Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-165268 | Voiding Table 4-1b Note 12 | CR | MCC TF160 | 36.523-2 13.1.0 CR#883 catF | TEI8_Test | Rel-13 |
R5-72 AI: 6.4.4 |
withdrawn | [WTS] [JSN] |
| R5-165354 | Correction to the applicability of Rel-11 eMBMS_CA test case 17.4.11.2 |
CR revised to R5-165917 |
Keysight Technologies UK Ltd | 36.523-2 13.1.0 CR#885 catF | TEI11_Test | Rel-13 |
R5-72 AI: 6.4.4 |
revised | [WTS] [JSN] |
| R5-165355 | Correction to applicability of loopback mode test cases for IMS enabled devices | CR | Keysight Technologies UK Ltd | 36.523-2 13.1.0 CR#886 catF | TEI8_Test | Rel-13 |
R5-72 AI: 6.4.4 |
agreed | [WTS] [JSN] |
| R5-165452 | Update of MAC test case 7.1.4.3 applicability for UE CAT 1 |
CR revised to R5-165918 |
Qualcomm Incorporated | 36.523-2 13.1.0 CR#896 catF | TEI8_Test | Rel-13 |
R5-72 AI: 6.4.4 |
revised | [WTS] [JSN] |
| R5-165560 | Correction to applicability of Rel-11 SIMTC test cases |
CR revised to R5-165919 |
Keysight Technologies UK Ltd | 36.523-1 13.1.0 CR#3577 catF | TEI11_Test | Rel-13 |
R5-72 AI: 6.4.4 |
revised | [WTS] [JSN] |
| R5-165562 | Correction to the execution guidelines of MO SMS over SGs test cases for IMS enabled devices |
CR revised to R5-166256 |
Keysight Technologies UK Ltd, Qualcomm Incorporated | 36.523-2 13.1.0 CR#899 catF | TEI8_Test | Rel-13 |
R5-72 AI: 6.4.4 |
revised | [WTS] [JSN] |
| R5-165759 | Removing EMM test case 9.2.1.1.30 from TS 36.523-2 | CR | ROHDE & SCHWARZ, Qualcomm Incorporated | 36.523-2 13.1.0 CR#907 catF | TEI10_Test | Rel-13 |
R5-72 AI: 6.4.4 |
agreed | [WTS] [JSN] |
| R5-165805 | Modification of test applicability for TC6.1.2.23 |
CR revised to R5-166328 |
TDIA, CATT, Bureau Veritas | 36.523-2 13.1.0 CR#910 catF | TEI12_Test | Rel-13 |
R5-72 AI: 6.4.4 |
revised | [WTS] [JSN] |
| R5-165864 | Update the applicabity of GERAN test cases for IMS enabled UE | CR | ETSI | 36.523-2 13.1.0 CR#867 catF | TEI8_Test | Rel-13 |
R5-72 AI: 6.4.4 |
withdrawn | [WTS] [JSN] |
| R5-165882 | Correction to applicability of test case 9.2.1.1.2a |
CR revised to R5-166258 |
Anritsu Ltd, Qualcomm Incorporated | 36.523-2 13.1.0 CR#912 catF | TEI8_Test | Rel-13 |
R5-72 AI: 6.4.4 |
revised | [WTS] [JSN] |
| R5-165917 | Correction to the applicability of Rel-11 eMBMS_CA test case 17.4.11.2 |
CR revision of R5-165354 |
Keysight Technologies UK Ltd | 36.523-2 13.1.0 CR#8851 catF | TEI11_Test | Rel-13 |
R5-72 AI: 6.4.4 |
agreed | [WTS] [JSN] |
| R5-165918 | Update of MAC test case 7.1.4.3 applicability for UE CAT 1 |
CR revision of R5-165452 |
Qualcomm Incorporated | 36.523-2 13.1.0 CR#8961 catF | TEI8_Test | Rel-13 |
R5-72 AI: 6.4.4 |
withdrawn | [WTS] [JSN] |
| R5-165919 | Correction to applicability of Rel-11 SIMTC test cases |
CR revision of R5-165560 |
Keysight Technologies UK Ltd | 36.523-1 13.1.0 CR#35771 catF | TEI11_Test | Rel-13 |
R5-72 AI: 6.4.4 |
withdrawn | [WTS] [JSN] |
| R5-165920 | Correction to applicability of Rel-11 SIMTC test cases | CR | Keysight Technologies UK Ltd | 36.523-2 13.1.0 CR#913 catF | TEI11_Test | Rel-13 |
R5-72 AI: 6.4.4 |
agreed | [WTS] [JSN] |
| R5-165976 | Addition of new PICs for Rel11 Capabilities and Update of applicability to Testase 8.2.2.8 |
CR revised to R5-166254 |
Anritsu Ltd, Qualcomm Incorporated | 36.523-2 13.1.0 CR#914 catF | TEI11_Test | Rel-13 |
R5-72 AI: 6.4.4 |
revised | [WTS] [JSN] |
| R5-166254 | Addition of new PICs for Rel11 Capabilities and Update of applicability to Testase 8.2.2.8 |
CR revision of R5-165976 |
Anritsu Ltd, Qualcomm Incorporated | 36.523-2 13.1.0 CR#9141 catF | TEI11_Test | Rel-13 |
R5-72 AI: 6.4.4 |
agreed | [WTS] [JSN] |
| R5-166256 | Correction to the execution guidelines of MO SMS over SGs test cases for IMS enabled devices |
CR revision of R5-165562 |
Keysight Technologies UK Ltd, Qualcomm Incorporated | 36.523-2 13.1.0 CR#8991 catF | TEI8_Test | Rel-13 |
R5-72 AI: 6.4.4 |
agreed | [WTS] [JSN] |
| R5-166257 | Applicabity update of GERAN test cases for IMS enabled UE |
CR revised to R5-166329 |
Qualcomm Incorporated, Keysight Ltd UK | 36.523-2 13.1.0 CR#917 catF | TEI8_Test | Rel-13 |
R5-72 AI: 6.4.4 |
revised | [WTS] [JSN] |
| R5-166258 | Correction to applicability of test case 9.2.1.1.2a |
CR revision of R5-165882 |
Anritsu Ltd, Qualcomm Incorporated | 36.523-2 13.1.0 CR#9121 catF | TEI8_Test | Rel-13 |
R5-72 AI: 6.4.4 |
agreed | [WTS] [JSN] |
| R5-166328 | Modification of test applicability for TC6.1.2.23 |
CR revision of R5-165805 |
TDIA, CATT, Bureau Veritas | 36.523-2 13.1.0 CR#9101 catF | TEI12_Test | Rel-13 |
R5-72 AI: 6.4.4 |
agreed | [WTS] [JSN] |
| R5-166329 | Applicabity update of GERAN test cases for IMS enabled UE |
CR revision of R5-166257 |
Qualcomm Incorporated, Keysight Ltd UK | 36.523-2 13.1.0 CR#9171 catF | TEI8_Test | Rel-13 |
R5-72 AI: 6.4.4 |
agreed | [WTS] [JSN] |
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