Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-230114 | Update to NSSAA test case 9.1.10.2 | CR | MCC TF160 | 38.523-2 17.1.0 CR#298 catF | TEI16_Test, eNS-UEConTest | Rel-17 |
R5-98 AI: 6.4.5 |
agreed | [WTS] [JSN] |
| R5-230115 | Update to test case 11.4.3 | CR | MCC TF160 | 38.523-2 17.1.0 CR#299 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 6.4.5 |
agreed | [WTS] [JSN] |
| R5-230612 | Add applicabilities for new NE-DC test cases |
CR revised to R5-231575 |
ZTE Corporation | 38.523-2 17.1.0 CR#314 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 6.4.5 |
revised | [WTS] [JSN] |
| R5-230613 | Add applicabilities for new inter-system mobility test cases |
CR revised to R5-231420 |
ZTE Corporation | 38.523-2 17.1.0 CR#315 catF | TEI15_Test | Rel-17 |
R5-98 AI: 6.4.5 |
revised | [WTS] [JSN] |
| R5-230648 | Update the test applicability for 7.1.1.4.1.3 and 7.1.1.4.1.4 |
CR revised to R5-231421 |
Huawei, Hisilicon | 38.523-2 17.1.0 CR#319 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 6.4.5 |
revised | [WTS] [JSN] |
| R5-231350 | Applicability of new test case for RRC DL segmentation |
CR revised to R5-231582 |
MediaTek Inc. | 38.523-2 17.1.0 CR#333 catF | TEI16_Test | Rel-17 |
R5-98 AI: 6.4.5 |
revised | [WTS] [JSN] |
| R5-231420 | Add applicabilities for new inter-system mobility test cases |
CR revision of R5-230613 |
ZTE Corporation | 38.523-2 17.1.0 CR#3151 catF | TEI15_Test | Rel-17 |
R5-98 AI: 6.4.5 |
agreed | [WTS] [JSN] |
| R5-231421 | Update the test applicability for 7.1.1.4.1.3 and 7.1.1.4.1.4 |
CR revision of R5-230648 |
Huawei, Hisilicon | 38.523-2 17.1.0 CR#3191 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 6.4.5 |
agreed | [WTS] [JSN] |
| R5-231566 | Update to Applicability for Test Case 7.1.1.8.1 |
CR revised to R5-231903 |
Qualcomm Incorporated | 38.523-2 17.1.0 CR#336 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 6.4.5 |
revised | [WTS] [JSN] |
| R5-231575 | Add applicabilities for new NE-DC test cases |
CR revision of R5-230612 |
ZTE Corporation | 38.523-2 17.1.0 CR#3141 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 6.4.5 |
agreed | [WTS] [JSN] |
| R5-231582 | Applicability of new test case for RRC DL segmentation |
CR revision of R5-231350 |
MediaTek Inc. | 38.523-2 17.1.0 CR#3331 catF | TEI16_Test | Rel-17 |
R5-98 AI: 6.4.5 |
agreed | [WTS] [JSN] |
| R5-231903 | Update to Applicability for Test Case 7.1.1.8.1 |
CR revision of R5-231566 |
Qualcomm Incorporated | 38.523-2 17.1.0 CR#3361 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 6.4.5 |
agreed | [WTS] [JSN] |
| R5-231911 | Guidance on usage of PICS parameters | CR | Qualcomm Incorporated | 38.523-2 17.1.0 CR#337 catF | TEI15_Test | Rel-17 |
R5-98 AI: 6.4.5 |
agreed | [WTS] [JSN] |
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