Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-260108 Addition of maximum output power for CA_n78(2A) PC2 CR Nokia 38.521-1 19.3.0 CR#3623 catF TEI17_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260110 Test configuration correction for NS_14 A-MPR CR Nokia 38.521-1 19.3.0 CR#3625 catF TEI16_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260312 UL Tx Switching power boosting support CR

revised to R5-261435

Keysight Technologies UK Ltd 38.521-1 19.3.0 CR#3635 catF TEI16_Test, NR_RF_FR1-UEConTest Rel-19 R5-110

AI: 5.4.4.1

revised [WTS] [JSN]
R5-260313 Correction on test requirements for TxD general ON-OFF time mask test case 6.3G.3.1 CR Keysight Technologies UK Ltd 38.521-1 19.3.0 CR#3636 catF TEI17_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260314 Editorial correction in waveform required in 3Tx test case 6.2L.3.1 CR Keysight Technologies UK Ltd 38.521-1 19.3.0 CR#3637 catF TEI18_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260315 Correction for NS_100 PC2 in FR1 A-MPR test case CR

revised to R5-261436

Keysight Technologies UK Ltd, Anritsu 38.521-1 19.3.0 CR#3638 catF TEI18_Test, HPUE_NR_FR1_FDD_R18-UEConTest Rel-19 R5-110

AI: 5.4.4.1

revised [WTS] [JSN]
R5-260316 Editorial correction of test IDs numbering in A-MPR test 6.2.3 CR Keysight Technologies UK Ltd 38.521-1 19.3.0 CR#3639 catF TEI18_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260317 MPR PC2 coverage for bands n8 and n25 CR Keysight Technologies UK Ltd 38.521-1 19.3.0 CR#3640 catF TEI18_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260446 Update of UE MPR test requirements for 2Tx TxD CR Huawei, HiSilicon 38.521-1 19.3.0 CR#3649 catF TEI17_Test, NR_RF_TxD-UEConTest Rel-19 R5-110

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-260668 Correction to Table 6.1A-1a Common uplink configuration for intra-band contiguous 2UL CA with contiguous RB allocation CR Apple 38.521-1 19.3.0 CR#3670 catF TEI16_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260700 Adding Band n1/n3 configurations for MPR, A-MPR, UTRA ACLR and ASE for Tx Divesity for PC2 UE CR

revised to R5-261634

Huawei, HiSilicon 38.521-1 19.3.0 CR#3673 catF TEI17_Test, NR_PC2_UE_FDD-UEConTest Rel-19 R5-110

AI: 5.4.4.1

revised [WTS] [JSN]
R5-260701 Adding testing for NS_48 and NS_49 for AMPR for UL MIMO CR Huawei, HiSilicon 38.521-1 19.3.0 CR#3674 catF TEI15_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260704 Updating the message contents for In-band emissions CR Huawei, HiSilicon 38.521-1 19.3.0 CR#3675 catF TEI15_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260706 Correction to editorial error in transmit modulation quality for CA CR Huawei, HiSilicon 38.521-1 19.3.0 CR#3677 catF TEI15_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260831 Editorial corrections for CA CR Anritsu 38.521-1 19.3.0 CR#3682 catF TEI15_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260832 Correction to p-Max of 6.2A.2.1 CR

revised to R5-261428

Anritsu 38.521-1 19.3.0 CR#3683 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-19 R5-110

AI: 5.4.4.1

revised [WTS] [JSN]
R5-260833 Correction to slot configuration and TDD-UL-DL-Config of 6.3A.3.2 CR Anritsu, ROHDE & SCHWARZ 38.521-1 19.3.0 CR#3684 catF TEI16_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260834 Correction to T_LOW for TxD CR

revised to R5-261429

Anritsu, Huawei, HiSilicon 38.521-1 19.3.0 CR#3685 catF TEI17_Test, NR_RF_TxD-UEConTest Rel-19 R5-110

AI: 5.4.4.1

revised [WTS] [JSN]
R5-260835 Update of NS_18 A-MPR for n28 CR

revised to R5-261618

Anritsu, Rohde&Schwarz 38.521-1 19.3.0 CR#3686 catF TEI19_Test, NR_n28_PC2_40MHz_CBW-UEConTest Rel-19 R5-110

AI: 5.4.4.1

revised [WTS] [JSN]
R5-260836 Update of NS_18 A-MPR for n109 CR Anritsu 38.521-1 19.3.0 CR#3687 catF TEI18_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260837 Update of NS_46 A-MPR for PC3 CR Anritsu 38.521-1 19.3.0 CR#3688 catF TEI15_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260838 Update of NS_46 A-MPR for PC1 CR Anritsu 38.521-1 19.3.0 CR#3689 catF TEI18_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260839 Update of NS_46 A-MPR for PC2 CR Anritsu 38.521-1 19.3.0 CR#3690 catF TEI18_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260841 Update of NS_100 A-MPR for n3 PC2 CR Anritsu 38.521-1 19.3.0 CR#3691 catF TEI17_Test, NR_PC2_UE_FDD-UEConTest Rel-19 R5-110

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-260842 Update of UL MIMO A-MPR for n8 CR Anritsu 38.521-1 19.3.0 CR#3692 catF TEI18_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260915 Correction to 6.2D.4 Configured transmitted power for ULFPTx CR Huawei, HiSilicon 38.521-1 19.3.0 CR#3699 catF TEI16_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-260916 Correction to 6.2.4 Configured transmitted power for HPUE CR Huawei, HiSilicon 38.521-1 19.3.0 CR#3700 catF TEI17_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-261044 Correction of MPR and A-MPR test cases CR

revised to R5-261646

ROHDE & SCHWARZ 38.521-1 19.3.0 CR#3706 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-19 R5-110

AI: 5.4.4.1

revised [WTS] [JSN]
R5-261045 Correction of Rel-17 UL Tx switching test cases CR

revised to R5-261437

ROHDE & SCHWARZ 38.521-1 19.3.0 CR#3707 catF TEI17_Test, NR_RF_FR1_enh-UEConTest Rel-19 R5-110

AI: 5.4.4.1

revised [WTS] [JSN]
R5-261046 Correction of Rel-16 UL Tx switching test cases CR

revised to R5-261438

ROHDE & SCHWARZ 38.521-1 19.3.0 CR#3708 catF TEI16_Test, NR_RF_FR1-UEConTest Rel-19 R5-110

AI: 5.4.4.1

revised [WTS] [JSN]
R5-261428 Correction to p-Max of 6.2A.2.1 CR

revision of R5-260832

Anritsu 38.521-1 19.3.0 CR#36831 catF TEI15_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-261429 Correction to T_LOW for TxD CR

revision of R5-260834

Anritsu, Huawei, HiSilicon 38.521-1 19.3.0 CR#36851 catF TEI17_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-261435 UL Tx Switching power boosting support CR

revision of R5-260312

Keysight Technologies UK Ltd 38.521-1 19.3.0 CR#36351 catF TEI16_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-261436 Correction for NS_100 PC2 in FR1 A-MPR test case CR

revision of R5-260315

Keysight Technologies UK Ltd, Anritsu 38.521-1 19.3.0 CR#36381 catF TEI18_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-261437 Correction of Rel-17 UL Tx switching test cases CR

revision of R5-261045

ROHDE & SCHWARZ 38.521-1 19.3.0 CR#37071 catF TEI17_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-261438 Correction of Rel-16 UL Tx switching test cases CR

revision of R5-261046

ROHDE & SCHWARZ 38.521-1 19.3.0 CR#37081 catF TEI16_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-261618 Update of NS_18 A-MPR for n28 CR

revision of R5-260835

Anritsu, Rohde&Schwarz 38.521-1 19.3.0 CR#36861 catF TEI19_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-261634 Adding Band n1/n3 configurations for MPR, A-MPR, UTRA ACLR and ASE for Tx Divesity for PC2 UE CR

revision of R5-260700

Huawei, HiSilicon 38.521-1 19.3.0 CR#36731 catF TEI17_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-261646 Correction of MPR and A-MPR test cases CR

revision of R5-261044

ROHDE & SCHWARZ 38.521-1 19.3.0 CR#37061 catF TEI15_Test Rel-19 R5-110

AI: 5.4.4.1

agreed [WTS] [JSN]

39 documents (0.38142013549805 seconds)