Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-244180 | Corrections to test procedure for UUAA-MM |
CR revised to R5-245654 |
QUALCOMM JAPAN LLC. | 38.508-1 18.3.0 CR#3230 catF | TEI17_Test, ID_UAS-UEConTest | Rel-18 |
R5-104 AI: 6.4.1.1 |
revised | [WTS] [JSN] |
| R5-244423 | Updates to test procedure 4.9.44 | CR | MCC TF160 | 38.508-1 18.3.0 CR#3260 catF | TEI17_Test, ID_UAS-UEConTest | Rel-18 |
R5-104 AI: 6.4.1.1 |
withdrawn | [WTS] [JSN] |
| R5-244517 | Addition of a new section to check user plane connectivity with WLAN AP |
CR revised to R5-245524 |
CMCC, Anritsu, R&S, Keysight | 38.508-1 18.3.0 CR#3271 catF | TEI17_Test, NR_ENDC_SON_MDT_enh-UEConTest | Rel-18 |
R5-104 AI: 6.4.1.1 |
revised | [WTS] [JSN] |
| R5-245197 | Correction to the procedure of establishing multiple additional PDN connections in S1 |
CR revised to R5-245655 |
Anritsu EMEA Ltd, Samsung | 38.508-1 18.3.0 CR#3318 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-104 AI: 6.4.1.1 |
revised | [WTS] [JSN] |
| R5-245524 | Addition of a new section to check user plane connectivity with WLAN AP |
CR revision of R5-244517 |
CMCC, Anritsu, R&S, Keysight | 38.508-1 18.3.0 CR#32711 catF | TEI17_Test, NR_ENDC_SON_MDT_enh-UEConTest | Rel-18 |
R5-104 AI: 6.4.1.1 |
withdrawn | [WTS] [JSN] |
| R5-245608 | Allow tester to disable IMS and set Data Centric |
CR revised to R5-245656 |
Huawei, HiSilicon | 38.508-1 18.3.0 CR#3329 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-104 AI: 6.4.1.1 |
revised | [WTS] [JSN] |
| R5-245654 | Corrections to test procedure for UUAA-MM |
CR revision of R5-244180 |
QUALCOMM JAPAN LLC. | 38.508-1 18.3.0 CR#32301 catF | TEI17_Test | Rel-18 |
R5-104 AI: 6.4.1.1 |
agreed | [WTS] [JSN] |
| R5-245655 | Correction to the procedure of establishing multiple additional PDN connections in S1 |
CR revision of R5-245197 |
Anritsu EMEA Ltd, Samsung | 38.508-1 18.3.0 CR#33181 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-104 AI: 6.4.1.1 |
withdrawn | [WTS] [JSN] |
| R5-245656 | Allow tester to disable IMS and set Data Centric |
CR revision of R5-245608 |
Huawei, HiSilicon | 38.508-1 18.3.0 CR#33291 catF | TEI15_Test | Rel-18 |
R5-104 AI: 6.4.1.1 |
agreed | [WTS] [JSN] |
9 documents (0.40928220748901 seconds)