Please enter the search related information in the fields below. Partial information works, e.g. "SP-21
" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501
" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP
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tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
---|---|---|---|---|---|---|---|---|---|
R5-224249 | Correction of Power Class 2 test requirements in 6.2B.1.3.5 for Interband EN-DC FDD and TDD Duplex-mode |
CR revised to R5-225799 |
CAICT | 38.521-3 17.5.0 CR#1406 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
revised | [WTS] [JSN] |
R5-224307 | PC1 MU - General Editor notes update in 38.521-3 FR2 Tx tests |
CR revised to R5-225657 |
Keysight Technologies UK Ltd | 38.521-3 17.5.0 CR#1407 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
revised | [WTS] [JSN] |
R5-224308 | FR2 NSA EVM test case editor notes update | CR | Keysight Technologies UK Ltd | 38.521-3 17.5.0 CR#1408 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-224372 | Replacing the word LTE by E-UTRA in description of exception requirement |
CR revised to R5-225800 |
Sporton, Ericsson | 38.521-3 17.5.0 CR#1411 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
revised | [WTS] [JSN] |
R5-224622 | Addition of test requirement for E-UTRA cell of PC2 UE in 6.2B.4.1 | CR | Anritsu | 38.521-3 17.5.0 CR#1413 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-224651 | Update of AMPR NS_04 for intra band non contiguous EN-DC test case | CR | Ericsson | 38.521-3 17.5.0 CR#1416 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
withdrawn | [WTS] [JSN] |
R5-224653 | Correction of reference to test configuration table for intra band contiguous EN-DC test case | CR | Ericsson | 38.521-3 17.5.0 CR#1417 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-224809 | Editorial correction for 6.2B.1.3 Maximum output power for Inter-band EN-DC within FR1 | CR | TTA | 38.521-3 17.5.0 CR#1418 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-224936 | Corrections on test configuration table in spurious emission band UE co-existence for Rel-15 inter-band EN-DC configuration | CR | ZTE Corporation | 38.521-3 17.5.0 CR#1423 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-224942 | Corrections on general spurious emission test requirements for DC_2A_n5A | CR | ZTE Corporation | 38.521-3 17.5.0 CR#1426 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-225005 | Editorial correction to reference table ID to TC6.2B.1.3 | CR | Bureau Veritas | 38.521-3 17.5.0 CR#1436 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-225006 | Update to test case 6.5B.3.3.2 | CR | Bureau Veritas | 38.521-3 17.5.0 CR#1437 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-225047 | Removal of brackets for DCI format for Tx test cases |
CR revised to R5-225801 |
Ericsson | 38.521-3 17.5.0 CR#1439 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
revised | [WTS] [JSN] |
R5-225105 | Addition of new test case additional spurious for FR2 |
CR revised to R5-225881 |
ROHDE & SCHWARZ | 38.521-3 17.5.0 CR#1440 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
revised | [WTS] [JSN] |
R5-225181 | Alignment of MOP test case 6.2B.1.3 with TS 38.101-3 for for Rel-15 EN-DC TDD-TDD configurations and PC2 | CR | Ericsson | 38.521-3 17.5.0 CR#1442 catF | TEI16_Test, ENDC_UE_PC2_TDD_TDD-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
withdrawn | [WTS] [JSN] |
R5-225182 | Alignment of MOP test case 6.2B.1.3 with TS 38.101-3 for Rel-16 EN-DC FDD-TDD configurations and PC2 | CR | Ericsson | 38.521-3 17.5.0 CR#1443 catF | TEI16_Test, ENDC_UE_PC2_FDD_TDD-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
withdrawn | [WTS] [JSN] |
R5-225195 | Introduction of test section for UL MIMO EN-DC MPR with FR1 and FR2 |
CR revised to R5-225802 |
Ericsson | 38.521-3 16.8.0 CR#1445 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.6.1 |
revised | [WTS] [JSN] |
R5-225196 | Introduction of test section for UL MIMO EN-DC A-MPR with FR1 and FR2 |
CR revised to R5-225803 |
Ericsson | 38.521-3 16.8.0 CR#1446 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.6.1 |
revised | [WTS] [JSN] |
R5-225197 | Introduction of test tase for UL MIMO EN-DC MPR in FR2 |
CR revised to R5-225804 |
Ericsson | 38.521-3 16.8.0 CR#1447 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.6.1 |
revised | [WTS] [JSN] |
R5-225198 | Introduction of test tase for UL MIMO EN-DC A-MPR in FR2 |
CR revised to R5-225805 |
Ericsson | 38.521-3 16.8.0 CR#1448 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.6.1 |
revised | [WTS] [JSN] |
R5-225224 | P-MaxUE-FR1-r15 correction for PC2 ENDC test cases |
CR revised to R5-225806 |
Keysight technologies UK Ltd | 38.521-3 17.5.0 CR#1449 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
revised | [WTS] [JSN] |
R5-225657 | PC1 MU - General Editor notes update in 38.521-3 FR2 Tx tests |
CR revision of R5-224307 |
Keysight Technologies UK Ltd | 38.521-3 17.5.0 CR#14071 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
withdrawn | [WTS] [JSN] |
R5-225799 | Correction of Power Class 2 test requirements in 6.2B.1.3.5 for Interband EN-DC FDD and TDD Duplex-mode |
CR revision of R5-224249 |
CAICT | 38.521-3 17.5.0 CR#14061 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-225800 | Replacing the word LTE by E-UTRA in description of exception requirement |
CR revision of R5-224372 |
Sporton, Ericsson | 38.521-3 17.5.0 CR#14111 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-225801 | Removal of brackets for DCI format for Tx test cases |
CR revision of R5-225047 |
Ericsson | 38.521-3 17.5.0 CR#14391 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-225802 | Introduction of test section for UL MIMO EN-DC MPR with FR1 and FR2 |
CR revision of R5-225195 |
Ericsson | 38.521-3 17.5.0 CR#14451 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-225803 | Introduction of test section for UL MIMO EN-DC A-MPR with FR1 and FR2 |
CR revision of R5-225196 |
Ericsson | 38.521-3 17.5.0 CR#14461 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-225804 | Introduction of test tase for UL MIMO EN-DC MPR in FR2 |
CR revision of R5-225197 |
Ericsson | 38.521-3 17.5.0 CR#14471 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-225805 | Introduction of test tase for UL MIMO EN-DC A-MPR in FR2 |
CR revision of R5-225198 |
Ericsson | 38.521-3 17.5.0 CR#14481 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-225806 | P-MaxUE-FR1-r15 correction for PC2 ENDC test cases |
CR revision of R5-225224 |
Keysight technologies UK Ltd | 38.521-3 17.5.0 CR#14491 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
R5-225881 | Addition of new test case additional spurious for FR2 |
CR revision of R5-225105 |
ROHDE & SCHWARZ | 38.521-3 17.5.0 CR#14401 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
31 documents (0.33392405509949 seconds)