Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-236098 | Correction to FR2 Power level tables for NR CAG test cases |
CR revised to R5-237331 |
Anritsu EMEA Ltd | 38.523-1 17.4.0 CR#4000 catF | TEI16_Test, NG_RAN_PRN_Vertical_LAN-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
revised | [WTS] [JSN] |
| R5-236102 | Correction to FR2 Power level tables for NR slice-based test cases |
CR revised to R5-237332 |
Anritsu EMEA Ltd | 38.523-1 17.4.0 CR#4001 catF | NR_slice-UEConTest, TEI17_Test | Rel-17 |
R5-101 AI: 6.4.4.2 |
revised | [WTS] [JSN] |
| R5-236180 | Correction to eCPSOR TC 6.3.2.5 |
CR revised to R5-237423 |
MediaTek Inc. | 38.523-1 17.4.0 CR#4009 catF | TEI17_Test, eCPSOR_CON-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
revised | [WTS] [JSN] |
| R5-236181 | Correction to eCPSOR TC 6.3.2.6 | CR | MediaTek Inc., Anritsu | 38.523-1 17.4.0 CR#4010 catF | TEI17_Test, eCPSOR_CON-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
| R5-236240 | Correction to several NR tests due to changes in RRC IDLE procedure |
CR revised to R5-237333 |
Anritsu EMEA Ltd | 38.523-1 17.4.0 CR#4020 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
revised | [WTS] [JSN] |
| R5-236447 | Correction to NR5GC testcase 6.3.1.7 |
CR revised to R5-237334 |
ROHDE & SCHWARZ, Qualcomm | 38.523-1 17.4.0 CR#4055 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
revised | [WTS] [JSN] |
| R5-236635 | Update of test case 6.1.2.24 for NR slice |
CR revised to R5-237335 |
CMCC, Anritsu | 38.523-1 17.4.0 CR#4093 catF | NR_slice-UEConTest, TEI17_Test | Rel-17 |
R5-101 AI: 6.4.4.2 |
revised | [WTS] [JSN] |
| R5-236636 | Update of test case 6.4.2.3 for NR slice |
CR revised to R5-237336 |
CMCC, Anritsu | 38.523-1 17.4.0 CR#4094 catF | NR_slice-UEConTest, TEI17_Test | Rel-17 |
R5-101 AI: 6.4.4.2 |
revised | [WTS] [JSN] |
| R5-236966 | Editorial correction to NR NPN TC 6.5.1.1 | CR | Huawei, Hisilicon | 38.523-1 17.4.0 CR#4132 catF | TEI16_Test, NG_RAN_PRN_Vertical_LAN-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
| R5-236967 | Editorial correction to NR SNPN TC 6.5.3.1 | CR | Huawei, Hisilicon | 38.523-1 17.4.0 CR#4133 catF | NG_RAN_PRN_enh_plus_CT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
| R5-236968 | Editorial correction to NR SNPN TC 6.5.3.2 | CR | Huawei, Hisilicon | 38.523-1 17.4.0 CR#4134 catF | NG_RAN_PRN_enh_plus_CT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
| R5-236969 | Editorial correction to NR SNPN TC 6.5.3.3 | CR | Huawei, Hisilicon | 38.523-1 17.4.0 CR#4135 catF | NG_RAN_PRN_enh_plus_CT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
withdrawn | [WTS] [JSN] |
| R5-236970 | Editorial correction to NR SNPN TC 6.5.3.4 | CR | Huawei, Hisilicon | 38.523-1 17.4.0 CR#4136 catF | NG_RAN_PRN_enh_plus_CT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
| R5-236971 | Editorial correction to NR SNPN TC 6.5.3.5 | CR | Huawei, Hisilicon | 38.523-1 17.4.0 CR#4137 catF | NG_RAN_PRN_enh_plus_CT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
| R5-236972 | Correction to NR SNPN TC 6.5.3.8 | CR | Huawei, Hisilicon | 38.523-1 17.4.0 CR#4138 catF | NG_RAN_PRN_enh_plus_CT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
| R5-236973 | Editorial correction to NR SNPN TC 6.5.3.9 | CR | Huawei, Hisilicon | 38.523-1 17.4.0 CR#4139 catF | NG_RAN_PRN_enh_plus_CT-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
| R5-237331 | Correction to FR2 Power level tables for NR CAG test cases |
CR revision of R5-236098 |
Anritsu EMEA Ltd | 38.523-1 17.4.0 CR#40001 catF | TEI16_Test, NG_RAN_PRN_Vertical_LAN-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
| R5-237332 | Correction to FR2 Power level tables for NR slice-based test cases |
CR revision of R5-236102 |
Anritsu EMEA Ltd | 38.523-1 17.4.0 CR#40011 catF | TEI17_Test, NR_slice-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
| R5-237333 | Correction to several NR tests due to changes in RRC IDLE procedure |
CR revision of R5-236240 |
Anritsu EMEA Ltd | 38.523-1 17.4.0 CR#40201 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
| R5-237334 | Correction to NR5GC testcase 6.3.1.7 |
CR revision of R5-236447 |
ROHDE & SCHWARZ, Qualcomm | 38.523-1 17.4.0 CR#40551 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
withdrawn | [WTS] [JSN] |
| R5-237335 | Update of test case 6.1.2.24 for NR slice |
CR revision of R5-236635 |
CMCC, Anritsu | 38.523-1 17.4.0 CR#40931 catF | TEI17_Test, NR_slice-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
| R5-237336 | Update of test case 6.4.2.3 for NR slice |
CR revision of R5-236636 |
CMCC, Anritsu | 38.523-1 17.4.0 CR#40941 catF | TEI17_Test, NR_slice-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
| R5-237423 | Correction to eCPSOR TC 6.3.2.5 |
CR revision of R5-236180 |
MediaTek Inc. | 38.523-1 17.4.0 CR#40091 catF | TEI17_Test, eCPSOR_CON-UEConTest | Rel-17 |
R5-101 AI: 6.4.4.2 |
agreed | [WTS] [JSN] |
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