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" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501
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tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
---|---|---|---|---|---|---|---|---|---|
R5-233965 | Editorial correction to UE additional maximum output power reduction for new NR band n13 | CR | Nokia, Nokia Shanghai Bell | 38.521-1 17.9.0 CR#2319 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-234126 | Correction of requirements of Spurious emissions for UE co-existence for NR |
CR revised to R5-235867 |
CAICT | 38.521-1 17.9.0 CR#2329 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-234127 | Correction of requirements of Spurious emissions for UE co-existence in 6.5D.3_2.2 | CR | CAICT | 38.521-1 17.9.0 CR#2330 catF | TEI17_Test, NR_bands_UL_MIMO_PC3_R17-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
R5-234128 | Correction of requirements of Spurious emissions for UE co-existence in 6.5D.3_1.2 | CR | CAICT | 38.521-1 17.9.0 CR#2331 catF | TEI16_Test, NR_eMIMO-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
R5-234129 | Correction of test requirements for 6.5A.3.2.1 | CR | CAICT | 38.521-1 17.9.0 CR#2332 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
R5-234136 | Correction of requirements of Spurious emissions for UE co-existence for NR |
draftCR revised to R5-235862 |
CAICT | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
revised | [WTS] [JSN] | |
R5-234137 | Correction of requirements of Spurious emissions for UE co-existence in 6.5D.3_2.2 | draftCR | CAICT | TEI17_Test, NR_bands_UL_MIMO_PC3_R17-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] | |
R5-234138 | Correction of requirements of Spurious emissions for UE co-existence in 6.5D.3_1.2 | draftCR | CAICT | TEI16_Test, NR_eMIMO-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] | |
R5-234139 | Correction of test requirements for 6.5A.3.2.1 | draftCR | CAICT | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
noted | [WTS] [JSN] | |
R5-234174 | Define RMS detector for FR1 SEM tests in 38.521-1 | CR | Keysight Technologies UK Ltd | 38.521-1 17.9.0 CR#2346 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
R5-234180 | Pending BW addition in 6.5D.2.3 | CR | Keysight Technologies UK Ltd | 38.521-1 17.9.0 CR#2351 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-234297 | Addition of spurious emissions for CA_n3A-n77A |
CR revised to R5-235648 |
KDDI Corporation | 38.521-1 17.9.0 CR#2360 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-234524 | Update of UL MIMO Maximum Output Power TC |
CR revised to R5-235828 |
Rohde & Schwarz | 38.521-1 17.9.0 CR#2363 catF | TEI16_Test, NR_eMIMO-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-234557 | Update 6.2.2 for 38.521-1 |
CR revised to R5-235863 |
Qualcomm France | 38.521-1 17.9.0 CR#2369 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-234637 | Remove duplicated AMPR test configurations for NS_24 | CR | 38.521-1 17.9.0 CR#2374 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] | |
R5-234707 | Update of IE p-Max value for MPR and SEM for inter-band CA Power Class 3 | CR | Huawei, HiSilicon | 38.521-1 17.9.0 CR#2377 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-234746 | Addition of PC2 n40 MOP | CR | CMCC | 38.521-1 17.9.0 CR#2387 catF | TEI16_Test | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-234830 | Editorial correction of AMPR for CA test requirements |
CR revised to R5-235644 |
Huawei, HiSilicon | 38.521-1 17.9.0 CR#2399 catF | 5GS_NR_LTE-UEConTest, TEI15_Test | Rel-17 |
R5-100 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-234831 | Correction to test requirements of EVM for CA |
CR revised to R5-235646 |
Huawei, HiSilicon | 38.521-1 17.9.0 CR#2400 catF | 5GS_NR_LTE-UEConTest, TEI15_Test | Rel-17 |
R5-100 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-234832 | Clarification of unwanted emission testing configuration - Part 1 |
CR revised to R5-235864 |
Huawei, HiSilicon, Keysight | 38.521-1 17.9.0 CR#2401 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-234908 | Correction to A-MPR for NS_44 | CR | Anritsu | 38.521-1 17.9.0 CR#2416 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-234909 | Correction to message contents of 6.5A.2.2.1 | CR | Anritsu | 38.521-1 17.9.0 CR#2417 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-234911 | Correction to A-MPR for UL MIMO | CR | Anritsu | 38.521-1 17.9.0 CR#2419 catF | TEI16_Test, NR_eMIMO-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-234932 | Correction of test case 6.2D.1 MOP for UL-MIMO | CR | Ericsson, Google | 38.521-1 17.9.0 CR#2420 catF | TEI16_Test, NR_eMIMO-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
R5-235038 | Editorial: Removing editor’s Note in test case 6.5D.2.2_1 | CR | Huawei, HiSilicon | 38.521-1 17.9.0 CR#2425 catF | TEI17_Test, NR_bands_UL_MIMO_PC3_R17-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-235133 | Alignments on the terms for NR DC configured maximum UE output power |
CR revised to R5-235653 |
ZTE Corporation | 38.521-1 17.9.0 CR#2437 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-235134 | Corrections on the delta TIB values for NR DC configurations |
CR revised to R5-235655 |
ZTE Corporation | 38.521-1 17.9.0 CR#2438 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-235135 | Corrections on the maximum output power tolerance |
CR revised to R5-235656 |
ZTE Corporation | 38.521-1 17.9.0 CR#2439 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
revised | [WTS] [JSN] |
R5-235142 | Correction of A-MPR test case | CR | ROHDE & SCHWARZ | 38.521-1 17.9.0 CR#2443 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-235151 | Editorial correction of PRACH time mask test case | CR | ROHDE & SCHWARZ | 38.521-1 17.9.0 CR#2446 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-235644 | Editorial correction of AMPR for CA test requirements |
CR revision of R5-234830 |
Huawei, HiSilicon | 38.521-1 17.9.0 CR#23991 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-235646 | Correction to test requirements of EVM for CA |
CR revision of R5-234831 |
Huawei, HiSilicon | 38.521-1 17.9.0 CR#24001 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-235648 | Addition of spurious emissions for CA_n3A-n77A |
CR revision of R5-234297 |
KDDI Corporation | 38.521-1 17.9.0 CR#23601 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-235653 | Alignments on the terms for NR DC configured maximum UE output power |
CR revision of R5-235133 |
ZTE Corporation | 38.521-1 17.9.0 CR#24371 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-235655 | Corrections on the delta TIB values for NR DC configurations |
CR revision of R5-235134 |
ZTE Corporation | 38.521-1 17.9.0 CR#24381 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-235656 | Corrections on the maximum output power tolerance |
CR revision of R5-235135 |
ZTE Corporation | 38.521-1 17.9.0 CR#24391 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-235828 | Update of UL MIMO Maximum Output Power TC |
CR revision of R5-234524 |
Rohde & Schwarz | 38.521-1 17.9.0 CR#23631 catF | TEI16_Test, NR_eMIMO-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-235862 | Correction of requirements of Spurious emissions for UE co-existence for NR |
draftCR revision of R5-234136 |
CAICT | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
noted | [WTS] [JSN] | |
R5-235863 | Update 6.2.2 for 38.521-1 |
CR revision of R5-234557 |
Qualcomm France | 38.521-1 17.9.0 CR#23691 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-235864 | Clarification of unwanted emission testing configuration - Part 1 |
CR revision of R5-234832 |
Huawei, HiSilicon, Keysight | 38.521-1 17.9.0 CR#24011 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
agreed | [WTS] [JSN] |
R5-235867 | Correction of requirements of Spurious emissions for UE co-existence for NR |
CR revision of R5-234126 |
CAICT | 38.521-1 17.9.0 CR#23291 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.4.1 |
withdrawn | [WTS] [JSN] |
41 documents (0.32987403869629 seconds)