Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-236067 | FR2 MUs - Editor notes updates for Tx test cases in 38.521-3 | CR | Keysight Technologies UK Ltd | 38.521-3 18.0.0 CR#1667 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-236339 | Defined MU and TT for EUTRA and NR UL Switching test case 6.3B.3_1.1 | CR | Keysight Technologies UK Ltd | 38.521-3 18.0.0 CR#1676 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-236340 | Editorial correction in test procedure of NSA ACLR test 6.5B.2.1.3 | CR | Keysight Technologies UK Ltd | 38.521-3 18.0.0 CR#1677 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-236531 | Correction to 6.5B.3.3.2 |
CR revised to R5-237955 |
Huawei, HiSilicon | 38.521-3 18.0.0 CR#1692 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.6.1 |
revised | [WTS] [JSN] |
| R5-236814 | Correction to test condition for test frequency restriction of DC_xA_n28A |
CR revised to R5-237666 |
Anritsu | 38.521-3 18.0.0 CR#1700 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.6.1 |
revised | [WTS] [JSN] |
| R5-237258 | Editors notes update in FR2 UL MIMO test cases |
CR revised to R5-237732 |
ROHDE & SCHWARZ, Keysight Technologies UK Ltd | 38.521-3 18.0.0 CR#1707 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.6.1 |
revised | [WTS] [JSN] |
| R5-237261 | Editorial correction of FR2 spurious emissions test cases | CR | ROHDE & SCHWARZ | 38.521-3 18.0.0 CR#1709 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-237666 | Correction to test condition for test frequency restriction of DC_xA_n28A |
CR revision of R5-236814 |
Anritsu | 38.521-3 18.0.0 CR#17001 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-237732 | Editors notes update in FR2 UL MIMO test cases |
CR revision of R5-237258 |
ROHDE & SCHWARZ, Keysight Technologies UK Ltd | 38.521-3 18.0.0 CR#17071 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
| R5-237955 | Correction to 6.5B.3.3.2 |
CR revision of R5-236531 |
Huawei, HiSilicon | 38.521-3 18.0.0 CR#16921 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.6.1 |
agreed | [WTS] [JSN] |
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