Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-251894 | FR2 MU - PC7 update for ACS and IBB tests in 38.521-3 | CR | Keysight Technologies | 38.521-3 18.6.0 CR#1920 catF | TEI17_Test, NR_redcap_plus_ARCH-UEConTest | Rel-18 |
R5-107 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-252147 | UL harmonic for DC_8A_n77A and DC_8A_n78A not correctly tested - band 8 CBW correction | CR | Keysight Technologies | 38.521-3 18.6.0 CR#1929 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-107 AI: 5.4.6.2 |
withdrawn | [WTS] [JSN] |
| R5-252505 | Update to FR1 inter-band EN-DC REFSENS for Rel-15 |
CR revised to R5-253470 |
Anritsu | 38.521-3 18.6.0 CR#1938 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-107 AI: 5.4.6.2 |
revised | [WTS] [JSN] |
| R5-252509 | Removal of unnecessary test requirement from 7.3B.2.3_1.1 | CR | Anritsu | 38.521-3 18.6.0 CR#1942 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-107 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-252749 | Correction to 7.3B.2.3 for Rel-15 EN-DC configurations |
CR revised to R5-253471 |
Huawei, HiSilicon, Keysight | 38.521-3 18.6.0 CR#1944 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-107 AI: 5.4.6.2 |
revised | [WTS] [JSN] |
| R5-252834 | Updates on 7.3B.2.3.5 for PC2 EN-DC reference sensitivity test requirement table | CR | ZTE Corporation | 38.521-3 18.6.0 CR#1947 catF | TEI17_Test, ENDC_UE_PC2_R17_NR_TDD-UEConTest | Rel-18 |
R5-107 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-252836 | Corrections on 7.3B.2.3_1.1.5 for TT denotation for Rel-15 EN-DC reference sensitivity test requirement table | CR | ZTE Corporation | 38.521-3 18.6.0 CR#1948 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-107 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-252839 | Corrections on 7.3B.2.3_1.1.5 for TT denotation for Rel-17 PC2 EN-DC reference sensitivity test requirement table | CR | ZTE Corporation | 38.521-3 18.6.0 CR#1951 catF | TEI17_Test, ENDC_UE_PC2_R17_NR_TDD-UEConTest | Rel-18 |
R5-107 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-252840 | Corrections on EN-DC Refsens requirements for DC_1A_n28A-n78A and some other configurations | CR | ZTE Corporation | 38.521-3 18.6.0 CR#1952 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-107 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-252841 | Corrections on EN-DC Refsens test requirement for DC_1A_n3A-n78A | CR | ZTE Corporation | 38.521-3 18.6.0 CR#1953 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-107 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-253470 | Update to FR1 inter-band EN-DC REFSENS for Rel-15 |
CR revision of R5-252505 |
Anritsu | 38.521-3 18.6.0 CR#19381 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-107 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-253471 | Correction to 7.3B.2.3 for Rel-15 EN-DC configurations |
CR revision of R5-252749 |
Huawei, HiSilicon, Keysight | 38.521-3 18.6.0 CR#19441 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-107 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
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