Please enter the search related information in the fields below. Partial information works, e.g. "SP-21
" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501
" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP
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tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
---|---|---|---|---|---|---|---|---|---|
R4-1713345 | CR on E-CID for eNB-IOT normal coverage |
CR revised to R4-1714283 |
Huawei,HiSilicon | 36.133 14.5.0 CR#5420 catB | NB_IOTenh-Core | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1713346 | CR on E-CID for eNB-IOT enhanced coverage |
CR revised to R4-1714284 |
Huawei,HiSilicon | 36.133 14.5.0 CR#5421 catB | NB_IOTenh-Core | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1713347 | CR for intra frequency RSTD reporting delay test case for eNB-IOT positioning |
CR revised to R4-1713900 |
Huawei,HiSilicon | 36.133 14.5.0 CR#5422 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1713348 | CR for inter frequency RSTD reporting delay test case for eNB-IOT positioning |
CR revised to R4-1713901 |
Huawei,HiSilicon | 36.133 14.5.0 CR#5423 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1713349 | CR for intra RSTD accuracy test case for eNB-IOT positioning in normal coverage |
CR revised to R4-1713902 |
Huawei,HiSilicon | 36.133 14.5.0 CR#5424 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1713350 | CR for intra RSTD accuracy test case for eNB-IOT positioning in enhanced coverage |
CR revised to R4-1713903 |
Huawei,HiSilicon | 36.133 14.5.0 CR#5425 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1713351 | CR for inter RSTD accuracy test case for eNB-IOT positioning in normal coverage |
CR revised to R4-1713904 |
Huawei,HiSilicon | 36.133 14.5.0 CR#5426 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1713352 | CR for inter RSTD accuracy test case for eNB-IOT positioning in enhanced coverage |
CR revised to R4-1713905 |
Huawei,HiSilicon | 36.133 14.5.0 CR#5427 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1713353 | CR on NB-IOT RSTD requirement | CR | Huawei,HiSilicon | 36.133 14.5.0 CR#5428 catF | NB_IOTenh-Core | Rel-14 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
R4-1713354 | CR for intra RSTD accuracy for eNB-IOT | CR | Huawei,HiSilicon | 36.133 14.5.0 CR#5429 catF | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
noted | [WTS] [JSN] |
R4-1713355 | CR for inter RSTD accuracy for eNB-IOT | CR | Huawei,HiSilicon | 36.133 14.5.0 CR#5430 catF | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
noted | [WTS] [JSN] |
R4-1713371 | CR on E-CID for eNB-IOT normal coverage R15 | CR | Huawei,HiSilicon | 36.133 15.0.0 CR#5444 catA | NB_IOTenh-Core | Rel-15 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
R4-1713372 | CR on E-CID for eNB-IOT enhanced coverage R15 | CR | Huawei,HiSilicon | 36.133 15.0.0 CR#5445 catA | NB_IOTenh-Core | Rel-15 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
R4-1713373 | CR for intra frequency RSTD reporting delay test case for eNB-IOT positioning R15 | CR | Huawei,HiSilicon | 36.133 15.0.0 CR#5446 catA | NB_IOTenh-Perf | Rel-15 |
R4-85 AI: 7.3.2.1 |
withdrawn | [WTS] [JSN] |
R4-1713374 | CR for inter frequency RSTD reporting delay test case for eNB-IOT positioning R15 | CR | Huawei,HiSilicon | 36.133 15.0.0 CR#5447 catA | NB_IOTenh-Perf | Rel-15 |
R4-85 AI: 7.3.2.1 |
withdrawn | [WTS] [JSN] |
R4-1713375 | CR for intra RSTD accuracy test case for eNB-IOT positioning in normal coverage R15 | CR | Huawei,HiSilicon | 36.133 15.0.0 CR#5448 catA | NB_IOTenh-Perf | Rel-15 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
R4-1713376 | CR for intra RSTD accuracy test case for eNB-IOT positioning in enhanced coverage R15 | CR | Huawei,HiSilicon | 36.133 15.0.0 CR#5449 catA | NB_IOTenh-Perf | Rel-15 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
R4-1713377 | CR for inter RSTD accuracy test case for eNB-IOT positioning in normal coverage R15 | CR | Huawei,HiSilicon | 36.133 15.0.0 CR#5450 catA | NB_IOTenh-Perf | Rel-15 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
R4-1713378 | CR for inter RSTD accuracy test case for eNB-IOT positioning in enhanced coverage R15 | CR | Huawei,HiSilicon | 36.133 15.0.0 CR#5451 catA | NB_IOTenh-Perf | Rel-15 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
R4-1713379 | CR on NB-IOT RSTD requirement R15 | CR | Huawei,HiSilicon | 36.133 15.0.0 CR#5452 catA | NB_IOTenh-Core | Rel-15 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
R4-1713380 | CR for intra RSTD accuracy for eNB-IOT R15 | CR | Huawei,HiSilicon | 36.133 15.0.0 CR#5453 catA | NB_IOTenh-Perf | Rel-15 |
R4-85 AI: 7.3.2.1 |
withdrawn | [WTS] [JSN] |
R4-1713381 | CR for inter RSTD accuracy for eNB-IOT R15 | CR | Huawei,HiSilicon | 36.133 15.0.0 CR#5454 catA | NB_IOTenh-Perf | Rel-15 |
R4-85 AI: 7.3.2.1 |
withdrawn | [WTS] [JSN] |
R4-1713900 | CR for intra frequency RSTD reporting delay test case for eNB-IOT positioning |
CR revision of R4-1713347 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54221 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
noted | [WTS] [JSN] |
R4-1713901 | CR for inter frequency RSTD reporting delay test case for eNB-IOT positioning |
CR revision of R4-1713348 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54231 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
noted | [WTS] [JSN] |
R4-1713902 | CR for intra RSTD accuracy test case for eNB-IOT positioning in normal coverage |
CR revision of R4-1713349 revised to R4-1714412 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54241 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1713903 | CR for intra RSTD accuracy test case for eNB-IOT positioning in enhanced coverage |
CR revision of R4-1713350 revised to R4-1714413 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54251 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1713904 | CR for inter RSTD accuracy test case for eNB-IOT positioning in normal coverage |
CR revision of R4-1713351 revised to R4-1714414 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54261 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1713905 | CR for inter RSTD accuracy test case for eNB-IOT positioning in enhanced coverage |
CR revision of R4-1713352 revised to R4-1714415 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54271 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1714283 | CR on E-CID for eNB-IOT normal coverage |
CR revision of R4-1713345 revised to R4-1714408 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54201 catB | NB_IOTenh-Core | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1714284 | CR on E-CID for eNB-IOT enhanced coverage |
CR revision of R4-1713346 revised to R4-1714409 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54211 catB | NB_IOTenh-Core | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1714408 | CR on E-CID for eNB-IOT normal coverage |
CR revision of R4-1714283 revised to R4-1714504 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54202 catB | NB_IOTenh-Core | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1714409 | CR on E-CID for eNB-IOT enhanced coverage |
CR revision of R4-1714284 revised to R4-1714505 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54212 catB | NB_IOTenh-Core | Rel-14 |
R4-85 AI: 7.3.2.1 |
revised | [WTS] [JSN] |
R4-1714410 | CR for intra frequency RSTD reporting delay test case for eNB-IOT positioning | CR | Huawei,HiSilicon | 36.133 14.5.0 CR#54222 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
withdrawn | [WTS] [JSN] |
R4-1714411 | CR for inter frequency RSTD reporting delay test case for eNB-IOT positioning | CR | Huawei,HiSilicon | 36.133 14.5.0 CR#54232 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
withdrawn | [WTS] [JSN] |
R4-1714412 | CR for intra RSTD accuracy test case for eNB-IOT positioning in normal coverage |
CR revision of R4-1713902 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54242 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
R4-1714413 | CR for intra RSTD accuracy test case for eNB-IOT positioning in enhanced coverage |
CR revision of R4-1713903 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54252 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
R4-1714414 | CR for inter RSTD accuracy test case for eNB-IOT positioning in normal coverage |
CR revision of R4-1713904 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54262 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
R4-1714415 | CR for inter RSTD accuracy test case for eNB-IOT positioning in enhanced coverage |
CR revision of R4-1713905 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54272 catB | NB_IOTenh-Perf | Rel-14 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
R4-1714504 | CR on E-CID for eNB-IOT normal coverage |
CR revision of R4-1714408 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54203 catB | NB_IOTenh-Core | Rel-14 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
R4-1714505 | CR on E-CID for eNB-IOT enhanced coverage |
CR revision of R4-1714409 |
Huawei,HiSilicon | 36.133 14.5.0 CR#54213 catB | NB_IOTenh-Core | Rel-14 |
R4-85 AI: 7.3.2.1 |
agreed | [WTS] [JSN] |
40 documents (0.34511208534241 seconds)