Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-232353 | Test configuration table update for NS 46 in A-MPR test | CR | Keysight Technologies UK Ltd | 38.521-1 17.8.0 CR#2212 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-232354 | NS_27 - corrections for 30MHz RBStart for condition A1 |
CR revised to R5-233541 |
Keysight Technologies UK Ltd | 38.521-1 17.8.0 CR#2213 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-232376 | Correction of Spurious emissions for UE co-existence requirement in 6.5D.3_1.2 | CR | CAICT | 38.521-1 17.8.0 CR#2215 catF | TEI16_Test, NR_eMIMO-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
| R5-232377 | Correction of Spurious emissions for UE co-existence requirement of NR FR1 | CR | CAICT | 38.521-1 17.8.0 CR#2216 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
| R5-232444 | Adding UE maximum output power for new NR band n13 | CR | Nokia, Nokia Shanghai Bell | 38.521-1 17.8.0 CR#2226 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-232445 | Adding UE maximum output power reduction for new NR band n13 | CR | Nokia, Nokia Shanghai Bell | 38.521-1 17.8.0 CR#2227 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-232744 | Update of UL MIMO aggregate power TC | CR | Rohde & Schwarz | 38.521-1 17.8.0 CR#2253 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
| R5-232750 | Addition of UL MIMO SEM and NR ACLR test cases for Power Class 1.5 | CR | Huawei, HiSilicon | 38.521-1 17.8.0 CR#2256 catF | TEI16_Test, LTE_NR_B41_Bn41_PC29dBm-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-232751 | Editorial correction of reference table numbers for SUL test cases | CR | Huawei, HiSilicon | 38.521-1 17.8.0 CR#2257 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-232752 | Editorial Update of PC2 fallback PC3 test requirements | CR | Huawei, HiSilicon | 38.521-1 17.8.0 CR#2258 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
| R5-232977 | Adding UE additional maximum output power reduction for new NR band n13 |
CR revised to R5-233524 |
Nokia, Nokia Shanghai Bell | 38.521-1 17.8.0 CR#2272 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-232978 | Adding additional spectrum emission mask requirement for new NR band n13 | CR | Nokia, Nokia Shanghai Bell | 38.521-1 17.8.0 CR#2273 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-232979 | Adding spurious emissions for UE co-existence for new NR band n13 | CR | Nokia, Nokia Shanghai Bell | 38.521-1 17.8.0 CR#2274 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-232980 | Adding additional spurious emissions for new NR band n13 | CR | Nokia, Nokia Shanghai Bell | 38.521-1 17.8.0 CR#2275 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-232997 | Addition of BW condition to 6.5D.2.3 A-SEM for UL MIMO |
CR revised to R5-233542 |
Anritsu | 38.521-1 17.8.0 CR#2280 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-233023 | Removing redundant parameter setting from time mask testing | CR | Huawei, HiSilicon | 38.521-1 17.8.0 CR#2281 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-233026 | Clarification of spurious emsission testing configuration - Part 1 |
CR revised to R5-233543 |
Huawei, HiSilicon | 38.521-1 17.8.0 CR#2282 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-233082 | Updating FR1 test case Additional spectrum emission mask for UL MIMO |
CR revised to R5-233547 |
Huawei, HiSilicon | 38.521-1 17.8.0 CR#2285 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-233083 | Updating test case UTRA ACLR for UL MIMO | CR | Huawei, HiSilicon | 38.521-1 17.8.0 CR#2286 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-233084 | Updating test case AMPR for UL MIMO | CR | Huawei, HiSilicon | 38.521-1 17.8.0 CR#2287 catF | TEI16_Test, NR_eMIMO-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-233085 | Updating test requirement of test case AMPR for UL MIMO | CR | Huawei, HiSilicon | 38.521-1 17.8.0 CR#2288 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-233086 | Updating PUCCH aggregated power tolerance test case for SUL and for MIMO |
CR revised to R5-233548 |
Huawei, HiSilicon, Rohde&Schwarz | 38.521-1 17.8.0 CR#2289 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-233186 | Correction to clauses using void table 5.5A.3-x | CR | Bureau Veritas ADT | 38.521-1 17.8.0 CR#2302 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-233193 | Editorial correction to TC6.2.3 configuration table for NS_06 | CR | Bureau Veritas ADT | 38.521-1 17.8.0 CR#2303 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-233524 | Adding UE additional maximum output power reduction for new NR band n13 |
CR revision of R5-232977 |
Nokia, Nokia Shanghai Bell | 38.521-1 17.8.0 CR#22721 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-233541 | NS_27 - corrections for 30MHz RBStart for condition A1 |
CR revision of R5-232354 |
Keysight Technologies UK Ltd | 38.521-1 17.8.0 CR#22131 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-233542 | Addition of BW condition to 6.5D.2.3 A-SEM for UL MIMO |
CR revision of R5-232997 |
Anritsu | 38.521-1 17.8.0 CR#22801 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-233543 | Clarification of spurious emsission testing configuration - Part 1 |
CR revision of R5-233026 |
Huawei, HiSilicon | 38.521-1 17.8.0 CR#22821 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-233547 | Updating FR1 test case Additional spectrum emission mask for UL MIMO |
CR revision of R5-233082 |
Huawei, HiSilicon | 38.521-1 17.8.0 CR#22851 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-233548 | Updating PUCCH aggregated power tolerance test case for SUL and for MIMO |
CR revision of R5-233086 |
Huawei, HiSilicon, Rohde&Schwarz | 38.521-1 17.8.0 CR#22891 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
30 documents (0.34198904037476 seconds)