Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-250140 | Correction to Editor Notes of FR2 TCs |
CR revised to R5-251707 |
CMCC | 38.521-2 18.5.2 CR#1124 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-106 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-250200 | FR2 MU - MU and TT definition for EVM measurement on PUCCH in 38.521-2 | CR | Keysight Technologies | 38.521-2 18.5.2 CR#1125 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-106 AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
| R5-250208 | FR2 MU - MOP CA test cases definition update for PC1 and PC5 |
CR revised to R5-251574 |
Keysight Technologies | 38.521-2 18.5.2 CR#1130 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-106 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-250209 | FR2 MU - MPR CA test cases definition update for PC1 and PC5 | CR | Keysight Technologies | 38.521-2 18.5.2 CR#1131 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-250210 | FR2 MU - Min power CA test cases definition update for PC1 and PC5 |
CR revised to R5-251575 |
Keysight Technologies | 38.521-2 18.5.2 CR#1132 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-106 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-250288 | FR2 - Updates for CA NS 202 and NS 203 in 38.521-2 |
CR revised to R5-251523 |
Keysight Technologies UK Ltd | 38.521-2 18.5.2 CR#1133 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-106 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-250302 | Editorial corrections in test configuration table in FR2 phase continuity test | CR | Keysight Technologies | 38.521-2 18.5.2 CR#1134 catF | TEI17_Test | Rel-18 |
R5-106 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-250938 | Update of EVM test case for PUCCH | CR | Anritsu | 38.521-2 18.5.2 CR#1136 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-250954 | Removal of unnecessary applicability note from TC 6.3.2 | CR | Anritsu | 38.521-2 18.5.2 CR#1138 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-251142 | Correction of ON OFF time mask CA test cases | CR | ROHDE & SCHWARZ | 38.521-2 18.5.2 CR#1141 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-251523 | FR2 - Updates for CA NS 202 and NS 203 in 38.521-2 |
CR revision of R5-250288 |
Keysight Technologies | 38.521-2 18.5.2 CR#11331 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-251574 | FR2 MU - MOP CA test cases definition update for PC1 and PC5 |
CR revision of R5-250208 |
Keysight Technologies | 38.521-2 18.5.2 CR#11301 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-251575 | FR2 MU - Min power CA test cases definition update for PC1 and PC5 |
CR revision of R5-250210 |
Keysight Technologies | 38.521-2 18.5.2 CR#11321 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-251707 | Correction to Editor Notes of FR2 TCs |
CR revision of R5-250140 |
CMCC | 38.521-2 18.5.2 CR#11241 catF | TEI15_Test | Rel-18 |
R5-106 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
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