Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-223927 | Correction to EN-DC FR2 RLM tests for PSCell configured with CSI-RS-based RLM RS in DRX including TT |
CR revised to R5-225617 |
Anritsu | 38.533 17.3.1 CR#1839 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
revised | [WTS] [JSN] |
| R5-223965 | Complete 5.7.1.3 including TT analysis results | CR | ROHDE & SCHWARZ | 38.533 17.3.1 CR#1841 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-224467 | Corrections to 5.7.4.x | CR | ROHDE & SCHWARZ | 38.533 17.3.1 CR#1865 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
withdrawn | [WTS] [JSN] |
| R5-224468 | Corrections to 5.6.1.3 and 5.6.1.4 | CR | ROHDE & SCHWARZ | 38.533 17.3.1 CR#1866 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-224469 | Corrections to 5.5.5.1 | CR | ROHDE & SCHWARZ | 38.533 17.3.1 CR#1867 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-224470 | Corrections to 5.5.5.2 | CR | ROHDE & SCHWARZ | 38.533 17.3.1 CR#1868 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-224471 | Corrections to 5.5.5.3 | CR | ROHDE & SCHWARZ | 38.533 17.3.1 CR#1869 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-224647 | Correction to SS-SINR condition in 5.7.3.x | CR | Anritsu | 38.533 17.3.1 CR#1917 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-224649 | Correction to test parameters in 5.6.3.x |
CR revised to R5-225871 |
Anritsu | 38.533 17.3.1 CR#1919 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
revised | [WTS] [JSN] |
| R5-224650 | Correction to test procedure in 5.7.4.x | CR | Anritsu | 38.533 17.3.1 CR#1920 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
withdrawn | [WTS] [JSN] |
| R5-224801 | Update to FR2 L1-RSRP measurement test cases 5.6.3.x | CR | Qualcomm Korea | 38.533 17.3.1 CR#1926 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-224802 | Test Tolerances for FR2 RLM test cases 5.5.1.x |
CR revised to R5-225630 |
Qualcomm Korea | 38.533 17.3.1 CR#1927 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
revised | [WTS] [JSN] |
| R5-224804 | Test Tolerances and test case introduction for FR2 RLM test cases 7.5.1.x | CR | Qualcomm Korea | 38.533 17.3.1 CR#1928 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-224805 | TT analysis update for FR2 RLM test cases 7.5.1.x | CR | Qualcomm Korea | 38.533 17.3.1 CR#1929 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
withdrawn | [WTS] [JSN] |
| R5-225141 | Correction of ENDC FR2 SS-RSRP measurement accuracy test case 5.7.1.1 |
CR revised to R5-225818 |
Ericsson | 38.533 17.3.1 CR#1931 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
revised | [WTS] [JSN] |
| R5-225142 | Correction of ENDC FR2-FR2 SS-RSRP measurement accuracy test case 5.7.1.2 including Test Tolerance |
CR revised to R5-225850 |
Ericsson | 38.533 17.3.1 CR#1932 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
revised | [WTS] [JSN] |
| R5-225143 | Correction of ENDC FR2 SSB based L1-RSRP measurement accuracy test case 5.7.4.1 including Test Tolerance |
CR revised to R5-225631 |
Ericsson | 38.533 17.3.1 CR#1933 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
revised | [WTS] [JSN] |
| R5-225144 | Correction of ENDC FR2 CSI-RS based L1-RSRP measurement accuracy test case 5.7.4.2 including Test Tolerance |
CR revised to R5-225632 |
Ericsson | 38.533 17.3.1 CR#1934 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
revised | [WTS] [JSN] |
| R5-225218 | Updates on 5.7.4.1 test procedure and test requirements |
CR revised to R5-225819 |
Keysight Technologies UK Ltd | 38.533 17.3.1 CR#1949 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
revised | [WTS] [JSN] |
| R5-225228 | Updates on 5.7.4.2 test procedure and test requirements |
CR revised to R5-225820 |
Keysight Technologies UK Ltd | 38.533 17.3.1 CR#1951 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
revised | [WTS] [JSN] |
| R5-225617 | Correction to EN-DC FR2 RLM tests for PSCell configured with CSI-RS-based RLM RS in DRX including TT |
CR revision of R5-223927 |
Anritsu | 38.533 17.3.1 CR#18391 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-225630 | Test Tolerances for FR2 RLM test cases 5.5.1.x |
CR revision of R5-224802 |
Qualcomm Korea | 38.533 17.3.1 CR#19271 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-225631 | Correction of ENDC FR2 SSB based L1-RSRP measurement accuracy test case 5.7.4.1 including Test Tolerance |
CR revision of R5-225143 |
Ericsson | 38.533 17.3.1 CR#19331 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-225632 | Correction of ENDC FR2 CSI-RS based L1-RSRP measurement accuracy test case 5.7.4.2 including Test Tolerance |
CR revision of R5-225144 |
Ericsson | 38.533 17.3.1 CR#19341 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-225818 | Correction of ENDC FR2 SS-RSRP measurement accuracy test case 5.7.1.1 |
CR revision of R5-225141 |
Ericsson | 38.533 17.3.1 CR#19311 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-225819 | Updates on 5.7.4.1 test procedure and test requirements |
CR revision of R5-225218 |
Keysight Technologies UK Ltd | 38.533 17.3.1 CR#19491 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-225820 | Updates on 5.7.4.2 test procedure and test requirements |
CR revision of R5-225228 |
Keysight Technologies UK Ltd | 38.533 17.3.1 CR#19511 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-225850 | Correction of ENDC FR2-FR2 SS-RSRP measurement accuracy test case 5.7.1.2 including Test Tolerance |
CR revision of R5-225142 |
Ericsson | 38.533 17.3.1 CR#19321 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
| R5-225871 | Correction to test parameters in 5.6.3.x |
CR revision of R5-224649 |
Anritsu | 38.533 17.3.1 CR#19191 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.3 |
agreed | [WTS] [JSN] |
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