Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-236458 | Update test case 8.1.6.1.3.8 | CR | ZTE Corporation | 38.523-1 17.4.0 CR#4063 catF | TEI17_Test, NR_ENDC_SON_MDT_enh-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
agreed | [WTS] [JSN] |
| R5-236459 | Update test case 8.1.6.1.3.10 |
CR revised to R5-237425 |
ZTE Corporation | 38.523-1 17.4.0 CR#4064 catF | TEI17_Test, NR_ENDC_SON_MDT_enh-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
revised | [WTS] [JSN] |
| R5-236460 | Update test case 8.1.6.1.3.11 |
CR revised to R5-237426 |
ZTE Corporation | 38.523-1 17.4.0 CR#4065 catF | TEI17_Test, NR_ENDC_SON_MDT_enh-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
revised | [WTS] [JSN] |
| R5-236481 | Update test case 8.1.6.1.3.9 |
CR revised to R5-237427 |
ZTE Corporation | 38.523-1 17.4.0 CR#4066 catF | TEI17_Test, NR_ENDC_SON_MDT_enh-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
revised | [WTS] [JSN] |
| R5-236590 | Editorial Updates to NR5GC MDT testcase 8.1.6.1.2.1 | CR | Qualcomm Technologies Int | 38.523-1 17.4.0 CR#4079 catF | TEI16_Test, NR_SON_MDT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
withdrawn | [WTS] [JSN] |
| R5-236591 | Correction to NR5GC MDT testcase 8.1.6.1.2.4 |
CR revised to R5-237358 |
Qualcomm Technologies Int, ANRITSU LTD, Keysight Technologies Inc, Rohde & Schwarz | 38.523-1 17.4.0 CR#4080 catF | TEI16_Test, NR_SON_MDT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
revised | [WTS] [JSN] |
| R5-236592 | Correction to NR5GC MDT testcase 8.1.6.1.2.5 |
CR revised to R5-237359 |
Qualcomm Technologies Int, ANRITSU LTD, Keysight Technologies Inc, Rohde & Schwarz | 38.523-1 17.4.0 CR#4081 catF | TEI16_Test, NR_SON_MDT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
revised | [WTS] [JSN] |
| R5-236598 | Correction to NR5GC MDT testcase 8.1.6.1.2.12 |
CR revised to R5-237360 |
Qualcomm Technologies Int, Qualcomm Technologies Int, ANRITSU LTD, Keysight Technologies Inc, Rohde & Schwarz | 38.523-1 17.4.0 CR#4083 catF | TEI16_Test, NR_SON_MDT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
revised | [WTS] [JSN] |
| R5-236618 | Addition of FR2 cell power levels for SON-MDT test cases | CR | Keysight Technologies UK | 38.523-1 17.4.0 CR#4087 catF | TEI16_Test, NR_SON_MDT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
agreed | [WTS] [JSN] |
| R5-236638 | Update of test case 8.1.6.1.2.14 for SON_MDT |
CR revised to R5-237361 |
CMCC | 38.523-1 17.4.0 CR#4096 catF | NR_ENDC_SON_MDT_enh-UEConTest, TEI17_Test | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
revised | [WTS] [JSN] |
| R5-236838 | Correction to SON MDT test case 8.1.6.1.2.16 |
CR revised to R5-237362 |
TDIA, CATT | 38.523-1 17.4.0 CR#4118 catF | NR_ENDC_SON_MDT_enh-UEConTest, TEI17_Test | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
revised | [WTS] [JSN] |
| R5-236839 | Correction to test case 8.1.6.4.3 |
CR revised to R5-237363 |
TDIA, CATT | 38.523-1 17.4.0 CR#4119 catF | NR_ENDC_SON_MDT_enh-UEConTest, TEI17_Test | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
revised | [WTS] [JSN] |
| R5-237321 | Correction to NR logged MDT test case 8.1.6.1.2.6 | CR | ANRITSU LTD | 38.523-1 17.4.0 CR#4153 catF | TEI16_Test, NR_SON_MDT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
agreed | [WTS] [JSN] |
| R5-237358 | Correction to NR5GC MDT testcase 8.1.6.1.2.4 |
CR revision of R5-236591 |
Qualcomm Technologies Int, ANRITSU LTD, Keysight Technologies Inc, Rohde & Schwarz | 38.523-1 17.4.0 CR#40801 catF | TEI16_Test, NR_SON_MDT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
agreed | [WTS] [JSN] |
| R5-237359 | Correction to NR5GC MDT testcase 8.1.6.1.2.5 |
CR revision of R5-236592 |
Qualcomm Technologies Int, ANRITSU LTD, Keysight Technologies Inc, Rohde & Schwarz | 38.523-1 17.4.0 CR#40811 catF | TEI16_Test, NR_SON_MDT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
agreed | [WTS] [JSN] |
| R5-237360 | Correction to NR5GC MDT testcase 8.1.6.1.2.12 |
CR revision of R5-236598 |
Qualcomm Technologies Int, Qualcomm Technologies Int, ANRITSU LTD, Keysight Technologies Inc, Rohde & Schwarz | 38.523-1 17.4.0 CR#40831 catF | TEI16_Test, NR_SON_MDT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
agreed | [WTS] [JSN] |
| R5-237361 | Update of test case 8.1.6.1.2.14 for SON_MDT |
CR revision of R5-236638 |
CMCC | 38.523-1 17.4.0 CR#40961 catF | TEI17_Test, NR_ENDC_SON_MDT_enh-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
agreed | [WTS] [JSN] |
| R5-237362 | Correction to SON MDT test case 8.1.6.1.2.16 |
CR revision of R5-236838 |
TDIA, CATT | 38.523-1 17.4.0 CR#41181 catF | TEI17_Test, NR_ENDC_SON_MDT_enh-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
agreed | [WTS] [JSN] |
| R5-237363 | Correction to test case 8.1.6.4.3 |
CR revision of R5-236839 |
TDIA, CATT | 38.523-1 17.4.0 CR#41191 catF | TEI17_Test, NR_ENDC_SON_MDT_enh-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
agreed | [WTS] [JSN] |
| R5-237425 | Update test case 8.1.6.1.3.10 |
CR revision of R5-236459 |
ZTE Corporation | 38.523-1 17.4.0 CR#40641 catF | TEI17_Test, NR_ENDC_SON_MDT_enh-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
agreed | [WTS] [JSN] |
| R5-237426 | Update test case 8.1.6.1.3.11 |
CR revision of R5-236460 |
ZTE Corporation | 38.523-1 17.4.0 CR#40651 catF | TEI17_Test, NR_ENDC_SON_MDT_enh-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
agreed | [WTS] [JSN] |
| R5-237427 | Update test case 8.1.6.1.3.9 |
CR revision of R5-236481 |
ZTE Corporation | 38.523-1 17.4.0 CR#40661 catF | TEI17_Test, NR_ENDC_SON_MDT_enh-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.4.1.6 |
agreed | [WTS] [JSN] |
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