Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-233965 Editorial correction to UE additional maximum output power reduction for new NR band n13 CR Nokia, Nokia Shanghai Bell 38.521-1 17.9.0 CR#2319 catF TEI17_Test, NR_lic_bands_BW_R17-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-234126 Correction of requirements of Spurious emissions for UE co-existence for NR CR

revised to R5-235867

CAICT 38.521-1 17.9.0 CR#2329 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

revised [WTS] [JSN]
R5-234127 Correction of requirements of Spurious emissions for UE co-existence in 6.5D.3_2.2 CR CAICT 38.521-1 17.9.0 CR#2330 catF TEI17_Test, NR_bands_UL_MIMO_PC3_R17-UEConTest Rel-17 R5-100

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-234128 Correction of requirements of Spurious emissions for UE co-existence in 6.5D.3_1.2 CR CAICT 38.521-1 17.9.0 CR#2331 catF TEI16_Test, NR_eMIMO-UEConTest Rel-17 R5-100

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-234129 Correction of test requirements for 6.5A.3.2.1 CR CAICT 38.521-1 17.9.0 CR#2332 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-234136 Correction of requirements of Spurious emissions for UE co-existence for NR draftCR

revised to R5-235862

CAICT TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

revised [WTS] [JSN]
R5-234137 Correction of requirements of Spurious emissions for UE co-existence in 6.5D.3_2.2 draftCR CAICT TEI17_Test, NR_bands_UL_MIMO_PC3_R17-UEConTest Rel-17 R5-100

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-234138 Correction of requirements of Spurious emissions for UE co-existence in 6.5D.3_1.2 draftCR CAICT TEI16_Test, NR_eMIMO-UEConTest Rel-17 R5-100

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-234139 Correction of test requirements for 6.5A.3.2.1 draftCR CAICT TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

noted [WTS] [JSN]
R5-234174 Define RMS detector for FR1 SEM tests in 38.521-1 CR Keysight Technologies UK Ltd 38.521-1 17.9.0 CR#2346 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-234180 Pending BW addition in 6.5D.2.3 CR Keysight Technologies UK Ltd 38.521-1 17.9.0 CR#2351 catF TEI17_Test, NR_lic_bands_BW_R17-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-234297 Addition of spurious emissions for CA_n3A-n77A CR

revised to R5-235648

KDDI Corporation 38.521-1 17.9.0 CR#2360 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

revised [WTS] [JSN]
R5-234524 Update of UL MIMO Maximum Output Power TC CR

revised to R5-235828

Rohde & Schwarz 38.521-1 17.9.0 CR#2363 catF TEI16_Test, NR_eMIMO-UEConTest Rel-17 R5-100

AI: 5.4.4.1

revised [WTS] [JSN]
R5-234557 Update 6.2.2 for 38.521-1 CR

revised to R5-235863

Qualcomm France 38.521-1 17.9.0 CR#2369 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

revised [WTS] [JSN]
R5-234637 Remove duplicated AMPR test configurations for NS_24 CR Google 38.521-1 17.9.0 CR#2374 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-234707 Update of IE p-Max value for MPR and SEM for inter-band CA Power Class 3 CR Huawei, HiSilicon 38.521-1 17.9.0 CR#2377 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-234746 Addition of PC2 n40 MOP CR CMCC 38.521-1 17.9.0 CR#2387 catF TEI16_Test Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-234830 Editorial correction of AMPR for CA test requirements CR

revised to R5-235644

Huawei, HiSilicon 38.521-1 17.9.0 CR#2399 catF 5GS_NR_LTE-UEConTest, TEI15_Test Rel-17 R5-100

AI: 5.4.4.1

revised [WTS] [JSN]
R5-234831 Correction to test requirements of EVM for CA CR

revised to R5-235646

Huawei, HiSilicon 38.521-1 17.9.0 CR#2400 catF 5GS_NR_LTE-UEConTest, TEI15_Test Rel-17 R5-100

AI: 5.4.4.1

revised [WTS] [JSN]
R5-234832 Clarification of unwanted emission testing configuration - Part 1 CR

revised to R5-235864

Huawei, HiSilicon, Keysight 38.521-1 17.9.0 CR#2401 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

revised [WTS] [JSN]
R5-234908 Correction to A-MPR for NS_44 CR Anritsu 38.521-1 17.9.0 CR#2416 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-234909 Correction to message contents of 6.5A.2.2.1 CR Anritsu 38.521-1 17.9.0 CR#2417 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-234911 Correction to A-MPR for UL MIMO CR Anritsu 38.521-1 17.9.0 CR#2419 catF TEI16_Test, NR_eMIMO-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-234932 Correction of test case 6.2D.1 MOP for UL-MIMO CR Ericsson, Google 38.521-1 17.9.0 CR#2420 catF TEI16_Test, NR_eMIMO-UEConTest Rel-17 R5-100

AI: 5.4.4.1

withdrawn [WTS] [JSN]
R5-235038 Editorial: Removing editor’s Note in test case 6.5D.2.2_1 CR Huawei, HiSilicon 38.521-1 17.9.0 CR#2425 catF TEI17_Test, NR_bands_UL_MIMO_PC3_R17-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-235133 Alignments on the terms for NR DC configured maximum UE output power CR

revised to R5-235653

ZTE Corporation 38.521-1 17.9.0 CR#2437 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

revised [WTS] [JSN]
R5-235134 Corrections on the delta TIB values for NR DC configurations CR

revised to R5-235655

ZTE Corporation 38.521-1 17.9.0 CR#2438 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

revised [WTS] [JSN]
R5-235135 Corrections on the maximum output power tolerance CR

revised to R5-235656

ZTE Corporation 38.521-1 17.9.0 CR#2439 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

revised [WTS] [JSN]
R5-235142 Correction of A-MPR test case CR ROHDE & SCHWARZ 38.521-1 17.9.0 CR#2443 catF TEI16_Test, NR_bands_BW_R16-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-235151 Editorial correction of PRACH time mask test case CR ROHDE & SCHWARZ 38.521-1 17.9.0 CR#2446 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-235644 Editorial correction of AMPR for CA test requirements CR

revision of R5-234830

Huawei, HiSilicon 38.521-1 17.9.0 CR#23991 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-235646 Correction to test requirements of EVM for CA CR

revision of R5-234831

Huawei, HiSilicon 38.521-1 17.9.0 CR#24001 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-235648 Addition of spurious emissions for CA_n3A-n77A CR

revision of R5-234297

KDDI Corporation 38.521-1 17.9.0 CR#23601 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-235653 Alignments on the terms for NR DC configured maximum UE output power CR

revision of R5-235133

ZTE Corporation 38.521-1 17.9.0 CR#24371 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-235655 Corrections on the delta TIB values for NR DC configurations CR

revision of R5-235134

ZTE Corporation 38.521-1 17.9.0 CR#24381 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-235656 Corrections on the maximum output power tolerance CR

revision of R5-235135

ZTE Corporation 38.521-1 17.9.0 CR#24391 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-235828 Update of UL MIMO Maximum Output Power TC CR

revision of R5-234524

Rohde & Schwarz 38.521-1 17.9.0 CR#23631 catF TEI16_Test, NR_eMIMO-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-235862 Correction of requirements of Spurious emissions for UE co-existence for NR draftCR

revision of R5-234136

CAICT TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

noted [WTS] [JSN]
R5-235863 Update 6.2.2 for 38.521-1 CR

revision of R5-234557

Qualcomm France 38.521-1 17.9.0 CR#23691 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-235864 Clarification of unwanted emission testing configuration - Part 1 CR

revision of R5-234832

Huawei, HiSilicon, Keysight 38.521-1 17.9.0 CR#24011 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

agreed [WTS] [JSN]
R5-235867 Correction of requirements of Spurious emissions for UE co-existence for NR CR

revision of R5-234126

CAICT 38.521-1 17.9.0 CR#23291 catF TEI15_Test, 5GS_NR_LTE-UEConTest Rel-17 R5-100

AI: 5.4.4.1

withdrawn [WTS] [JSN]

41 documents (0.32987403869629 seconds)