Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R4-163687 | On dynamic range aspect in antenna test range calibration | discussion | Ericsson | AAS_BS_LTE_UTRA-Perf | Rel-13 |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-163749 | TP for TR37.842: Adding uncertainty value to the EIS measurement with Indoor Anechoic Chamber | pCR | Sumitomo Elec. Industries, Ltd | 37.842 2.0.0 |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | ||
| R4-163750 | TP for TR37.842: Adding uncertainty value to the EIRP measurement with Indoor Anechoic Chamber | pCR | Sumitomo Elec. Industries, Ltd | 37.842 2.0.0 |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | ||
| R4-163751 | TP for TR 37.842: Indoor Anechoic Chamber EIRP testing procedure | pCR | Sumitomo Elec. Industries, NTT DOCOMO, NEC | 37.842 2.0.0 |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | ||
| R4-163752 | TP for TR 37.842: Indoor Anechoic Chamber EIS testing procedure | pCR | Sumitomo Elec. Industries, NTT DOCOMO, NEC | 37.842 2.0.0 |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | ||
| R4-163753 | Uncertainty distribution and values for common equipments used in EIRP/EIS test methods | other | Sumitomo Elec. Industries, Ltd |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |||
| R4-163898 | Ambiguous Uncertainty Contributions | discussion | Ericsson | AAS_BS_LTE_UTRA-Perf | Rel-13 |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-163899 | Frequency Range Specific Uncertainty Budgets for AAS | discussion | Ericsson | AAS_BS_LTE_UTRA-Perf | Rel-13 |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-163900 | TP for TR 37.842: Test Method Limitations and Scope | pCR | Ericsson | 37.842 2.0.0 | AAS_BS_LTE_UTRA-Perf |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-163901 | Conducted Uncertainty of Test Equipment | discussion | Ericsson | AAS_BS_LTE_UTRA-Perf | Rel-13 |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-163902 | TP for TR 37.842: Proposed Uncertainty Budget Values for EIRP in CATR | pCR | Ericsson | 37.842 2.0.0 | AAS_BS_LTE_UTRA-Perf |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-163903 | TP for TR 37.842: Proposed Uncertainty Budget Values for EIS in CATR | pCR | Ericsson | 37.842 2.0.0 | AAS_BS_LTE_UTRA-Perf |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-163904 | OTA Test Method Text in TS 37.105 | discussion | Ericsson | AAS_BS_LTE_UTRA-Perf | Rel-13 |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-164253 | Discussion on manufacturer declarations for TAE requirements | discussion | Ericsson | AAS_BS_LTE_UTRA-Perf | Rel-13 |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-164254 | TP for TS 37.145: declarations for TAE requirements | pCR | Ericsson | 37.145-1 0.1.0 | AAS_BS_LTE_UTRA-Perf |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-164255 | TP for TR 37.842: declarations for TAE requirements | pCR | Ericsson | 37.842 2.0.0 | AAS_BS_LTE_UTRA-Perf |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-164285 | EIRP measurement accuracy values | discussion | Huawei |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |||
| R4-164286 | EIS measurement accuracy values | discussion | Huawei |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |||
| R4-164287 | Test tolerance for EIRP and EIS | discussion | Huawei |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |||
| R4-164340 | TP for TR 37.842: Indoor Anechoic Chamber EIRP testing uncertainty value | discussion | NEC | AAS_BS_LTE_UTRA | Rel-13 |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-164341 | TP for TR 37.842: Indoor Anechoic Chamber EIS testing uncertainty value | discussion | NEC | AAS_BS_LTE_UTRA | Rel-13 |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-164342 | Discussion on Plorasiation for EIRP testing | discussion | NEC | AAS_BS_LTE_UTRA | Rel-13 |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-164404 | TP to TR37.842 – Proposed changes/modifications for the Near Field Test Method section | pCR | MVG Industries | 37.842 2.0.0 | AAS_BS_LTE_UTRA |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] | |
| R4-164405 | TP to TR 37.842: Near Field Test Range – OTA sensitivity | pCR | MVG Industries | 37.842 2.0.0 | AAS_BS_LTE_UTRA |
R4-79 AI: 6.2.2.2 |
available | [WTS] [JSN] |
24 documents (0.3532919883728 seconds)