Please enter the search related information in the fields below. Partial information works, e.g. "SP-21
" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501
" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP
" gives the same results as "3gpp
".
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tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
---|---|---|---|---|---|---|---|---|---|
R5-242365 | Adding transmitter requirements for band n85 | CR | Nokia | 38.521-1 18.2.0 CR#2745 catF | TEI17_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-242519 | Absolute power control - test requirements correction | CR | Keysight Technologies | 38.521-1 18.2.0 CR#2767 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-242520 | EVM in transient periods - test case definition update | CR | Keysight Technologies | 38.521-1 18.2.0 CR#2768 catF | TEI16_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
R5-242918 | Correction to initial condition for SUL Tx switching TC 6.3C.3.2.4.1 | CR | Qualcomm Tech. Netherlands B.V | 38.521-1 18.2.0 CR#2783 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-242945 | Core spec alignment Missing DMRS configuration restriction for intra ULCA | CR | Qualcomm Tech. Netherlands B.V | 38.521-1 18.2.0 CR#2792 catF | TEI16_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243010 | Correction to test configuration and test requirements for NS_49 A-MPR | CR | Anritsu, China Unicom | 38.521-1 18.2.0 CR#2796 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243011 | Correction to test configuration and test requirements for NS_21 A-MPR | CR | Anritsu | 38.521-1 18.2.0 CR#2797 catF | TEI16_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243012 | Correction to notes for NS_21 A-SEM | CR | Anritsu | 38.521-1 18.2.0 CR#2798 catF | TEI16_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243013 | Update for EVM including symbols with transient period |
CR revised to R5-243839 |
Anritsu, Keysight | 38.521-1 18.2.0 CR#2799 catF | TEI16_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-243126 | Adding clarification of trace mode in emission test cases | CR | Huawei, HiSilicon | 38.521-1 18.2.0 CR#2817 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243127 | Correction to general RB allocation in 6.1A | CR | Huawei, HiSilicon | 38.521-1 18.2.0 CR#2818 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243128 | Cleaning up test applicability for ULFPTx in test cases | CR | Huawei, HiSilicon | 38.521-1 18.2.0 CR#2819 catF | TEI16_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243201 | Updating AMPR requirements for PC3 UE supporting power boosting | CR | Huawei, HiSilicon | 38.521-1 18.2.0 CR#2831 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243202 | Updating AMPR testing for CA_n41A-n79A | CR | Huawei, HiSilicon | 38.521-1 18.2.0 CR#2832 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243256 | Correction of spurious emission minimum conformance requirements for UE co-ex to align with RAN4 specs | CR | Apple, Keysight | 38.521-1 18.2.0 CR#2842 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243258 | Correction of spurious emission minimum conformance requirements for UE co-ex for inter-band 2UL |
CR revised to R5-243649 |
Apple, Keysight | 38.521-1 18.2.0 CR#2844 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-243295 | Corrections on 6.2 and 6.2A for almost contiguous A-MPR requirements for HPUE |
CR revised to R5-243818 |
ZTE Corporation | 38.521-1 18.2.0 CR#2850 catF | TEI16_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-243296 | Corrections on 6.2.3 for UE additional maximum output power reduction requirements | CR | ZTE Corporation | 38.521-1 18.2.0 CR#2851 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243297 | Corrections on 6.5.2.2 for UE spectrum emission mask | CR | ZTE Corporation | 38.521-1 18.2.0 CR#2852 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243298 | Corrections on 6.5.3.3 for UE additional spurious emissions | CR | ZTE Corporation | 38.521-1 18.2.0 CR#2853 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243299 | Corrections on clause 6 for removal of power class capable UE denotation | CR | ZTE Corporation | 38.521-1 18.2.0 CR#2854 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243411 | Updates to FR1 RF phase continuity test | CR | Apple Benelux B.V. | 38.521-2 18.2.0 CR#1056 catF | TEI17_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
R5-243447 | Updates to FR1 RF phase continuity test |
CR revised to R5-243650 |
Apple Benelux B.V. | 38.521-1 18.2.0 CR#2860 catF | TEI17_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-243649 | Correction of spurious emission minimum conformance requirements for UE co-ex for inter-band 2UL |
CR revision of R5-243258 |
Apple, Keysight | 38.521-1 18.2.0 CR#28441 catF | TEI15_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243650 | Updates to FR1 RF phase continuity test |
CR revision of R5-243447 |
Apple Benelux B.V. | 38.521-1 18.2.0 CR#28601 catF | TEI17_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243818 | Corrections on 6.2 and 6.2A for almost contiguous A-MPR requirements for HPUE |
CR revision of R5-243295 |
ZTE Corporation | 38.521-1 18.2.0 CR#28501 catF | TEI16_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-243839 | Update for EVM including symbols with transient period |
CR revision of R5-243013 |
Anritsu, Keysight Technologies | 38.521-1 18.2.0 CR#27991 catF | TEI16_Test | Rel-18 |
R5-103 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
27 documents (0.34220290184021 seconds)