Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-230162 | PC1 - ACLR test case update in 38.521-2 |
CR revised to R5-231779 |
Keysight Technologies UK Ltd, Anritsu | 38.521-2 17.1.0 CR#868 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-230163 | PC1 - Min power test case update in 38.521-2 |
CR revised to R5-231866 |
Keysight Technologies UK Ltd, Anritsu | 38.521-2 17.1.0 CR#869 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-230164 | PC1 - MOP test case update in 38.521-2 |
CR revised to R5-231780 |
Keysight Technologies UK Ltd, Anritsu | 38.521-2 17.1.0 CR#870 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-230165 | PC1 - MPR test case update in 38.521-2 |
CR revised to R5-231845 |
Keysight Technologies UK Ltd, Anritsu | 38.521-2 17.1.0 CR#871 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-230166 | PC1 - OBW test case update in 38.521-2 | CR | Keysight Technologies UK Ltd | 38.521-2 17.1.0 CR#872 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
| R5-230168 | PC1 - SEM test case update in 38.521-2 | CR | Keysight Technologies UK Ltd | 38.521-2 17.1.0 CR#874 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
| R5-230169 | PC1 - TX spurious test cases update in 38.521-2 |
CR revised to R5-231846 |
Keysight Technologies UK Ltd, Anritsu | 38.521-2 17.1.0 CR#875 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-230211 | Definition of PC1 MU and TT |
CR revised to R5-231791 |
Anritsu | 38.521-2 17.1.0 CR#878 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-230214 | Correction of RB allocation in MPR and ACLR for PC1 | CR | Anritsu, Keysight Technologies | 38.521-2 17.1.0 CR#879 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-230222 | Update of the spurious emissions test cases |
CR revised to R5-231967 |
ROHDE & SCHWARZ | 38.521-2 17.1.0 CR#880 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-230225 | Update of PC1 MU and TT |
CR revised to R5-231781 |
ROHDE & SCHWARZ, Keysight Technologies | 38.521-2 17.1.0 CR#881 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-230563 | Editorial correction for style of clause title in 6.2.4 and 6.2.5 | CR | CAICT | 38.521-2 17.1.0 CR#882 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-230564 | Editorial correction for content style in 6.5.3.1_1.5 | CR | CAICT | 38.521-2 17.1.0 CR#883 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
| R5-230797 | Correcting reference to BEAM SELECT WAIT TIME definition |
CR revised to R5-231661 |
Keysight Technologies UK Ltd | 38.521-2 17.1.0 CR#887 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-230801 | Removal of Tx beam peak direction reference in TX spherical coverage test procedure |
CR revised to R5-231881 |
Keysight Technologies UK Ltd | 38.521-2 17.1.0 CR#891 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-231244 | Minor updates to UPLF activation in applicable UL CA test procedures | CR | Keysight Technologies UK Ltd | 38.521-2 17.1.0 CR#903 catF | TEI16_Test | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-231251 | Minor updates to UPLF activation in applicable UL CA test procedures | CR | Keysight Technologies UK Ltd | 38.521-2 17.1.0 CR#904 catF | TEI16_Test | Rel-17 |
R5-98 AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
| R5-231303 | Update of MOP with additional requirements | CR | ROHDE & SCHWARZ | 38.521-2 17.1.0 CR#907 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-231323 | Updates to PHR method to avoid Scell drop |
CR revised to R5-231886 |
Keysight Technologies UK Ltd | 38.521-2 17.1.0 CR#909 catF | 5GS_NR_LTE-UEConTest, TEI15_Test | Rel-17 |
R5-98 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-231661 | Correcting reference to BEAM SELECT WAIT TIME definition |
CR revision of R5-230797 |
Keysight Technologies UK Ltd | 38.521-2 17.1.0 CR#8871 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-231779 | PC1 - ACLR test case update in 38.521-2 |
CR revision of R5-230162 |
Keysight Technologies UK Ltd, Anritsu | 38.521-2 17.1.0 CR#8681 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-231780 | PC1 - MOP test case update in 38.521-2 |
CR revision of R5-230164 |
Keysight Technologies UK Ltd, Anritsu | 38.521-2 17.1.0 CR#8701 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-231781 | Update of PC1 MU and TT |
CR revision of R5-230225 |
ROHDE & SCHWARZ, Keysight Technologies | 38.521-2 17.1.0 CR#8811 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-231791 | Definition of PC1 MU and TT |
CR revision of R5-230211 |
Anritsu | 38.521-2 17.1.0 CR#8781 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-231845 | PC1 - MPR test case update in 38.521-2 |
CR revision of R5-230165 |
Keysight Technologies UK Ltd, Anritsu | 38.521-2 17.1.0 CR#8711 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-231846 | PC1 - TX spurious test cases update in 38.521-2 |
CR revision of R5-230169 |
Keysight Technologies UK Ltd, Anritsu | 38.521-2 17.1.0 CR#8751 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-231866 | PC1 - Min power test case update in 38.521-2 |
CR revision of R5-230163 |
Keysight Technologies UK Ltd, Anritsu | 38.521-2 17.1.0 CR#8691 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-231881 | Removal of Tx beam peak direction reference in TX spherical coverage test procedure |
CR revision of R5-230801 |
Keysight Technologies UK Ltd | 38.521-2 17.1.0 CR#8911 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-231886 | Updates to PHR method to avoid Scell drop |
CR revision of R5-231323 |
Keysight Technologies UK Ltd | 38.521-2 17.1.0 CR#9091 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-231967 | Update of the spurious emissions test cases |
CR revision of R5-230222 |
ROHDE & SCHWARZ | 38.521-2 17.1.0 CR#8801 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
30 documents (0.3225679397583 seconds)