Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-227077 | Definition of TRP grids for spurious emissions for PC1 |
CR revised to R5-227986 |
Anritsu | 38.521-2 17.0.1 CR#843 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.5.3 |
revised | [WTS] [JSN] |
| R5-227233 | Addition of new Annex Q for Difference of relative phase and power errors |
CR revised to R5-228031 |
Keysight technologies UK Ltd | 38.521-2 17.0.1 CR#844 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.5.3 |
revised | [WTS] [JSN] |
| R5-227373 | Editorial clean-up of Pending R15 FR2 CA configs from cl 5 of SA FR2 RF test specification |
CR revised to R5-227766 |
Apple Portugal | 38.521-2 17.0.1 CR#857 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.5.3 |
revised | [WTS] [JSN] |
| R5-227641 | Definition of TRP grids for spurious emissions for PC1 |
CR revision of R5-227986 |
Anritsu | 38.521-2 17.0.1 CR#8432 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.5.3 |
agreed | [WTS] [JSN] |
| R5-227766 | Editorial clean-up of Pending R15 FR2 CA configs from cl 5 of SA FR2 RF test specification |
CR revision of R5-227373 |
Apple Portugal | 38.521-2 17.0.1 CR#8571 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.5.3 |
agreed | [WTS] [JSN] |
| R5-227986 | Definition of TRP grids for spurious emissions for PC1 |
CR revision of R5-227077 revised to R5-227641 |
Anritsu | 38.521-2 17.0.1 CR#8431 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.5.3 |
revised | [WTS] [JSN] |
| R5-228031 | Addition of new Annex Q for Difference of relative phase and power errors |
CR revision of R5-227233 |
Keysight technologies UK Ltd | 38.521-2 17.0.1 CR#8441 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.5.3 |
agreed | [WTS] [JSN] |
7 documents (0.33536911010742 seconds)