Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

Download results in JSON format

tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-242365 Adding transmitter requirements for band n85 CR Nokia 38.521-1 18.2.0 CR#2745 catF TEI17_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-242519 Absolute power control - test requirements correction CR Keysight Technologies 38.521-1 18.2.0 CR#2767 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-242520 EVM in transient periods - test case definition update CR Keysight Technologies 38.521-1 18.2.0 CR#2768 catF TEI16_Test Rel-18 R5-103

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-242918 Correction to initial condition for SUL Tx switching TC 6.3C.3.2.4.1 CR Qualcomm Tech. Netherlands B.V 38.521-1 18.2.0 CR#2783 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-242945 Core spec alignment Missing DMRS configuration restriction for intra ULCA CR Qualcomm Tech. Netherlands B.V 38.521-1 18.2.0 CR#2792 catF TEI16_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243010 Correction to test configuration and test requirements for NS_49 A-MPR CR Anritsu, China Unicom 38.521-1 18.2.0 CR#2796 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243011 Correction to test configuration and test requirements for NS_21 A-MPR CR Anritsu 38.521-1 18.2.0 CR#2797 catF TEI16_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243012 Correction to notes for NS_21 A-SEM CR Anritsu 38.521-1 18.2.0 CR#2798 catF TEI16_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243013 Update for EVM including symbols with transient period CR

revised to R5-243839

Anritsu, Keysight 38.521-1 18.2.0 CR#2799 catF TEI16_Test Rel-18 R5-103

AI: 5.4.4.1

revised [WTS] [JSN]
R5-243126 Adding clarification of trace mode in emission test cases CR Huawei, HiSilicon 38.521-1 18.2.0 CR#2817 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243127 Correction to general RB allocation in 6.1A CR Huawei, HiSilicon 38.521-1 18.2.0 CR#2818 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243128 Cleaning up test applicability for ULFPTx in test cases CR Huawei, HiSilicon 38.521-1 18.2.0 CR#2819 catF TEI16_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243201 Updating AMPR requirements for PC3 UE supporting power boosting CR Huawei, HiSilicon 38.521-1 18.2.0 CR#2831 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243202 Updating AMPR testing for CA_n41A-n79A CR Huawei, HiSilicon 38.521-1 18.2.0 CR#2832 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243256 Correction of spurious emission minimum conformance requirements for UE co-ex to align with RAN4 specs CR Apple, Keysight 38.521-1 18.2.0 CR#2842 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243258 Correction of spurious emission minimum conformance requirements for UE co-ex for inter-band 2UL CR

revised to R5-243649

Apple, Keysight 38.521-1 18.2.0 CR#2844 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

revised [WTS] [JSN]
R5-243295 Corrections on 6.2 and 6.2A for almost contiguous A-MPR requirements for HPUE CR

revised to R5-243818

ZTE Corporation 38.521-1 18.2.0 CR#2850 catF TEI16_Test Rel-18 R5-103

AI: 5.4.4.1

revised [WTS] [JSN]
R5-243296 Corrections on 6.2.3 for UE additional maximum output power reduction requirements CR ZTE Corporation 38.521-1 18.2.0 CR#2851 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243297 Corrections on 6.5.2.2 for UE spectrum emission mask CR ZTE Corporation 38.521-1 18.2.0 CR#2852 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243298 Corrections on 6.5.3.3 for UE additional spurious emissions CR ZTE Corporation 38.521-1 18.2.0 CR#2853 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243299 Corrections on clause 6 for removal of power class capable UE denotation CR ZTE Corporation 38.521-1 18.2.0 CR#2854 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243411 Updates to FR1 RF phase continuity test CR Apple Benelux B.V. 38.521-2 18.2.0 CR#1056 catF TEI17_Test Rel-18 R5-103

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-243447 Updates to FR1 RF phase continuity test CR

revised to R5-243650

Apple Benelux B.V. 38.521-1 18.2.0 CR#2860 catF TEI17_Test Rel-18 R5-103

AI: 5.4.4.1

revised [WTS] [JSN]
R5-243649 Correction of spurious emission minimum conformance requirements for UE co-ex for inter-band 2UL CR

revision of R5-243258

Apple, Keysight 38.521-1 18.2.0 CR#28441 catF TEI15_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243650 Updates to FR1 RF phase continuity test CR

revision of R5-243447

Apple Benelux B.V. 38.521-1 18.2.0 CR#28601 catF TEI17_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243818 Corrections on 6.2 and 6.2A for almost contiguous A-MPR requirements for HPUE CR

revision of R5-243295

ZTE Corporation 38.521-1 18.2.0 CR#28501 catF TEI16_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-243839 Update for EVM including symbols with transient period CR

revision of R5-243013

Anritsu, Keysight Technologies 38.521-1 18.2.0 CR#27991 catF TEI16_Test Rel-18 R5-103

AI: 5.4.4.1

agreed [WTS] [JSN]

27 documents (0.34220290184021 seconds)