Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R4-2506935 | CR to TS 38.141-2: Correction on the test procedure | CR | NEC | 38.141-2 19.0.0 CR#648 catF | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-115 AI: 7.13.4.1 |
merged | [WTS] [JSN] |
| R4-2506936 | CR to TR 38.908: Correction on the test procedure | CR | NEC | 38.908 19.0.0 CR#3 catF | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-115 AI: 7.13.4.1 |
merged | [WTS] [JSN] |
| R4-2507154 | CR to TS 38.141-2: improvements related to Expected EIRP for band n104 |
CR revised to R4-2508654 |
Ericsson | 38.141-2 19.0.0 CR#649 catF | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-115 AI: 7.13.4.1 |
revised | [WTS] [JSN] |
| R4-2507247 | Draft CR to TS 38.141-2 with updates to OTA spatial emission requirement | draftCR | Nokia | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-115 AI: 7.13.4.1 |
merged | [WTS] [JSN] | |
| R4-2507248 | CR to TS 38.115-2 for introduction of expected EIRP mask conformance test for NCR |
CR revised to R4-2508655 |
Nokia | 38.115-2 18.4.0 CR#36 catB | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-115 AI: 7.13.4.1 |
revised | [WTS] [JSN] |
| R4-2507514 | Discussion on conformance testing for U6GHz BS EEIRP mask | other | ZTE Corporation, Sanechips |
R4-115 AI: 7.13.4.1 |
noted | [WTS] [JSN] | |||
| R4-2507515 | CR to TS 38.908: MU and others |
CR revised to R4-2508653 |
ZTE Corporation, Sanechips | 38.908 19.0.0 CR#4 catF | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-115 AI: 7.13.4.1 |
revised | [WTS] [JSN] |
| R4-2507677 | On EEIRP equations and step size equations | other | Huawei, HiSilicon |
R4-115 AI: 7.13.4.1 |
noted | [WTS] [JSN] | |||
| R4-2507678 | Draft CR to TS 38.908 corrctions | draftCR | Huawei, HiSilicon | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-115 AI: 7.13.4.1 |
merged | [WTS] [JSN] | |
| R4-2507679 | Draft CR to TS 38.141-2 EEIRP measurement uncertainty and coordinate alignment | draftCR | Huawei, HiSilicon | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-115 AI: 7.13.4.1 |
merged | [WTS] [JSN] | |
| R4-2508653 | CR to TR 38.908: MU and others |
CR revision of R4-2507515 |
ZTE Corporation, Sanechips, Huawei, Rohde&Schwarz, Ericsson,NEC,Nokia | 38.908 19.0.0 CR#41 catF | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-115 AI: 7.13.4.1 |
agreed | [WTS] [JSN] |
| R4-2508654 | CR to TS 38.141-2: improvements related to Expected EIRP for band n104 |
CR revision of R4-2507154 revised to R4-2508784 |
Ericsson | 38.141-2 19.0.0 CR#6491 catF | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-115 AI: 7.13.4.1 |
revised | [WTS] [JSN] |
| R4-2508655 | CR to TS 38.115-2 for introduction of expected EIRP mask conformance test for NCR |
CR revision of R4-2507248 |
Nokia | 38.115-2 18.4.0 CR#361 catB | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-115 AI: 7.13.4.1 |
withdrawn | [WTS] [JSN] |
| R4-2508784 | CR to TS 38.141-2: improvements related to Expected EIRP for band n104 |
CR revision of R4-2508654 |
Ericsson, Nokia, Huawei, ZTE, Keysight, NEC | 38.141-2 19.0.0 CR#6492 catF | NR_BS_RF_req_evo-Perf | Rel-19 |
R4-115 AI: 7.13.4.1 |
agreed | [WTS] [JSN] |
14 documents (0.39359712600708 seconds)