Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-240308 | Updating test principle for AMPR for inter-band UL CA | CR | Huawei, HiSilicon | 38.905 18.1.0 CR#852 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.19 |
agreed | [WTS] [JSN] |
| R5-240318 | Updating test points for FR1 REFSENS for SUL test case | CR | Huawei, HiSilicon | 38.905 18.1.0 CR#853 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.19 |
agreed | [WTS] [JSN] |
| R5-240456 | Correction to reference sensitivity test point analysis for CA_n28A-n78A |
CR revised to R5-241777 |
Nokia, Nokia Shanghai Bell | 38.905 18.1.0 CR#858 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.19 |
revised | [WTS] [JSN] |
| R5-240881 | Test point analysis of EN-DC spurious emissions for DC_2A_n66A and DC_30A_n66A |
CR revised to R5-241778 |
WE Certification Oy, AT&T | 38.905 18.1.0 CR#866 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.19 |
revised | [WTS] [JSN] |
| R5-241006 | Test points analysis for FR1 AMPR test case with NS_47 and PC 1.5 | CR | Huawei, HiSilicon, SoftBank Corp. | 38.905 18.1.0 CR#871 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-18 |
R5-102 AI: 5.4.19 |
agreed | [WTS] [JSN] |
| R5-241053 | Addition of REFSENS TP analysis for DC_19A_n78A and DC_19A_n77A in PC3 | CR | NTT DOCOMO INC. | 38.905 18.1.0 CR#873 catF | TEI15_Test | Rel-18 |
R5-102 AI: 5.4.19 |
withdrawn | [WTS] [JSN] |
| R5-241055 | Addition of REFSENS TP analysis for 3CC EN-DC for n78 and n79 in PC3 | CR | NTT DOCOMO, INC. | 38.905 18.1.0 CR#875 catF | TEI15_Test | Rel-18 |
R5-102 AI: 5.4.19 |
withdrawn | [WTS] [JSN] |
| R5-241777 | Correction to reference sensitivity test point analysis for CA_n28A-n78A |
CR revision of R5-240456 |
Nokia, Nokia Shanghai Bell | 38.905 18.1.0 CR#8581 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.19 |
agreed | [WTS] [JSN] |
| R5-241778 | Test point analysis of EN-DC spurious emissions for DC_2A_n66A and DC_30A_n66A |
CR revision of R5-240881 |
WE Certification Oy, AT&T | 38.905 18.1.0 CR#8661 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.19 |
agreed | [WTS] [JSN] |
9 documents (0.34640312194824 seconds)