Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-222201 | Correction of test metric of out of band emission for UL MIMO | CR | CAICT | 38.521-1 17.4.0 CR#1618 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-222203 | Correction of test applicability of 6.4.2.5 | CR | CAICT | 38.521-1 17.4.0 CR#1620 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-222207 | Moving additional tolerance in 6.2A.3.1.5 and 6.2D.3.5 to end of the section |
CR revised to R5-223804 |
CAICT, Nokia, Nokia Shanghai Bell | 38.521-1 17.4.0 CR#1624 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-222334 | Reference correction in test case 6.5C.4 | CR | Keysight Technologies UK Ltd | 38.521-1 17.4.0 CR#1652 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-222335 | Correction of min value for A-MPR - FR1 - NS_44 - Test ID 17 | CR | Keysight Technologies UK Ltd | 38.521-1 17.4.0 CR#1653 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-222336 | Replace n79C by n77C in test case 6.2A.2.1 | CR | Keysight Technologies UK Ltd | 38.521-1 17.4.0 CR#1654 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-222480 | Correction to time mask test cases |
CR revised to R5-223805 |
Anritsu | 38.521-1 17.4.0 CR#1670 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-222485 | Correction to RB allocation and test requirement in 6.2.3 |
CR revised to R5-223806 |
Anritsu | 38.521-1 17.4.0 CR#1672 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-222495 | Correction to DCI format in 6.4.2.1 |
CR revised to R5-223807 |
Anritsu | 38.521-1 17.4.0 CR#1673 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-222740 | Update for 6.3.3.1 General clause of Tx ON-OFF time mask | CR | Qualcomm Israel Ltd. | 38.523-2 16.11.0 CR#220 catF | TEI16_Test | Rel-16 |
R5-95-e AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
| R5-222741 | Update 6.4.2.1a EVM including symbols with transient period |
CR revised to R5-223872 |
Qualcomm Israel Ltd. | 38.521-1 17.4.0 CR#1698 catF | TEI16_Test | Rel-17 |
R5-95-e AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-222742 | Update AMPR for NS_04 |
CR revised to R5-223808 |
Qualcomm Israel Ltd. | 38.521-1 17.4.0 CR#1699 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-222745 | Update 6.5.3.2 Spurious emissions for UE co-existence | CR | Qualcomm Israel Ltd. | 38.521-1 17.4.0 CR#1700 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-222808 | Correction of A-MPR regions for NS_46 | CR | Keysight Technologies UK Ltd | 38.521-1 17.4.0 CR#1703 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-222878 | Update to MPR test requirements to remove ambiguity of T_LC |
CR revised to R5-223809 |
Huawei, HiSilicon, Bureau Veritas | 38.521-1 17.4.0 CR#1708 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-222993 | Corrections of DCI format for Tx TCs having impact on ETSI EN 301 908-25 | CR | Ericsson | 38.521-1 17.4.0 CR#1724 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-223139 | Correction to 6.2.3 A-MPR PC2 NS_04 test requirements for band n41 | CR | Huawei, Hisilicon | 38.521-1 17.4.0 CR#1742 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
| R5-223140 | Correction to Test Channel Bandwidths for FR1 CA |
CR revised to R5-223810 |
Huawei, Hisilicon | 38.521-1 17.4.0 CR#1743 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-223141 | Editorial correction to test requirement of Aggregate power tolerance for UL MIMO |
CR revised to R5-223811 |
Huawei, Hisilicon | 38.521-1 17.4.0 CR#1744 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-223238 | Update 6.2.3 for additional maximum power reduction |
CR revised to R5-223812 |
ZTE Corporation | 38.521-1 17.4.0 CR#1752 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-223291 | Update for 6.3.3.1 General clause of Tx ON-OFF time mask |
CR revised to R5-223873 |
Qualcomm Israel Ltd. | 38.521-1 17.4.0 CR#1755 catF | TEI16_Test | Rel-17 |
R5-95-e AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-223804 | Moving additional tolerance in 6.2A.3.1.5 and 6.2D.3.5 to end of the section |
CR revision of R5-222207 |
CAICT, Nokia, Nokia Shanghai Bell | 38.521-1 17.4.0 CR#16241 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-223805 | Correction to time mask test cases |
CR revision of R5-222480 |
Anritsu | 38.521-1 17.4.0 CR#16701 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-223806 | Correction to RB allocation and test requirement in 6.2.3 |
CR revision of R5-222485 |
Anritsu | 38.521-1 17.4.0 CR#16721 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-223807 | Correction to DCI format in 6.4.2.1 |
CR revision of R5-222495 |
Anritsu | 38.521-1 17.4.0 CR#16731 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-223808 | Update AMPR for NS_04 |
CR revision of R5-222742 revised to R5-223875 |
Qualcomm Israel Ltd. | 38.521-1 17.4.0 CR#16991 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-223809 | Update to MPR test requirements to remove ambiguity of T_LC |
CR revision of R5-222878 |
Huawei, HiSilicon, Bureau Veritas | 38.521-1 17.4.0 CR#17081 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-223810 | Correction to Test Channel Bandwidths for FR1 CA |
CR revision of R5-223140 |
Huawei, Hisilicon | 38.521-1 17.4.0 CR#17431 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-223811 | Editorial correction to test requirement of Aggregate power tolerance for UL MIMO |
CR revision of R5-223141 |
Huawei, Hisilicon | 38.521-1 17.4.0 CR#17441 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-223812 | Update 6.2.3 for additional maximum power reduction |
CR revision of R5-223238 |
ZTE Corporation | 38.521-1 17.4.0 CR#17521 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-223872 | Update 6.4.2.1a EVM including symbols with transient period |
CR revision of R5-222741 |
Qualcomm Israel Ltd. | 38.521-1 17.4.0 CR#16981 catF | TEI16_Test | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-223873 | Update for 6.3.3.1 General clause of Tx ON-OFF time mask |
CR revision of R5-223291 |
Qualcomm Israel Ltd. | 38.521-1 17.4.0 CR#17551 catF | TEI16_Test | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-223875 | Update AMPR for NS_04 |
CR revision of R5-223808 |
Qualcomm Israel Ltd. | 38.521-1 17.4.0 CR#16992 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
33 documents (0.33544397354126 seconds)