Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-223984 | Update of EN-DC FR1 TC 4.5.7.1 |
CR revised to R5-225883 |
MediaTek Inc. | 38.533 17.3.1 CR#1849 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-224225 | Correction on test applicability of HST TCs |
CR revised to R5-225815 |
CMCC | 38.533 17.3.1 CR#1863 catF | TEI16_Test, NR_HST-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-224466 | Correction message contents 4.6.4.3 and 4.6.4.4 |
CR revised to R5-225816 |
ROHDE & SCHWARZ | 38.533 17.3.1 CR#1864 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-224542 | Correction to EN-DC FR1 RRM TC 4.5.2.X - interruption |
CR revised to R5-225884 |
Huawei, HiSilicon | 38.533 17.3.1 CR#1899 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-224543 | Correction to EN-DC FR1 RRM TC 4.5.3.X - SCell activation |
CR revised to R5-225885 |
Huawei, HiSilicon | 38.533 17.3.1 CR#1900 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-224544 | Correction to EN-DC FR1 RRM TC 4.5.6.1.2 - BWP switching |
CR revised to R5-225886 |
Huawei, HiSilicon | 38.533 17.3.1 CR#1901 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-224545 | Correction to EN-DC FR1 RRM TC 4.6.4.3 - L1-RSRP non-DRX | CR | Huawei, HiSilicon | 38.533 17.3.1 CR#1902 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
withdrawn | [WTS] [JSN] |
| R5-224546 | Correction to NR HST RRM TC 6.1.1.7 - intra-freq reselection | CR | Huawei, HiSilicon | 38.533 17.3.1 CR#1903 catF | TEI16_Test, NR_HST-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-224637 | Correction to test requirement for SFTD measurement accuracy | CR | Anritsu | 38.533 17.3.1 CR#1914 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-224645 | Correction to measurement delay in 4.6.4.5 | CR | Anritsu | 38.533 17.3.1 CR#1915 catF | TEI16_Test, NR_HST-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-225216 | Clarification on SFTD delay in 4.7.5.1 |
CR revised to R5-225817 |
Keysight Technologies UK Ltd | 38.533 17.3.1 CR#1947 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-225815 | Correction on test applicability of HST TCs |
CR revision of R5-224225 |
CMCC | 38.533 17.3.1 CR#18631 catF | TEI16_Test, NR_HST-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-225816 | Correction message contents 4.6.4.3 and 4.6.4.4 |
CR revision of R5-224466 |
ROHDE & SCHWARZ | 38.533 17.3.1 CR#18641 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-225817 | Clarification on SFTD delay in 4.7.5.1 |
CR revision of R5-225216 |
Keysight Technologies UK Ltd | 38.533 17.3.1 CR#19471 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-225883 | Update of EN-DC FR1 TC 4.5.7.1 |
CR revision of R5-223984 |
MediaTek Inc. | 38.533 17.3.1 CR#18491 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
withdrawn | [WTS] [JSN] |
| R5-225884 | Correction to EN-DC FR1 RRM TC 4.5.2.X - interruption |
CR revision of R5-224542 |
Huawei, HiSilicon | 38.533 17.3.1 CR#18991 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-225885 | Correction to EN-DC FR1 RRM TC 4.5.3.X - SCell activation |
CR revision of R5-224543 |
Huawei, HiSilicon | 38.533 17.3.1 CR#19001 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-225886 | Correction to EN-DC FR1 RRM TC 4.5.6.1.2 - BWP switching |
CR revision of R5-224544 |
Huawei, HiSilicon | 38.533 17.3.1 CR#19011 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
18 documents (0.33142900466919 seconds)