Please enter the search related information in the fields below. Partial information works, e.g. "SP-21
" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501
" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP
" gives the same results as "3gpp
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tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
---|---|---|---|---|---|---|---|---|---|
R5-232165 | PC1 - SEM test case update in 38.521-2 | CR | Keysight Technologies UK Ltd | 38.521-2 17.2.0 CR#916 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
R5-232170 | FR2 PC3 - Network Analyzer MU and TT update in 38.521-2 | CR | Keysight Technologies UK Ltd | 38.521-2 17.2.0 CR#918 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
R5-232356 | FR2 OBW CA - Test requirements misaligned with minimum requirements | CR | Keysight Technologies UK Ltd | 38.521-2 17.2.0 CR#919 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
R5-232357 | 1RB allocation increased to accommodate PHR in 2UL CA tests | CR | Keysight Technologies UK Ltd, Ericsson | 38.521-2 17.2.0 CR#920 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
R5-232628 | Update of SE TRP Offsets |
CR revised to R5-233702 |
Keysight Technologies UK Ltd | 38.521-2 17.2.0 CR#927 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
R5-232984 | Definition of MU and requirements for FR2c |
CR revised to R5-233635 |
Anritsu | 38.521-2 17.2.0 CR#932 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
R5-232998 | Correction to test procedure in Minimum output power test cases | CR | Anritsu | 38.521-2 17.2.0 CR#933 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
R5-233027 | Clarification of spurious emsission testing configuration - Part 2 |
CR revised to R5-233544 |
Huawei, HiSilicon | 38.521-2 17.2.0 CR#937 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
R5-233169 | Update of Additional Spurious Emissions CA test cases |
CR revised to R5-233527 |
ROHDE & SCHWARZ | 38.521-2 17.2.0 CR#940 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
R5-233170 | Update of Additional MPR CA test cases |
CR revised to R5-233562 |
ROHDE & SCHWARZ | 38.521-2 17.2.0 CR#941 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
R5-233191 | Update to connection diagram of Spurious Emissions test cases | CR | Bureau Veritas ADT, Qualcomm | 38.521-2 17.2.0 CR#942 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
R5-233223 | Update to test case 6.3.4.3 Relative power tolerance | CR | Ericsson | 38.521-2 17.2.0 CR#948 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
R5-233225 | FR2 Spectrum Emission Mask test procedure update | CR | Keysight Technologies UK Ltd, Apple | 38.521-2 17.2.0 CR#949 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
R5-233527 | Update of Additional Spurious Emissions CA test cases |
CR revision of R5-233169 |
ROHDE & SCHWARZ | 38.521-2 17.2.0 CR#9401 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
R5-233544 | Clarification of spurious emsission testing configuration - Part 2 |
CR revision of R5-233027 |
Huawei, HiSilicon | 38.521-2 17.2.0 CR#9371 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
R5-233562 | Update of Additional MPR CA test cases |
CR revision of R5-233170 |
ROHDE & SCHWARZ | 38.521-2 17.2.0 CR#9411 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
R5-233635 | Definition of MU and requirements for FR2c |
CR revision of R5-232984 |
Anritsu | 38.521-2 17.2.0 CR#9321 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
R5-233702 | Update of SE TRP Offsets |
CR revision of R5-232628 |
Keysight Technologies UK Ltd | 38.521-2 17.2.0 CR#9271 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
18 documents (0.34192395210266 seconds)