Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-260369 | Update of Redcap demod test case | CR | Mediatek India Technology Pvt. | 38.521-4 18.9.0 CR#1049 catF | TEI18_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
agreed | [WTS] [JSN] |
| R5-260572 | Addition of 6CC SDR test case |
CR revised to R5-261516 |
QUALCOMM JAPAN LLC. | 38.521-4 18.9.0 CR#1061 catF | 5GS_NR_LTE-UEConTest, TEI15_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
revised | [WTS] [JSN] |
| R5-260573 | Addition of 5CC and 6CC PDSCH Demodulation test case |
CR revised to R5-261517 |
QUALCOMM JAPAN LLC. | 38.521-4 18.9.0 CR#1062 catF | 5GS_NR_LTE-UEConTest, TEI15_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
revised | [WTS] [JSN] |
| R5-260574 | Addition of 6CC CQI test case |
CR revised to R5-261518 |
QUALCOMM JAPAN LLC. | 38.521-4 18.9.0 CR#1063 catF | 5GS_NR_LTE-UEConTest, TEI15_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
revised | [WTS] [JSN] |
| R5-260583 | Correction of UL allocation for eMIMO Type II codebook PMI tests | CR | Rohde & Schwarz | 38.521-4 18.9.0 CR#1065 catF | TEI16_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
agreed | [WTS] [JSN] |
| R5-260585 | Correction of UL allocation for Type II codebook PMI tests | CR | Rohde & Schwarz | 38.521-4 18.9.0 CR#1067 catF | TEI16_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
agreed | [WTS] [JSN] |
| R5-260646 | Update of test frequencies for intra-band non-contiguous EN-DC in chapter 5 of demod test cases |
CR revised to R5-261502 |
Keysight Technologies UK Ltd | 38.521-4 18.9.0 CR#1068 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-110 AI: 5.4.7.1 |
revised | [WTS] [JSN] |
| R5-260657 | Update of test frequencies for intra-band non-contiguous EN-DC in chapter 6 of demod test cases |
CR revised to R5-261503 |
Keysight Technologies UK Ltd | 38.521-4 18.9.0 CR#1069 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-110 AI: 5.4.7.1 |
revised | [WTS] [JSN] |
| R5-260688 | Correction of applicability Table 5.1.1.4-1 | CR | CAICT | 38.521-4 18.9.0 CR#1070 catF | TEI15_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
agreed | [WTS] [JSN] |
| R5-260823 | Typo correction in the test procedure for PMI test cases | CR | Keysight Technologies UK Ltd | 38.521-4 18.9.0 CR#1078 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-110 AI: 5.4.7.1 |
withdrawn | [WTS] [JSN] |
| R5-260863 | Clarification on HST-DPS test scenarios | CR | Keysight Technologies UK Ltd | 38.521-4 18.9.0 CR#1080 catF | TEI17_Test, NR_HST_FR1_enh-UEConTest | Rel-18 |
R5-110 AI: 5.4.7.1 |
withdrawn | [WTS] [JSN] |
| R5-260913 | Update chapter 5 procedures to clarify requirements |
CR revised to R5-261610 |
Keysight Technologies UK Ltd | 38.521-4 18.9.0 CR#1088 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-110 AI: 5.4.7.1 |
revised | [WTS] [JSN] |
| R5-260964 | Typo correction in the test procedure for PMI test cases | CR | Keysight Technologies UK Ltd | 38.521-4 18.9.0 CR#1092 catF | TEI15_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
agreed | [WTS] [JSN] |
| R5-261502 | Update of test frequencies for intra-band non-contiguous EN-DC in chapter 5 of demod test cases |
CR revision of R5-260646 |
Keysight Technologies UK Ltd | 38.521-4 18.9.0 CR#10681 catF | TEI15_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
agreed | [WTS] [JSN] |
| R5-261503 | Update of test frequencies for intra-band non-contiguous EN-DC in chapter 6 of demod test cases |
CR revision of R5-260657 |
Keysight Technologies UK Ltd | 38.521-4 18.9.0 CR#10691 catF | TEI15_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
agreed | [WTS] [JSN] |
| R5-261516 | Addition of 6CC SDR test case |
CR revision of R5-260572 |
QUALCOMM JAPAN LLC. | 38.521-4 18.9.0 CR#10611 catF | TEI15_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
agreed | [WTS] [JSN] |
| R5-261517 | Addition of 5CC and 6CC PDSCH Demodulation test case |
CR revision of R5-260573 |
QUALCOMM JAPAN LLC. | 38.521-4 18.9.0 CR#10621 catF | TEI15_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
agreed | [WTS] [JSN] |
| R5-261518 | Addition of 6CC CQI test case |
CR revision of R5-260574 |
QUALCOMM JAPAN LLC. | 38.521-4 18.9.0 CR#10631 catF | TEI15_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
agreed | [WTS] [JSN] |
| R5-261610 | Update chapter 5 procedures to clarify requirements |
CR revision of R5-260913 |
Keysight Technologies UK Ltd | 38.521-4 18.9.0 CR#10881 catF | TEI15_Test | Rel-18 |
R5-110 AI: 5.4.7.1 |
agreed | [WTS] [JSN] |
19 documents (0.39934611320496 seconds)