Ericsson	34.229-1 12.5.0 CR#664 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151237	Update of CoMP TCs 9.2.4.1_F and 9.2.4.2_F	CR	Samsung	36.521-1 12.5.0 CR#1876 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151238	Update of CoMP TCs in sections 9.3.6.1_F and 9.3.6.2_F	CR	Samsung	36.521-1 12.5.0 CR#1877 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151239	Update to the applicability of Intra/inter-frequencySI acquisition Home eNB test cases	CR revision of R5-151139	Anite, Intel	36.523-2 12.5.0 CR#7161 catF	TEI9_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151240	Update VoLTE definition in A.4.5	CR	Ericsson	36.523-2 12.5.0 CR#723 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151241	Update test case 15.21b	CR	Ericsson	34.229-1 12.5.0 CR#665 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151242	Update REGISTER message with accesstype	CR	Ericsson	34.229-1 12.5.0 CR#666 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151243	Add capability for accesstype	CR	Ericsson	34.229-2 12.4.0 CR#140 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.2	available	[WTS] [JSN]
R5-151244	Update GBA capabilities	CR	Ericsson	34.229-2 12.4.0 CR#141 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.2	available	[WTS] [JSN]
R5-151245	Addition of new test case TC 8.5.4.4 - UE Capability Transfer/ Success/ UE Cat 0/ UE Paging Info	CR	TechMahindra Ltd, Ericsson	36.523-1 12.5.0 CR#2938 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.7.2	available	[WTS] [JSN]
R5-151246	New TCs: FDD PMI Reporting with 4Tx enhanced codebook - PUSCH 1-2 (Multiple PMI) for eDL-MIMO Enhancement	CR	SGS Wireless	36.521-1 12.5.0 CR#1878 catF	TEI12_Test	Rel-12	R5-67 AI: 5.3.5.1	available	[WTS] [JSN]
R5-151247	New TCs: TDD PMI Reporting with 4Tx enhanced codebook - PUSCH 1-2 (Multiple PMI) for eDL-MIMO Enhancement	CR	SGS Wireless	36.521-1 12.5.0 CR#1879 catF	TEI12_Test	Rel-12	R5-67 AI: 5.3.5.1	available	[WTS] [JSN]
R5-151248	Addition of applicability for P-CCPCH RSCP absolute accuracy	CR	SGS Wireless	36.521-2 12.5.0 CR#249 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151249	Addition and correction of applicability for TDD sustained data rate performance	CR revised to R5-151533	SGS Wireless	36.521-2 12.5.0 CR#250 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.3	revised	[WTS] [JSN]
R5-151250	Correction to CA 2UL Tx test case 6.2.2A.1 (Rel-10, intra-band contiguous)	CR	Ericsson	36.521-1 12.5.0 CR#1880 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151251	Correction to CA 2UL Tx test case 6.2.3A.1 (Rel-10, intra-band contiguous)	CR	Ericsson	36.521-1 12.5.0 CR#1881 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151252	New CA 2UL Tx test case 6.2.2A.2	CR	Ericsson	36.521-1 12.5.0 CR#1882 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151253	New CA 2UL Tx test case 6.2.2A.3	CR	Ericsson	36.521-1 12.5.0 CR#1883 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151254	Update of CA Physical Layer Baseline Implementation Capabilities for Rel-12 CA 2UL configurations	CR	Ericsson	36.521-2 12.5.0 CR#251 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.3	available	[WTS] [JSN]
R5-151255	Update of CA Physical Layer Baseline Implementation Capabilities for Rel-12 CA 2UL configurations	CR	Ericsson	36.523-2 12.5.0 CR#724 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 6.3.8.3	available	[WTS] [JSN]
R5-151256	Update of CoMP TCs in section 8	CR	Samsung	36.521-1 12.5.0 CR#1884 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151257	Update of CoMP TCs 9.5.5.1_F.1 and 9.5.5.2_F.1	CR	Samsung	36.521-1 12.5.0 CR#1885 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151258	Updates of minimum requirement for reference sensitivity for CA	CR	NTT DOCOMO INC.	36.521-1 12.5.0 CR#1886 catF		Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151259	Discussion for receiver test cases for 3DL inter-band CA	other	NTT DOCOMO INC.			Rel-12	R5-67 AI: 5.3.4.	noted	[WTS] [JSN]
R5-151260	Addition of test points and test requirements for 3DL inter-band CA	CR	NTT DOCOMO INC.	36.521-1 12.5.0 CR#1887 catF		Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151261	Revised WID: UE Conformance Test Aspects - Codec for Enhanced Voice Services (EVS)	WID new	Ericsson				R5-67 AI: 7.3	agreed	[WTS] [JSN]
R5-151262	Update of Maximum input level for CA (3DL CA without UL CA)	CR	ANRITSU LTD	36.521-1 12.5.0 CR#1888 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151263	Update Test Tolerance Analysis for TS 36.521-3 TC 8.3.1+8.3.2+8.14.1+8.14.2	CR	ZTE	36.903 12.5.0 CR#186 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151264	Update Test Tolerance Analysis for TS 36.521-3 TC 8.4.1+8.4.2+8.15.1+8.15.2	CR	ZTE	36.903 12.5.0 CR#187 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151265	Update Test Tolerance Analysis for TS 36.521-3 TC 9.2.4A.1	CR	ZTE	36.903 12.5.0 CR#188 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151266	Update Test Tolerance Analysis for TS 36.521-3 TC 9.2.4A.2	CR	ZTE	36.903 12.5.0 CR#189 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151267	Corrections to Derivation of Test Requirements for above 3GHz RRM test cases	CR	ZTE	36.521-3 12.5.0 CR#1126 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151268	Introduction of ACS Test Case for 3DL CA without UL CA	CR	ANRITSU LTD	36.521-1 12.5.0 CR#1889 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151269	Update Test Tolerances and Test requirements for TS 36.521-3 Test cases 4.2.3, 4.2.4, 4.2.5, 4.2.6	CR	ANRITSU LTD	36.903 12.5.0 CR#190 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151270	Update Test Tolerances and Test requirements for TS 36.521-3 Test cases 4.2.3, 4.2.4, 4.2.5, 4.2.6	CR	ANRITSU LTD	36.521-3 12.5.0 CR#1127 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151271	Update Test Tolerance analyses for TS 36.521-3 Test case 9.1.5.1	CR	ANRITSU LTD	36.903 12.5.0 CR#191 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151272	Update Test Tolerance analyses for TS 36.521-3 Test case 9.1.5.1	CR	ANRITSU LTD	36.521-1 12.5.0 CR#1890 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151273	Update Test Tolerances and Test requirements for TS 36.521-3 Test case 9.1.5.2	CR	ANRITSU LTD	36.903 12.5.0 CR#192 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151274	Update Test Tolerances and Test requirements for TS 36.521-3 Test case 9.1.5.2	CR	ANRITSU LTD	36.903 12.5.0 CR#193 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151275	Add Test Tolerance analysis for Rel-12 Improved RSRP accuracy Test cases	CR	ANRITSU LTD	36.903 12.5.0 CR#194 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151276	Uncertainties and Test Tolerances for Rel-12 Improved RSRP accuracy	CR	ANRITSU LTD	36.521-3 12.5.0 CR#1128 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151277	Correction to RRM test case 8.2.4	CR	Starpoint	36.521-3 12.5.0 CR#1129 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151278	Correction to RRM test case 8.11.4	CR	Starpoint	36.521-3 12.5.0 CR#1130 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151279	[PTCO] Correction to applicability of R99 RAB test cases	CR	Motorola Mobility, Ericsson, Samsung & AT&T	34.123-2 11.6.0 CR#734 catF	TEI_Test	Rel-11	R5-67 AI: 6.6.4.2	available	[WTS] [JSN]
R5-151280	Correction of UL RB Allocation in Interband DL CA Testcases	CR	Inte	36.521-1 12.5.0 CR#1891 catF	TEI10_Test	Rel-10	R5-67 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-151281	[PTCO] Change of TC applicability for tests which verify procedure(s) or/and message contents which are also verified in other TCs - straightforward implicit testing	CR	Samsung	36.523-2 12.5.0 CR#725 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151282	New TC: E-UTRAN TDD-TDD Inter-frequency event triggered reporting under fading propagation conditions in synchronous cells for 20 MHz +20 MHz bandwidth	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1131 catF	TEI10_Test	Rel-10	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151283	New TC: E-UTRAN TDD-TDD Inter-frequency event triggered reporting under fading propagation conditions in synchronous cells for 20 MHz +10 MHz bandwidth	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1132 catF		Rel-10	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151284	Correction in EMM test cases 9.2.3.1.15 and 9.2.3.1.15a	CR	Anite	36.523-1 12.5.0 CR#2939 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151285	Discussion on Fallback 2DL RX RF Testcase applicability if 3DL CA is tested	other revised to R5-151863	Intel				R5-67 AI: 5.3.4.	revised	[WTS] [JSN]
R5-151286	New TC: E-UTRAN TDD to UTRAN TDD cell search under fading propagation conditions for 20 MHz + 20 MHz bandwidth	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1133 catF		Rel-10	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151287	Applicability Changes to 36.521-1 Chapter 7 due to Band Selection Concept	CR	Intel	36.521-1 12.5.0 CR#1892 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151288	New TC: E-UTRAN TDD to UTRAN TDD cell search under fading propagation conditions for 20 MHz + 10 MHz bandwidth	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1134 catF		Rel-10	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151289	Introduction of 3DL CA Maximum Input Level applicability and implementation of skipping 3DL CA’s 2DL fallbacks for 2DL CA	CR	Intel	36.521-2 12.5.0 CR#252 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.3	available	[WTS] [JSN]
R5-151290	Addition of applicability for newly added 20MHz+20MHz and 20MHz+10MHz CA RRM test cases	CR	China Mobile Com. Corporation	36.521-2 12.5.0 CR#253 catF		Rel-10	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151291	Update applicabilities of merged TDD CA cases	CR	China Mobile Com. Corporation	36.521-2 12.5.0 CR#254 catF		Rel-10	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151292	Merge of TDD CQI Reporting under AWGN conditions – PUCCH 1-0 for CA cases	CR	China Mobile Com. Corporation	36.521-1 12.5.0 CR#1893 catF		Rel-10	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151293	Updated test system uncertainties in annex F for merge TDD sustained data rate CA test cases	CR	China Mobile Com. Corporation	36.521-1 12.5.0 CR#1894 catF		Rel-10	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151294	Correction to UTRA CSG test cases 12.2.1.5e and 12.2.2.7e	CR	Anite, Ericsson	34.123-1 11.6.0 CR#3740 catF	TEI8_Test	Rel-11	R5-67 AI: 6.3.11.2	available	[WTS] [JSN]
R5-151295	Merge of TDD sustained data rate CA test cases	CR	China Mobile Com. Corporation	36.521-1 12.5.0 CR#1895 catF		Rel-10	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151296	Update Reference Channel and Minimum test time for TDD CA power imbalance demodulation test	CR	China Mobile Com. Corporation	36.521-1 12.5.0 CR#1896 catF		Rel-10	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151297	Update TDD CA BW combination to power imbalance test	CR	China Mobile Com. Corporation	36.521-1 12.5.0 CR#1897 catF		Rel-10	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151298	Addition of applicability for newly introduced RSRP accuracy RRM test cases	CR	China Mobile Com. Corporation	36.521-2 12.5.0 CR#255 catF		Rel-12	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151299	Addition of applicability for newly added FDD CA RSRP accuracy RRM test cases	CR	China Mobile Com. Corporation	36.521-2 12.5.0 CR#256 catF		Rel-12	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151300	Cell configuration mapping for Rel 12 and forward RSRP relative accuracy RRM cases	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1135 catF		Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151301	Cell configuration mapping for Rel 12 and forward FDD absolute RSRP accuracy RRM cases	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1136 catF		Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151302	New TCs: R12 RSRP accuracy in eICIC	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1137 catF		Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151303	New TCs: R12 RSRP accuracy in FeICIC	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1138 catF		Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151304	New TCs: RSRP absolute accuracy for FDD E-UTRA CA	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1139 catF		Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151305	New TCs: R12 inter frequency relative accuracy of RSRP	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1140 catF		Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151306	Update of R12 CA RSRP measurement accuracy test cases	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1141 catF		Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151307	Update of R12 RSRP inter frequency measurement accuracy test cases	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1142 catF		Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151308	Update of R12 RSRP intra frequency measurement accuracy test cases	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1143 catF		Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151309	Update test applicabilities for R8 inter frequency relative accuracy of RSRP	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1144 catF		Rel-8	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151310	Update test applicabilities for R9 inter frequency relative accuracy of RSRP	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1145 catF		Rel-9	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151311	Update test applicabilities of R10 RSRP measurement accuracy	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1146 catF		Rel-10	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151312	Update test applicabilities of R11 RSRP measurement accuracy	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1147 catF		Rel-11	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151313	Update FDD CA RSRP Accuracy requirements	CR	China Mobile Com. Corporation	36.521-3 12.5.0 CR#1148 catF		Rel-10	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151314	New Work Item Proposal: UE Conformance Test Aspects – Core Requirements for Uplink 64QAM for E-UTRA	WID new revised to R5-151715	China Mobile Com. Corporation				R5-67 AI: 4.1	revised	[WTS] [JSN]
R5-151315	Test case list for 20MHz+10MHz CA RRM tests - before RAN5#67	other revised to R5-151919	China Mobile Com. Corporation				R5-67 AI: 5.4.1.11	revised	[WTS] [JSN]
R5-151316	Update of TC list for Rel-12 RSRP accuracy requirements - before RAN5#67	other revised to R5-151920	China Mobile Com. Corporation				R5-67 AI: 5.4.1.11	revised	[WTS] [JSN]
R5-151317	Correction of allowed CQI report delays in sCell Activation Tests	CR	Intel	36.521-3 12.5.9 CR#1149 catF	TEI11_Test	Rel-11	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151318	Correction of CA_25A-25A wrong allocation in Chapter 7 Table 7.3A.4.4.1-1	CR	Intel	36.521-1 12.5.0 CR#1898 catF	TEI11_Test	Rel-11	R5-67 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-151319	Addition of 2DL CA and 3DL CA Frequencies to 36.508 Chapter 6	CR	Intel	36.508 12.5.0 CR#591 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.1	available	[WTS] [JSN]
R5-151320	Addition of several CA Combinations to 35.521-1 Chapter 5	CR	Intel	36.521-1 12.5.0 CR#1899 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151321	Addition of test case for MFBI	other	China Mobile Com. Corporation				R5-67 AI: 6.4.6	noted	[WTS] [JSN]
R5-151322	Addition of Multiple 3DL CA Combinations to Chapter 7 Delta RIB and REFSENS Exceptions Tables	CR	Intel	36.521-1 12.5.0 CR#1900 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151323	Addition of 3DL CA Configurations to 36.523-2	CR	Intel	36.523-2 12.5.0 CR#726 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 6.3.8.3	available	[WTS] [JSN]
R5-151324	Addition of frequency for UTRA band 32	CR	Ericsson	34.123-2 11.6.0 CR#735 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 6.3.6.2	available	[WTS] [JSN]
R5-151325	Addition of frequency for E-UTRA band 32	CR	Ericsson	36.523-2 12.5.0 CR#727 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 6.3.6.4	available	[WTS] [JSN]
R5-151326	Correction to conditions C647a and C731a for Further Enhanced CELL_FACH test cases	CR	Ericsson, MCC TF160	34.123-2 11.6.0 CR#736 catF	TEI11_Test	Rel-11	R5-67 AI: 6.6.1.3	available	[WTS] [JSN]
R5-151327	Addition of band 32 to 36.508	CR	Ericsson	36.508 12.5.0 CR#592 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 5.3.7.4	available	[WTS] [JSN]
R5-151328	Addition of band 32 to clause 5 in 36.521-1	CR	Ericsson	36.521-1 12.5.0 CR#1901 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 5.3.7.5	available	[WTS] [JSN]
R5-151329	Addition of band 32 to clause 6 in 36.521-1	CR	Ericsson	36.521-1 12.5.0 CR#1902 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 5.3.7.5	available	[WTS] [JSN]
R5-151330	Addition of band 32 to TS36.521-3	CR	Ericsson	36.521-3 12.5.0 CR#1150 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 5.3.7.7	available	[WTS] [JSN]
R5-151331	Addition of band 32 to 37.571-1	CR	Ericsson	37.571-1 12.2.0 CR#136 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 5.3.7.11	available	[WTS] [JSN]
R5-151332	Addition of band XXXII to 34.108	CR	Ericsson	34.108 12.6.0 CR#978 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 5.3.7.1	available	[WTS] [JSN]
R5-151333	Addition of band XXXII to 34.121-1 clause 4	CR	Ericsson	34.121-1 12.6.0 CR#1598 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 5.3.7.2	available	[WTS] [JSN]
R5-151334	Addition of band XXXII to 34.121-1 clause 5	CR	Ericsson	34.121-1 12.6.0 CR#1599 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 5.3.7.2	available	[WTS] [JSN]
R5-151335	Corrections to message contents for feICIC TCs in 37.571-1	CR	Ericsson	37.571-1 12.2.0 CR#137 catF	TEI11_Test	Rel-12	R5-67 AI: 5.5.9	available	[WTS] [JSN]
R5-151336	Update of eICIC test case 8.3.1.20	CR	Qualcomm Incorporated, Anritsu Ltd.	36.523-1 12.5.0 CR#2940 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-151337	Update of eICIC test case 8.3.1.21	CR	Qualcomm Incorporated, Anritsu Ltd.	36.523-1 12.5.0 CR#2941 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-151338	Update of eICIC test case 8.3.1.28	CR	Qualcomm Incorporated, Anritsu Ltd.	36.523-1 12.5.0 CR#2942 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-151339	Update of EMM information procedure test case 9.1.5.1	CR	Qualcomm Incorporated, CATR, Anritsu Ltd., MCC TF160, Rohde & Schwartz	36.523-1 12.5.0 CR#2943 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151340	Applicability Update of EMM information procedure test case 9.1.5.1	CR	Qualcomm Incorporated, CATR, Anritsu Ltd., MCC TF160, Rohde & Schwartz	36.523-2 12.5.0 CR#728 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151341	Correction of DL SPS test case 7.1.3.2	CR	Qualcomm Incorporated, Anritsu Ltd., MCC TF160	36.523-1 12.5.0 CR#2944 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.2.1	available	[WTS] [JSN]
R5-151342	Correction of UL SPS test case 7.1.4.2	CR	Qualcomm Incorporated, Anritsu Ltd., MCC TF160	36.523-1 12.5.0 CR#2945 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.2.1	available	[WTS] [JSN]
R5-151343	Update of eICIC test case 8.3.1.21 title	CR	Qualcomm Incorporated, Anritsu Ltd.	36.523-2 12.5.0 CR#729 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151344	Update of eICIC test case 8.3.1.28 title	CR	Qualcomm Incorporated, Anritsu Ltd.	36.523-2 12.5.0 CR#730 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151345	Addition of CA_12-30 to Table A.4.6.3-3 of 36.521-2	CR	CGC Inc.	36.521-2 12.5.0 CR#257 catF		Rel-12	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151346	Addition of CA_12-30 to Table A.4.3.3.3-3 of 36.523-2	CR	CGC Inc.	36.523-2 12.5.0 CR#731 catF		Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151347	Correction of UEs category for TDD sustained data rate performance	CR	SGS Wireless	36.521-1 12.5.0 CR#1903 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2	available	[WTS] [JSN]
R5-151348	Correction of applicability for TDD sustained data rate performance	CR revised to R5-151534	SGS Wireless	36.521-2 12.5.0 CR#258 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.3	revised	[WTS] [JSN]
R5-151349	Corrections to eMDT test case 8.6.6.6	CR	CATR	36.523-1 12.5.0 CR#2946 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-151350	Correction of CA_18A-28A test frequency	CR	Anritsu	36.508 12.5.0 CR#593 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.1	available	[WTS] [JSN]
R5-151351	Clarification to spurious emission requirement for the edge of spurious domain	CR	Anritsu	36.521-1 12.5.0 CR#1904 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151352	Correction of PCC/SCCs frequency mapping in Tx	CR	Anritsu	36.521-1 12.5.0 CR#1905 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151353	Clarification of the power of interferer with deltaRIBc	CR	Anritsu	36.521-1 12.5.0 CR#1906 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-151354	Correction of PHICH configuration	CR	Anritsu	36.521-1 12.5.0 CR#1907 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151355	Add pre-test steps to check the band capability of UE in MFBI protocol test cases	CR	CATR	36.101 12.5.0 CR#2966 catA		Rel-12	R5-67 AI: 6.4.3.1	withdrawn	[WTS] [JSN]
R5-151356	Add pre-test steps to check the band capability of UE in MFBI protocol test cases	CR	CATR	36.523-1 12.5.0 CR#2947 catA		Rel-12	R5-67 AI: 6.4.3	available	[WTS] [JSN]
R5-151357	Correction of idle mode test case 6.1.1.2a	CR revision of R5-151154	KTL	36.523-1 12.5.0 CR#29321 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.1	available	[WTS] [JSN]
R5-151358	Update of TC8.2.1.1.1_A.2:FDD PDSCH Single Antenna Performance for 3DL CA	CR	Anritsu, TTA, Huawei	36.521-1 12.5.0 CR#1908 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151359	Addition of new TC FDD PDSCH 2x2 Open Loop Performance for 3DL CA	CR	Anritsu, LGE	36.521-1 12.5.0 CR#1909 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151360	Addition of new TC FDD PDSCH 4x2 Closed Loop Performance for 3DL CA	CR	Anritsu, LGE	36.521-1 12.5.0 CR#1910 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151361	Update of DL RMCs for PDSCH performance requirements	CR	Anritsu	36.521-1 12.5.0 CR#1911 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151362	Corrections to Test Case 8.4.3.1A	CR	ROHDE & SCHWARZ	34.121-1 11.6.0 CR#1600 catF	TEI10_Test	Rel-11	R5-67 AI: 5.4.1.6	available	[WTS] [JSN]
R5-151363	Corrections to test procedure of Test Cases 8.7.11 and 8.7.13	CR	ROHDE & SCHWARZ	34.121-1 11.6.0 CR#1601 catF	TEI10_Test	Rel-11	R5-67 AI: 5.4.1.6	available	[WTS] [JSN]
R5-151364	Corrections to Test Case 8.6.5.4	CR	ROHDE & SCHWARZ	34.122 11.10.0 CR#436 catF	TEI10_Test	Rel-11	R5-67 AI: 5.4.1.8	available	[WTS] [JSN]
R5-151365	Updates to 36.508 for CA_7C, CA_40C, CA_41C, CA_41D	CR	ROHDE & SCHWARZ	36.508 12.5.0 CR#594 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.1	available	[WTS] [JSN]
R5-151366	Removal of double table 7.6.1B.5-2	CR	ROHDE & SCHWARZ	36.521-1 12.5.0 CR#1912 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-151367	Corrections to UL CA Test Cases	CR	ROHDE & SCHWARZ	36.521-1 12.5.0 CR#1913 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151368	Updates for interferer placement in non-contiguous CA	CR	ROHDE & SCHWARZ	36.521-1 12.5.0 CR#1914 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-151369	Editorial corrections to TC 6.6.1	CR	ROHDE & SCHWARZ	36.521-1 12.5.0 CR#1915 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151370	List of remaining TT analysis above 3GHz	other revised to R5-151852	Ericsson				R5-67 AI: 5.4.1.11	revised	[WTS] [JSN]
R5-151371	Clean up of PDSCH performance test cases	CR	Anritsu	36.521-1 12.5.0 CR#1916 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151372	Correction to UE category in 8.7.2.1_1	CR	Anritsu	36.521-1 12.5.0 CR#1917 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151373	Correction to CQI reference measurement channels	CR	Anritsu	36.521-1 12.5.0 CR#1918 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151374	Correction to DL parameters in Rx tests	CR	Anritsu	36.521-1 12.5.0 CR#1919 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.2	withdrawn	[WTS] [JSN]
R5-151375	Correction to test applicability in TDD CSI test:9.6.1.2_A.2	CR	Anritsu	36.521-1 12.5.0 CR#1920 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151376	Addition of minimum test time for TDD CA inter band performance	CR	Anritsu	36.521-1 12.5.0 CR#1921 catF	TEI8_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151377	Corrections to spurious emission band co-existence limit tables in clause 6	CR	Ericsson	36.521-1 12.5.0 CR#1922 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151378	Addition and aligment of all Rel-12 CA configurations in Section 5	CR	MICROSOFT EUROPE SARL	36.521-1 12.5.0 CR#1923 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151379	[PTCO] Proposed way forward to Test Optimisation	other revised to R5-151977	Telecom Italia, Orange, CMCC, Spirent Communications, NTT DoCoMo				R5-67 AI: 4.5.5	revised	[WTS] [JSN]
R5-151380	Addition of new test case TC 8.4.8.3 - WLAN Offload/ Offload Success/ EUTRA RRC_CONNECTED to/from WLAN (Qqualmeas, BeaconRSSI)	CR	TechMahindra Ltd	36.523-1 12.5.0 CR#2948 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-67 AI: 6.3.4.6	available	[WTS] [JSN]
R5-151381	Corrections to MDT test case 8.6.3.1	CR	CATR	36.523-1 12.5.0 CR#2949 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-151382	Corrections to eMDT test case 8.6.2.10	CR	CATR	36.523-1 12.5.0 CR#2950 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-151383	Correction to MDT test case 8.6.5.3	CR	CATR	36.523-1 12.5.0 CR#2951 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-151384	Corrections to RRC test case 8.3.2.10	CR	CATR	34.123-1 11.6.0 CR#3741 catF	TEI_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151385	Clean up of eDL-MIMO test cases	CR	Anritsu	36.521-1 12.5.0 CR#1924 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151386	Clean up of TM9 interference model test cases	CR	Anritsu	36.521-1 12.5.0 CR#1925 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151387	Correction to eICIC performance test cases	CR	Anritsu	36.521-1 12.5.0 CR#1926 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151388	Correction to CQI and RI reporting test in feICIC	CR	Anritsu	36.521-1 12.5.0 CR#1927 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151389	Correction to PDSCH demodulation test in feICIC	CR	Anritsu	36.521-1 12.5.0 CR#1928 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151390	Clean up on PCFICH/PDCCH demodulation test in feICIC	CR	Anritsu	36.521-1 12.5.0 CR#1929 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151391	Clean up on PHICH demodulation test in feICIC	CR	Anritsu	36.521-1 12.5.0 CR#1930 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151392	Correction to RLM test in feICIC	CR	Anritsu	36.521-3 12.5.0 CR#1151 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151393	Add capability for EVS	CR	Ericsson	34.229-2 12.4.0 CR#142 catF	EVS_codec-UEConTest	Rel-12	R5-67 AI: 6.3.9.2	available	[WTS] [JSN]
R5-151394	Implementation Capability statement for Half-Duplex operation Type B for UE Cat 0	CR	Ericsson	36.523-2 12.5.0 CR#732 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.7.3	available	[WTS] [JSN]
R5-151395	Add applicability for new MO EVS test case	CR	Ericsson	34.229-2 12.4.0 CR#143 catF	EVS_codec-UEConTest	Rel-12	R5-67 AI: 6.3.9.2	available	[WTS] [JSN]
R5-151396	Discussion paper on Low Cost MTC testing	other	Ericsson		LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 4.5.6	withdrawn	[WTS] [JSN]
R5-151397	Discussion paper on testing of Rel-11 ROHC context continuation for intra-ENB handover	other	Ericsson		TEI11_Test	Rel-11	R5-67 AI: 6.4.6	withdrawn	[WTS] [JSN]
R5-151398	Addition of FDD-TDD RSRP accuracy test cases for FDD-TDD CA.	CR	QUALCOMM Inc	36.521-3 12.5.0 CR#1152 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.4	available	[WTS] [JSN]
R5-151399	Applicability update of FDD-TDD RSRP accuracy test cases for FDD-TDD CA.	CR	QUALCOMM UK Ltd	36.521-2 12.5.0 CR#259 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.3	available	[WTS] [JSN]
R5-151400	Correction to test applicability in test case 8.7.2.1	CR	CGC Inc.	36.521-1 12.5.0 CR#1931 catF		Rel-9	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151401	Correction to test case 9.2.10.1 of 36.521-3	CR	CGC Inc.	36.521-3 12.5.0 CR#1153 catF		Rel-10	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151402	LTE Carrier Aggregation Enhancements TC completion follow-up	other	MICROSOFT EUROPE SARL				R5-67 AI: 5.7	noted	[WTS] [JSN]
R5-151403	Revised WID: UE Conformance Test Aspects - Further Rel-12 Configurations for LTE Advanced Carrier Aggregation with 3DL	WID new	MICROSOFT EUROPE SARL			Rel-12	R5-67 AI: 7.3	agreed	[WTS] [JSN]
R5-151404	Correction of PMI test cases in the section 9.4.1 and 9.4.2	CR	CGC Inc.	36.521-1 12.5.0 CR#1932 catF		Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151405	Add new generic procedure for MO speech / EVS	CR	Ericsson	34.229-1 12.5.0 CR#667 catF	EVS_codec-UEConTest	Rel-12	R5-67 AI: 6.3.9.1	available	[WTS] [JSN]
R5-151406	Correction to test applicability in test cases 9.6.1.2_A.1	CR	CGC Inc.	36.521-1 12.5.0 CR#1933 catF		Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151407	Correction to test applicability in test cases 9.6.1.2_A.3	CR	CGC Inc.	36.521-1 12.5.0 CR#1934 catF		Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151408	Correction to feICIC Radio link monitoring test cases	CR	QUALCOMM UK Ltd	36.521-3 12.5.0 CR#1154 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151409	Project Plan and Example Results for Data Analytics Approach to Test Optimisation	other revised to R5-151978	Spirent Communications				R5-67 AI: 4.5.5	revised	[WTS] [JSN]
R5-151410	Addition of new Signalling test cases for 2DL CA and 3DL CA	other revised to R5-151730	QUALCOMM Incorporated				R5-67 AI: 6.4.6	revised	[WTS] [JSN]
R5-151411	Introduction of New TC 8.2.4.24.1 - CA / RRC connection reconfiguration / SCell Addition / Success /RRC Processing Delay/Intra-Band Contiguous CA	CR	QUALCOMM Incorporated	36.523-1 12.5.0 CR#2952 catF	TEI11_Test	Rel-11	R5-67 AI: 6.4.3.3.2	available	[WTS] [JSN]
R5-151412	Add Applicability for New TC 8.2.4.24.1 - CA / RRC connection reconfiguration / SCell Addition / Success /RRC Processing Delay/Intra-Band Contiguous CA	CR	QUALCOMM Incorporated	36.523-2 12.5.0 CR#733 catF	TEI11_Test	Rel-11	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151413	Update of DL-SCH transport block size selection test case 7.1.7.1.1 for UE Cat 0	CR	Ericsson	36.523-1 12.5.0 CR#2953 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.7.2	available	[WTS] [JSN]
R5-151414	Update of DL-SCH transport block size selection test case 7.1.7.1.2 for UE Cat 0	CR	Ericsson	36.523-1 12.5.0 CR#2954 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.7.2	available	[WTS] [JSN]
R5-151415	Update of DL-SCH transport block size selection test case 7.1.7.1.3 for UE Cat 0	CR	Ericsson	36.523-1 12.5.0 CR#2955 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.7.2	available	[WTS] [JSN]
R5-151416	Update of DL-SCH transport block size selection test case 7.1.7.1.4 for UE Cat 0	CR	Ericsson	36.523-1 12.5.0 CR#2956 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.7.2	available	[WTS] [JSN]
R5-151417	Update of UL-SCH transport block size selection test case 7.1.7.2.1 for UE Cat 0	CR	Ericsson	36.523-1 12.5.0 CR#2957 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.7.2	available	[WTS] [JSN]
R5-151418	Introduction of TC 7.6.1A.5 In-band blocking for CA (3DL CA without UL CA)	CR	MICROSOFT EUROPE SARL	36.521-1 12.5.0 CR#1935 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151419	Introduction of TC 7.6.2A.5 Out-of-band blocking for CA (3DL CA without UL CA)	CR	MICROSOFT EUROPE SARL	36.521-1 12.5.0 CR#1936 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151420	Introduction of TC 7.6.3A.5 Narrow-band blocking for CA (3DL CA without UL CA)	CR	MICROSOFT EUROPE SARL	02.36 12.5.0 CR#1 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151421	Introduction of TC 7.7A.5 Spurious response for CA (3DL CA without UL CA)	CR	MICROSOFT EUROPE SARL	36.521-1 12.5.0 CR#1937 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151422	Introduction of test case 7.8.1A.5 Wideband intermodulation for CA (3DL CA without UL CA)	CR	Ericsson	36.521-1 12.5.0 CR#1938 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151423	Change of default Network Signalling Value for Uplink Carrier aggregation test cases	CR	Ericsson	36.508 12.5.0 CR#595 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.1	available	[WTS] [JSN]
R5-151424	NS value for intra-band contiguous CA configurations not allowed A-MPR	CR	Ericsson	36.521-1 12.5.0 CR#1939 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151425	Addition of Band 32 in Receiver test cases	CR	Ericsson	36.521-1 12.5.0 CR#1940 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 5.3.7.5	available	[WTS] [JSN]
R5-151426	Addition of Band XXXII in Receiver test cases	CR	Ericsson	34.121-1 11.6.0 CR#1602 catF	LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 5.3.7.2	available	[WTS] [JSN]
R5-151427	Addition of UE category 0 ICS and test cases	CR	Ericsson	36.521-2 12.5.0 CR#260 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 5.3.8.3	available	[WTS] [JSN]
R5-151428	Addition of test case 6.2.2E - UE Maximum Output Power for UE category 0	CR	Ericsson	36.521-1 12.5.0 CR#1941 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 5.3.8.2	available	[WTS] [JSN]
R5-151429	Addition of test case 7.3E - Reference sensitivity level for UE category 0	CR	Ericsson	36.521-1 12.5.0 CR#1942 catF		Rel-12	R5-67 AI: 5.3.8.2	available	[WTS] [JSN]
R5-151430	Introduction of UE category 0 in section 4 of 36.521-1	CR	Ericsson	36.521-1 12.5.0 CR#1943 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 5.3.8.2	available	[WTS] [JSN]
R5-151431	Introduction of test case Maximum Power Reduction (MPR) for CA (inter-band DL CA and UL CA)	CR	Ericsson	36.521-1 12.5.0 CR#1944 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151432	Introduction of test case Maximum Power Reduction (MPR) for CA (intra-band non-contiguous DL CA and UL CA)	CR	Ericsson	36.521-1 12.5.0 CR#1945 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151433	Correction to Rx spurious emissions test case	CR	Ericsson	34.121-1 11.6.0 CR#1603 catF	TEI_Test	Rel-12	R5-67 AI: 5.5.2	available	[WTS] [JSN]
R5-151434	Correction to Tx spurious emissions test cases	CR	Ericsson	34.121-1 11.6.0 CR#1604 catF	TEI_Test	Rel-12	R5-67 AI: 5.5.2	available	[WTS] [JSN]
R5-151435	Status on proposals for RF/RRM test optimisation (requested by GCF)	other revised to R5-151979	Ericsson			Rel-12	R5-67 AI: 7.1.1	revised	[WTS] [JSN]
R5-151436	Discussion on test time reduction for LTE CA Out-of-band Blocking test case	other	Ericsson			Rel-12	R5-67 AI: 5.4.1.2.2	withdrawn	[WTS] [JSN]
R5-151437	Add new test case for MO speech / EVS	CR	Ericsson	34.229-1 12.5.0 CR#668 catF	EVS_codec-UEConTest	Rel-12	R5-67 AI: 6.3.9.1	available	[WTS] [JSN]
R5-151438	Add generic procedure for IMS MO speech for EVS	CR	Ericsson	36.508 12.5.0 CR#596 catF	EVS_codec-UEConTest	Rel-12	R5-67 AI: 6.3.9.4	available	[WTS] [JSN]
R5-151439	Add test case 8.4.8.1 for WLAN Offload	CR	Ericsson	36.523-1 12.5.0 CR#2958 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-67 AI: 6.3.4.6	available	[WTS] [JSN]
R5-151440	Add applicability for new WLAN test case 8.4.8.1	CR	Ericsson	36.523-2 12.5.0 CR#734 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-67 AI: 6.3.4.7	available	[WTS] [JSN]
R5-151441	Editorial correction in generic procedure C.21	CR	Ericsson	34.229-1 12.5.0 CR#669 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151442	Addition of CA_1A-41A and CA_26A-41A in 36.508	CR	KDDI Corporation	36.508 12.5.0 CR#597 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 6.3.2.1	available	[WTS] [JSN]
R5-151443	Update two band and three band information in test case 7.3	CR	CGC Inc.	36.521-1 12.5.0 CR#1946 catF		Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151444	Introduction of Reference system configuration for UTRA-WLAN interworking	CR	Motorola Mobility	34.108 11.13.0 CR#979 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-11	R5-67 AI: 6.3.4.1	available	[WTS] [JSN]
R5-151445	Corrections to SS test case 15.9.1	CR	CATR	34.123-1 11.6.0 CR#3742 catF	TEI8_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151446	Corrections to preamble steps for UTRA-WLAN interworking	CR	Motorola Mobility	34.108 11.13.0 CR#980 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-11	R5-67 AI: 6.3.4.1	available	[WTS] [JSN]
R5-151447	Corrections to SS test case 15.9.3	CR	CATR	34.123-1 11.6.0 CR#3743 catF	TEI8_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151448	Adding contents Dedicated WLAN offload information in UTRAN Mobility Information	CR	Motorola Mobility	34.108 11.13.0 CR#981 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-11	R5-67 AI: 6.3.4.1	available	[WTS] [JSN]
R5-151449	Corrections to SS test case 15.9.4	CR	CATR	34.123-1 11.6.0 CR#3744 catF	TEI8_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151450	Corrections to SS test case 15.9.5	CR	CATR	34.123-1 11.6.0 CR#3745 catF	TEI8_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151451	Introduction of Reference to 3GPP TS 36.508	CR	Motorola Mobility	34.123-1 11.6.0 CR#3746 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-11	R5-67 AI: 6.3.4.2	available	[WTS] [JSN]
R5-151452	Introduction of generic test procedure for offload to/from WLAN	CR	Motorola Mobility	34.123-1 11.6.0 CR#3747 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-11	R5-67 AI: 6.3.4.2	available	[WTS] [JSN]
R5-151453	Introduction of EUTRA-WLAN interworking test environment parameters and message contents	CR	Motorola Mobility	36.508 12.5.0 CR#598 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-67 AI: 6.3.4.5	available	[WTS] [JSN]
R5-151454	Introduction of generic procedures for EUTRA-WLAN interworking	CR	Motorola Mobility	36.508 12.5.0 CR#599 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-67 AI: 6.3.4.5	available	[WTS] [JSN]
R5-151455	Addition of CA capability, applicability changes and core spec updates to Section 8 36.521-1 TDD TM1 CA test cases	CR	QUALCOMM UK Ltd	36.521-1 12.5.0 CR#1947 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151456	Addition of CA capability, applicability changes and core spec updates to Section 8 36.521-1 TDD TM3 CA test cases	CR	QUALCOMM UK Ltd	36.521-1 12.5.0 CR#1948 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151457	Addition of CA capability, applicability changes and core spec updates to Section 8 36.521-1 TDD TM4 CA test cases	CR	QUALCOMM UK Ltd	36.521-1 12.5.0 CR#1949 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151458	Introduction of TDD FDD CA with TDD as Pcell for PDSCH Single Antenna Port Performance	CR	QUALCOMM UK Ltd	36.521-1 12.5.0 CR#1950 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151459	Introduction of TDD FDD CA with FDD as Pcell for PDSCH Single Antenna Port Performance	CR	QUALCOMM UK Ltd	36.521-1 12.5.0 CR#1951 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151460	Updates to 36.521-1 Annnex F and G	CR	QUALCOMM UK Ltd	36.521-1 12.5.0 CR#1952 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151461	Updates to 36.521-2 regarding merging of TDD CA test cases	CR	QUALCOMM UK Ltd	36.521-2 12.5.0 CR#261 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151462	[PTCO] Introduction of new PIXIT for optional execution of implicit R99 RAB test cases	CR	Motorola Mobility, Ericsson, Samsung & AT&T	34.123-3 11.6.0 CR#3330 catF	TEI_Test	Rel-11	R5-67 AI: 6.6.4.3	available	[WTS] [JSN]
R5-151463	Addition of applicability of TD-LTE to UTRA TDD periodic measurements	CR	QUALCOMM UK Ltd	36.521-2 12.5.0 CR#262 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151464	Correction to applicability of TD-LTE to UTRA TDD periodic measurements	CR	QUALCOMM UK Ltd	36.521-3 12.5.0 CR#1155 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151465	Addition of applicability for newly added TC “SRVCC Emergency Call Handover to GERAN”	CR	China Mobile Com. Corporation	36.523-2 12.5.0 CR#735 catF		Rel-9	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151466	Addition of applicability for newly added TC “cell reselection / MFBI/UE does not support multiBandInfoList”	CR	China Mobile Com. Corporation	36.523-2 12.5.0 CR#736 catF		Rel-9	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151467	Correction to Rel-8 SS testcases 15.10.1, 15.10.2, 15.10.3, 15.10.4	CR	ROHDE & SCHWARZ	34.123-1 11.6.0 CR#3748 catF	TEI8_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151468	Correction to Rel-9 CSG testcase 6.3.4.1	CR	ROHDE & SCHWARZ	34.123-1 11.6.0 CR#3749 catF	TEI9_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151469	Correction to Rel-9 CSG testcase 6.3.1.4	CR	ROHDE & SCHWARZ	34.123-1 11.6.0 CR#3750 catF	TEI9_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151470	Correction to Rel-7 NISPC testcases 11.1.5.1, 11.1.5.2, 11.2.1a, 11.2.1b, 11.3.2a and 11.9.1	CR	ROHDE & SCHWARZ, MediaTek	34.123-1 11.6.0 CR#3751 catF	TEI7_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151471	Correction to LTE-GERAN SRVCC test case 13.4.3.41	CR	ROHDE & SCHWARZ	36.523-1 12.5.0 CR#2959 catF	TEI9_Test	Rel-12	R5-67 AI: 6.4.3.8	available	[WTS] [JSN]
R5-151472	Correction to EMM test case 9.2.2.1.3	CR	Rohde & Schwarz, Anite, Nvidia	36.523-1 12.5.0 CR#2960 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151473	Correction to test cases 8.6.7.1, 8.6.7.2 and 8.6.7.3	CR	TTA, KTL	36.523-1 12.5.0 CR#2961 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-151474	Correction to Measurements for self optimized networks test case 8.3.3.x	CR	TTA	36.523-1 12.5.0 CR#2962 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-151475	Correction to test case 8.3.4.1	CR	TTA, KTL	36.523-1 12.5.0 CR#2963 catF	TEI9_Test	Rel-12	R5-67 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-151476	Addition of exception of RRC Connection Setup(UTRA)	CR	Anritsu	36.508 12.5.0 CR#600 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.1	available	[WTS] [JSN]
R5-151477	Correction to 9.3.1.3.1_E.1 FDD CQI Reporting test	CR	Anritsu	36.521-1 12.5.0 CR#1953 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151478	Correction to Event Triggered Reporting test in feICIC	CR	Anritsu	36.521-3 12.5.0 CR#1156 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151479	Clarification of 2DL CA RRM inter-frequency tests with smaller channels bandwidth	CR	Anritsu	36.521-3 12.5.0 CR#1157 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151480	Corrections for use of EFloci field in USIM configurations for Idle Mode test cases	CR	Anite, MCC TF160	36.523-1 12.5.0 CR#2964 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.1	available	[WTS] [JSN]
R5-151481	Addition of Carrier Aggregation band combination 2 to 13	CR	Anritsu Ltd., Qualcomm Inc	36.508 12.5.0 CR#601 catF		Rel-12	R5-67 AI: 6.4.1	available	[WTS] [JSN]
R5-151482	[PTCO] More details to Risk Analysis on Test Optimisation	other revised to R5-152115	Telecom Italia, Orange, CMCC, Spirent Communications				R5-67 AI: 7.1.5	revised	[WTS] [JSN]
R5-151483	Correction to Annex C.24 Generic test procedure for SRVCC media removal	CR	Anite	34.229-1 12.5.0 CR#670 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151484	Corrections to the applicability of DC-HSDPA test cases	CR	ROHDE & SCHWARZ	34.123-2 11.6.0 CR#737 catF	TEI8_Test	Rel-11	R5-67 AI: 6.6.4.2	available	[WTS] [JSN]
R5-151485	Update of eICIC meas pattern for PCell, TC 8.2.5	CR	Ericsson	36.521-3 12.5.0 CR#1158 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151486	Update of SNR definition in clause 8.1.1	CR	Ericsson	36.521-1 12.5.0 CR#1954 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 5.3.8.2	available	[WTS] [JSN]
R5-151487	Introduction of new test case 8.9.1.1.1 MTC	CR	Ericsson	36.521-1 12.5.0 CR#1955 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 5.3.8.2	available	[WTS] [JSN]
R5-151488	[PTCO] Removal of TC 9.2.1.1.25 due to scope of testing not covering a realistic user case	CR	Samsung	36.523-1 12.5.0 CR#2965 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151489	[PTCO] Removal of TC 9.2.1.1.21 due to scope of testing being covered by TC 9.2.1.1.22	CR	Samsung	36.523-1 12.5.0 CR#2966 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151490	[PTCO] Removal of redundant TCs from the Applicability table	CR	Samsung	36.523-1 12.5.0 CR#2967 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.4	withdrawn	[WTS] [JSN]
R5-151491	[PTCO] Protocol TCs Optimisation - Implicit and Failure Testing	other	Samsung, Motorola Mobility				R5-67 AI: 4.5.5	noted	[WTS] [JSN]
R5-151492	Update of TC 9.2.1.1.1a	CR	Samsung	36.523-1 12.5.0 CR#2968 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151493	Update of Section 9's text for call to generic procedure 6.4.2.5 of 36.508 to reflect what the generic procedure does	CR	Samsung	36.523-1 12.5.0 CR#2969 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151494	Update of TC 8.1.2.11	CR	Samsung	36.523-1 12.5.0 CR#2970 catF	TEI9_Test	Rel-12	R5-67 AI: 6.4.3.3.1	available	[WTS] [JSN]
R5-151495	Update of PRD13 Protocol TCs scope and TCs numbers sections	other revised to R5-151718	Samsung				R5-67 AI: 4.3	revised	[WTS] [JSN]
R5-151496	Change of applicablility for eMBMS-SC TCs 17.4.x	CR	Anritsu Ltd, Verizon	36.523-2 12.5.0 CR#737 catF		Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151497	Editorial changes to 9.1.3.3	CR	Anritsu Ltd	36.523-1 12.5.0 CR#2971 catF		Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151498	Editorial changes to WI-086 EUTRA<>UTRAN SRVCC Testcase 13.4.3.2	CR	Anritsu Ltd	36.523-1 12.5.0 CR#2972 catF		Rel-12	R5-67 AI: 6.4.3.8	available	[WTS] [JSN]
R5-151499	Correction to WI-82 EUTRA EMM Testcases for IMS capable UE	CR	Anritsu Ltd, Qualcomm Incorporated.	36.523-1 12.5.0 CR#2973 catF		Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151500	Updated WID: UE Conformance Test Aspects - L-band for Supplemental Downlink in E-UTRA and UTRA	WID new	Ericsson		LTE_UTRA_SDL_BandL-UEConTest	Rel-12	R5-67 AI: 7.3	agreed	[WTS] [JSN]
R5-151501	Correction to A.2.10 MO REFER Message	CR	Anritsu Ltd, Qualcomm Incorporated.	34.229-1 12.5.0 CR#671 catF		Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151502	Correction to Annex Procedure C.25	CR	Anritsu Ltd, Qualcomm Incorporated.	34.229-1 12.5.0 CR#672 catF		Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151503	Change of applicablility for Testcase 8.3	CR	Anritsu Ltd	34.229-2 12.4.0 CR#144 catF		Rel-12	R5-67 AI: 6.6.6.2	available	[WTS] [JSN]
R5-151504	Correction to eMBMS-SC-CA test case 17.4.10.1	CR	Samsung, Anritsu Ltd,Anite	36.523-1 12.5.0 CR#2974 catF		Rel-12	R5-67 AI: 6.4.3.11	available	[WTS] [JSN]
R5-151505	Correction to eMBMS-SC-CA test case 17.4.11.1	CR	Samsung, Anritsu Ltd	36.523-1 12.5.0 CR#2975 catF		Rel-12	R5-67 AI: 6.4.3.11	available	[WTS] [JSN]
R5-151506	Correction to Annex Procedure C.28	CR	Anritsu Ltd	34.229-1 12.5.0 CR#673 catF		Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151507	Introduction to test case 9.6.1.1_A.2: FDD CQI Reporting under AWGN conditions – PUCCH 1-0 (3DL CA)	CR	BlackBerry UK Limited	36.521-1 12.5.0 CR#1956 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151508	Introduction to test case 9.6.1.2_A.2: TDD CQI Reporting under AWGN conditions – PUCCH 1-0 (3DL CA)	CR	BlackBerry UK Limited	36.521-1 12.5.0 CR#1957 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151509	Introduction of applicability for test cases 9.6.1.1-A.2 and 9.6.1.2-A.2: FDD/TDD CQI Reporting under AWGN conditions – PUCCH 1-0 (3DL CA)	CR	BlackBerry UK Limited	36.521-2 12.5.0 CR#263 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.3	available	[WTS] [JSN]
R5-151510	Introduction to test case 6.3.3A.3: UE Transmit OFF power for CA (intra-band non-contiguous DL CA and UL CA)	CR	BlackBerry UK Limited	36.521-1 12.5.0 CR#1958 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151511	Introduction to test case 6.3.4A.1.3: General ON/OFF time mask for CA (intra-band non-contiguous DL CA and UL CA)	CR	BlackBerry UK Limited	36.521-1 12.5.0 CR#1959 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151512	Introduction to test case 6.6.1A.3: UE Occupied bandwidth for CA (intra-band non-contiguous DL CA and UL CA)	CR	BlackBerry UK Limited	36.521-1 12.5.0 CR#1960 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151513	Introduction to test case 6.6.2.1A.3: Spectrum Emission Mask for CA (intra-band non-contiguous DL CA and UL CA)	CR	BlackBerry UK Limited	36.521-1 12.5.0 CR#1961 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.2	available	[WTS] [JSN]
R5-151514	Introduction to applicability for 2UL CA RF test cases (Tx and Rx)	CR	BlackBerry UK Limited	36.521-2 12.5.0 CR#264 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.3	available	[WTS] [JSN]
R5-151515	Correction to test case 6.3.3A.1: UE Transmit OFF power for CA (intra-band contiguous DL CA and UL CA)	CR	BlackBerry UK Limited, Anritsu	36.521-1 12.5.0 CR#1962 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151516	Update to test case 19.3.1 for location information	CR	BlackBerry UK Limited	34.229-1 12.5.0 CR#674 catF	TEI9_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151517	Update to test cases 19.1.1, 19.1.2, 19.3.3, 19.3.4, 19.4.1, 19.5.13.1 and Annex A.2.1 for location information	CR	BlackBerry UK Limited	34.229-1 12.5.0 CR#675 catF	TEI9_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151518	Correction to test case applicability 19.1.1 and 19.3.1 for location information	CR	BlackBerry UK Limited	34.229-2 12.4.0 CR#145 catF	TEI9_Test	Rel-12	R5-67 AI: 6.6.6.2	available	[WTS] [JSN]
R5-151519	Correction to test case 19.1.3	CR	BlackBerry UK Limited	34.229-1 12.5.0 CR#676 catF	TEI9_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151520	Correction to test case 19.3.2	CR	BlackBerry UK Limited	34.229-1 12.5.0 CR#677 catF	TEI9_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151521	Correction to test case 19.3.2b	CR	BlackBerry UK Limited	34.229-1 12.5.0 CR#678 catF	TEI9_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151522	Correction to test case 19.3.2c	CR	BlackBerry UK Limited	34.229-1 12.5.0 CR#679 catF	TEI9_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151523	Correction to test cases 8.1, 8.10 and 8.11	CR	BlackBerry UK Limited, Rohde&Schwarz	34.229-1 12.5.0 CR#680 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151524	Work Item codes on CR coversheets for ‘frozen’/‘closed’ WIs	other revised to R5-152126	BlackBerry UK Limited, Anite				R5-67 AI: 7.1	revised	[WTS] [JSN]
R5-151525	TS 36.523-1 Status before RAN5#67	report	Rapporteur (BlackBerry)				R5-67 AI: 6.4.6	noted	[WTS] [JSN]
R5-151526	TS 36.523-1 Status after RAN5#67	report	Rapporteur (BlackBerry)				R5-67 AI: 6.4.6	noted	[WTS] [JSN]
R5-151527	Correction to TS 36.523-1 Rel-8 pointer	CR	Rapporteur (BlackBerry)	36.523-1 8.6.0 CR#2976 catF	TEI8_Test	Rel-8	R5-67 AI: 6.4.3.11	available	[WTS] [JSN]
R5-151528	Text proposal for TS 37.544 v0.3.0 Annex G	pCR	Intel Corporation (UK) Ltd	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151529	Text proposal for TS 37.544 v0.3.0 Annex K	pCR revised to R5-151907	Intel Corporation (UK) Ltd	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-67 AI: 5.3.2.1	revised	[WTS] [JSN]
R5-151530	Proposed updated to TS 37.544 v0.3.0 Subclauses 6.3 and 7.3	pCR	Intel Corporation (UK) Ltd	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151531	Correction to TS 37.544 v0.3.0 Test Titles 6.1.7 and 6.1.8	pCR	Intel Corporation (UK) Ltd	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151532	Addition of new TC 7.1.4.24 Correct HARQ process handling / TTI bundling without resource allocation restriction	CR	China Telecom	36.523-1 12.5.0 CR#2977 catF	Cov_Enh_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.3.2	available	[WTS] [JSN]
R5-151533	Addition and correction of applicability for TDD sustained data rate performance	CR revision of R5-151249	SGS Wireless, KTL, TTA	36.521-2 12.5.0 CR#2501 catF	TEI9_Test	Rel-12	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151534	Correction of applicability for TDD sustained data rate performance	CR revision of R5-151348	SGS Wireless, KTL, TTA	36.521-2 12.5.0 CR#2581 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151535	Update Test Tolerance analysis for TCs 8.11.1+8.11.2 for frequencies above 3GHz 36.903 CR	CR	Huawei, Anritsu	36.903 12.5.0 CR#195 catF		Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151536	Update Uncerts and Test Tols for TCs 8.11.1+8.11.2 for frequencies above 3GHz 36.521-3 CR	CR	Huawei, Anritsu	36.521-3 12.5.0 CR#1159 catF		Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151537	Update Test Tolerance analysis for TC 8.11.3 for frequencies above 3GHz 36.903 CR	CR	Huawei, Anritsu	36.903 12.5.0 CR#196 catF		Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151538	Update Uncerts and Test Tols for TC 8.11.3 for frequencies above 3GHz 36.521-3 CR	CR	Huawei, Anritsu	36.521-3 12.5.0 CR#1160 catF		Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151539	Update Test Tolerance analysis for TC 8.11.4 for frequencies above 3GHz 36.903 CR	CR	Huawei, Anritsu	36.903 12.5.0 CR#197 catF		Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151540	Update Uncerts and Test Tols for TC 8.11.4 for frequencies above 3GHz 36.521-3 CR	CR	Huawei, Anritsu	36.521-3 12.5.0 CR#1161 catF		Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151541	Add Test Tolerance analysis for TC 8.16.21 36.903 CR	CR	Huawei, Anritsu	36.903 12.5.0 CR#198 catF		Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151542	Uncerts and Test Tols for TC 8.16.21 36.521-3 CR	CR	Huawei, Anritsu	36.521-3 12.5.0 CR#1162 catF		Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151543	Add Test Tolerance analysis for TC 8.16.22 36.903 CR	CR	Huawei, Anritsu	36.903 12.5.0 CR#199 catF		Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151544	Uncerts and Test Tols for TC 8.16.22 36.521-3 CR	CR	Huawei, Anritsu	36.521-3 12.5.0 CR#1163 catF		Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151545	Add Test Tolerance analysis for TCs 9.1.24.1 36.903 CR	CR	Huawei, Anritsu	36.903 12.5.0 CR#200 catF		Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151546	Uncerts and Test Tols for TCs 9.1.24.1 36.521-3 CR	CR	Huawei, Anritsu	36.521-3 12.5.0 CR#1164 catF		Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151547	Add Test Tolerance analysis for TCs 9.1.24.1_1 36.903 CR	CR	Huawei, Anritsu	36.903 12.5.0 CR#201 catF		Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151548	Uncerts and Test Tols for TCs 9.1.24.1_1 36.521-3 CR	CR	Huawei, Anritsu	36.521-3 12.5.0 CR#1165 catF		Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151549	Add Test Tolerance analysis for TC 9.1.24.2 36.903 CR	CR	Huawei, Anritsu	36.903 12.5.0 CR#202 catF		Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151550	Uncerts and Test Tols for TC 9.1.24.2 36.521-3 CR	CR	Huawei, Anritsu	36.521-3 12.5.0 CR#1166 catF		Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151551	Add Test Tolerance analysis for TC 9.2.27.1 36.903 CR	CR	Huawei, Anritsu	36.903 12.5.0 CR#203 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151552	Uncerts and Test Tols for TC 9.2.27.1 36.521-3 CR	CR	Huawei, Anritsu	36.521-3 12.5.0 CR#1167 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151553	Add Test Tolerance analysis for TC 9.2.27.2 36.903 CR	CR	Huawei, Anritsu	36.903 12.5.0 CR#204 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.5.2	available	[WTS] [JSN]
R5-151554	Uncerts and Test Tols for TC 9.2.27.2 36.521-3 CR	CR	Huawei, Anritsu	36.521-3 12.5.0 CR#1168 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.5.1	available	[WTS] [JSN]
R5-151555	Addition of new RRM TC 8.16.23 E-UTRAN TDD-FDD CA Event Triggered Reporting Under Deactivated SCell in Non-DRX with PCell in FDD	CR	Huawei	36.521-3 12.5.0 CR#1169 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.4	available	[WTS] [JSN]
R5-151556	Addition of new RRM TC 8.16.24 E-UTRAN TDD-FDD CA Event Triggered Reporting Under Deactivated SCell in Non-DRX with PCell in TDD	CR	Huawei	36.521-3 12.5.0 CR#1170 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.4	available	[WTS] [JSN]
R5-151557	Addition of new RRM TC 8.16.25 E-UTRAN TDD-FDD CA Event Triggered Reporting on Deactivated SCell with PCell interruption in Non-DRX with PCell in FDD	CR	Huawei	36.521-3 12.5.0 CR#1171 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.4	available	[WTS] [JSN]
R5-151558	Addition of new RRM TC 8.16.26 E-UTRAN TDD-FDD CA Event Triggered Reporting on Deactivated SCell with PCell interruption in Non-DRX with PCell in TDD	CR	Huawei	36.521-3 12.5.0 CR#1172 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.4	available	[WTS] [JSN]
R5-151559	Applicability for newly added TDD-FDD CA RRM test cases	CR	Huawei	36.521-3 12.5.0 CR#1173 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.3	available	[WTS] [JSN]
R5-151560	Correction to the titles of 2UL CA RRM test cases	CR	Huawei	36.521-3 12.5.0 CR#1174 catF	LTE_CA_Rel12_2UL-UEConTest	Rel-12	R5-67 AI: 5.3.9.4	available	[WTS] [JSN]
R5-151561	Update to TX test case 6.6.3.3 Additional spurious emissions	CR	Huawei	36.521-1 12.5.0 CR#1963 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.1	available	[WTS] [JSN]
R5-151562	Protocol Test case list for TDD-FDD CA	other revised to R5-152100	Huawei			Rel-12	R5-67 AI: 6.3.2.5	revised	[WTS] [JSN]
R5-151563	Addition of new TC 7.1.2.11.3 CA / Maintenance of uplink time alignment / Multiple TA / TDD-FDD CA	CR	Huawei	36.523-1 12.5.0 CR#2978 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 6.3.2.2	available	[WTS] [JSN]
R5-151564	Addition of new test case of FDD-TDD CA / Correct HARQ process handling / Dynamic case / FDD PCell and TDD Scell	CR	Huawei	36.523-1 12.5.0 CR#2979 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 6.3.2.2	available	[WTS] [JSN]
R5-151565	Addition of new test case of FDD-TDD CA / Correct HARQ process handling / Dynamic case / TDD PCell and FDD Scell	CR	Huawei	36.523-1 12.5.0 CR#2980 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 6.3.2.2	available	[WTS] [JSN]
R5-151566	Addition of new test case of FDD-TDD CA / Correct HARQ process handling / PUSCH / FDD PCell and TDD Scell	CR	Huawei	36.523-1 12.5.0 CR#2981 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 6.3.2.2	available	[WTS] [JSN]
R5-151567	Addition of new test case of FDD-TDD CA / Correct HARQ process handling / PUSCH / TDD PCell and FDD Scell	CR	HUAWEI TECHNOLOGIES Co. Ltd.	36.523-1 12.5.0 CR#2982 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 6.3.2.2	available	[WTS] [JSN]
R5-151568	New Work Item Proposal: UE Conformance Test Aspects – Small cell enhancements - Physical layer aspects	WID new revised to R5-151716	Huawei				R5-67 AI: 4.1	revised	[WTS] [JSN]
R5-151569	Correction to the number of HARQ processes of CSI reference measurement channels	CR	LG Electronics Inc.	36.521-1 12.5.0 CR#1964 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151570	Addition of CA capability and applicability for 3 DL CCs in Chapter 8	CR	LG Electronics Inc.	36.521-1 12.5.0 CR#1965 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151571	Removal of the correlation matrix of HST propagation conditions	CR	LG Electronics Inc.	36.521-1 12.5.0 CR#1966 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151572	Introduction of TC TDD PDSCH Closed Loop Multi Layer Spatial Multiplexing 4X2 for CA (3DL CA)	CR	LG Electronics Inc.	36.521-1 12.5.0 CR#1967 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151573	Introduction of TC TDD PDSCH Open Loop Spatial Multiplexing 2X2 for CA (3DL CA)	CR	LG Electronics Inc.	36.521-1 12.5.0 CR#1968 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151574	Correction to remark of message content of TC 6.2.3.34	CR	LG Electronics Inc.	36.523-1 12.5.0 CR#2983 catF	TEI9_Test	Rel-12	R5-67 AI: 6.4.3.1	available	[WTS] [JSN]
R5-151575	Addition of a new TC for SCM, 8.1.2.16 MTSI MO video call / SCM / 0% access probability skip for MTSI MO video call	CR	LG Electronics Inc.	36.523-1 12.5.0 CR#2984 catF	SCM_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.10.1	available	[WTS] [JSN]
R5-151576	Applicability of a new TC 8.1.2.16 (Smart Congestion Mitigation)	CR	LG Electronics Inc.	36.523-2 12.5.0 CR#738 catF	SCM_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.10.2	available	[WTS] [JSN]
R5-151577	Correction to eMDT test case 8.6.11.1 – RACH optimization	CR	LG Electronics Inc.	36.523-1 12.5.0 CR#2985 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-151578	New CA band combination CA_1A-41A and CA_26A-41A - Updates of 6.2.5.3 Delta TIB	CR	KDDI Corporation	36.521-1 12.5.0 CR#1969 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151579	New CA band combination CA_1A-41A and CA_26A-41A - Updates of 7.3.3 Delta RIB	CR	KDDI Corporation	36.521-1 12.5.0 CR#1970 catF		Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151580	New CA band combination CA_1A-41A and CA_26A-41A - Updates of 7.3A Refsens	CR	KDDI Corporation	36.521-1 12.5.0 CR#1971 catF		Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151581	New CA band combination CA_1A-41A and CA_26A-41A - Updates of Table A.4.6.3-3	CR	KDDI Corporation	36.521-2 12.5.0 CR#265 catF		Rel-12	R5-67 AI: 5.3.4.3	available	[WTS] [JSN]
R5-151582	Addition of test frequencies for CA_1A-18A-28A in 36 508	CR	KDDI Corporation	36.508 12.5.0 CR#602 catF		Rel-12	R5-67 AI: 5.3.4.1	available	[WTS] [JSN]
R5-151583	New CA band combination CA_1A-18A-28A - Updates of 7.3.3 Delta RIB and 7.3A Refsens	CR	KDDI Corporation	36.521-1 12.5.0 CR#1972 catF		Rel-12	R5-67 AI: 5.3.4.2	available	[WTS] [JSN]
R5-151584	New CA band combination CA_1A-18A-28A - Updates of Table A.4.6.3-3	CR	KDDI Corporation	36.521-2 12.5.0 CR#266 catF		Rel-12	R5-67 AI: 5.3.4.3	available	[WTS] [JSN]
R5-151585	Discussion for exceptions of 3DL test	other	KDDI Corporation			Rel-12	R5-67 AI: 5.3.4.	noted	[WTS] [JSN]
R5-151586	Correction to message contents for 8.4.1.2.3_E.2 FDD PCFICH/PDCCH Transmit Diversity 2x2 for feICIC (MBSFN ABS)	CR	LG Electronics Inc.	36.521-1 12.5.0 CR#1973 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151587	Editorial correction to 8.2.1.1.1_A.1 and 8.2.1.3.1_A.1	CR	LG Electronics Inc.	36.521-1 12.5.0 CR#1974 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151588	Removal of SIB1 transmission in 5.2A.5 Exceptions for feICIC tests	CR	LG Electronics Inc.	36.508 12.5.0 CR#603 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.1	available	[WTS] [JSN]
R5-151589	Addition of applicability for LTE Coverage Enhancements	CR	China Telecom	36.523-2 12.5.0 CR#739 catF	Cov_Enh_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.3.3	available	[WTS] [JSN]
R5-151590	Clarification of the test applicability for feICIC	CR	LG Electronics Inc.	36.521-1 12.5.0 CR#1975 catF	TEI12_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151591	36.521-1: CA Soft buffering corrections	CR	Keysight Technologies UK Ltd, Ericsson	36.521-1 12.5.0 CR#1976 catF	TEI10_Test	Rel-10	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151592	Correction to FeICIC measurement performance test cases and Annex H.3	CR	QUALCOMM UK Ltd	36.521-3 12.5.0 CR#1175 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151593	Addition of new SCM TC 13.5.1	CR	NTT DOCOMO INC.	36.523-1 12.5.0 CR#2986 catF	SCM_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.10.1	available	[WTS] [JSN]
R5-151594	Correction to SIMTC test case 9.2.3.1.8b	CR	Sporton	36.523-1 12.5.0 CR#2987 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151595	Correction to SIMTC test case 9.2.1.1.27a	CR	Sporton	36.523-1 12.5.0 CR#2988 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151596	Correction to SIMTC test case 8.1.1.7	CR	Sporton	36.523-1 12.5.0 CR#2989 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.3.3.1	available	[WTS] [JSN]
R5-151597	Correction to SIMTC test cases 10.5.1a and 10.5.1b	CR	Sporton	36.523-1 12.5.0 CR#2990 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.3.5	available	[WTS] [JSN]
R5-151598	Addition of new applicability for SCM TCs	CR	NTT DOCOMO INC.	36.523-2 12.5.0 CR#740 catF	SCM_LTE-UEConTest	Rel-12	R5-67 AI: 6.3.10.2	available	[WTS] [JSN]
R5-151599	Removal of Route header checking in REGISTER method	CR	NTT DOCOMO INC.	34.229-1 12.5.0 CR#681 catF	TEI10_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151600	Removal of precondition with call hold	CR	NTT DOCOMO INC.	34.229-1 12.5.0 CR#682 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151601	Revised WID: UE Conformance Test Aspects – Smart Congestion Mitigation in E-UTRA	WID new	NTT DOCOMO INC.		SCM_LTE-UEConTest	Rel-12	R5-67 AI: 7.3	agreed	[WTS] [JSN]
R5-151602	Update of 7.6.1A.1	CR	China Unicom	36.521-1 12.5.0 CR#1977 catF		Rel-11	R5-67 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-151603	Discussion paper on LTE ULCA Test Configuration for Devices with Multiple Tx Antenna Ports	other	QUALCOMM UK Ltd		TEI10_Test	Rel-12	R5-67 AI: 5.4.1.11	noted	[WTS] [JSN]
R5-151604	Updates to Annex C.40	CR	Ericsson	34.229-1 12.5.0 CR#683 catF	TEI12_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151605	New TC 11.2.12 LIMITED-SERVICE / Inter-system mobility / E-UTRA to GSM CS / SRVCC Emergency Call Handover to GERAN	CR	ZTE Corporation	36.523-1 12.5.0 CR#2991 catF		Rel-12	R5-67 AI: 6.4.3.6	available	[WTS] [JSN]
R5-151606	New test case 6.5.3 WLAN Offload / Cell Selection / EUTRA RRC_Idle to/from WLAN (Qqualmeas, BackhaulRateUlWLAN)	CR	Ericsson	36.523-1 12.5.0 CR#2992 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-67 AI: 6.3.4.6	available	[WTS] [JSN]
R5-151607	Updates to 13.4.3.36	CR	Ericsson	36.523-1 12.5.0 CR#2993 catF	TEI12_Test	Rel-12	R5-67 AI: 6.4.3.8	available	[WTS] [JSN]
R5-151608	Updates to 13.4.3.37	CR	Ericsson	36.523-1 12.5.0 CR#2994 catF	TEI12_Test	Rel-12	R5-67 AI: 6.4.3.8	available	[WTS] [JSN]
R5-151609	Updates to 13.4.3.38	CR	Ericsson	36.523-1 12.5.0 CR#2995 catF	TEI12_Test	Rel-12	R5-67 AI: 6.4.3.8	available	[WTS] [JSN]
R5-151610	Updates to references to annex C.39 for rSRVCC test cases	CR	Ericsson	36.523-1 12.5.0 CR#2996 catF	TEI12_Test	Rel-12	R5-67 AI: 6.4.3.8	available	[WTS] [JSN]
R5-151611	New test case “Correct HARQ process handling / TTI bundling with enhanced HARQ pattern”	CR	ZTE Corporation	36.523-1 12.5.0 CR#2997 catF		Rel-12	R5-67 AI: 6.3.3	reserved	[WTS] [JSN]
R5-151612	Correction to UTRA eMDT test case 8.6.5.1	CR	MCC TF160, ZTE	34.123-1 11.6.0 CR#3752 catF	TEI11_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151613	New test case “Correct HARQ process handling / TTI bundling with enhanced HARQ pattern”	CR	ZTE Corporation	36.523-1 12.5.0 CR#2998 catF		Rel-12	R5-67 AI: 6.3.3	available	[WTS] [JSN]
R5-151614	Updated applicability for 10.2.1	CR	Ericsson	36.523-2 12.5.0 CR#741 catF	TEI12_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151615	Add applicability for new WLAN test case 6.5.3	CR	Ericsson	36.523-2 12.5.0 CR#742 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-67 AI: 6.3.4.7	available	[WTS] [JSN]
R5-151616	Introduction of new test case 9.7.1.1 MTC	CR	Ericsson	36.521-1 12.5.0 CR#1978 catF	LC_MTC_LTE-UEConTest	Rel-12	R5-67 AI: 5.3.8.2	available	[WTS] [JSN]
R5-151617	Clarification of RRM UE Timing Advance test cases	CR	Keysight Technologies UK Ltd, China Telecom	36.521-3 12.5.0 CR#1176 catF	TEI8_Test	Rel-8	R5-67 AI: 5.4.1.4	available	[WTS] [JSN]
R5-151618	Update CA_3C in TC 7.6.1A.2	CR	China Unicom	36.101 12.5.0 CR#3010 catF		Rel-11	R5-67 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-151619	New test case “cell reselection / MFBI/UE does not support multiBandInfoList”	CR	ZTE Corporation	36.523-1 12.5.0 CR#2999 catF		Rel-12	R5-67 AI: 6.4.3.1	available	[WTS] [JSN]
R5-151620	[PTCO] Correction to applicability of R99 RAB test cases for test case optimisation: Changed TTI	CR	Motorola Mobility, Ericsson, Samsung, AT&T	34.123-2 11.6.0 CR#738 catF	TEI_Test	Rel-11	R5-67 AI: 6.6.4.2	withdrawn	[WTS] [JSN]
R5-151621	Updates to CoMP test cases 9.5.5.x	CR	QUALCOMM UK Ltd	36.521-1 12.5.0 CR#1979 catF	TEI11_Test	Rel-12	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151622	Additional test coverage for PUSCH frequency hopping and AMPR	other	Ericsson				R5-67 AI: 5.4.1.2.1	noted	[WTS] [JSN]
R5-151623	Test tolerance update to TC 921M	CR	QUALCOMM UK Ltd	34.121-1 11.6.0 CR#1605 catF	TEI11_Test	Rel-11	R5-67 AI: 5.4.1.6	available	[WTS] [JSN]
R5-151624	Test tolerance update to TC 921M	CR	QUALCOMM UK Ltd	34.121-1 11.6.0 CR#1606 catF		Rel-11	R5-67 AI: 5.4.1.6	withdrawn	[WTS] [JSN]
R5-151625	Correction and alignment of test cases 15.21 and 15.21b	CR	MCC TF160	34.229-1 12.5.0 CR#684 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151626	Correction to test frequencies for CA_18A-28A in 36.508	CR	Keysight Technologies UK Ltd, Sporton	36.508 12.5.0 CR#604 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.1	available	[WTS] [JSN]
R5-151627	Correction of test case 17.2	CR	MCC TF160	34.229-1 12.5.0 CR#685 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151628	Correction to Annex C.29 - Missing headers in HTTP Responses	CR	ROHDE & SCHWARZ	34.229-1 12.5.0 CR#686 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151629	Applicability correction to test case 13.4.3.41	CR	MICROSOFT EUROPE SARL	36.523-2 12.5.0 CR#743 catF	TEI9_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151630	New TC 20.1 Mobile Originating CAT – Forking Model	CR	Ericsson	34.229-1 12.5.0 CR#687 catF	TEI9_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151631	Applicability for new TC 20.1 Mobile Originating CAT – Forking Model	CR	Ericsson	34.229-2 12.5.0 CR#146 catF	TEI9_Test	Rel-12	R5-67 AI: 6.6.6.2	available	[WTS] [JSN]
R5-151632	New generic procedure 4.5A.15 Generic Test Procedure for IMS MO Customized Alerting Tones and speech establishment in E-UTRA	CR	Ericsson	36.508 12.5.0 CR#605 catF	TEI9_Test	Rel-12	R5-67 AI: 6.4.1	available	[WTS] [JSN]
R5-151633	Proposal for introducing test case for IMS Customized Alerting Tones	other revised to R5-151735	Ericsson				R5-67 AI: 6.2	revised	[WTS] [JSN]
R5-151634	orrection to IMS Emergency Call test case 19.5.7	CR	ROHDE & SCHWARZ	34.229-1 12.5.0 CR#688 catF	TEI9_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151635	Correction to MDT test cases 8.6.4.4	CR	Anite, Qualcomm	36.523-1 12.5.0 CR#3000 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-151636	Corrections for bSRVCC test cases 13.4.3.22 and 13.4.3.23	CR	Anite, Samsung	36.523-1 12.5.0 CR#3001 catF	TEI12_Test	Rel-12	R5-67 AI: 6.4.3.8	available	[WTS] [JSN]
R5-151637	[PTCO] Removal of redundant TCs from the Applicability table	CR	Samsung	36.523-2 12.5.0 CR#744 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151638	Addition of Test Case - WLAN Offload / Cell Selection / EUTRA RRC_Idle to/from WLAN (Qrxlevmeas, BeaconRSSI) - 3GPP/WLAN Work Plan	CR	Intel Corporation (UK) Ltd	36.523-1 12.5.0 CR#3002 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-67 AI: 6.3.4.6	available	[WTS] [JSN]
R5-151639	Test points correction in test case 7.3A.2 for CA_23B in 36.521-1	CR	Keysight Technologies UK Ltd, Sporton	36.521-1 12.5.0 CR#1980 catF	TEI10_Test	Rel-10	R5-67 AI: 5.4.1.2.2	available	[WTS] [JSN]
R5-151640	Addition of Test Case - WLAN Offload / Offload Success / EUTRA RRC_Connected to/from WLAN (Qrxlevmeas , ChannelUtilizationWLAN) - 3GPP/WLAN Work Plan	CR	Intel Corporation (UK) Ltd	36.523-1 12.5.0 CR#3003 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-67 AI: 6.3.4.6	available	[WTS] [JSN]
R5-151641	Correction to GCF WI-159 Pre-registration at 1xRTT testcase 13.4.4.2	CR	Anritsu Ltd	36.523-1 12.5.0 CR#3004 catF		Rel-12	R5-67 AI: 6.4.3.8	available	[WTS] [JSN]
R5-151642	Addition of Generic Procedure for 3GPP/WLAN Offload	CR	Intel Corporation (UK) Ltd	36.508 12.5.0 CR#606 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-67 AI: 6.3.4.5	available	[WTS] [JSN]
R5-151643	Applicability of New 3GPP/WLAN Offload Test Cases	CR	Intel Corporation (UK) Ltd	36.523-2 12.5.0 CR#745 catF	UTRA_LTE_WLAN_interw-UEConTest	Rel-12	R5-67 AI: 6.3.4.7	available	[WTS] [JSN]
R5-151644	Correction to WI-82 EUTRA EMM Testcase 9.2.1.2.2 for IMS capable UE	CR	Anritsu Ltd, Qualcomm Incorporated.	36.523-1 12.5.0 CR#3005 catF		Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151645	Correction to WI-82 EUTRA EMM Testcase 9.3.1.12a for IMS capable UE	CR	Anritsu Ltd, Qualcomm Incorporated.	36.523-1 12.5.0 CR#3006 catF		Rel-12	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151646	36.521-1: DL Sustained Data Rate clarifications	CR	Keysight Technologies UK Ltd	36.521-1 12.5.0 CR#1981 catF	TEI9_Test	Rel-9	R5-67 AI: 5.4.1.2.3	available	[WTS] [JSN]
R5-151647	Discussion on MFBI Test Case	other	Intel Corporation (UK) Ltd			Rel-12	R5-67 AI: 6.4.6	withdrawn	[WTS] [JSN]
R5-151648	Update of WI-087 Inter-RAT Cell Reselection test case 6.2.3.17	CR	Anritsu Ltd., Qualcomm Incorporated	36.523-1 12.5.0 CR#3007 catF		Rel-12	R5-67 AI: 6.4.3.1	available	[WTS] [JSN]
R5-151649	Update of EMM Test Case 9.1.5.1	CR	Intel Corporation (UK) Ltd	36.523-1 12.5.0 CR#3008 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.5	available	[WTS] [JSN]
R5-151650	Update execution guidelines for CA test case 8.2.4.21.2	CR	Anite	36.523-2 12.5.0 CR#746 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.4	withdrawn	[WTS] [JSN]
R5-151651	Update execution guidelines for Rel-11 TDD SSC test cases	CR	Anite	36.523-2 12.5.0 CR#747 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.4	withdrawn	[WTS] [JSN]
R5-151652	Correction to test applicability in test cases 9.6.1.2_A.1 and 9.6.1.2_A.3	CR	CGC Inc.	36.521-2 12.5.0 CR#267 catF		Rel-10	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151653	Correction to Annex A.2.1	CR	ROHDE & SCHWARZ	34.229-1 12.5.0 CR#689 catF	TEI9_Test	Rel-9	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151654	Correction to Idle Mode test cases 6.1.1.1a and 6.1.1.4a	CR	ROHDE & SCHWARZ	36.523-1 12.5.0 CR#3009 catF	TEI8_Test	Rel-8	R5-67 AI: 6.4.3.1	available	[WTS] [JSN]
R5-151655	Correction to IMS Emergency Call test case 11.2.6	CR	ROHDE & SCHWARZ	36.523-1 12.5.0 CR#3010 catF	TEI9_Test	Rel-9	R5-67 AI: 6.4.3.6	available	[WTS] [JSN]
R5-151656	36.521-1: A-MPR test requirement alignment	CR	Keysight Technologies UK Ltd	36.521-1 12.5.0 CR#1982 catF	TEI8_Test	Rel-8	R5-67 AI: 5.4.1.2.1	reserved	[WTS] [JSN]
R5-151657	Addition of UE categories to A.4.3.2	CR	ROHDE & SCHWARZ, MCC-TF160	36.523-2 12.5.0 CR#748 catF	TEI8_Test	Rel-8	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151658	36.508: Test frequencies definition for CA_12B	CR	Keysight Technologies UK Ltd	36.508 12.5.0 CR#607 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 5.3.4.1	available	[WTS] [JSN]
R5-151659	Correction to Test Case 8.6.7.1	CR	Intel Corporation (UK) Ltd	36.523-1 12.5.0 CR#3011 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.3.3.5	available	[WTS] [JSN]
R5-151660	36.508: Signalling test frequencies definition for CA_12B	CR	Keysight Technologies UK Ltd	36.508 12.5.0 CR#608 catF	LTE_CA_Rel12_3DL-UEConTest	Rel-12	R5-67 AI: 6.3.2.1	available	[WTS] [JSN]
R5-151661	Correction to IMS Emergency Call test case 11.2.7	CR	ROHDE & SCHWARZ, MCC-TF160, Samsung, Qualcomm Incorporated	36.523-1 12.5.0 CR#3012 catF	TEI9_Test	Rel-9	R5-67 AI: 6.4.3.6	available	[WTS] [JSN]
R5-151662	Correction to Test Case 9.1.3.3	CR	Intel Corporation (UK) Ltd	36.523-1 12.5.0 CR#3013 catF	TEI10_Test	Rel-10	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151663	Correction to WI-103 EPS Testcase 10.4.2 for IMS capable UE	CR	Anritsu Ltd	36.523-1 12.5.0 CR#3014 catF		Rel-12	R5-67 AI: 6.4.3.5	available	[WTS] [JSN]
R5-151664	Correction to Test Case 9.2.1.2.4	CR	Intel Corporation (UK) Ltd	36.523-1 12.5.0 CR#3015 catF	TEI11_Test	Rel-11	R5-67 AI: 6.4.3.4	available	[WTS] [JSN]
R5-151665	Introduction of new test case 8.1.3 to 37.571-1	CR	Ericsson	37.571-1 12.2.0 CR#138 catF	TEI10_Test	Rel-12	R5-67 AI: 5.5.9	available	[WTS] [JSN]
R5-151666	Correction to IMS Emergency Call test case 19.4.2	CR	ROHDE & SCHWARZ, MCC-TF160	34.229-1 12.5.0 CR#690 catF	TEI9_Test	Rel-9	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151667	Introduction of new test case 8.1.4 to 37.571-1	CR	Ericsson	37.571-1 12.2.0 CR#139 catF	TEI10_Test	Rel-12	R5-67 AI: 5.5.9	available	[WTS] [JSN]
R5-151668	Correction to EUTRA MAC test case 7.1.3.13a	CR	ROHDE & SCHWARZ, Qualcomm Incorporated	36.523-1 12.5.0 CR#3016 catF	TEI11_Test	Rel-11	R5-67 AI: 6.4.3.2.1	available	[WTS] [JSN]
R5-151669	Correction to EUTRA RRC test case 8.5.4.1	CR	ROHDE & SCHWARZ, Qualcomm Incorporated	36.523-1 12.5.0 CR#3017 catF	TEI8_Test	Rel-8	R5-67 AI: 6.4.3.3.1	available	[WTS] [JSN]
R5-151670	Correction to IMS Emergency Call test case 11.2.5	CR	ROHDE & SCHWARZ, Qualcomm Incorporated	36.523-1 12.5.0 CR#3018 catF	TEI9_Test	Rel-9	R5-67 AI: 6.4.3.6	available	[WTS] [JSN]
R5-151671	Correction to IMS Emergency Call test cases 11.2.8	CR	ROHDE & SCHWARZ, Qualcomm Incorporated, Samsung	36.523-1 12.5.0 CR#3019 catF	TEI9_Test	Rel-9	R5-67 AI: 6.4.3.6	withdrawn	[WTS] [JSN]
R5-151672	Correction to TS 36.523-1 Rel-9 pointer	CR	Rapporteur (BlackBerry)	36.523-1 9.9.0 CR#3020 catF	TEI9_Test	Rel-9	R5-67 AI: 6.4.3.11	available	[WTS] [JSN]
R5-151673	Correction to IMS Emergency Call test cases 11.2.8	CR	ROHDE & SCHWARZ, Qualcomm Incorporated, Samsung	36.523-2 12.5.0 CR#749 catF	TEI9_Test	Rel-9	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151674	Correction to IMS Emergency Call test case 11.2.3	CR	ROHDE & SCHWARZ, Qualcomm Incorporated	36.523-1 12.5.0 CR#3021 catF	TEI9_Test	Rel-9	R5-67 AI: 6.4.3.6	available	[WTS] [JSN]
R5-151675	Correction to EUTRA UE Positioning test case 7.3.3.1	CR	ROHDE & SCHWARZ	37.571-2 12.1.0 CR#57 catF	TEI9_Test	Rel-9	R5-67 AI: 6.6.7.1	available	[WTS] [JSN]
R5-151676	Correction to LTE-UTRA FE-FACH test cases 6.2.4.x	CR	ROHDE & SCHWARZ, Anite Ltd., Anritsu Ltd., Qualcomm Incorporated	36.523-1 12.5.0 CR#3022 catF	TEI11_Test	Rel-11	R5-67 AI: 6.4.3.1	available	[WTS] [JSN]
R5-151677	Update execution guidelines for CA test case 8.2.4.21.2	CR	Anite	36.523-3 12.1.0 CR#2629 catF	TEI10_Test	Rel-12	R5-67 AI: 6.4.5.1	available	[WTS] [JSN]
R5-151678	Update execution guidelines for Rel-11 TDD SSC test cases	CR	Anite	36.523-3 12.1.0 CR#2630 catF	TEI11_Test	Rel-12	R5-67 AI: 6.4.5.1	available	[WTS] [JSN]
R5-151679	Applicability of TS 36.523-1 TC 8.6.4.4 to Rel-11 devices	other	Intel Corporation (UK) Ltd				R5-67 AI: 6.4.6	noted	[WTS] [JSN]
R5-151680	Correction to PICS items referenced in C32b and C33b applicability conditions.	CR	AT4 wireless S.A.	36.521-2 12.5.0 CR#268 catF	TEI10_Test	Rel-12	R5-67 AI: 5.4.1.3	available	[WTS] [JSN]
R5-151681	Correction for C.10 and C.38	CR	MCC TF160	34.229-1 12.5.0 CR#691 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151682	Correction for C.19 and C.37	CR	MCC TF160	34.229-1 12.5.0 CR#692 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151683	Correction for C.24 and C.31	CR	MCC TF160	34.229-1 12.5.0 CR#693 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151684	Further corrections for SDP o-lines	CR	MCC TF160	34.229-1 12.5.0 CR#694 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151685	Introduction of New TC 8.3.1.1d Inter-frequency absolute priority based reselection in CELL_FACH (Lower Priority)	CR	QUALCOMM Incorporated	34.123-1 11.6.0 CR#3753 catF	TEI11_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151686	Correction to ESM test case 10.2.1	CR	ROHDE & SCHWARZ, Qualcomm Incorporated	36.523-1 12.5.0 CR#3023 catF	TEI8_Test	Rel-8	R5-67 AI: 6.4.3.5	available	[WTS] [JSN]
R5-151687	Introduction of New TC 8.3.1.1e Inter-frequency absolute priority based reselection in CELL_FACH (Higher Priority)	CR	QUALCOMM Incorporated	34.123-1 11.6.0 CR#3754 catF	TEI11_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151688	Introduction of New TC 8.3.1.1f - Inter-frequency reselection to a no priority layer when NW and UE supports absolute priority in CELL_FACH	CR	QUALCOMM Incorporated	34.123-1 11.6.0 CR#3755 catF	TEI11_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151689	Void 1x SRVCC test case 8.4.7.1	CR	Qualcomm Incorporated	36.523-1 12.5.0 CR#3024 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.3.3.4	available	[WTS] [JSN]
R5-151690	Void applicability of 1x SRVCC test case 8.4.7.1	CR	Qualcomm Incorporated	36.523-2 12.5.0 CR#750 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151691	Update of SI acquisition measurement test cases 8.3.4.x	CR	Qualcomm Incorporated	36.523-1 12.5.0 CR#3025 catF		Rel-12	R5-67 AI: 6.4.3.3.3	available	[WTS] [JSN]
R5-151692	Editorial correction to C32 in 36.523-2	CR	MICROSOFT EUROPE SARL	36.523-2 12.5.0 CR#751 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151693	Editorial correction to C216F and C216T in 36.523-2	CR	MICROSOFT EUROPE SARL	36.523-2 12.5.0 CR#752 catF	TEI8_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151694	Editorial correction to C119F and C119T in 36.523-2	CR	MICROSOFT EUROPE SARL	36.523-2 12.5.0 CR#753 catF	TEI9_Test	Rel-12	R5-67 AI: 6.4.4	available	[WTS] [JSN]
R5-151695	Introduction of new test case 8.2.2.89 - Radio Bearer Reconfiguration in CELL_DCH: Successful Reconfiguration of DCH Enhancement in Basic Mode	CR	QUALCOMM Incorporated	34.123-1 11.6.0 CR#3756 catF	UTRA_DCHenh-UEConTest	Rel-12	R5-67 AI: 6.3.11.2	available	[WTS] [JSN]
R5-151696	Correction to the multiple messages to include Rel. 11 and Rel. 12 IEs	CR	QUALCOMM Incorporated	34.108 11.13.0 CR#982 catF	UTRA_DCHenh-UEConTest	Rel-12	R5-67 AI: 6.3.11.1	available	[WTS] [JSN]
R5-151697	Add Applicability for New DCH Enhancement Test Case 8.2.2.89	CR	QUALCOMM Incorporated	34.123-2 11.6.0 CR#739 catF	UTRA_DCHenh-UEConTest	Rel-12	R5-67 AI: 6.3.11.3	available	[WTS] [JSN]
R5-151698	Add Applicability for New FE-FACH Test Cases 8.3.1.1d, 8.3.1.1e and 8.3.1.1f	CR	QUALCOMM Incorporated	34.123-2 11.6.0 CR#740 catF	TEI11_Test	Rel-11	R5-67 AI: 6.6.4.2	available	[WTS] [JSN]
R5-151699	New Work Item Proposal: UE Conformance Test Aspects – Dual connectivity for LTE	WID new revised to R5-151717	Ericsson			Rel-12	R5-67 AI: 4.1	revised	[WTS] [JSN]
R5-151700	Correction to A.1.3 concerning expiration interval	CR	ROHDE & SCHWARZ	34.229-1 12.5.0 CR#695 catF		Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151701	Correction of TC 17.2	CR	ROHDE & SCHWARZ	34.229-1 12.5.0 CR#696 catF		Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151702	Correction to C.31 and C.24	CR	ROHDE & SCHWARZ	34.229-1 12.5.0 CR#697 catF		Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151703	Addition of option tag “precondition” in follow-up SIP requests and responses	CR	ROHDE & SCHWARZ	34.229-1 12.5.0 CR#698 catF		Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151704	Aligning usage of a=inactive	CR	ROHDE & SCHWARZ	34.229-1 12.5.0 CR#699 catF		Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151705	Correction to step number reference in 19.5.6, 19.5.8, 19.5.10	CR	ROHDE & SCHWARZ	34.229-1 12.5.0 CR#700 catF		Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151706	References to default messages in C.10	CR	ROHDE & SCHWARZ	34.229-1 12.5.0 CR#701 catF		Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151707	Changes to TC 15.21	CR	ROHDE & SCHWARZ	34.229-1 12.5.0 CR#702 catF		Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151708	Corrections to TC 18.1	CR	ROHDE & SCHWARZ	34.229-1 12.5.0 CR#703 catF		Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151709	Corrections to TC 15.19	CR	ROHDE & SCHWARZ	34.229-1 12.5.0 CR#704 catF		Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151710	Correction for test cases 15.21a and 15.21c	CR	MCC TF160	34.229-1 12.5.0 CR#704 catF	TEI8_Test	Rel-12	R5-67 AI: 6.6.6.1	available	[WTS] [JSN]
R5-151711	Correction to F-DPCH channelisation code in DC-HSUPA test cases	CR	MCC TF160, Rohde&Schwarz	34.123-1 11.6.0 CR#3757 catF	TEI9_Test	Rel-11	R5-67 AI: 6.6.4.1	available	[WTS] [JSN]
R5-151712	Correction to RADIO BEARER SETUP message condition A25c	CR	MCC TF160, Rohde&Schwarz	34.108 11.13.0 CR#983 catF	TEI9_Test	Rel-11	R5-67 AI: 6.6.2.1	available	[WTS] [JSN]
R5-151715	New Work Item Proposal: UE Conformance Test Aspects – Core Requirements for Uplink 64QAM for E-UTRA	WID new revision of R5-151314 revised to R5-152123	China Mobile Com. Corporation				R5-67 AI: 7.3	revised	[WTS] [JSN]
R5-151716	New Work Item Proposal: UE Conformance Test Aspects – Small cell enhancements - Physical layer aspects	WID new revision of R5-151568 revised to R5-152124	Huawei				R5-67 AI: 7.3	revised	[WTS] [JSN]
R5-151717	New Work Item Proposal: UE Conformance Test Aspects – Dual connectivity for LTE	WID new revision of R5-151699 revised to R5-152125	Ericsson				R5-67 AI: 7.3	revised	[WTS] [JSN]
R5-151718	Update of PRD13 Protocol TCs scope and TCs numbers sections	other revision of R5-151495	Samsung				R5-67 AI: 4.3	approved	[WTS] [JSN]
R5-151730	Addition of new Signalling test cases for 2DL CA and 3DL CA	other revision of R5-151410	QUALCOMM Incorporated				R5-67 AI: 6.4.6	withdrawn	[WTS] [JSN]
R5-151732	Addition of new Signalling test cases for 2DL CA	other	QUALCOMM Incorporated				R5-67 AI: 6.4.6	noted	[WTS] [JSN]
R5-151733	Revised WID: UE Conformance Test Aspects – Low Cost MTC	WID revised revised to R5-152121	Ericsson				R5-67 AI: 7.3	revised	[WTS] [JSN]
R5-151734	Status update on LTE (non-IMS) TCs regression test with IMS-enabled UEs	other revision of R5-151111	MCC TF160				R5-67 AI: 6.4.6	noted	[WTS] [JSN]
R5-151735	Proposal for introducing test case for IMS Customized Alerting Tones	other revision of R5-151633	Ericsson				R5-67 AI: 6.2	noted	[WTS] [JSN]
R5-151736	Procedures Wi-Fi Offload from/To 3GPP in WLAN interworking	other revised to R5-151990	Motorola Mobility				R5-67 AI: 6.3.4.9	revised	[WTS] [JSN]
R5-151852	List of remaining TT analysis above 3GHz	other revision of R5-151370	Ericsson				R5-67 AI: 5.4.1.11	noted	[WTS] [JSN]
R5-151863	Discussion on Fallback 2DL RX RF Testcase applicability if 3DL CA is tested	other revision of R5-151285	Intel				R5-67 AI: 5.3.4.	noted	[WTS] [JSN]
R5-151907	Text proposal for TS 37.544 v0.3.0 Annex K	pCR revision of R5-151529	Intel Corporation (UK) Ltd	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-12	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151908	Text proposal to TS 37.544 v0.3.0 for Annex D Maximum Uncertainty of Test System	pCR revision of R5-151225	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151909	Text proposal to TS 37.544 v0.3.0 for Annex D Test Tolerances	pCR revision of R5-151226	ZTE	37.544 0.3.0	LTE_UTRA_TRP_TRS-UEConTest	Rel-13	R5-67 AI: 5.3.2.1	noted	[WTS] [JSN]
R5-151919	Test case list for 20MHz+10MHz CA RRM tests - before RAN5#67	other revision of R5-151315	China Mobile Com. Corporation				R5-67 AI: 5.4.1.11	noted	[WTS] [JSN]
R5-151920	Update of TC list for Rel-12 RSRP accuracy requirements - before RAN5#67	other revision of R5-151316	China Mobile Com. Corporation				R5-67 AI: 5.4.1.11	noted	[WTS] [JSN]
R5-151977	[PTCO] Proposed way forward to Test Optimisation	other revision of R5-151379	Telecom Italia, Orange, CMCC, Spirent Communications, NTT DoCoMo				R5-67 AI: 7.1.5	noted	[WTS] [JSN]
R5-151978	Project Plan and Example Results for Data Analytics Approach to Test Optimisation	other revision of R5-151409	Spirent Communications				R5-67 AI: 4.5.5	noted	[WTS] [JSN]
R5-151979	Status on proposals for RF/RRM test optimisation (requested by GCF)	other revision of R5-151435	Ericsson				R5-67 AI: 7.1.2	noted	[WTS] [JSN]
R5-151988	LS on usage of preconditions	LS out	TSG WG RAN5				R5-67 AI: 7.5	approved	[WTS] [JSN]
R5-151990	Procedures Wi-Fi Offload from/To 3GPP in WLAN interworking	other revision of R5-151736	Motorola Mobility				R5-67 AI: 6.3.4.9	noted	[WTS] [JSN]
R5-151996	LS on Way Forward to Test Optimisation	LS out	TSG WG RAN5				R5-67 AI: 7.5	approved	[WTS] [JSN]
R5-151997	LS on Interoperability consequences for not testing presence of IM CN SS flag	LS out	TSG WG RAN5				R5-67 AI: 7.5	approved	[WTS] [JSN]
R5-151998	LS on Status of Non-IMS E-UTRA Test Cases Regression on IMS Enabled Devices	LS out	TSG WG RAN5				R5-67 AI: 7.5	approved	[WTS] [JSN]
R5-152051	Critical prose CRs list for Protocol Test Cases at RAN5#67	LS out revised to R5-152150	TSG WG RAN5				R5-67 AI: 7.5	revised	[WTS] [JSN]
R5-152100	Protocol Test case list for TDD-FDD CA	other revision of R5-151562	Huawei				R5-67 AI: 6.3.2.5	noted	[WTS] [JSN]
R5-152109	[PTCO] Test Optimisation Way Forward Proposal	other	Telecom Italia, Orange, CMCC, Spirent Communications, NTT DoCoMo, Motorola Mobility, Samsung, Vodafone				R5-67 AI: 7.1.5	noted	[WTS] [JSN]
R5-152110	New RAN5 TR for RF test points	draft TR	Ericsson				R5-67 AI: 7.5	agreed	[WTS] [JSN]
R5-152115	[PTCO] More details to Risk Analysis on Test Optimisation	other revision of R5-151482	Telecom Italia, Orange, CMCC, Spirent Communications				R5-67 AI: 7.1.5	noted	[WTS] [JSN]
R5-152118	wp UE Conformance Test Aspects – WLAN/3GPP Radio Interworking	Work Plan revision of R5-151032	Intel Corporation (UK) Ltd				R5-67 AI: 7.3	agreed	[WTS] [JSN]
R5-152119	wp UE Conformance Test Aspects - Low cost & enhanced coverage MTC UE for LTE	Work Plan revision of R5-151040	Ericsson				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-152120	SR UE Conformance Test Aspects - Low cost & enhanced coverage MTC UE for LTE	WI status report revision of R5-151041	Ericsson				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-152121	Revised WID: UE Conformance Test Aspects – Low Cost MTC	WID revised revision of R5-151733	Ericsson				R5-67 AI: 7.3	agreed	[WTS] [JSN]
R5-152122	SR UE Conformance Test Aspects - Smart Congestion Mitigation in E-UTRAN	WI status report revision of R5-151047	NTT DOCOMO INC.				R5-67 AI: 7.3	noted	[WTS] [JSN]
R5-152123	New Work Item Proposal: UE Conformance Test Aspects – Core Requirements for Uplink 64QAM for E-UTRA	WID new revision of R5-151715	China Mobile Com. Corporation				R5-67 AI: 7.3	agreed	[WTS] [JSN]
R5-152124	New Work Item Proposal: UE Conformance Test Aspects – Small cell enhancements - Physical layer aspects	WID new revision of R5-151716	Huawei				R5-67 AI: 7.3	agreed	[WTS] [JSN]
R5-152125	New Work Item Proposal: UE Conformance Test Aspects – Dual connectivity for LTE	WID new revision of R5-151717	Ericsson				R5-67 AI: 7.3	agreed	[WTS] [JSN]
R5-152126	Work Item codes on CR coversheets for ‘frozen’/‘closed’ WIs	other revision of R5-151524	BlackBerry, AT&T, Anite				R5-67 AI: 7.1	noted	[WTS] [JSN]
R5-152127	Way forward on Work Item codes on CR coversheets for ‘frozen’/‘closed’ Wis	other	BlackBerry UK Limited, Anite, AT&T, Ericsson				R5-67 AI: 7.1	noted	[WTS] [JSN]
R5-152150	Critical prose CRs list for Protocol Test Cases at RAN5#67	LS out revision of R5-152051	TSG WG RAN5				R5-67 AI: 7.5	approved	[WTS] [JSN]

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