Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-232358 | NSA beam correspondence test applicability inconsistent with SA test |
CR revised to R5-233724 |
Keysight Technologies UK Ltd | 38.521-3 17.8.0 CR#1595 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
revised | [WTS] [JSN] |
| R5-232380 | Correction of Spurious emissions for UE co-existence requirement of ENDC | CR | CAICT | 38.521-3 17.8.0 CR#1597 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
withdrawn | [WTS] [JSN] |
| R5-232514 | Update the Initial Conditions of four 6.2B.x TCs | CR | SGS Wireless | 38.521-3 17.8.0 CR#1601 catF | TEI15_Test | Rel-17 |
R5-99 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-232623 | Adding SE Coex Inter band ENDC FR2 UL-MIMO test case | CR | Qualcomm Tech. Netherlands B.V | 38.521-3 17.8.0 CR#1604 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-232753 | Correction to 6.2B.4.1.3 configured output power for EN-DC |
CR revised to R5-233725 |
Huawei, HiSilicon | 38.521-3 17.8.0 CR#1606 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
revised | [WTS] [JSN] |
| R5-232754 | Correction to test ID for PC2 fallback PC3 testing | CR | Huawei, HiSilicon | 38.521-3 17.8.0 CR#1607 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-233001 | Correction to reference of RMC for E-UTRA TDD in FR1 EN-DC test cases | CR | Anritsu | 38.521-3 17.8.0 CR#1612 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-233002 | Correction to 6.2B.4.1.3 and editorial correction to Tx test cases | CR | Anritsu | 38.521-3 17.8.0 CR#1613 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-233003 | Correction to test procedure in FR2 EN-DC Minimum output power test cases | CR | Anritsu | 38.521-3 17.8.0 CR#1614 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
withdrawn | [WTS] [JSN] |
| R5-233025 | Adding time delay to intra-band EN-DC test cases | CR | Huawei, HiSilicon | 38.521-3 17.8.0 CR#1615 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-233028 | Clarification of spurious emsission testing configuration - Part 3 |
CR revised to R5-233545 |
Huawei, HiSilicon | 38.521-3 17.8.0 CR#1616 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
revised | [WTS] [JSN] |
| R5-233168 | Addition of Additional Spurious Emissions FR2 CA test cases | CR | ROHDE & SCHWARZ | 38.521-3 17.8.0 CR#1618 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-233545 | Clarification of spurious emsission testing configuration - Part 3 |
CR revision of R5-233028 |
Huawei, HiSilicon | 38.521-3 17.8.0 CR#16161 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-233724 | NSA beam correspondence test applicability inconsistent with SA test |
CR revision of R5-232358 |
Keysight Technologies UK Ltd | 38.521-3 17.8.0 CR#15951 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-233725 | Correction to 6.2B.4.1.3 configured output power for EN-DC |
CR revision of R5-232753 |
Huawei, HiSilicon | 38.521-3 17.8.0 CR#16061 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
15 documents (0.31475591659546 seconds)