Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-232162 | On FR2 PC1 Priority 1 test cases pending for FR2b | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-232168 | On the network analyzer uncertainty for PC3 in FR2 | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-232374 | Discussion on spurious emission for UE co-existence requirement | discussion | CAICT |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | |||
| R5-232627 | Spurious Emissions TRP Measurement Grids using Offset Approach | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-232633 | On MU Threshold for RRM FR2 PC1 | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-232660 | Discussion on affected list of RRM test cases with testability issues |
discussion revised to R5-233696 |
Qualcomm France | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-99 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-232668 | Discussion on RRM test grouping | discussion | Qualcomm France | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-232673 | Discussion on signal variation and balancing in FR2 multiple AoA setups | discussion | Qualcomm France | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-232823 | Discussion on handling of test case applicability with different branches | discussion | CMCC, BV ADT, Sporton |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | |||
| R5-232910 | FR2 RRM test cases: Known Issue List |
discussion revised to R5-233634 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-99 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-232911 | Discussion on additional UE gain parameters in FR2 RRM testing |
discussion revised to R5-233642 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-99 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-232983 | MU discussion on FR2c | discussion | Anritsu | TEI16_Test, NR_bands_BW_R16-UEConTest |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-232987 | Discussion on power settings in FR1 EVM including symbols with transient period |
discussion revised to R5-233697 |
Anritsu, Apple Inc | TEI16_Test |
R5-99 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-233095 | Discussion on handling of test frequencies for band n79 10MHz channel bandwidth |
discussion revised to R5-233698 |
Huawei, HiSilicon, Keysight | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.17 |
revised | [WTS] [JSN] | |
| R5-233174 | On the MU for n259 | discussion | ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-233222 | Testability issue in FR2 Relative Power Control test case |
discussion revised to R5-233701 |
Ericsson India Private Limited | Rel-15 |
R5-99 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-233634 | FR2 RRM test cases: Known Issue List |
discussion revision of R5-232910 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-233642 | Discussion on additional UE gain parameters in FR2 RRM testing |
discussion revision of R5-232911 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-233696 | Discussion on affected list of RRM test cases with testability issues |
discussion revision of R5-232660 |
Qualcomm France | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-233697 | Discussion on power settings in FR1 EVM including symbols with transient period |
discussion revision of R5-232987 revised to R5-233760 |
Anritsu, Apple Inc | TEI16_Test |
R5-99 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-233698 | Discussion on handling of test frequencies for band n79 10MHz channel bandwidth |
discussion revision of R5-233095 |
Huawei, HiSilicon, Keysight | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-233701 | Testability issue in FR2 Relative Power Control test case |
discussion revision of R5-233222 |
Ericsson India Private Limited | Rel-15 |
R5-99 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-233760 | Discussion on power settings in FR1 EVM including symbols with transient period |
discussion revision of R5-233697 |
Anritsu, Apple Inc | TEI16_Test |
R5-99 AI: 5.4.17 |
agreed | [WTS] [JSN] |
23 documents (0.33873414993286 seconds)