Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-162135 Correction to UEPCOP EMM test cases CR MCC TF160 36.523-1 13.0.0 CR#3383 catF TEI12_Test, MTCe-UEPCOP-UEConTest Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162138 Correction to Test Case 9.2.1.2.4 CR

revised to R5-162773

Intel Corporation (UK) Ltd 36.523-1 13.0.0 CR#3385 catF TEI11_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162178 Correction to EMM test case 9.3.1.17 CR Keysight Technologies UK Ltd, Qualcomm Incorporated, MCC TF160 36.523-1 12.9.0 CR#3390 catF TEI8_Test Rel-12 R5-71

AI: 6.4.3.4

withdrawn [WTS] [JSN]
R5-162184 Correction to EMM test case 9.2.1.2.4a for Multi-PDN enabled device CR Keysight Technologies UK, Qualcomm Incorporated, MCC TF160 36.523-1 12.9.0 CR#3391 catF TEI11_Test Rel-12 R5-71

AI: 6.4.3.4

withdrawn [WTS] [JSN]
R5-162198 Correction to EMM test cases 9.2.1.2.2 and 9.2.1.2.4 for Multi-PDN enabled UE CR Keysight Technologies UK, Qualcomm Incorporated, MCC TF160 36.523-1 12.9.0 CR#3393 catF TEI8_Test Rel-12 R5-71

AI: 6.4.3.4

withdrawn [WTS] [JSN]
R5-162202 Correction to EMM test case 9.2.1.1.18 for Multi-PDN enabled device CR Keysight Technologies UK Ltd, Qualcomm Incorporated 36.523-1 12.9.0 CR#3394 catF TEI8_Test Rel-12 R5-71

AI: 6.4.3.4

withdrawn [WTS] [JSN]
R5-162214 Correction to EMM test case 9.2.1.1.26 for Multi-PDN enabled device CR Keysight Technologies UK , Qualcomm Incorporated 36.523-1 12.9.0 CR#3396 catF TEI8_Test Rel-12 R5-71

AI: 6.4.3.4

withdrawn [WTS] [JSN]
R5-162216 Correction to EMM test case 9.2.1.1.2 for Multi-PDN enabled device CR Keysight Technologies UK Ltd, Qualcomm Incorporated 36.523-1 12.9.0 CR#3397 catF TEI8_Test Rel-12 R5-71

AI: 6.4.3.4

withdrawn [WTS] [JSN]
R5-162287 Correction to EMM test case 9.2.2.1.2 for IMS-enabled device CR Keysight Technologies UK Ltd, Qualcomm Incorporated 36.523-1 13.0.0 CR#3398 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162289 Correction to EMM test case 9.2.1.1.18 for Multi-PDN enabled device CR

revised to R5-162774

Keysight Technologies UK Ltd, Qualcomm Incorporated 36.523-1 13.0.0 CR#3399 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162291 Correction to EMM test case 9.2.1.1.2 for Multi-PDN enabled device CR

revised to R5-162775

Keysight Technologies UK, Qualcomm Incorporated 36.523-1 13.0.0 CR#3400 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162292 Correction to EMM test case 9.2.1.1.26 for Multi-PDN enabled device CR

revised to R5-162776

Keysight Technologies UK, Qualcomm Incorporated 36.523-1 13.0.0 CR#3401 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162373 Correction to EMM test cases 9.2.1.2.2 and 9.2.1.2.4 for Multi-PDN enabled UE CR

revised to R5-162777

Keysight Technologies UK, Qualcomm Incorporated, MCC TF160 36.523-1 13.0.0 CR#3409 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162374 Correction to EMM test case 9.2.1.2.4a for Multi-PDN enabled device CR

revised to R5-162778

Keysight Technologies UK, Qualcomm Incorporated, MCC TF160 36.523-1 13.0.0 CR#3410 catF TEI11_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162375 Correction to EMM test case 9.3.1.17 CR

revised to R5-162779

Keysight Technologies UK, Qualcomm Incorporated, MCC TF160 36.523-1 13.0.0 CR#3411 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162376 Correction to EMM test case 9.2.3.2.3 for IMS-enabled UE CR

revised to R5-162780

Keysight Technologies UK Ltd, Qualcomm Incorporated 36.523-1 13.0.0 CR#3412 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162377 Correction to EMM test case 9.2.1.1.19 CR

revised to R5-162781

Keysight Technologies UK, MCC TF160 36.523-1 13.0.0 CR#3413 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162378 Correction to EMM test case 9.2.3.1.25 CR

revised to R5-162782

Keysight Technologies UK, MCC TF160 36.523-1 13.0.0 CR#3414 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162386 Correction of EMM test cases 9.2.1.1.1, 9.2.1.1.1a for Multi-PDN UE CR Qualcomm Incorporated, Keysight Technologies UK, MCC TF160 36.523-1 12.9.0 CR#3420 catF TEI8_Test Rel-12 R5-71

AI: 6.4.3.4

withdrawn [WTS] [JSN]
R5-162387 Correction of EMM test cases 9.2.1.2.1, 9.2.3.2.2 for Multi-PDN UE CR Qualcomm Incorporated, Keysight Technologies UK, MCC TF160 36.523-1 12.9.0 CR#3421 catF TEI8_Test Rel-12 R5-71

AI: 6.4.3.4

withdrawn [WTS] [JSN]
R5-162578 Correction to EMM test cases to refer the generic registration procedure steps CR

revised to R5-162783

Keysight Technologies UK Ltd, MCC TF160 36.523-1 13.0.0 CR#3449 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162635 Correction to EMM test case 9.2.2.2.1 for Multi-PDN enabled UE CR

revised to R5-162784

Keysight Technologies UK Ltd, Qualcomm Incorporated 36.523-1 13.0.0 CR#3462 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162636 Correction to EMM test case 9.2.3.1.5 for Multi-PDN enabled UE CR

revised to R5-162785

Keysight Technologies UK Ltd, Qualcomm Incorporated 36.523-1 13.0.0 CR#3463 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162637 Correction to EMM test case 9.2.1.1.7c to refer the generic registration procedure steps CR

revised to R5-162786

Keysight Technologies UK Ltd, MCC TF160 36.523-1 13.0.0 CR#3464 catF TEI12_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162674 Correction to EMM test case 9.1.2.5 CR ROHDE & SCHWARZ 36.523-1 13.0.0 CR#3467 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162679 Correction to EMM test case 9.1.2.7 CR ROHDE & SCHWARZ 36.523-1 13.0.0 CR#3468 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162686 Correction to EMM test case 9.2.1.1.30 CR

revised to R5-163045

ROHDE & SCHWARZ 36.523-1 13.0.0 CR#3469 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162694 Correction to GCF WI-082 EUTRA EMM Testcase 9.2.1.2.3 with IMS enabled CR

revised to R5-163051

Anritsu Ltd, Qualcomm Incorporated, Keysight Technologies UK 36.523-1 13.0.0 CR#3470 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162696 Correction to GCF WI-82 9.2.3.1.15 and 9.2.3.1.15a with IMS enabled CR Anritsu Ltd., Qualcomm Incorporated 36.523-1 13.0.0 CR#3471 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162697 Correction to EMM test case 9.2.1.1.28 CR

revised to R5-163059

ROHDE & SCHWARZ 36.523-1 13.0.0 CR#3472 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162730 Correction of EMM test cases 9.2.1.2.1, 9.2.3.2.2 for Multi-PDN UE CR

revised to R5-162788

Qualcomm Incorporated, Keysight Technologies UK, MCC TF160 36.523-1 13.0.0 CR#3491 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162731 Correction of EMM test cases 9.2.1.1.1, 9.2.1.1.1a for Multi-PDN UE CR

revised to R5-162787

Qualcomm Incorporated, Keysight Technologies UK, MCC TF160 36.523-1 13.0.0 CR#3492 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

revised [WTS] [JSN]
R5-162773 Correction to Test Case 9.2.1.2.4 CR

revision of R5-162138

Intel Corporation (UK) Ltd 36.523-1 13.0.0 CR#33851 catF TEI11_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162774 Correction to EMM test case 9.2.1.1.18 for Multi-PDN enabled device CR

revision of R5-162289

Keysight Technologies UK Ltd, Qualcomm Incorporated 36.523-1 13.0.0 CR#33991 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162775 Correction to EMM test case 9.2.1.1.2 for Multi-PDN enabled device CR

revision of R5-162291

Keysight Technologies UK, Qualcomm Incorporated 36.523-1 13.0.0 CR#34001 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162776 Correction to EMM test case 9.2.1.1.26 for Multi-PDN enabled device CR

revision of R5-162292

Keysight Technologies UK, Qualcomm Incorporated 36.523-1 13.0.0 CR#34011 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162777 Correction to EMM test cases 9.2.1.2.2 and 9.2.1.2.4 for Multi-PDN enabled UE CR

revision of R5-162373

Keysight Technologies UK, Qualcomm Incorporated, MCC TF160 36.523-1 13.0.0 CR#34091 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162778 Correction to EMM test case 9.2.1.2.4a for Multi-PDN enabled device CR

revision of R5-162374

Keysight Technologies UK, Qualcomm Incorporated, MCC TF160 36.523-1 13.0.0 CR#34101 catF TEI11_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162779 Correction to EMM test case 9.3.1.17 CR

revision of R5-162375

Keysight Technologies UK, Qualcomm Incorporated, MCC TF160 36.523-1 13.0.0 CR#34111 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162780 Correction to EMM test case 9.2.3.2.3 for IMS-enabled UE CR

revision of R5-162376

Keysight Technologies UK Ltd, Qualcomm Incorporated 36.523-1 13.0.0 CR#34121 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162781 Correction to EMM test case 9.2.1.1.19 CR

revision of R5-162377

Keysight Technologies UK, MCC TF160 36.523-1 13.0.0 CR#34131 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162782 Correction to EMM test case 9.2.3.1.25 CR

revision of R5-162378

Keysight Technologies UK, MCC TF160 36.523-1 13.0.0 CR#34141 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162783 Correction to EMM test cases to refer the generic registration procedure steps CR

revision of R5-162578

Keysight Technologies UK Ltd, MCC TF160, Qualcomm Inc. 36.523-1 13.0.0 CR#34491 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162784 Correction to EMM test case 9.2.2.2.1 for Multi-PDN enabled UE CR

revision of R5-162635

Keysight Technologies UK Ltd, Qualcomm Incorporated 36.523-1 13.0.0 CR#34621 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162785 Correction to EMM test case 9.2.3.1.5 for Multi-PDN enabled UE CR

revision of R5-162636

Keysight Technologies UK Ltd, Qualcomm Incorporated 36.523-1 13.0.0 CR#34631 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162786 Correction to EMM test case 9.2.1.1.7c to refer the generic registration procedure steps CR

revision of R5-162637

Keysight Technologies UK Ltd, MCC TF160, Qualcomm Inc. 36.523-1 13.0.0 CR#34641 catF TEI12_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162787 Correction of EMM test cases 9.2.1.1.1, 9.2.1.1.1a for Multi-PDN UE CR

revision of R5-162731

Qualcomm Incorporated, Keysight Technologies UK, MCC TF160 36.523-1 13.0.0 CR#34921 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-162788 Correction of EMM test cases 9.2.1.2.1, 9.2.3.2.2 for Multi-PDN UE CR

revision of R5-162730

Qualcomm Incorporated, Keysight Technologies UK, MCC TF160 36.523-1 13.0.0 CR#34911 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-163045 Correction to EMM test case 9.2.1.1.30 CR

revision of R5-162686

ROHDE & SCHWARZ 36.523-1 13.0.0 CR#34691 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

withdrawn [WTS] [JSN]
R5-163051 Correction to GCF WI-082 EUTRA EMM Testcase 9.2.1.2.3 with IMS enabled CR

revision of R5-162694

Anritsu Ltd, Qualcomm Incorporated, Keysight Technologies UK 36.523-1 13.0.0 CR#34701 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-163058 Correction to EMM test case 9.2.1.1.30 CR ROHDE & SCHWARZ, Qualcomm Inc. 36.523-1 13.0.0 CR#3503 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]
R5-163059 Correction to EMM test case 9.2.1.1.28 CR

revision of R5-162697

ROHDE & SCHWARZ 36.523-1 13.0.0 CR#34721 catF TEI8_Test Rel-13 R5-71

AI: 6.4.3.4

agreed [WTS] [JSN]

52 documents (0.35848116874695 seconds)