Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc	Title	Type / Revs	Source	Spec / CR	S/WID	Release	Meeting	Status	Links
R5-168083	Voiding Table 4-1b Note12	CR	MCC TF160	36.523-2 13.2.0 CR#919 catF	TEI8_Test	Rel-13	R5-73 AI: 6.4.4	withdrawn	[WTS] [JSN]
R5-168342	Voiding Table 4-1b Note15 and Note16	CR	MCC TF160, Keysight Technologies UK Ltd	36.523-2 13.2.0 CR#921 catF	TEI8_Test	Rel-13	R5-73 AI: 6.4.4	agreed	[WTS] [JSN]
R5-168386	Adapted applicability for UEPCOP test cases 9.2.1.1.7c, 9.2.3.1.1a and 9.2.3.1.5b.	CR	ROHDE & SCHWARZ, Qualcomm Incorporated, Ericsson	36.523-2 13.2.0 CR#925 catF	TEI10_Test, MTCe-UEPCOP-UEConTest	Rel-13	R5-73 AI: 6.4.4	agreed	[WTS] [JSN]
R5-168392	Correction to add Band 66 Intra-band CA applicability to 36.523-2	CR	Dish Network, Ericsson	36.523-2 13.2.0 CR#926 catF	TEI13_Test	Rel-14	R5-73 AI: 6.4.4	withdrawn	[WTS] [JSN]
R5-168435	CA_66A-66A, CA_66B, CA_66C: Update of CA Physical Layer Baseline Implementation	CR	Ericsson	36.523-2 13.2.0 CR#928 catF	TEI10_Test	Rel-13	R5-73 AI: 6.4.4	withdrawn	[WTS] [JSN]
R5-168437	Voiding Table 4-1b Note12	CR	MCC TF160	36.523-2 13.2.0 CR#929 catF	TEI8_Test	Rel-13	R5-73 AI: 6.4.4	agreed	[WTS] [JSN]
R5-168445	Correction to the applicability of EUTRA PDCP test cases 7.3.5.2 and 7.3.5.3	CR	Keysight Technologies UK Ltd	36.523-2 13.2.0 CR#930 catF	TEI8_Test	Rel-13	R5-73 AI: 6.4.4	withdrawn	[WTS] [JSN]
R5-168458	Updated applicability conditions for eDRX test cases 9.2.4.1.1, 9.2.4.1.2 and 9.2.4.1.3	CR	QUALCOMM Incorporated, MCC TF160	36.523-2 13.2.0 CR#932 catF	TEI13_Test, LTE_extDRX-UEConTest	Rel-13	R5-73 AI: 6.4.4	agreed	[WTS] [JSN]
R5-168606	Correction to applicability for SCM test cases 13.5.4, 13.5.5 and 13.5.6	CR revised to R5-169049	ROHDE & SCHWARZ, Intel Corporation	36.523-2 13.2.0 CR#934 catF	TEI12_Test, SCM_LTE-UEConTest	Rel-13	R5-73 AI: 6.4.4	revised	[WTS] [JSN]
R5-168641	Correction of 36.523-2 Table 4-1a to update the use of E-UTRA FDD and E-UTRA TDD in the condition statements.	CR	Panasonic Corporation, Samsung, MCC TF160	36.523-2 13.2.0 CR#937 catF	TEI8_Test	Rel-13	R5-73 AI: 6.4.4	agreed	[WTS] [JSN]
R5-168720	Editorial Correction to pics declaration	CR	ROHDE & SCHWARZ	36.523-2 13.2.0 CR#938 catF	TEI12_Test	Rel-13	R5-73 AI: 6.4.4	agreed	[WTS] [JSN]
R5-168780	Correction to applicability test condition C266	CR	7LAYERS GmbH	36.523-2 13.2.0 CR#939 catF	TEI13_Test	Rel-13	R5-73 AI: 6.4.4	agreed	[WTS] [JSN]
R5-168783	Correction of test applicability expression for test case 17.4.11.2	CR	7LAYERS GmbH	36.523-2 13.2.0 CR#940 catF	TEI11_Test	Rel-13	R5-73 AI: 6.4.4	agreed	[WTS] [JSN]
R5-168828	Correction to applicability of non-IMS test case 9.3.1.3 for IMS enabled devices	CR revised to R5-169155	ANRITSU LTD	36.523-2 13.2.0 CR#941 catF	TEI8_Test	Rel-13	R5-73 AI: 6.4.4	revised	[WTS] [JSN]
R5-168832	Correction to applicability of loopback mode test cases for IMS enabled devices	CR	ANRITSU LTD	36.523-2 13.2.0 CR#942 catF	TEI8_Test	Rel-13	R5-73 AI: 6.4.4	withdrawn	[WTS] [JSN]
R5-169002	Correction to add Band 66 Intra-band CA applicability to 36.523-2	CR	Dish Network, Ericsson	36.523-2 13.2.0 CR#953 catF	TEI13_Test	Rel-13	R5-73 AI: 6.4.4	agreed	[WTS] [JSN]
R5-169049	Correction to applicability for SCM test cases 13.5.4, 13.5.5 and 13.5.6	CR revision of R5-168606	ROHDE & SCHWARZ, Intel Corporation	36.523-2 13.2.0 CR#9341 catF	TEI12_Test, SCM_LTE-UEConTest	Rel-13	R5-73 AI: 6.4.4	withdrawn	[WTS] [JSN]
R5-169155	Correction to applicability of non-IMS test case 9.3.1.3 for IMS enabled devices	CR revision of R5-168828	ANRITSU LTD	36.523-2 13.2.0 CR#9411 catF	TEI8_Test	Rel-13	R5-73 AI: 6.4.4	withdrawn	[WTS] [JSN]

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