Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-253811 | Addition of reference sensitivity TP analysis for new R15 EN-DC combos within FR1 |
CR revised to R5-255238 |
KDDI Corporation | 38.905 19.0.0 CR#1035 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-19 |
R5-108 AI: 5.4.19 |
revised | [WTS] [JSN] |
| R5-254082 | TP analysis update for test case 6.3C.3.2 | CR | Keysight Technologies UK Ltd | 38.905 19.0.0 CR#1040 catF | TEI16_Test | Rel-19 |
R5-108 AI: 5.4.19 |
agreed | [WTS] [JSN] |
| R5-254316 | Updates on TP analysis for Refsens for PC2 DC_66A_n41A | CR | ZTE Corporation | 38.905 19.0.0 CR#1045 catF | TEI17_Test | Rel-19 |
R5-108 AI: 5.4.19 |
agreed | [WTS] [JSN] |
| R5-254318 | Addition of reference sensitivity test point analysis for DC_1A-41A_n78A | CR | ZTE Corporation | 38.905 19.0.0 CR#1046 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.19 |
agreed | [WTS] [JSN] |
| R5-254333 | Corrections on reference sensitivity test cases for R15 3CC EN-DC configurations | CR | ZTE Corporation | 38.905 19.0.0 CR#1050 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.19 |
agreed | [WTS] [JSN] |
| R5-254334 | Corrections on single uplink configurations for reference sensitivity test cases for R15 2CC EN-DC configurations | CR | ZTE Corporation | 38.905 19.0.0 CR#1051 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.19 |
agreed | [WTS] [JSN] |
| R5-254622 | Correction of testing potints for NS_47 in AMPR for UL MIMO | CR | Huawei, HiSilicon | 38.905 19.0.0 CR#1072 catF | TEI16_Test | Rel-19 |
R5-108 AI: 5.4.19 |
agreed | [WTS] [JSN] |
| R5-254796 | TP analysis for spurious emission for several EN-DC configurations including band n40 | CR | Huawei, HiSilicon | 38.905 19.0.0 CR#1080 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.19 |
agreed | [WTS] [JSN] |
| R5-254797 | TP analysis for REFSENS for several EN-DC configurations including band n40 | CR | Huawei, HiSilicon | 38.905 19.0.0 CR#1081 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.19 |
agreed | [WTS] [JSN] |
| R5-255238 | Addition of reference sensitivity TP analysis for new R15 EN-DC combos within FR1 |
CR revision of R5-253811 |
KDDI Corporation | 38.905 19.0.0 CR#10351 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.19 |
agreed | [WTS] [JSN] |
10 documents (0.3817138671875 seconds)