Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-222198 | Correction of table numbers in 6.2D.2.5 | CR | CAICT | 38.521-2 16.11.0 CR#720 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-222199 | Correction of Test Environment for UL MIMO MPR test case | CR | CAICT | 38.521-2 16.11.0 CR#721 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-222341 | FR2 SA EVM test case update based on TT analysis | CR | Keysight Technologies UK Ltd | 38.521-2 16.11.0 CR#722 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
| R5-222437 | Rel-15 MPR updates |
CR revised to R5-223814 |
Keysight technologies UK Ltd | 38.521-2 16.11.0 CR#724 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-222443 | Common Uplink Configuration updates for Rel-15 FR2 |
CR revised to R5-223815 |
Keysight technologies UK Ltd | 38.521-2 16.11.0 CR#725 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-222488 | Editorial correction for Tx test cases | CR | Anritsu | 38.521-2 16.11.0 CR#731 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-222496 | Correction to DCI format in singnal quality TCs |
CR revised to R5-223816 |
Anritsu | 38.521-2 16.11.0 CR#732 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-222544 | Update of A-MPR and A-SE test cases | CR | ROHDE & SCHWARZ | 38.521-2 16.11.0 CR#733 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-222879 | Update to FR2 6.2.3 A-MPR | CR | Huawei, HiSilicon, Bureau Veritas | 38.521-2 16.11.0 CR#736 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-222880 | Update to TT of beam correspondance | CR | Huawei, HiSilicon, Bureau Veritas | 38.521-2 16.11.0 CR#737 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
| R5-223030 | Implement test function approach to limit Pcell Power in FR2 UL-CA tests |
CR revised to R5-223817 |
Apple Portugal | 38.521-2 16.11.0 CR#739 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-223142 | Editorial correction to test requirement of FR2 test cases | CR | Huawei, Hisilicon | 38.521-1 17.4.0 CR#1745 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
| R5-223230 | Correction to 6.2.1.1 for multi-band relaxation factors for PC3 UE |
CR revised to R5-223818 |
ZTE Corporation | 38.521-2 16.11.0 CR#750 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-223258 | Correction of FR2 MOP and beam correspondence test cases | CR | ROHDE & SCHWARZ | 38.521-2 16.11.0 CR#752 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-223272 | Change FR2 SEM verification test metric |
CR revised to R5-223640 |
Apple Portugal | 38.521-2 16.11.0 CR#753 catF | TEI15_Test | Rel-16 |
R5-95-e AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-223281 | Implementation of FR2 single carrier Tx beam peak applicability for UL MIMO Tx tests | CR | Qualcomm Finland RFFE Oy | 38.521-2 15.4.0 CR#756 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-15 |
R5-95-e AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
| R5-223283 | Implementation of FR2 single carrier Tx beam peak applicability for UL MIMO Tx tests |
CR revised to R5-223820 |
QUALCOMM JAPAN LLC. | 38.521-2 16.11.0 CR#757 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-223292 | Editorial correction to test requirement of FR2 test cases |
CR revised to R5-223821 |
Huawei, Hisilicon | 38.521-2 16.11.0 CR#761 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-223600 | Update to FR2 UL CA MPR test case 6.2A.2.1 to prevent SCell drop by using UE PHR |
draftCR revised to R5-223647 |
Ericsson | TEI15_Test | Rel-16 |
R5-95-e AI: 5.4.5.1 |
revised | [WTS] [JSN] | |
| R5-223640 | Change FR2 SEM verification test metric |
CR revision of R5-223272 |
Apple Portugal | 38.521-2 16.11.0 CR#7531 catF | TEI15_Test | Rel-16 |
R5-95-e AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
| R5-223647 | Update to FR2 UL CA MPR test case 6.2A.2.1 to prevent SCell drop by using UE PHR |
draftCR revision of R5-223600 |
Ericsson | TEI15_Test | Rel-16 |
R5-95-e AI: 5.4.5.1 |
not pursued | [WTS] [JSN] | |
| R5-223814 | Rel-15 MPR updates |
CR revision of R5-222437 |
Keysight technologies UK Ltd | 38.521-2 16.11.0 CR#7241 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-223815 | Common Uplink Configuration updates for Rel-15 FR2 |
CR revision of R5-222443 |
Keysight technologies UK Ltd | 38.521-2 16.11.0 CR#7251 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-223816 | Correction to DCI format in singnal quality TCs |
CR revision of R5-222496 |
Anritsu | 38.521-2 16.11.0 CR#7321 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-223817 | Implement test function approach to limit Pcell Power in FR2 UL-CA tests |
CR revision of R5-223030 |
Apple Portugal | 38.521-2 16.11.0 CR#7391 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-223818 | Correction to 6.2.1.1 for multi-band relaxation factors for PC3 UE |
CR revision of R5-223230 |
ZTE Corporation | 38.521-2 16.11.0 CR#7501 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-223820 | Implementation of FR2 single carrier Tx beam peak applicability for UL MIMO Tx tests |
CR revision of R5-223283 |
QUALCOMM JAPAN LLC. | 38.521-2 16.11.0 CR#7571 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-223821 | Editorial correction to test requirement of FR2 test cases |
CR revision of R5-223292 |
Huawei, Hisilicon | 38.521-2 16.11.0 CR#7611 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
28 documents (0.33432602882385 seconds)