Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R4-1806227 | ONCG and RMC definitions for slot and subslot RRM testing in LTE |
CR revised to R4-1807942 |
Ericsson | 36.133 15.2.0 CR#5758 catB | LTE_sTTIandPT-Perf | Rel-15 |
R4-87 AI: 6.22.5 |
revised | [WTS] [JSN] |
| R4-1807320 | Test case principle for sTTI |
CR revised to R4-1807943 |
Huawei, HiSilicon | 36.133 15.2.0 CR#5791 catB | LTE_sTTIandPT-Perf | Rel-15 |
R4-87 AI: 6.22.5 |
revised | [WTS] [JSN] |
| R4-1807321 | E-UTRAN FDD – UE Timing Advance Adjustment Delay Test for sTTI and processing time reduction |
CR revised to R4-1807944 |
Huawei, HiSilicon | 36.133 15.2.0 CR#5792 catB | LTE_sTTIandPT-Perf | Rel-15 |
R4-87 AI: 6.22.5 |
revised | [WTS] [JSN] |
| R4-1807322 | E-UTRAN TDD – UE Timing Advance Adjustment Delay Test for sTTI and processing time reduction |
CR revised to R4-1807945 |
Huawei, HiSilicon | 36.133 15.2.0 CR#5793 catB | LTE_sTTIandPT-Perf | Rel-15 |
R4-87 AI: 6.22.5 |
revised | [WTS] [JSN] |
| R4-1807942 | ONCG and RMC definitions for slot and subslot RRM testing in LTE |
CR revision of R4-1806227 |
Ericsson | 36.133 15.2.0 CR#57581 catB | LTE_sTTIandPT-Perf | Rel-15 |
R4-87 AI: 6.22.5 |
revised | [WTS] [JSN] |
| R4-1807943 | Test case principle for sTTI |
CR revision of R4-1807320 |
Huawei, HiSilicon | 36.133 15.2.0 CR#57911 catB | LTE_sTTIandPT-Perf | Rel-15 |
R4-87 AI: 6.22.5 |
revised | [WTS] [JSN] |
| R4-1807944 | E-UTRAN FDD – UE Timing Advance Adjustment Delay Test for sTTI and processing time reduction |
CR revision of R4-1807321 |
Huawei, HiSilicon | 36.133 15.2.0 CR#57921 catB | LTE_sTTIandPT-Perf | Rel-15 |
R4-87 AI: 6.22.5 |
revised | [WTS] [JSN] |
| R4-1807945 | E-UTRAN TDD – UE Timing Advance Adjustment Delay Test for sTTI and processing time reduction |
CR revision of R4-1807322 |
Huawei, HiSilicon | 36.133 15.2.0 CR#57931 catB | LTE_sTTIandPT-Perf | Rel-15 |
R4-87 AI: 6.22.5 |
withdrawn | [WTS] [JSN] |
| R4-1808231 | ONCG and RMC definitions for slot and subslot RRM testing in LTE | CR | Ericsson | 36.133 15.2.0 CR#57582 catB | LTE_sTTIandPT-Perf | Rel-15 |
R4-87 AI: 6.22.5 |
agreed | [WTS] [JSN] |
| R4-1808232 | Test case principle for sTTI | CR | Huawei, HiSilicon | 36.133 15.2.0 CR#57912 catB | LTE_sTTIandPT-Perf | Rel-15 |
R4-87 AI: 6.22.5 |
agreed | [WTS] [JSN] |
| R4-1808233 | E-UTRAN FDD – UE Timing Advance Adjustment Delay Test for sTTI and processing time reduction | CR | Huawei, HiSilicon | 36.133 15.2.0 CR#57922 catB | LTE_sTTIandPT-Perf | Rel-15 |
R4-87 AI: 6.22.5 |
agreed | [WTS] [JSN] |
| R4-1808234 | E-UTRAN TDD – UE Timing Advance Adjustment Delay Test for sTTI and processing time reduction | CR | Huawei, HiSilicon | 36.133 15.2.0 CR#5833 catB | LTE_sTTIandPT-Perf | Rel-15 |
R4-87 AI: 6.22.5 |
agreed | [WTS] [JSN] |
12 documents (0.35492515563965 seconds)