Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-250160 | Editorial correction to Reference sensitivity for DC | CR | MediaTek Beijing Inc. | 38.521-3 18.5.0 CR#1878 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-250212 | FR2 MU - General Updates in 38.521-3 Rx test cases | CR | Keysight Technologies | 38.521-3 18.5.0 CR#1881 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-250278 | Editorial correction to DC_14A-66A_n77A PC2 reference sensitivity test requirement | CR | WE Certification Oy, AT&T, FirstNet | 38.521-3 18.5.0 CR#1883 catF | TEI17_Test | Rel-18 |
R5-106 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-250816 | Correction to reference sensitivity for Rel-15 inter-band EN-DC configurations |
CR revised to R5-251560 |
Huawei, HiSilicon | 38.521-3 18.5.0 CR#1899 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-106 AI: 5.4.6.2 |
revised | [WTS] [JSN] |
| R5-250955 | Correction to DL UL allocation in 7.3B.2 for Rel-15 FR1 inter-band EN-DC | CR | Anritsu | 38.521-3 18.5.0 CR#1903 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-250965 | Correction to DL frequency of DC_66A_n77A in 7.3B.2.3 |
CR revised to R5-251688 |
Anritsu | 38.521-3 18.5.0 CR#1907 catF | TEI17_Test, ENDC_UE_PC2_R17_NR_TDD-UEConTest | Rel-18 |
R5-106 AI: 5.4.6.2 |
revised | [WTS] [JSN] |
| R5-251028 | Update for EN-DC Reference sensitivity testing | CR | Rohde & Schwarz, OPPO | 38.521-3 18.5.0 CR#1908 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-251054 | CR for TS 38.521-3 to correct Test BW configuration of DC_5A-7A_n78A MSD |
CR revised to R5-251746 |
Samsung, Anritsu | 38.521-3 18.5.0 CR#1909 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-106 AI: 5.4.6.2 |
revised | [WTS] [JSN] |
| R5-251092 | Corrections on Clause 7.3B.2 for intra-band contiguous EN-DC reference sensitivity | CR | ZTE Corporation | 38.521-3 18.5.0 CR#1914 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-251093 | Updates on Ch7 for UL harmonic and harmonic mixing MSD for DC_3A_n77A and DC_3A_n78A | CR | ZTE Corporation | 38.521-3 18.5.0 CR#1915 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-251094 | Additions on Ch7 for harmonic mixing MSD for DC_5A_n78A |
CR revised to R5-251525 |
ZTE Corporation | 38.521-3 18.5.0 CR#1916 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-106 AI: 5.4.6.2 |
revised | [WTS] [JSN] |
| R5-251095 | Updates on Ch7 for PC2 cross band isloation MSD for DC_2A_n41A | CR | ZTE Corporation | 38.521-3 18.5.0 CR#1917 catF | TEI17_Test | Rel-18 |
R5-106 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-251440 | CR for TS 38.521-3 to correct Test BW configuration of DC_5A-7A_n78A MSD | CR | Samsung, Anritsu | 38.521-3 18.5.0 CR#19092 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-251525 | Additions on Ch7 for harmonic mixing MSD for DC_5A_n78A |
CR revision of R5-251094 |
ZTE Corporation | 38.521-3 18.5.0 CR#19161 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-251560 | Correction to reference sensitivity for Rel-15 inter-band EN-DC configurations |
CR revision of R5-250816 |
Huawei, HiSilicon | 38.521-3 18.5.0 CR#18991 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-251688 | Correction to DL frequency of DC_66A_n77A in 7.3B.2.3 |
CR revision of R5-250965 |
Anritsu | 38.521-3 18.5.0 CR#19071 catF | TEI17_Test | Rel-18 |
R5-106 AI: 5.4.6.2 |
agreed | [WTS] [JSN] |
| R5-251746 | CR for TS 38.521-3 to correct Test BW configuration of DC_5A-7A_n78A MSD |
CR revision of R5-251054 |
Samsung, Anritsu | 38.521-3 18.5.0 CR#19091 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-106 AI: 5.4.6.2 |
revised | [WTS] [JSN] |
17 documents (0.42656803131104 seconds)