Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-240081 Addition of PC2 n40 MOP CR CMCC 38.521-1 18.1.0 CR#2603 catF TEI16_Test Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-240307 Updating test case AMPR for inter-band CA CR Huawei, HiSilicon 38.521-1 18.1.0 CR#2624 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-240310 Updating test frequency range for SUL band n83 CR Huawei, HiSilicon 38.521-1 18.1.0 CR#2625 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-240319 Updating AMPR testing for SUL band n81 CR Huawei, HiSilicon 38.521-1 18.1.0 CR#2630 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-240320 Updating UTRA ACLR testing for SUL band n81 CR Huawei, HiSilicon 38.521-1 18.1.0 CR#2631 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-240333 Updating PC2 test requirements in MPR test case for band n1 and n3 CR Huawei, HiSilicon 38.521-1 18.1.0 CR#2636 catF TEI17_Test, NR_PC2_UE_FDD-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-240336 Addition of new test case 6.3G.4.1 Absolute power tolerance for Tx Diversity CR Huawei, HiSilicon 38.521-1 18.1.0 CR#2638 catF TEI17_Test, NR_RF_TxD-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-240337 Removal of square brackets for Tx Diversity capability CR

revised to R5-241879

Huawei, HiSilicon 38.521-1 18.1.0 CR#2639 catF TEI17_Test, NR_RF_TxD-UEConTest Rel-18 R5-102

AI: 5.4.4.1

revised [WTS] [JSN]
R5-240470 Addition of 35 MHz CBW for transmitter requirements CR Nokia, Nokia Shanghai Bell 38.521-1 18.1.0 CR#2649 catF NR_lic_bands_BW_R17-UEConTest, TEI17_Test Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-240622 Message exceptions clarifications for 6.3G.3.3 CR

revised to R5-241726

Keysight Technologies 38.521-1 18.1.0 CR#2653 catF TEI17_Test, NR_RF_TxD-UEConTest Rel-18 R5-102

AI: 5.4.4.1

revised [WTS] [JSN]
R5-240623 MBW table reference corrected for inter-band case in test case 6.5A.4.1 CR Keysight Technologies 38.521-1 18.1.0 CR#2654 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-240625 p-Max and p-NR-FR1 adjustment when higherPowerLimit-r17 applies CR

revised to R5-241766

Keysight Technologies UK Ltd, Mediatek 38.521-1 18.1.0 CR#2656 catF TEI17_Test, Power_Limit_CA_DC-UEConTest Rel-18 R5-102

AI: 5.4.4.1

revised [WTS] [JSN]
R5-240992 Clarification of trace mode in emission testing_FR1 CR

revised to R5-241767

Huawei, HiSilicon 38.521-1 18.1.0 CR#2675 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

revised [WTS] [JSN]
R5-240997 Update to message exception of SUL time mask test cases CR Huawei, HiSilicon 38.521-1 18.1.0 CR#2676 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-240998 Update to AMPR, ASEM and ASE for intra-band CA for CA_NS_04 CR

revised to R5-241768

Huawei, HiSilicon 38.521-1 18.1.0 CR#2677 catF TEI16_Test, NR_RF_FR1 Rel-18 R5-102

AI: 5.4.4.1

revised [WTS] [JSN]
R5-241007 Adding the support of NS_47 for PC 1.5 CR Huawei, HiSilicon, SoftBank Corp. 38.521-1 18.1.0 CR#2681 catF TEI16_Test, NR_bands_BW_R16-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241099 Correction to UL configuration for intra-band contiguous CA CR Anritsu 38.521-1 18.1.0 CR#2706 catF TEI16_Test, NR_RF_FR1-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241100 Correction to Rel-15 A-MPR CR

revised to R5-241922

Anritsu 38.521-1 18.1.0 CR#2707 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

revised [WTS] [JSN]
R5-241101 Correction to Rel-16 A-MPR CR Anritsu 38.521-1 18.1.0 CR#2708 catF TEI16_Test, NR_bands_BW_R16-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241102 Correction to test configuration in 6.2D.2 CR

revised to R5-241969

Anritsu 38.521-1 18.1.0 CR#2709 catF TEI16_Test, NR_eMIMO-UEConTest Rel-18 R5-102

AI: 5.4.4.1

revised [WTS] [JSN]
R5-241103 Correction to applicability of powerBoosting for PC3 UE CR Anritsu 38.521-1 18.1.0 CR#2710 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241104 Addition of CBW 35 MHz and 45 MHz to OBW for inter-band CA CR Anritsu 38.521-1 18.1.0 CR#2711 catF TEI17_Test, NR_lic_bands_BW_R17-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241154 Editorial correction in FR1 test case 6.4G.2.1 CR Keysight Technologies UK Ltd 38.521-1 18.1.0 CR#2716 catF TEI17_Test, NR_RF_TxD-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241155 Editorial correction in FR1 test case 6.5A.2.4.1.1 CR

revised to R5-241769

Keysight Technologies UK Ltd 38.521-1 18.1.0 CR#2717 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

revised [WTS] [JSN]
R5-241156 Editorial correction in FR1 test case 6.2A.2.1 CR Keysight Technologies 38.521-1 18.1.0 CR#2718 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241354 Correction in A-MPR test case CR ROHDE & SCHWARZ 38.521-1 18.1.0 CR#2730 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241726 Message exceptions clarifications for 6.3G.3.3 CR

revision of R5-240622

Keysight Technologies 38.521-1 18.1.0 CR#26531 catF TEI17_Test, NR_RF_TxD-UEConTest Rel-18 R5-102

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-241766 p-Max and p-NR-FR1 adjustment when higherPowerLimit-r17 applies CR

revision of R5-240625

Keysight Technologies UK Ltd, Mediatek 38.521-1 18.1.0 CR#26561 catF TEI17_Test, Power_Limit_CA_DC-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241767 Clarification of trace mode in emission testing_FR1 CR

revision of R5-240992

Huawei, HiSilicon 38.521-1 18.1.0 CR#26751 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241768 Update to AMPR, ASEM and ASE for intra-band CA for CA_NS_04 CR

revision of R5-240998

Huawei, HiSilicon 38.521-1 18.1.0 CR#26771 catF TEI16_Test, NR_RF_FR1 Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241769 Editorial correction in FR1 test case 6.5A.2.4.1.1 CR

revision of R5-241155

Keysight Technologies UK Ltd 38.521-1 18.1.0 CR#27171 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241779 Corrections for 6.3G.3.3 CR Keysight Technologies 38.521-1 18.1.0 CR#27351 catF TEI17_Test, NR_RF_TxD-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241879 Removal of square brackets for Tx Diversity capability CR

revision of R5-240337

Huawei, HiSilicon 38.521-1 18.1.0 CR#26391 catF TEI17_Test, NR_RF_TxD-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241922 Correction to Rel-15 A-MPR CR

revision of R5-241100

Anritsu 38.521-1 18.1.0 CR#27071 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-241969 Correction to test configuration in 6.2D.2 CR

revision of R5-241102

Anritsu 38.521-1 18.1.0 CR#27091 catF TEI16_Test, NR_eMIMO-UEConTest Rel-18 R5-102

AI: 5.4.4.1

agreed [WTS] [JSN]

35 documents (0.34575605392456 seconds)