Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-233817 | New test case 6.3.4.3A Relative power tolerance at fixed target Tx power level | CR | Ericsson | 38.521-2 17.3.0 CR#955 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
| R5-233818 | Addition of test requirement for relative power tolerance inside some TRX test cases |
CR revised to R5-235819 |
Ericsson | 38.521-2 17.3.0 CR#956 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-233973 | FR2c MU - Tx test cases update in 38.521-2 |
CR revised to R5-235747 |
Keysight Technologies UK Ltd, Anritsu | 38.521-2 17.3.0 CR#957 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-233980 | PC1 - SEM test case update in 38.521-2 | CR | Keysight Technologies UK Ltd | 38.521-2 17.3.0 CR#960 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
| R5-233981 | FR2 MU - Absolute power tolerance test update to new Network Analyzer MU value | CR | Keysight Technologies UK Ltd | 38.521-2 17.3.0 CR#961 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-234632 | Removing editors note from spurious emission test case indicating connection diagram FFS | CR | Qualcomm Technologies Ireland | 38.521-2 17.3.0 CR#970 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
withdrawn | [WTS] [JSN] |
| R5-234833 | Clarification of unwanted emission testing configuration - Part 2 |
CR revised to R5-235669 |
Huawei, HiSilicon | 38.521-2 17.3.0 CR#971 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-234893 | Update for FR2c MU |
CR revised to R5-235748 |
Anritsu | 38.521-2 17.3.0 CR#972 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-234894 | Update for transition period of spurious TRP measurement grid |
CR revised to R5-235670 |
Anritsu | 38.521-2 17.3.0 CR#973 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-235042 | Updating FR2 MPR for 2UL CA test case for PC3 | CR | Huawei, HiSilicon | 38.521-2 17.3.0 CR#975 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-235043 | Adding new test case UE maximum output power reduction for CA (3UL CA) for PC3 |
CR revised to R5-235833 |
Huawei, HiSilicon | 38.521-2 17.3.0 CR#976 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-235044 | Adding new test case UE maximum output power reduction for CA (4UL CA) for PC3 |
CR revised to R5-235834 |
Huawei, HiSilicon | 38.521-2 17.3.0 CR#977 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-235144 | Correction of spurious emission UE co-existence for UL CA | CR | ROHDE & SCHWARZ | 38.521-2 17.3.0 CR#980 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-235150 | Editorial correction of EVM test case | CR | ROHDE & SCHWARZ | 38.521-2 17.3.0 CR#981 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-235153 | Update of spurious emissions test cases |
CR revised to R5-235671 |
ROHDE & SCHWARZ, Qualcomm Technologies Ireland | 38.521-2 17.3.0 CR#982 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
revised | [WTS] [JSN] |
| R5-235669 | Clarification of unwanted emission testing configuration - Part 2 |
CR revision of R5-234833 |
Huawei, HiSilicon | 38.521-2 17.3.0 CR#9711 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-235670 | Update for transition period of spurious TRP measurement grid |
CR revision of R5-234894 |
Anritsu | 38.521-2 17.3.0 CR#9731 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-235671 | Update of spurious emissions test cases |
CR revision of R5-235153 |
ROHDE & SCHWARZ, Qualcomm Technologies Ireland | 38.521-2 17.3.0 CR#9821 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-235747 | FR2c MU - Tx test cases update in 38.521-2 |
CR revision of R5-233973 |
Keysight Technologies UK Ltd, Anritsu | 38.521-2 17.3.0 CR#9571 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-235748 | Update for FR2c MU |
CR revision of R5-234893 |
Anritsu | 38.521-2 17.3.0 CR#9721 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-235819 | Addition of test requirement for relative power tolerance inside some TRX test cases |
CR revision of R5-233818 |
Ericsson | 38.521-2 17.3.0 CR#9561 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-235833 | Adding new test case UE maximum output power reduction for CA (3UL CA) for PC3 |
CR revision of R5-235043 |
Huawei, HiSilicon | 38.521-2 17.3.0 CR#9761 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
| R5-235834 | Adding new test case UE maximum output power reduction for CA (4UL CA) for PC3 |
CR revision of R5-235044 |
Huawei, HiSilicon | 38.521-2 17.3.0 CR#9771 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.5.1 |
agreed | [WTS] [JSN] |
23 documents (0.3397159576416 seconds)