Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R4-2504295 | Further discussion on Expected EIRP test | other | Huawei, HiSilicon |
R4-114-bis AI: 7.13.5.1 |
noted | [WTS] [JSN] | |||
| R4-2504296 | Draft CR to TS 38.908 EEIRP measurement uncertainty |
draftCR revised to R4-2504732 |
Huawei, HiSilicon | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
revised | [WTS] [JSN] | |
| R4-2504297 | Draft CR to TS 38.141-2 EEIRP measurement uncertainty and coordinate alignment | draftCR | Huawei, HiSilicon | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
merged | [WTS] [JSN] | |
| R4-2504360 | Discussion on conformance testing for U6GHz BS EEIRP mask | other | ZTE Corporation, Sanechips |
R4-114-bis AI: 7.13.5.1 |
noted | [WTS] [JSN] | |||
| R4-2504361 | Draft CR to TS 38.141-2: MU value and angular transformation for U6GHz EEIRP mask | draftCR | ZTE Corporation, Sanechips | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
merged | [WTS] [JSN] | |
| R4-2504362 | Draft CR to TR 38.908 EEIRP measurement uncertainty and angular transformation |
draftCR revised to R4-2504733 |
ZTE Corporation, Sanechips | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
not pursued | [WTS] [JSN] | |
| R4-2504363 | Big Draft CR to TS 38.908: MU and others | draftCR | ZTE Corporation, Sanechips | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
endorsed | [WTS] [JSN] | |
| R4-2504434 | Draft CR to TS 38.115-2 for introduction of expected EIRP mask conformance test for NCR |
draftCR revised to R4-2504734 |
Nokia, ZTE Corporation, Ericsson, Huawei, Samsung, Qualcomm, CATT | NR_BS_RF_req_evo | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
revised | [WTS] [JSN] | |
| R4-2504435 | Draft CR to TS 38.141-2 with updates for EEIRP requirement conformance testing |
draftCR revised to R4-2504735 |
Nokia | NR_BS_RF_req_evo | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
revised | [WTS] [JSN] | |
| R4-2504514 | Draft CR to TS 38.141-2: Improvements related to Expected EIRP (EEIRP) |
draftCR revised to R4-2504738 |
Ericsson | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
revised | [WTS] [JSN] | |
| R4-2504732 | Draft CR to TS 38.908 EEIRP measurement uncertainty |
draftCR revision of R4-2504296 |
Huawei, HiSilicon | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
endorsed | [WTS] [JSN] | |
| R4-2504733 | Draft CR to TR 38.908 EEIRP measurement uncertainty and angular transformation |
draftCR revision of R4-2504362 |
ZTE Corporation, Sanechips | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
withdrawn | [WTS] [JSN] | |
| R4-2504734 | Draft CR to TS 38.115-2 for introduction of expected EIRP mask conformance test for NCR |
draftCR revision of R4-2504434 |
Nokia, ZTE Corporation, Ericsson, Huawei, Samsung, Qualcomm, CATT | NR_BS_RF_req_evo | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
postponed | [WTS] [JSN] | |
| R4-2504735 | Draft CR to TS 38.141-2 with updates for EEIRP requirement conformance testing |
draftCR revision of R4-2504435 |
Nokia | NR_BS_RF_req_evo | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
endorsed | [WTS] [JSN] | |
| R4-2504738 | Draft CR to TS 38.141-2: Improvements related to Expected EIRP (EEIRP) |
draftCR revision of R4-2504514 revised to R4-2504765 |
Ericsson | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
revised | [WTS] [JSN] | |
| R4-2504765 | Draft CR to TS 38.141-2: Improvements related to Expected EIRP (EEIRP) |
draftCR revision of R4-2504738 |
Ericsson | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-114-bis AI: 7.13.5.1 |
endorsed | [WTS] [JSN] |
16 documents (0.39991903305054 seconds)