Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-253810 | Addition of reference sensitivity for new R15 EN-DC combos within FR1 | CR | KDDI Corporation | 38.521-3 19.0.0 CR#1964 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-254083 | REFSENS NSA - Test points corrections for DC_3A_n77A and DC_3A_n78A | CR | Keysight Technologies UK Ltd | 38.521-3 19.0.0 CR#1969 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-19 |
R5-108 AI: 5.4.6.2 |
withdrawn | [WTS] [JSN] |
| R5-254084 | Editorial - References corrections in test case 7.6B.3.3 | CR | Keysight Technologies UK Ltd | 38.521-3 19.0.0 CR#1970 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-254315 | Addition of reference sensitivity for PC2 DC_66A_n41A |
CR revised to R5-255400 |
ZTE Corporation | 38.521-3 19.0.0 CR#1974 catF | TEI17_Test, ENDC_UE_PC2_R17_NR_TDD-UEConTest | Rel-19 |
R5-108 AI: 5.4.6.2 |
revised | [WTS] [JSN] |
| R5-254317 | Updates on Refsens test case for EN-DC configuration DC_1A-41A_n78A | CR | ZTE Corporation | 38.521-3 19.0.0 CR#1975 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-254330 | Corrections on test requirements for cross band isolation Refsens for DC_7A_n78A | CR | ZTE Corporation | 38.521-3 19.0.0 CR#1978 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-19 |
R5-108 AI: 5.4.6.2 |
withdrawn | [WTS] [JSN] |
| R5-254331 | Corrections on UL Fc frequency for R15 EN-DC configurations for MSD test points | CR | ZTE Corporation, Tejet, SRTC | 38.521-3 19.0.0 CR#1979 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-254332 | Removal of R15 pending configurations for MSD test points for intermodulation interference | CR | ZTE Corporation | 38.521-3 19.0.0 CR#1980 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-254336 | Corrections on cross band isolation Refsens test requirements for PC2 DC_7A_n78A | CR | ZTE Corporation | 38.521-3 19.0.0 CR#1981 catF | TEI17_Test, ENDC_UE_PC2_R17_NR_TDD-UEConTest | Rel-19 |
R5-108 AI: 5.4.6.2 |
withdrawn | [WTS] [JSN] |
| R5-254385 | Editorial correction in maximum input level test case | CR | ROHDE & SCHWARZ | 38.521-3 19.0.0 CR#1982 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-254755 | Addition of reference sensitivity requirements for Rel-15 FR1 2CC EN-DC | CR | Anritsu, Huawei, HiSilicon | 38.521-3 19.0.0 CR#1993 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-254759 | Addition of reference sensitivity requirements for Rel-15 FR1 3CC EN-DC | CR | Anritsu, KDDI Corporation | 38.521-3 19.0.0 CR#1997 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-19 |
R5-108 AI: 5.4.6.2 |
withdrawn | [WTS] [JSN] |
| R5-254795 | Completing several EN-DC configurations including band n40 | CR | Huawei, HiSilicon | 38.521-3 19.0.0 CR#2004 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-255400 | reference sensitivity for PC2 DC_66A_n41A |
CR revision of R5-254315 |
ZTE Corporation | 38.521-3 19.0.0 CR#19741 catF | TEI17_Test | Rel-19 |
R5-108 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
14 documents (0.39634609222412 seconds)