Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R4-1704715 | CR on reduced MGL test case for FDD-FDD |
CR revised to R4-1705953 |
Intel Corporation | 36.133 14.3.0 CR#4853 catB | LTE_meas_gap_enh-Perf | Rel-14 |
R4-83 AI: 7.26.3 |
revised | [WTS] [JSN] |
| R4-1704716 | CR on reduced MGL test case for TDD-TDD |
CR revised to R4-1705954 |
Intel Corporation | 36.133 14.3.0 CR#4854 catB | LTE_meas_gap_enh-Perf | Rel-14 |
R4-83 AI: 7.26.3 |
revised | [WTS] [JSN] |
| R4-1704717 | CR on per-CC measurement gap for FDD-FDD inter-frequency measurements | CR | Intel Corporation | 36.133 14.3.0 CR#4855 catB | LTE_meas_gap_enh-Perf | Rel-14 |
R4-83 AI: 7.26.3 |
noted | [WTS] [JSN] |
| R4-1704718 | CR on NCSG for FDD-FDD inter-frequency measurements | CR | Intel Corporation | 36.133 14.3.0 CR#4856 catB | LTE_meas_gap_enh-Perf | Rel-14 |
R4-83 AI: 7.26.3 |
noted | [WTS] [JSN] |
| R4-1704719 | CR on per-CC measurement gap for TDD-TDD inter-frequency measurements | CR | Intel Corporation | 36.133 14.3.0 CR#4857 catB | LTE_meas_gap_enh-Perf | Rel-14 |
R4-83 AI: 7.26.3 |
noted | [WTS] [JSN] |
| R4-1704720 | CR on NCSG for TDD-TDD inter-frequency measurements | CR | Intel Corporation | 36.133 14.3.0 CR#4858 catB | LTE_meas_gap_enh-Perf | Rel-14 |
R4-83 AI: 7.26.3 |
noted | [WTS] [JSN] |
| R4-1704784 | Discussion on eGAP RRM tests | discussion | Ericsson | LTE_meas_gap_enh-Perf | Rel-14 |
R4-83 AI: 7.26.3 |
noted | [WTS] [JSN] | |
| R4-1705746 | Test Configuration for Burst Gap | discussion | Qualcomm Incorporated | LTE_meas_gap_enh-Perf |
R4-83 AI: 7.26.3 |
noted | [WTS] [JSN] | ||
| R4-1705748 | Test Configuration for NCSG | discussion | Qualcomm Incorporated | LTE_meas_gap_enh-Perf |
R4-83 AI: 7.26.3 |
noted | [WTS] [JSN] | ||
| R4-1705753 | Introduction of test case for Burst gap |
CR revised to R4-1706171 |
Qualcomm Incorporated | 36.133 14.3.0 CR#4997 catB | LTE_meas_gap_enh-Perf | Rel-14 |
R4-83 AI: 7.26.3 |
revised | [WTS] [JSN] |
| R4-1705754 | Introduction of test case for NCSG |
CR revised to R4-1706170 |
Qualcomm Incorporated | 36.133 14.3.0 CR#4998 catB | LTE_meas_gap_enh-Perf | Rel-14 |
R4-83 AI: 7.26.3 |
revised | [WTS] [JSN] |
| R4-1705953 | E-UTRAN FDD-FDD Inter-frequency event triggered reporting with MGL=3ms under fading propagation conditions in synchronous cells |
CR revision of R4-1704715 |
Intel Corporation | 36.133 14.3.0 CR#48531 catB | LTE_meas_gap_enh-Core | Rel-14 |
R4-83 AI: 7.26.3 |
agreed | [WTS] [JSN] |
| R4-1705954 | E-UTRAN TDD-TDD Inter-frequency event triggered reporting with MGL=3ms under fading propagation conditions in synchronous cells |
CR revision of R4-1704716 |
Intel Corporation | 36.133 14.3.0 CR#48541 catB | LTE_meas_gap_enh-Core | Rel-14 |
R4-83 AI: 7.26.3 |
agreed | [WTS] [JSN] |
| R4-1706170 | Introduction of test cases for NCSG |
CR revision of R4-1705754 |
Qualcomm Incorporated | 36.133 14.3.0 CR#49981 catB | LTE_meas_gap_enh-Perf | Rel-14 |
R4-83 AI: 7.26.3 |
agreed | [WTS] [JSN] |
| R4-1706171 | Introduction of test cases for burst gap |
CR revision of R4-1705753 |
Qualcomm Incorporated | 36.133 14.3.0 CR#49971 catB | LTE_meas_gap_enh-Perf | Rel-14 |
R4-83 AI: 7.26.3 |
agreed | [WTS] [JSN] |
15 documents (0.35678315162659 seconds)