Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
Download results in JSON format
| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R4-1815098 | TDD intra-frequency RSTD measurement accuracy test case under normal coverage |
CR revised to R4-1816079 |
Huawei, HiSilicon | 36.133 15.4.0 CR#6069 catB | NB_IOTenh2-Perf | Rel-15 |
R4-89 AI: 6.4.5.8 |
revised | [WTS] [JSN] |
| R4-1815099 | TDD inter-frequency RSTD measurement accuracy test case under normal coverage |
CR revised to R4-1816080 |
Huawei, HiSilicon | 36.133 15.4.0 CR#6070 catB | NB_IOTenh2-Perf | Rel-15 |
R4-89 AI: 6.4.5.8 |
revised | [WTS] [JSN] |
| R4-1815100 | TDD intra-frequency RSTD measurement accuracy test case under enhanced coverage |
CR revised to R4-1816081 |
Huawei, HiSilicon | 36.133 15.4.0 CR#6071 catB | NB_IOTenh2-Perf | Rel-15 |
R4-89 AI: 6.4.5.8 |
revised | [WTS] [JSN] |
| R4-1815101 | TDD inter-frequency RSTD measurement accuracy test case under enhanced coverage |
CR revised to R4-1816082 |
Huawei, HiSilicon | 36.133 15.4.0 CR#6072 catB | NB_IOTenh2-Perf | Rel-15 |
R4-89 AI: 6.4.5.8 |
revised | [WTS] [JSN] |
| R4-1816079 | TDD intra-frequency RSTD measurement accuracy test case under normal coverage |
CR revision of R4-1815098 |
Huawei, HiSilicon | 36.133 15.4.0 CR#60691 catB | NB_IOTenh2-Perf | Rel-15 |
R4-89 AI: 6.4.5.8 |
agreed | [WTS] [JSN] |
| R4-1816080 | TDD inter-frequency RSTD measurement accuracy test case under normal coverage |
CR revision of R4-1815099 |
Huawei, HiSilicon | 36.133 15.4.0 CR#60701 catB | NB_IOTenh2-Perf | Rel-15 |
R4-89 AI: 6.4.5.8 |
agreed | [WTS] [JSN] |
| R4-1816081 | TDD intra-frequency RSTD measurement accuracy test case under enhanced coverage |
CR revision of R4-1815100 |
Huawei, HiSilicon | 36.133 15.4.0 CR#60711 catB | NB_IOTenh2-Perf | Rel-15 |
R4-89 AI: 6.4.5.8 |
agreed | [WTS] [JSN] |
| R4-1816082 | TDD inter-frequency RSTD measurement accuracy test case under enhanced coverage |
CR revision of R4-1815101 |
Huawei, HiSilicon | 36.133 15.4.0 CR#60721 catB | NB_IOTenh2-Perf | Rel-15 |
R4-89 AI: 6.4.5.8 |
agreed | [WTS] [JSN] |
8 documents (0.36591291427612 seconds)