Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-244196 Corrections to applicability of EUTRA to NR test case 8.1.5.5.2 CR

revised to R5-245538

Arriver Software AB 38.523-2 17.7.0 CR#483 catF TEI16_Test Rel-17 R5-104

AI: 6.4.5

revised [WTS] [JSN]
R5-244280 Update to the applicability of UPIP TC CR MediaTek Inc. 38.523-2 17.7.0 CR#485 catF TEI17_Test, UPIP_SEC_LTE-RAN-UEConTest Rel-17 R5-104

AI: 6.4.5

withdrawn [WTS] [JSN]
R5-244298 Updates to the applicability of RACS TC CR MediaTek Inc. 38.523-2 17.7.0 CR#486 catF TEI16_Test, RACS-UEConTest Rel-17 R5-104

AI: 6.4.5

withdrawn [WTS] [JSN]
R5-244430 Updates to the applicability of 5G extended/spare fields test cases CR MCC TF160 38.523-2 17.7.0 CR#489 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-104

AI: 6.4.5

withdrawn [WTS] [JSN]
R5-244516 Addition of applicability for R16 IDC test cases CR

revised to R5-245543

CMCC 38.523-2 17.7.0 CR#490 catF TEI16_Test Rel-17 R5-104

AI: 6.4.5

revised [WTS] [JSN]
R5-244520 Update of applicability for test cases 8.1.6.1.2.14 CR CMCC 38.523-2 17.7.0 CR#491 catF TEI17_Test, NR_ENDC_SON_MDT_enh-UEConTest Rel-17 R5-104

AI: 6.4.5

withdrawn [WTS] [JSN]
R5-244739 Correct test applicabliity for R17 eDRX test case CR

revised to R5-245539

Huawei, HiSilicon 38.523-2 17.7.0 CR#500 catF TEI17_Test, NR_redcap_plus_ARCH-UEConTest Rel-17 R5-104

AI: 6.4.5

revised [WTS] [JSN]
R5-244744 Update test applicability for inter-frequency DAPS test case CR

revised to R5-245540

Huawei, HiSilicon 38.523-2 17.7.0 CR#501 catF NR_Mob_enh-UEConTest, TEI16_Test Rel-17 R5-104

AI: 6.4.5

revised [WTS] [JSN]
R5-244844 Applicability updates for NR P-CSCF restoration test cases CR Qualcomm Incorporated, Orange 38.523-2 17.7.0 CR#502 catF TEI15_Test Rel-17 R5-104

AI: 6.4.5

agreed [WTS] [JSN]
R5-245203 Updates to the applicability of 5G extended/spare fields test cases CR MCC TF160 38.523-2 17.7.0 CR#508 catF TEI18_Test Rel-18 R5-104

AI: 6.4.5

agreed [WTS] [JSN]
R5-245325 Correction to Annexure A text CR

revised to R5-245542

Keysight Technologies UK 38.523-2 17.7.0 CR#511 catF TEI17_Test, NR_redcap_plus_ARCH-UEConTest Rel-17 R5-104

AI: 6.4.5

revised [WTS] [JSN]
R5-245538 Corrections to applicability of EUTRA to NR test case 8.1.5.5.2 CR

revision of R5-244196

Arriver Software AB 38.523-2 17.7.0 CR#4831 catF TEI16_Test Rel-17 R5-104

AI: 6.4.5

agreed [WTS] [JSN]
R5-245539 Correct test applicabliity for R17 eDRX test case CR

revision of R5-244739

Huawei, HiSilicon 38.523-2 17.7.0 CR#5001 catF TEI17_Test Rel-17 R5-104

AI: 6.4.5

agreed [WTS] [JSN]
R5-245540 Update test applicability for inter-frequency DAPS test case CR

revision of R5-244744

Huawei, HiSilicon 38.523-2 17.7.0 CR#5011 catF TEI16_Test, NR_Mob_enh-UEConTest Rel-17 R5-104

AI: 6.4.5

withdrawn [WTS] [JSN]
R5-245541 Update and add test applicability for inter-frequency DAPS test case CR Huawei, HiSilicon 38.523-2 17.7.0 CR#512 catF TEI16_Test Rel-17 R5-104

AI: 6.4.5

agreed [WTS] [JSN]
R5-245542 Correction to Annexure A text CR

revision of R5-245325

Keysight Technologies UK 38.523-2 17.7.0 CR#5111 catF TEI17_Test Rel-17 R5-104

AI: 6.4.5

agreed [WTS] [JSN]
R5-245543 Addition of applicability for R16 IDC test cases CR

revision of R5-244516

CMCC 38.523-2 17.7.0 CR#4901 catF TEI16_Test Rel-17 R5-104

AI: 6.4.5

agreed [WTS] [JSN]

17 documents (0.39189004898071 seconds)