Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
Download results in JSON format
| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-234086 | Correction of test step number and reference for RRM Test Case | CR | Sporton | 38.533 17.7.0 CR#2481 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-234434 | Editorial correction to NR RRM TCs |
CR revised to R5-235713 |
Huawei, HiSilicon | 38.533 17.7.0 CR#2542 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-234435 | Correction to FR1 L1 RSRP relative accuracy TCs with TT |
CR revised to R5-235741 |
Huawei, HiSilicon | 38.533 17.7.0 CR#2543 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-234684 | Update to gap-based measurement reporting tests |
CR revised to R5-235915 |
Qualcomm India Pvt Ltd | 38.533 17.7.0 CR#2568 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-234685 | Update to Random Access applicability |
CR revised to R5-235714 |
Qualcomm India Pvt Ltd | 38.533 17.7.0 CR#2569 catF | 5GS_NR_LTE-UEConTest, TEI15_Test | Rel-17 |
R5-100 AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-234927 | Correction to firstActiveDownlinkBWP-Id for non-contention Random Access test cases | CR | Anritsu | 38.533 17.7.0 CR#2599 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
withdrawn | [WTS] [JSN] |
| R5-234928 | Correction to BWP Switch Delay test cases |
CR revised to R5-235466 |
Anritsu | 38.533 17.7.0 CR#2600 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-234929 | Correction to csi-SSB-ResourceToAddModList for SSB-based CSI-Reporting test cases |
CR revised to R5-235946 |
Anritsu | 38.533 17.7.0 CR#2601 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-235027 | Typo correction for 4.5.2.6 Test purpose |
CR revised to R5-235715 |
ROHDE & SCHWARZ | 38.533 17.7.0 CR#2635 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-235029 | Correction to Test Procedure for CFRA TC 4.3.2.2.4 | CR | ROHDE & SCHWARZ | 38.533 17.7.0 CR#2637 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
withdrawn | [WTS] [JSN] |
| R5-235035 | Editorial changes to correct formatting |
CR revised to R5-235716 |
ROHDE & SCHWARZ | 38.533 17.7.0 CR#2643 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-235036 | Correction to differentiate Searchspace ID and CORESET ID between BWPs | CR | ROHDE & SCHWARZ | 38.533 17.7.0 CR#2644 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
withdrawn | [WTS] [JSN] |
| R5-235107 | TC 4.6.1.2 alignment with SA FR1 test case on DRX configuration | CR | Keysight Technologies UK Ltd | 38.533 17.7.0 CR#2646 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-235115 | Correction to firstActiveDownlinkBWP-Id for non-contention based RA TCs |
CR revised to R5-235717 |
Keysight Technologies UK Ltd, Anritsu | 38.533 17.7.0 CR#2651 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-235465 | Update to gap-based measurement reporting tests |
CR revision of R5-235915 |
Qualcomm India Pvt Ltd | 38.533 17.7.0 CR#25682 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-235466 | Correction to BWP Switch Delay test cases |
CR revision of R5-234928 |
Anritsu | 38.533 17.7.0 CR#26001 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-235713 | Editorial correction to NR RRM TCs |
CR revision of R5-234434 |
Huawei, HiSilicon | 38.533 17.7.0 CR#25421 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-235714 | Update to Random Access applicability |
CR revision of R5-234685 |
Qualcomm India Pvt Ltd | 38.533 17.7.0 CR#25691 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-235715 | Typo correction for 4.5.2.6 Test purpose |
CR revision of R5-235027 |
Rohde & Schwarz | 38.533 17.7.0 CR#26351 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-235716 | Editorial changes to correct formatting |
CR revision of R5-235035 |
ROHDE & SCHWARZ | 38.533 17.7.0 CR#26431 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-235717 | Correction to firstActiveDownlinkBWP-Id for non-contention based RA TCs |
CR revision of R5-235115 |
Keysight Technologies UK Ltd, Anritsu | 38.533 17.7.0 CR#26511 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-235741 | Correction to FR1 L1 RSRP relative accuracy TCs with TT |
CR revision of R5-234435 |
Huawei, HiSilicon | 38.533 17.7.0 CR#25431 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
| R5-235915 | Update to gap-based measurement reporting tests |
CR revision of R5-234684 revised to R5-235465 |
Qualcomm India Pvt Ltd | 38.533 17.7.0 CR#25681 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
revised | [WTS] [JSN] |
| R5-235946 | Correction to csi-SSB-ResourceToAddModList for SSB-based CSI-Reporting test cases |
CR revision of R5-234929 |
Anritsu | 38.533 17.7.0 CR#26011 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.9.1 |
agreed | [WTS] [JSN] |
24 documents (0.34451603889465 seconds)