Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R4-1710305 | On RSTD measurement requirement for eNB-IoT | discussion | Qualcomm Incorporated | NB_IOTenh | Rel-14 |
R4-84 AI: 6.3.2.1 |
noted | [WTS] [JSN] | |
| R4-1710314 | Introduction of NB-IoT RSTD measurement requirement rel.14 |
CR revised to R4-1711930 |
Qualcomm Incorporated | 36.133 14.5.0 CR#5172 catB | NB_IOTenh | Rel-14 |
R4-84 AI: 6.3.2.1 |
revised | [WTS] [JSN] |
| R4-1710317 | Introduction of NB-IoT RSTD measurement requirement |
CR revised to R4-1711870 |
Qualcomm Incorporated | 36.133 15.0.0 CR#5174 catA | NB_IOTenh-Perf | Rel-15 |
R4-84 AI: 6.3.2.1 |
agreed | [WTS] [JSN] |
| R4-1710337 | CR on E-CID for eNB-IOT normal coverage |
CR revised to R4-1711873 |
Huawei, HiSilicon | 36.133 14.5.0 CR#5185 catB | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
revised | [WTS] [JSN] |
| R4-1710338 | CR on E-CID for eNB-IOT enhanced coverage |
CR revised to R4-1711874 |
Huawei, HiSilicon | 36.133 14.5.0 CR#5186 catB | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
revised | [WTS] [JSN] |
| R4-1710339 | Test case list for eNB-IOT |
other revised to R4-1711665 |
Huawei, HiSilicon | Rel-14 |
R4-84 AI: 6.3.2.1 |
revised | [WTS] [JSN] | ||
| R4-1710340 | CR for RSTD test case for eNB-IOT positioning in normal coverage |
CR revised to R4-1711666 |
Huawei, HiSilicon | 36.133 14.5.0 CR#5187 catB | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
revised | [WTS] [JSN] |
| R4-1710341 | CR for inter RSTD test case for eNB-IOT positioning in enhanced coverage |
CR revised to R4-1711667 |
Huawei, HiSilicon | 36.133 14.5.0 CR#5188 catB | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
revised | [WTS] [JSN] |
| R4-1710342 | Discussion on RSTD measurement accuracy for eNB-IOT | discussion | Huawei, HiSilicon | Rel-14 |
R4-84 AI: 6.3.2.1 |
noted | [WTS] [JSN] | ||
| R4-1710343 | CR for intra RSTD accuracy for eNB-IOT |
CR revised to R4-1711871 |
Huawei, HiSilicon | 36.133 14.5.0 CR#5189 catF | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
revised | [WTS] [JSN] |
| R4-1710344 | CR for inter RSTD accuracy for eNB-IOT |
CR revised to R4-1711872 |
Huawei, HiSilicon | 36.133 14.5.0 CR#5190 catF | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
revised | [WTS] [JSN] |
| R4-1710354 | CR on E-CID for eNB-IOT normal coverage | CR | Huawei, HiSilicon | 36.133 15.0.0 CR#5200 catA | NB_IOTenh-Perf | Rel-15 |
R4-84 AI: 6.3.2.1 |
withdrawn | [WTS] [JSN] |
| R4-1710355 | CR on E-CID for eNB-IOT enhanced coverage | CR | Huawei, HiSilicon | 36.133 15.0.0 CR#5201 catA | NB_IOTenh-Perf | Rel-15 |
R4-84 AI: 6.3.2.1 |
withdrawn | [WTS] [JSN] |
| R4-1710356 | CR for RSTD test case for eNB-IOT positioning in normal coverage | CR | Huawei, HiSilicon | 36.133 15.0.0 CR#5202 catA | NB_IOTenh-Perf | Rel-15 |
R4-84 AI: 6.3.2.1 |
withdrawn | [WTS] [JSN] |
| R4-1710357 | CR for inter RSTD test case for eNB-IOT positioning in enhanced coverage | CR | Huawei, HiSilicon | 36.133 15.0.0 CR#5203 catA | NB_IOTenh-Perf | Rel-15 |
R4-84 AI: 6.3.2.1 |
withdrawn | [WTS] [JSN] |
| R4-1710358 | CR for intra RSTD accuracy for eNB-IOT | CR | Huawei, HiSilicon | 36.133 15.0.0 CR#5204 catA | NB_IOTenh-Perf | Rel-15 |
R4-84 AI: 6.3.2.1 |
withdrawn | [WTS] [JSN] |
| R4-1710359 | CR for inter RSTD accuracy for eNB-IOT | CR | Huawei, HiSilicon | 36.133 15.0.0 CR#5205 catA | NB_IOTenh-Perf | Rel-15 |
R4-84 AI: 6.3.2.1 |
withdrawn | [WTS] [JSN] |
| R4-1711305 | On RSTD requirements with NB-IoT | discussion | Ericsson | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
noted | [WTS] [JSN] | |
| R4-1711665 | Test case list for eNB-IOT |
other revision of R4-1710339 revised to R4-1711931 |
Huawei, HiSilicon | Rel-14 |
R4-84 AI: 6.3.2.1 |
revised | [WTS] [JSN] | ||
| R4-1711666 | CR for RSTD test case for eNB-IOT positioning in normal coverage |
CR revision of R4-1710340 |
Huawei, HiSilicon | 36.133 14.5.0 CR#51871 catB | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
noted | [WTS] [JSN] |
| R4-1711667 | CR for inter RSTD test case for eNB-IOT positioning in enhanced coverage |
CR revision of R4-1710341 |
Huawei, HiSilicon | 36.133 14.5.0 CR#51881 catB | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
noted | [WTS] [JSN] |
| R4-1711870 | Introduction of NB-IoT RSTD measurement requirement rel.15 |
CR revision of R4-1710317 |
Qualcomm Incorporated | 36.133 15.0.0 CR#51741 catA | NB_IOTenh | Rel-15 |
R4-84 AI: 6.3.2.1 |
withdrawn | [WTS] [JSN] |
| R4-1711871 | CR for intra RSTD accuracy for eNB-IOT |
CR revision of R4-1710343 |
Huawei, HiSilicon | 36.133 14.5.0 CR#51891 catF | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
endorsed | [WTS] [JSN] |
| R4-1711872 | CR for inter RSTD accuracy for eNB-IOT |
CR revision of R4-1710344 |
Huawei, HiSilicon | 36.133 14.5.0 CR#51901 catF | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
endorsed | [WTS] [JSN] |
| R4-1711873 | CR on E-CID for eNB-IOT normal coverage |
CR revision of R4-1710337 |
Huawei, HiSilicon | 36.133 14.5.0 CR#51851 catB | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
noted | [WTS] [JSN] |
| R4-1711874 | CR on E-CID for eNB-IOT enhanced coverage |
CR revision of R4-1710338 |
Huawei, HiSilicon | 36.133 14.5.0 CR#51861 catB | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
noted | [WTS] [JSN] |
| R4-1711930 | Introduction of NB-IoT RSTD measurement requirement |
CR revision of R4-1710314 |
Qualcomm Incorporated | 36.133 14.5.0 CR#51721 catB | NB_IOTenh-Perf | Rel-14 |
R4-84 AI: 6.3.2.1 |
agreed | [WTS] [JSN] |
| R4-1711931 | Test case list for eNB-IOT |
other revision of R4-1711665 |
Huawei, HiSilicon | Rel-14 |
R4-84 AI: 6.3.2.1 |
approved | [WTS] [JSN] |
28 documents (0.40742897987366 seconds)