Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-224213 Update test procedure of MOP CR

revised to R5-225689

CMCC 38.521-1 17.5.0 CR#1770 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

revised [WTS] [JSN]
R5-224240 Correction of additional tolerance to test requirement of R15 Transmitter power test cases CR

revised to R5-225784

CAICT 38.521-1 17.5.0 CR#1775 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

revised [WTS] [JSN]
R5-224257 Editorial correction to TC 6.5.3.3 CR

revised to R5-225785

Tejet 38.521-1 17.5.0 CR#1782 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

revised [WTS] [JSN]
R5-224281 Corrections to A-MPR test requirements for NS_04 CR

revised to R5-225786

Google Inc. 38.521-1 17.5.0 CR#1787 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

revised [WTS] [JSN]
R5-224293 Requirement correction for ON power in test 6.3D.3 CR Keysight Technologies UK Ltd 38.521-1 17.5.0 CR#1795 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-224294 Test procedure and requirement correction in OBW test 6.5D.1 CR

revised to R5-225787

Keysight Technologies UK Ltd, Huawei, HiSilicon 38.521-1 17.5.0 CR#1796 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

revised [WTS] [JSN]
R5-224295 PCC-SCC Prio in FR1 - p-Max message exception clarification in MOP CA test CR Keysight Technologies UK Ltd 38.521-1 17.5.0 CR#1797 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-224296 PCC-SCC Prio in FR1 - p-Max message exception clarification in MPR CA test CR Keysight Technologies UK Ltd 38.521-1 17.5.0 CR#1798 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-224297 PCC-SCC Prio in FR1 - p-Max message exception clarification in OBW CA test CR Keysight Technologies UK Ltd 38.521-1 17.5.0 CR#1799 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-224298 PCC-SCC Prio in FR1 - p-Max message exception clarification in SEM CA test CR Keysight Technologies UK Ltd 38.521-1 17.5.0 CR#1800 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-224299 PCC-SCC Prio in FR1 - p-Max message exception clarification in spurious emissions CA test CR Keysight Technologies UK Ltd 38.521-1 17.5.0 CR#1801 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-224829 Update to 6.2D.3 to align NS_04 test configuration with 6.2.3 CR

revised to R5-225788

Huawei, HiSilicon 38.521-1 17.5.0 CR#1831 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

revised [WTS] [JSN]
R5-224830 Update configuration table of 6.5D.2.3 to refer to AMPR CR Huawei, HiSilicon 38.521-1 17.5.0 CR#1832 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-224831 Update to SEM for CA CR Huawei, HiSilicon 38.521-1 17.5.0 CR#1833 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-224832 Update to SEM for SUL CR Huawei, HiSilicon 38.521-1 17.5.0 CR#1834 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-224935 Corrections on requirements of A-MPR for NS_05 and NS_05U CR ZTE Corporation 38.521-1 17.5.0 CR#1859 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-225003 Editorial correction to UTRA ACLR test cases CR Bureau Veritas 38.521-1 17.5.0 CR#1865 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-225035 Update to UE coexistence requirements for single bands n7 and n79 CR Apple Portugal 38.521-1 17.5.0 CR#1870 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-225064 Updating test configurations for SUL test cases CR Huawei, Hisilicon 38.521-1 17.5.0 CR#1875 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-225066 Updating Additional emission test cases for NS_xxU CR

revised to R5-225789

Huawei, Hisilicon 38.521-1 17.5.0 CR#1876 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

revised [WTS] [JSN]
R5-225068 Correction to AMPR test requirement for NS_04 CR Huawei, Hisilicon 38.521-1 17.5.0 CR#1877 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-225069 Updating structure of clause 6.3C.3 Transmit ON/OFF time mask for SUL CR Huawei, Hisilicon 38.521-1 17.5.0 CR#1878 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-225071 Updating test case 6.3.3.2 General ON/OFF time mask CR Huawei, Hisilicon 38.521-1 17.5.0 CR#1880 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-225115 Correction of UL MIMO A-MPR test case CR

revised to R5-225790

ROHDE & SCHWARZ 38.521-1 17.5.0 CR#1899 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

revised [WTS] [JSN]
R5-225689 Update test procedure of MOP CR

revision of R5-224213

CMCC 38.521-1 17.5.0 CR#17701 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-225784 Correction of additional tolerance to test requirement of R15 Transmitter power test cases CR

revision of R5-224240

CAICT 38.521-1 17.5.0 CR#17751 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-225785 Editorial correction to TC 6.5.3.3 CR

revision of R5-224257

Tejet 38.521-1 17.5.0 CR#17821 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-225786 Corrections to A-MPR test requirements for NS_04 CR

revision of R5-224281

Google Inc. 38.521-1 17.5.0 CR#17871 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-225787 Test procedure and requirement correction in OBW test 6.5D.1 CR

revision of R5-224294

Keysight Technologies UK Ltd, Huawei, HiSilicon 38.521-1 17.5.0 CR#17961 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-225788 Update to 6.2D.3 to align NS_04 test configuration with 6.2.3 CR

revision of R5-224829

Huawei, HiSilicon 38.521-1 17.5.0 CR#18311 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-225789 Updating Additional emission test cases for NS_xxU CR

revision of R5-225066

Huawei, Hisilicon 38.521-1 17.5.0 CR#18761 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-225790 Correction of UL MIMO A-MPR test case CR

revision of R5-225115

ROHDE & SCHWARZ 38.521-1 17.5.0 CR#18991 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-96-e

AI: 5.4.4.1

agreed [WTS] [JSN]

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