Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-236279 | Correction of RB allocation for ChBW 40 MHz and SCS 30 kHz in Table 6.2.3.4.1-16a | CR | CAICT | 38.521-1 18.0.0 CR#2473 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236335 | Editorial correction in FR1 test case 6.2.4 | CR | Keysight Technologies UK Ltd | 38.521-1 18.0.0 CR#2478 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236337 | Update applicability for NS_47 in FR1 test case 6.5.3.3 | CR | Keysight Technologies UK Ltd | 38.521-1 18.0.0 CR#2480 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236338 | Test procedure update in test case 6.5A.4.1 to skip IMPs overlapping with UL signal | CR | Keysight Technologies UK Ltd | 38.521-1 18.0.0 CR#2481 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236344 | Editorial correction for referred tables for NS_04 in FR1 test 6.5G.2.2 | CR | Keysight Technologies UK Ltd | 38.521-1 18.0.0 CR#2482 catF | TEI17_Test, NR_RF_TxD-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236345 | TxDiversity - in-band emissions test procedure correction |
CR revised to R5-237651 |
Keysight Technologies UK Ltd | 38.521-1 18.0.0 CR#2483 catF | TEI17_Test, NR_RF_TxD-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-236445 | Corrections to Spurious emissions for UE co-existence requirements | CR | Nokia, Nokia Shanghai Bell | 38.521-1 18.0.0 CR#2493 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236510 | Correction of test requirement for absolute power tolerance test case | CR | Ericsson | 38.521-1 18.0.0 CR#2499 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236517 | Correction of prach-ConfigurationIndex for time mask and EVM | CR | ROHDE & SCHWARZ | 38.521-1 18.0.0 CR#2500 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236529 | Correction to relative power tolerance test cases | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2503 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236530 | Correction to spurious emission co-existence | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2504 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
| R5-236650 | Update for PC3 n39 A-MPR | CR | CMCC, Huawei, HiSilicon | 38.521-1 18.0.0 CR#2505 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236803 | Correction to message exception for TDD UL DL pattern in 6.2.1 | CR | Anritsu | 38.521-1 18.0.0 CR#2509 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236804 | Editorial correction to 6.5A.2.2.1 | CR | Anritsu | 38.521-1 18.0.0 CR#2510 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236805 | Correction to message contents for P-max in ACLR and Transmit intermodulation for CA |
CR revised to R5-237652 |
Anritsu | 38.521-1 18.0.0 CR#2511 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-236806 | Correction to UL assignment for different SCS in 6.3A.3.1 | CR | Anritsu | 38.521-1 18.0.0 CR#2512 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236808 | Correction to test requirements of A-MPR for NS_44 | CR | Anritsu | 38.521-1 18.0.0 CR#2514 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236809 | Correction to RB allocation of A-MPR for NS_07 | CR | Anritsu | 38.521-1 18.0.0 CR#2515 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236810 | Correction to RB allocation of A-MPR for NS_27 | CR | Anritsu | 38.521-1 18.0.0 CR#2516 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236823 | Correction to average count for EVM including transient period |
CR revised to R5-237473 |
Anritsu | 38.521-1 18.0.0 CR#2518 catF | TEI16_Test | Rel-18 |
R5-101 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-236824 | Correction to minimum conformance requirements of A-MPR for NS_07 |
CR revised to R5-237949 |
Anritsu | 38.521-1 18.0.0 CR#2519 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-236914 | Correction to test configuration for 6.3D.1 minimum output power for UL MIMO | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2530 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-236915 | Correction to test procedure for 6.5D.2.4 NR ACLR for UL MIMO | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2531 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237039 | Removing n85 in Narrow band blocking test case | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2551 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237042 | Core specification alignment for almost contiguous RB allocation | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2553 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237043 | Cleaning up mentioned standardization groups name in specification | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2554 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237044 | Correcting wrong RB allocations for NS_05 and NS_05U | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2555 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237045 | Correcting wrong RB allocations for NS_46 | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2556 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237046 | Correcting wrong RB allocations for NS_48 | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2557 catF | TEI17_Test, NR_PC2_UE_FDD-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237047 | Correcting wrong RB allocations for NS_49 | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2558 catF | TEI17_Test, NR_PC2_UE_FDD-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237108 | Clarification of number of measured UL connectors for Tx requirements |
CR revised to R5-237653 |
ROHDE & SCHWARZ | 38.521-1 18.0.0 CR#2573 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-237147 | Editorial correction to 6.2D.2.5 | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2574 catF | TEI16_Test, NR_eMIMO-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237248 | Correction of TDD configuration in SRS time mask test case | CR | ROHDE & SCHWARZ | 38.521-1 18.0.0 CR#2579 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237251 | Correction of almost contiguous allocation in A-MPR test | CR | ROHDE & SCHWARZ | 38.521-1 18.0.0 CR#2581 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237253 | Tx signal quality for UL MIMO per layer |
CR revised to R5-237940 |
ROHDE & SCHWARZ | 38.521-1 18.0.0 CR#2582 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
| R5-237263 | Update for DC location in carrier leakage test cases | CR | ROHDE & SCHWARZ | 38.521-1 18.0.0 CR#2584 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237473 | Correction to average count for EVM including transient period |
CR revision of R5-236823 |
Anritsu | 38.521-1 18.0.0 CR#25181 catF | TEI16_Test | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237651 | TxDiversity - in-band emissions test procedure correction |
CR revision of R5-236345 |
Keysight Technologies UK Ltd | 38.521-1 18.0.0 CR#24831 catF | TEI17_Test, NR_RF_TxD-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237652 | Correction to message contents for P-max in ACLR and Transmit intermodulation for CA |
CR revision of R5-236805 |
Anritsu | 38.521-1 18.0.0 CR#25111 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237653 | Clarification of number of measured UL connectors for Tx requirements |
CR revision of R5-237108 |
ROHDE & SCHWARZ | 38.521-1 18.0.0 CR#25731 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237940 | Tx signal quality for UL MIMO per layer |
CR revision of R5-237253 |
ROHDE & SCHWARZ | 38.521-1 18.0.0 CR#25821 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
| R5-237949 | Correction to minimum conformance requirements of A-MPR for NS_07 |
CR revision of R5-236824 |
Anritsu | 38.521-1 18.0.0 CR#25191 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-18 |
R5-101 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
42 documents (0.28414297103882 seconds)