Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
Download results in JSON format
| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-222342 | Beam peak search - re-positioning formula correction | CR | Keysight Technologies UK Ltd | 38.521-2 16.11.0 CR#723 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.3 |
agreed | [WTS] [JSN] |
| R5-222478 | Update FR2 TRx MU in 38.521-2 |
CR revised to R5-223617 |
Anritsu | 38.521-2 16.11.0 CR#728 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.3 |
revised | [WTS] [JSN] |
| R5-222483 | Editorial correction in Annex |
CR revised to R5-223824 |
Anritsu | 38.521-2 16.11.0 CR#730 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.3 |
revised | [WTS] [JSN] |
| R5-222552 | Correction of TRP Measurement Grids |
CR revised to R5-223825 |
Keysight Technologies UK Ltd | 38.521-2 16.11.0 CR#734 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.3 |
revised | [WTS] [JSN] |
| R5-222556 | CR on applicability per permitted test method |
CR revised to R5-223826 |
Keysight Technologies UK Ltd | 38.521-2 16.11.0 CR#735 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.3 |
revised | [WTS] [JSN] |
| R5-223039 | Correction to FR2 DL RMCs |
CR revised to R5-223827 |
Apple Portugal | 38.521-2 16.11.0 CR#743 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.3 |
revised | [WTS] [JSN] |
| R5-223041 | Initial introduction of fast spherical coverage test method |
CR revised to R5-223828 |
Apple Portugal | 38.521-2 16.11.0 CR#744 catF | TEI15_Test | Rel-16 |
R5-95-e AI: 5.4.5.3 |
revised | [WTS] [JSN] |
| R5-223042 | Initial introduction of RSRP-B based Rx Peak Beam Search |
CR revised to R5-223829 |
Apple Portugal | 38.521-2 16.11.0 CR#745 catF | TEI15_Test | Rel-16 |
R5-95-e AI: 5.4.5.3 |
revised | [WTS] [JSN] |
| R5-223043 | Initial introduction of Enhanced EIRP measurement method |
CR revised to R5-223830 |
Apple Portugal | 38.521-2 16.11.0 CR#746 catF | TEI15_Test | Rel-16 |
R5-95-e AI: 5.4.5.3 |
revised | [WTS] [JSN] |
| R5-223232 | Correction to A.2.3 and A.3.3 for UL and DL RMCs |
CR revised to R5-223831 |
ZTE Corporation, Anritsu | 38.521-2 16.11.0 CR#751 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.3 |
revised | [WTS] [JSN] |
| R5-223617 | Update FR2 TRx MU in 38.521-2 |
CR revision of R5-222478 |
Anritsu | 38.521-2 16.11.0 CR#7281 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.3 |
agreed | [WTS] [JSN] |
| R5-223824 | Editorial correction in Annex |
CR revision of R5-222483 |
Anritsu | 38.521-2 16.11.0 CR#7301 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.3 |
agreed | [WTS] [JSN] |
| R5-223825 | Correction of TRP Measurement Grids |
CR revision of R5-222552 |
Keysight Technologies UK Ltd | 38.521-2 16.11.0 CR#7341 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.3 |
agreed | [WTS] [JSN] |
| R5-223826 | CR on applicability per permitted test method |
CR revision of R5-222556 |
Keysight Technologies UK Ltd | 38.521-2 16.11.0 CR#7351 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.3 |
agreed | [WTS] [JSN] |
| R5-223827 | Correction to FR2 DL RMCs |
CR revision of R5-223039 |
Apple Portugal | 38.521-2 16.11.0 CR#7431 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.3 |
agreed | [WTS] [JSN] |
| R5-223828 | Initial introduction of fast spherical coverage test method |
CR revision of R5-223041 |
Apple Portugal | 38.521-2 16.11.0 CR#7441 catF | TEI15_Test | Rel-16 |
R5-95-e AI: 5.4.5.3 |
agreed | [WTS] [JSN] |
| R5-223829 | Initial introduction of RSRP-B based Rx Peak Beam Search |
CR revision of R5-223042 |
Apple Portugal | 38.521-2 16.11.0 CR#7451 catF | TEI15_Test | Rel-16 |
R5-95-e AI: 5.4.5.3 |
agreed | [WTS] [JSN] |
| R5-223830 | Initial introduction of Enhanced EIRP measurement method |
CR revision of R5-223043 |
Apple Portugal | 38.521-2 16.11.0 CR#7461 catF | TEI15_Test | Rel-16 |
R5-95-e AI: 5.4.5.3 |
agreed | [WTS] [JSN] |
| R5-223831 | Correction to A.2.3 and A.3.3 for UL and DL RMCs |
CR revision of R5-223232 |
ZTE Corporation, Anritsu | 38.521-2 16.11.0 CR#7511 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.3 |
agreed | [WTS] [JSN] |
19 documents (0.33344006538391 seconds)